Optimisation aspects

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CPC
G01R31/3172

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/3172Optimisation aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Clock recovery unit adjustment
- Patent number 12,255,979
- Issue date Mar 18, 2025
- Keysight Technologies, Inc.
- Marlin E. Viss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mechanism capable of performing on-chip test and verification
- Patent number 12,253,564
- Issue date Mar 18, 2025
- Silicon Motion, Inc.
- Tse-Yen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Processing system, related integrated circuit, device and method
- Patent number 12,253,562
- Issue date Mar 18, 2025
- STMicroelectronics Application GmbH
- Roberto Colombo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring a duty cycle of a clock signal
- Patent number 12,253,563
- Issue date Mar 18, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Eric Soenen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device, debug system, and debug method
- Patent number 12,253,561
- Issue date Mar 18, 2025
- Renesas Electronics Corporation
- Masahide Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 12,248,022
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for capture clock control to minimize toggling...
- Patent number 12,241,931
- Issue date Mar 4, 2025
- MARVELL ASIA PTE. LTD.
- Balaji Upputuri
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system
- Patent number 12,237,029
- Issue date Feb 25, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for determining and calibrating non-linearity in a Phase In...
- Patent number 12,235,318
- Issue date Feb 25, 2025
- Samsung Electronics Co., Ltd.
- Gunjan Mandal
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for performing error detection on a clock gated...
- Patent number 12,229,002
- Issue date Feb 18, 2025
- Imagination Technologies Limited
- Faizan Nazar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault tolerant synchronizer
- Patent number 12,222,390
- Issue date Feb 11, 2025
- Texas Instruments Incorporated
- Denis Roland Beaudoin
- G01 - MEASURING TESTING
Information Patent Grant
Photonic wafer level testing systems, devices, and methods of opera...
- Patent number 12,216,020
- Issue date Feb 4, 2025
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Clock shaper circuit for transition fault testing
- Patent number 12,216,160
- Issue date Feb 4, 2025
- Texas Instruments Incorporated
- Wilson Pradeep
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,216,159
- Issue date Feb 4, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock gating for power reduction during testing
- Patent number 12,210,058
- Issue date Jan 28, 2025
- MARVELL ASIA PTE. LTD.
- Sreekanth G. Pai
- G01 - MEASURING TESTING
Information Patent Grant
Device access port selection
- Patent number 12,210,060
- Issue date Jan 28, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test element group and test method
- Patent number 12,210,059
- Issue date Jan 28, 2025
- Samsung Electronics Co., Ltd.
- Jeongha Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test-time optimization with few slow scan pads
- Patent number 12,203,985
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Signal test
- Patent number 12,196,803
- Issue date Jan 14, 2025
- Infineon Technologies AG
- Muhammad Hassan
- G01 - MEASURING TESTING
Information Patent Grant
Oscillation period detection circuit and method, and semiconductor...
- Patent number 12,188,981
- Issue date Jan 7, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhiqiang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Test method for delay circuit and test circuitry
- Patent number 12,188,982
- Issue date Jan 7, 2025
- Realtek Semiconductor Corp.
- Kuo-Wei Chi
- G01 - MEASURING TESTING
Information Patent Grant
Test access port with address and command capability
- Patent number 12,188,980
- Issue date Jan 7, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-detecting circuit, duty-cycle corrector, and electronic d...
- Patent number 12,184,287
- Issue date Dec 31, 2024
- GigaDevice Semiconductor Inc.
- Menghai Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit having test circuitry for memory sub-systems
- Patent number 12,181,522
- Issue date Dec 31, 2024
- NXP USA, INC.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, arrangement, and computer program product for organizing th...
- Patent number 12,182,612
- Issue date Dec 31, 2024
- Minima Processor Oy
- Lauri Koskinen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent riser testing device and methods
- Patent number 12,181,992
- Issue date Dec 31, 2024
- SANBlaze Technology, Inc.
- B. Vincent Asbridge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
At-speed test access port operations
- Patent number 12,181,521
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data correction and phase optimization in high-speed receivers
- Patent number 12,181,523
- Issue date Dec 31, 2024
- Diodes Incorporated
- Yu-Wei Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scan Data Transfer Circuits for Multi-die Chip Testing
- Publication number 20250093416
- Publication date Mar 20, 2025
- Apple Inc.
- Bo Yang
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20250095763
- Publication date Mar 20, 2025
- KIOXIA Corporation
- Michiru HOGYOKU
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR FACILIATATING A DYNAMIC CLOCK FREQUENCY...
- Publication number 20250085344
- Publication date Mar 13, 2025
- NXP B.V.
- CHANDAN GUPTA
- G01 - MEASURING TESTING
Information Patent Application
DATA CORRECTION AND PHASE OPTIMIZATION IN HIGH-SPEED RECEIVERS
- Publication number 20250085345
- Publication date Mar 13, 2025
- DIODES INCORPORATED
- Yu-Wei Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WAVEFORM-AWARE MIXED SIGNAL MEASUREMENT SYSTEM FOR BUS TRAFFIC REDU...
- Publication number 20250086138
- Publication date Mar 13, 2025
- QUALCOMM Incorporated
- Mustafa KESKIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL TESTING DEVICE
- Publication number 20250085342
- Publication date Mar 13, 2025
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Chih-Jen CHIN
- G01 - MEASURING TESTING
Information Patent Application
Diagnosing Identical Circuit Blocks in Data Streaming Environment
- Publication number 20250076376
- Publication date Mar 6, 2025
- Siemens Industry Software Inc.
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS
- Publication number 20250067801
- Publication date Feb 27, 2025
- Skyworks Solutions, Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONDUCTIVE INTEGRATED CIRCUIT DEVICES WITH ON-CHIP TESTING
- Publication number 20250067802
- Publication date Feb 27, 2025
- Synopsys, Inc.
- Abdelrahman G. QOUTB
- G01 - MEASURING TESTING
Information Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20250060410
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHANG HSIEN YANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR VOLTAGE DROOP DETECTION IN DIE ARCHITECTURES
- Publication number 20250052812
- Publication date Feb 13, 2025
- QUALCOMM Incorporated
- Amit ANEJA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...
- Publication number 20250052809
- Publication date Feb 13, 2025
- Intel Corporation
- Fei Su
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF
- Publication number 20250044353
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
SMART GRID INTERFACE RELAY AND BREAKER
- Publication number 20250038520
- Publication date Jan 30, 2025
- Lunar Energy, Inc.
- Mark Holveck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
- Publication number 20250028620
- Publication date Jan 23, 2025
- NVIDIA Corporation
- Shantanu SARANGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST-TIME OPTIMIZATION WITH FEW SLOW SCAN PADS
- Publication number 20250027994
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Sandeep JAIN
- G01 - MEASURING TESTING
Information Patent Application
CLOCK GATING CIRCUITS AND METHODS FOR DUAL-EDGE-TRIGGERED APPLICATIONS
- Publication number 20250027995
- Publication date Jan 23, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Arnab Khawas
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
FULLY DIGITAL DOMAIN INTEGRATED FREQUENCY MONITOR
- Publication number 20250012857
- Publication date Jan 9, 2025
- NVIDIA Corporation
- Ofek Abadi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...
- Publication number 20240426899
- Publication date Dec 26, 2024
- Rohm Co., Ltd.
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL INTEGRITY MONITORING SYSTEM
- Publication number 20240410943
- Publication date Dec 12, 2024
- Synopsys, Inc.
- Firooz MASSOUDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRONIC DEVICE FOR IMPROVING A PERFORMANCE OF A SIGNAL CHAIN
- Publication number 20240410942
- Publication date Dec 12, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
- Publication number 20240402247
- Publication date Dec 5, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE INCLUDING A PLURALITY OF PADS AND METHOD OF DETECTING...
- Publication number 20240402248
- Publication date Dec 5, 2024
- Samsung Electronics Co., Ltd.
- Dojong CHUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETECTING FAULTS IN INTEGRATED CIRCUITS
- Publication number 20240393391
- Publication date Nov 28, 2024
- NXP B.V.
- Jorge Ernesto Perez Chamorro
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
- Publication number 20240385243
- Publication date Nov 21, 2024
- IMEC vzw
- Wim BOGAERTS
- G01 - MEASURING TESTING
Information Patent Application
CLUSTERING CLOCK CHAIN DATA FOR TEST-TIME REDUCTION
- Publication number 20240385241
- Publication date Nov 21, 2024
- STMicroelectronics International N.V.
- Sandeep JAIN
- G01 - MEASURING TESTING

Optimisation aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Clock recovery unit adjustment

Mechanism capable of performing on-chip test and verification

Processing system, related integrated circuit, device and method

Device and method for measuring a duty cycle of a clock signal

Semiconductor device, debug system, and debug method

Method and apparatus for detecting defective logic devices

Method and apparatus for capture clock control to minimize toggling...

Testing method and testing system

Methods for determining and calibrating non-linearity in a Phase In...

Method and circuit for performing error detection on a clock gated...

Fault tolerant synchronizer

Photonic wafer level testing systems, devices, and methods of opera...

On-die aging measurements for dynamic timing modeling

Clock shaper circuit for transition fault testing

Circuit and method to measure simulation to silicon timing correlation

Clock gating for power reduction during testing

Device access port selection

Test element group and test method

Test-time optimization with few slow scan pads

Methods and apparatus for testing inaccessible interface circuits i...

Signal test

Oscillation period detection circuit and method, and semiconductor...

Test method for delay circuit and test circuitry

Test access port with address and command capability

Frequency-detecting circuit, duty-cycle corrector, and electronic d...

Integrated circuit having test circuitry for memory sub-systems

Method, arrangement, and computer program product for organizing th...

Intelligent riser testing device and methods

At-speed test access port operations

Data correction and phase optimization in high-speed receivers

Patents Applicationslast 30 patents

Scan Data Transfer Circuits for Multi-die Chip Testing

TEST APPARATUS AND TEST METHOD

APPARATUSES AND METHODS FOR FACILIATATING A DYNAMIC CLOCK FREQUENCY...

DATA CORRECTION AND PHASE OPTIMIZATION IN HIGH-SPEED RECEIVERS

WAVEFORM-AWARE MIXED SIGNAL MEASUREMENT SYSTEM FOR BUS TRAFFIC REDU...

FUNCTIONAL TESTING DEVICE

Diagnosing Identical Circuit Blocks in Data Streaming Environment

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS

SUPERCONDUCTIVE INTEGRATED CIRCUIT DEVICES WITH ON-CHIP TESTING

DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

APPARATUS AND METHODS FOR VOLTAGE DROOP DETECTION IN DIE ARCHITECTURES

DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...

SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF

SMART GRID INTERFACE RELAY AND BREAKER

IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS

TEST-TIME OPTIMIZATION WITH FEW SLOW SCAN PADS

CLOCK GATING CIRCUITS AND METHODS FOR DUAL-EDGE-TRIGGERED APPLICATIONS

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

FULLY DIGITAL DOMAIN INTEGRATED FREQUENCY MONITOR

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...

GENERATING A TEST PROGRAM

SIGNAL INTEGRITY MONITORING SYSTEM

ELECTRONIC DEVICE FOR IMPROVING A PERFORMANCE OF A SIGNAL CHAIN

SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT

MEMORY DEVICE INCLUDING A PLURALITY OF PADS AND METHOD OF DETECTING...

SYSTEM AND METHOD FOR DETECTING FAULTS IN INTEGRATED CIRCUITS

PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR

CLUSTERING CLOCK CHAIN DATA FOR TEST-TIME REDUCTION