Optical or photographic arrangements associated with the tube

Industry

CPC
H01J37/22

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/22Optical or photographic arrangements associated with the tube

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and specimen contamination prevention method
- Patent number 12,131,881
- Issue date Oct 29, 2024
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,125,667
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target and algorithm to measure overlay by modeling back scattering...
- Patent number 12,100,574
- Issue date Sep 24, 2024
- KLA Corporation
- Nadav Gutman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope for examining a specimen, and method of...
- Patent number 12,080,512
- Issue date Sep 3, 2024
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for high-performance electron microscopy
- Patent number 12,073,541
- Issue date Aug 27, 2024
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,074,076
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Soichiro Eto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automating cryo-electron microscopy data collection
- Patent number 12,057,289
- Issue date Aug 6, 2024
- New York Structural Biology Center
- Paul T. Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 12,046,445
- Issue date Jul 23, 2024
- NuFlare Technology, Inc.
- Takuro Nagao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,046,446
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cost effective probing in high volume manufacture of micro LEDs
- Patent number 12,014,896
- Issue date Jun 18, 2024
- ATTOLIGHT AG
- Matthew J. Davies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjusting method of charged particle beam device and charged partic...
- Patent number 12,001,521
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Use of optical polarization states to control a ponderomotive phase...
- Patent number 11,990,313
- Issue date May 21, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer positioning method and apparatus
- Patent number 11,978,677
- Issue date May 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Cheng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calibrating a scanning charged particle microscope
- Patent number 11,972,922
- Issue date Apr 30, 2024
- ASML Netherlands B.V.
- Hermanus Adrianus Dillen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,961,699
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and operation method therefor
- Patent number 11,961,701
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoharu Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
- Patent number 11,961,700
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration isolation system with one or more magnetic actuators
- Patent number 11,953,073
- Issue date Apr 9, 2024
- Integrated Dynamics Engineering GmbH
- Han Hartgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,935,722
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis method and analysis system of voltage contrast defect
- Patent number 11,927,625
- Issue date Mar 12, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Yue-Ying Yen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices, systems, and methods for using an imaging device to calibr...
- Patent number 11,925,983
- Issue date Mar 12, 2024
- Arcam AB
- Anders Snis
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and correction of system responses in real-time
- Patent number 11,894,214
- Issue date Feb 6, 2024
- KLA Corporation
- Henning Stoschus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,875,966
- Issue date Jan 16, 2024
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL
- Publication number 20240355579
- Publication date Oct 24, 2024
- KLA Corporation
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE, METHODS, AND SYSTEMS FOR DETERMINATION OF A LOCAL FOCUS P...
- Publication number 20240355578
- Publication date Oct 24, 2024
- ASML NETHERLANDS B.V.
- Te-Sheng WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY
- Publication number 20240355581
- Publication date Oct 24, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Walter REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF CLEANING ELECTRON SOURCES IN CHARGED-PARTICL...
- Publication number 20240347313
- Publication date Oct 17, 2024
- ASML NETHERLANDS B.V.
- Zhidong DU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS METHOD, COMPUTER-READABLE MEDIUM, AND MANUFACTURING METHOD...
- Publication number 20240347315
- Publication date Oct 17, 2024
- Fuji Electric Co., Ltd.
- Yusuke SHIMIZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS
- Publication number 20240339289
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Adar Sonn-Segev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD
- Publication number 20240339294
- Publication date Oct 10, 2024
- ASML NETHERLANDS B.V.
- Marijke SCOTUZZI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED NAVIGATION FOR ELECTRON MICROSCOPY
- Publication number 20240339293
- Publication date Oct 10, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE OPTICAL DEVICE
- Publication number 20240321547
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optimizing Image Distortion in a Multi Beam Charged Particle Proces...
- Publication number 20240304413
- Publication date Sep 12, 2024
- IMS Nanofabrication GmbH
- Christoph Spengler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE, INSPECTION METHOD AND INSPECTION SYSTEM
- Publication number 20240304411
- Publication date Sep 12, 2024
- WINBOND ELECTRONICS CORP.
- Yen-Chiao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240297013
- Publication date Sep 5, 2024
- ASML NETHERLANDS B.V.
- Jasper Frans Mathijs VAN RENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE
- Publication number 20240297012
- Publication date Sep 5, 2024
- Hitachi High-Tech Corporation
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA MONITORING SYSTEM
- Publication number 20240290590
- Publication date Aug 29, 2024
- SAMSUNG DISPLAY CO., LTD.
- YOUNGGIL PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING THERMIONIC ELECTRON EMITTER IN SITU
- Publication number 20240290594
- Publication date Aug 29, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
- Publication number 20240282549
- Publication date Aug 22, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MACHINE LEARNING BASED YIELD PREDICTION
- Publication number 20240281958
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris LEVANT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope, Aberration Correction Method, And Imaging Method
- Publication number 20240274402
- Publication date Aug 15, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE POSITION MONITORING DEVICES
- Publication number 20240274401
- Publication date Aug 15, 2024
- KLA Corporation
- James Richard Bella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER POSITIONING METHOD AND APPARATUS
- Publication number 20240274478
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Cheng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A POSITION OF AN OBJECT IN A BEAM APPARATUS,...
- Publication number 20240258068
- Publication date Aug 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRO...
- Publication number 20240258065
- Publication date Aug 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Inspection Apparatus
- Publication number 20240255556
- Publication date Aug 1, 2024
- Hitachi High-Tech Corporation
- Tomoko SHIMAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF CONVERTING DIFFRACTION PATTERN IMAGE FOR INTER...
- Publication number 20240257318
- Publication date Aug 1, 2024
- LightVision Inc.
- Jin Ha JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...
- Publication number 20240249909
- Publication date Jul 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...
- Publication number 20240242334
- Publication date Jul 18, 2024
- Carl Zeiss MultiSEM GmbH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...
- Publication number 20240242925
- Publication date Jul 18, 2024
- Hitachi, Ltd
- Shunya TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Controlling Same
- Publication number 20240242928
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Koichi KURODA
- G06 - COMPUTING CALCULATING COUNTING

Optical or photographic arrangements associated with the tube

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron microscope and specimen contamination prevention method

Charged particle beam device

Target and algorithm to measure overlay by modeling back scattering...

Charged particle microscope for examining a specimen, and method of...

Cross-talk cancellation in multiple charged-particle beam inspection

Inspection apparatus and method

Methods for high-performance electron microscopy

Plasma processing apparatus and plasma processing method

Automating cryo-electron microscopy data collection

Electron beam inspection apparatus and electron beam inspection method

Charged particle beam device

Cost effective probing in high volume manufacture of micro LEDs

Adjusting method of charged particle beam device and charged partic...

Method and system for cross-sectioning a sample with a preset thick...

System and method for generating and analyzing roughness measuremen...

Use of optical polarization states to control a ponderomotive phase...

Wafer positioning method and apparatus

Method for calibrating a scanning charged particle microscope

Charged particle beam device

Charged particle beam device and operation method therefor

Systems and methods for image enhancement for a multi-beam charged-...

Vibration isolation system with one or more magnetic actuators

Machine learning on wafer defect review

Analysis method and analysis system of voltage contrast defect

Devices, systems, and methods for using an imaging device to calibr...

Lateral recess measurement in a semiconductor specimen

Microscopy imaging method for 3D tomography with predictive drift t...

Detection and correction of system responses in real-time

Method and apparatus for inspection

Charged particle beam device

Patents Applicationslast 30 patents

HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL

SOFTWARE, METHODS, AND SYSTEMS FOR DETERMINATION OF A LOCAL FOCUS P...

METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY

SYSTEMS AND METHODS OF CLEANING ELECTRON SOURCES IN CHARGED-PARTICL...

ANALYSIS METHOD, COMPUTER-READABLE MEDIUM, AND MANUFACTURING METHOD...

FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS

CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD

IMPROVED NAVIGATION FOR ELECTRON MICROSCOPY

CHARGED-PARTICLE OPTICAL DEVICE

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

Optimizing Image Distortion in a Multi Beam Charged Particle Proces...

SEMICONDUCTOR STRUCTURE, INSPECTION METHOD AND INSPECTION SYSTEM

ALIGNING A DISTORTED IMAGE

CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE

PLASMA MONITORING SYSTEM

METHOD FOR EVALUATING THERMIONIC ELECTRON EMITTER IN SITU

USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...

MACHINE LEARNING BASED YIELD PREDICTION

Electron Microscope, Aberration Correction Method, And Imaging Method

SUBSTRATE POSITION MONITORING DEVICES

WAFER POSITIONING METHOD AND APPARATUS

METHOD FOR DETERMINING A POSITION OF AN OBJECT IN A BEAM APPARATUS,...

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRO...

Sample Inspection Apparatus

SYSTEM AND METHOD OF CONVERTING DIFFRACTION PATTERN IMAGE FOR INTER...

Method of Dispositioning and Control of a Semiconductor Manufacturi...

FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...

METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...

Charged Particle Beam Device and Method for Controlling Same