Optimisation aspects

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CPC
G01R31/3172

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/3172Optimisation aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Self-functional detection system for tap controller and method thereof
- Patent number 12,366,606
- Issue date Jul 22, 2025
- SQ Technology (Shanghai) Corporation
- Xue-Shan Han
- G01 - MEASURING TESTING
Information Patent Grant
Scan circuit and method
- Patent number 12,360,161
- Issue date Jul 15, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Functional circuit block harvesting in computer systems
- Patent number 12,361,191
- Issue date Jul 15, 2025
- Apple Inc.
- Peter A. Lisherness
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and an electronic device including integrated ci...
- Patent number 12,352,813
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interposer circuit
- Patent number 12,352,814
- Issue date Jul 8, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical wafer-scale photodiode bandwidth measurement system
- Patent number 12,353,007
- Issue date Jul 8, 2025
- Cisco Technology, Inc.
- Attila Mekis
- G01 - MEASURING TESTING
Information Patent Grant
Determination device, test system, and generation device
- Patent number 12,345,765
- Issue date Jul 1, 2025
- Kioxia Corporation
- Mikio Shiraishi
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 12,345,762
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for automatic fault detection in an electronic de...
- Patent number 12,332,304
- Issue date Jun 17, 2025
- Cadence Design Systems, Inc.
- Sushobhit Singh
- G01 - MEASURING TESTING
Information Patent Grant
Built-in testing in modular system-on-chip device
- Patent number 12,332,310
- Issue date Jun 17, 2025
- MARVELL ASIA PTE. LTD.
- Xiongzhi Ning
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter for ultra-high speed and storage device including the same
- Patent number 12,332,307
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Ikjin Jo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for implementing a scalable digital infrastruc...
- Patent number 12,332,306
- Issue date Jun 17, 2025
- TOKYO ELECTRON U.S. HOLDINGS, INC.
- Richard Wunderlich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,332,305
- Issue date Jun 17, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test device for testing on-chip clock controller having debug function
- Patent number 12,320,847
- Issue date Jun 3, 2025
- Realtek Semiconductor Corporation
- Sheng-Ping Yung
- G01 - MEASURING TESTING
Information Patent Grant
Superconductive integrated circuit devices with on-chip testing
- Patent number 12,320,848
- Issue date Jun 3, 2025
- Synopsys, Inc.
- Abdelrahman G. Qoutb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device and method for performing clock gating in electro...
- Patent number 12,320,846
- Issue date Jun 3, 2025
- Realtek Semiconductor Corp.
- Ching-Feng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Operating voltage adjustment for aging circuits
- Patent number 12,314,106
- Issue date May 27, 2025
- Advanced Micro Devices, Inc.
- Sriram Sambamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip current sensor
- Patent number 12,306,245
- Issue date May 20, 2025
- Texas Instruments Incorporated
- Guha Lakshmanan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 12,306,041
- Issue date May 20, 2025
- INNOLUX CORPORATION
- Kazuyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit in chip and circuit test method
- Patent number 12,306,244
- Issue date May 20, 2025
- Huawei Technologies Co., Ltd.
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive voltage scaling using temperature and performance sensors
- Patent number 12,301,229
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Jose Luis Flores
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-frequency oscillator monitoring circuit
- Patent number 12,298,345
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Brett Forejt
- G01 - MEASURING TESTING
Information Patent Grant
Yield improvements for three-dimensionally stacked neural network a...
- Patent number 12,292,473
- Issue date May 6, 2025
- Google LLC
- Andreas Georg Nowatzyk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for generating a signal test specification, data processing...
- Patent number 12,287,368
- Issue date Apr 29, 2025
- Rohde & Schwarz GmbH & Co. KG
- Markus Herdin
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and testing method
- Patent number 12,276,698
- Issue date Apr 15, 2025
- ASMedia Technology Inc.
- Te-Ming Kung
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit and detection method
- Patent number 12,270,856
- Issue date Apr 8, 2025
- Realtek Semiconductor Corporation
- Chun-Yi Kuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal integrity monitoring system
- Patent number 12,270,857
- Issue date Apr 8, 2025
- Synopsys, Inc.
- Firooz Massoudi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory profiler for emulation
- Patent number 12,265,122
- Issue date Apr 1, 2025
- Synopsys, Inc.
- Prashant Kumar Mishra
- G01 - MEASURING TESTING
Information Patent Grant
Clock recovery unit adjustment
- Patent number 12,255,979
- Issue date Mar 18, 2025
- Keysight Technologies, Inc.
- Marlin E. Viss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mechanism capable of performing on-chip test and verification
- Patent number 12,253,564
- Issue date Mar 18, 2025
- Silicon Motion, Inc.
- Tse-Yen Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TIME-ALIGNED RF ANALYSIS FROM GEOGRAPHICALLY DISTRIBUTED RECEIVERS
- Publication number 20250237699
- Publication date Jul 24, 2025
- Tektronix, Inc.
- Alejandro C. Buritica
- G01 - MEASURING TESTING
Information Patent Application
Latchup Detector and Clock Loss Detector
- Publication number 20250231234
- Publication date Jul 17, 2025
- Omni Design Technologies, Inc.
- Manar Ibrahim El-Chammas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION
- Publication number 20250224447
- Publication date Jul 10, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHECKING AT LEAST ONE FIRST CLOCK GENERATOR OF A FIRST F...
- Publication number 20250224448
- Publication date Jul 10, 2025
- Endress+Hauser SE+Co. KG
- Alexander Vogel
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT FOR TESTING ELECTRICAL DEVICES AND DEVICE UNDER TEST
- Publication number 20250216455
- Publication date Jul 3, 2025
- WINBOND ELECTRONICS CORP.
- Lih-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
Functional Circuit Block Harvesting in Integrated Circuits
- Publication number 20250217565
- Publication date Jul 3, 2025
- Apple Inc.
- Peter A. Lisherness
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE TESTING SYSTEM AND DEVICE TESTING METHOD
- Publication number 20250216452
- Publication date Jul 3, 2025
- GETAC TECHNOLOGY CORPORATION
- CHIEN-CHIH HU
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE PERFORMING TEST OPERATION ON LATCH CIRCUIT, OPERATING M...
- Publication number 20250216457
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Sangin PARK
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE MULTILAYERED OVERRIDE SYSTEM AND METHOD FOR CIRCUMVENT...
- Publication number 20250216454
- Publication date Jul 3, 2025
- NXP B.V.
- Neha Srivastava
- G01 - MEASURING TESTING
Information Patent Application
SCAN FLIP-FLOP
- Publication number 20250199070
- Publication date Jun 19, 2025
- NXP B.V.
- Pramod Gayakwad
- G01 - MEASURING TESTING
Information Patent Application
ARCHITECTURE FOR TESTING MULTIPLE SCAN CHAINS
- Publication number 20250199069
- Publication date Jun 19, 2025
- STMicroelectronics International N.V.
- Enea Dimroci
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING DIES WITH OFF-DIE CLOCKS
- Publication number 20250201637
- Publication date Jun 19, 2025
- ADVANCED MICRO DEVICES, INC.
- Russell Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ERROR DETECTION SYSTEM APPLICABLE TO RTL MODULE AND OPERATION METHO...
- Publication number 20250189578
- Publication date Jun 12, 2025
- TELECHIPS INC.
- Yeongbeen KIM
- G01 - MEASURING TESTING
Information Patent Application
SELF-FUNCTIONAL DETECTION SYSTEM FOR TAP CONTROLLER AND METHOD THEREOF
- Publication number 20250189582
- Publication date Jun 12, 2025
- SQ Technology ( Shanghai ) Corporation
- Xue-Shan Han
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR FACTORY TESTING OF INTEGRATED CIRCUITS USING...
- Publication number 20250189579
- Publication date Jun 12, 2025
- HIMAX TECHNOLOGIES LIMITED
- Yaw-Guang Chang
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Subsets of...
- Publication number 20250180643
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring a Duty Cycle of a Clock Signal
- Publication number 20250180644
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Eric SOENEN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER
- Publication number 20250180645
- Publication date Jun 5, 2025
- QUALCOMM Incorporated
- Jais ABRAHAM
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Delayed Me...
- Publication number 20250180642
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
- Publication number 20250174293
- Publication date May 29, 2025
- Samsung Electronics Co., Ltd.
- Jinuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS
- Publication number 20250173233
- Publication date May 29, 2025
- DELL PRODUCTS, L.P.
- Ibrahim Sayyed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AND CHIP TESTING METHOD
- Publication number 20250155501
- Publication date May 15, 2025
- REALTEK SEMICONDUCTOR CORPORATION
- Chang-Hsien Tai
- G01 - MEASURING TESTING
Information Patent Application
DEVICE ACCESS PORT SELECTION
- Publication number 20250155502
- Publication date May 15, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT
- Publication number 20250155503
- Publication date May 15, 2025
- GLOBAL UNICHIP CORPORATION
- Yu-Lun Wan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR JITTER MEASUREMENT
- Publication number 20250155499
- Publication date May 15, 2025
- Analog Devices International Unlimited Company
- Seamus Anthony RYAN
- G01 - MEASURING TESTING
Information Patent Application
Supply Chain Security for Chiplets
- Publication number 20250155500
- Publication date May 15, 2025
- ADVANCED MICRO DEVICES, INC.
- Robert Landon Pelt
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND MEMORY MODULE UNDER TEST
- Publication number 20250157557
- Publication date May 15, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung PENG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20250147102
- Publication date May 8, 2025
- INFINEON TECHNOLOGIES AG
- Wei Wang
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING METHOD AND APPARATUS
- Publication number 20250147101
- Publication date May 8, 2025
- XIAMEN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE CO., LTD.
- Yonghong HUANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING A CLOCK SIGNAL
- Publication number 20250138577
- Publication date May 1, 2025
- ARM Limited
- Amit Chhabra
- G06 - COMPUTING CALCULATING COUNTING

Optimisation aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-functional detection system for tap controller and method thereof

Scan circuit and method

Functional circuit block harvesting in computer systems

Integrated circuit and an electronic device including integrated ci...

Interposer circuit

Optical wafer-scale photodiode bandwidth measurement system

Determination device, test system, and generation device

Built-in self-test circuit and temperature measurement circuit incl...

System and method for automatic fault detection in an electronic de...

Built-in testing in modular system-on-chip device

Transmitter for ultra-high speed and storage device including the same

Apparatus and method for implementing a scalable digital infrastruc...

Circuit and method to measure simulation to silicon timing correlation

Test device for testing on-chip clock controller having debug function

Superconductive integrated circuit devices with on-chip testing

Electronic device and method for performing clock gating in electro...

Operating voltage adjustment for aging circuits

On-chip current sensor

Electronic device

Test circuit in chip and circuit test method

Adaptive voltage scaling using temperature and performance sensors

Low-frequency oscillator monitoring circuit

Yield improvements for three-dimensionally stacked neural network a...

Method for generating a signal test specification, data processing...

Testing system and testing method

Detection circuit and detection method

Signal integrity monitoring system

Memory profiler for emulation

Clock recovery unit adjustment

Mechanism capable of performing on-chip test and verification

Patents Applicationslast 30 patents

TIME-ALIGNED RF ANALYSIS FROM GEOGRAPHICALLY DISTRIBUTED RECEIVERS

Latchup Detector and Clock Loss Detector

DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION

METHOD FOR CHECKING AT LEAST ONE FIRST CLOCK GENERATOR OF A FIRST F...

TESTING CIRCUIT FOR TESTING ELECTRICAL DEVICES AND DEVICE UNDER TEST

Functional Circuit Block Harvesting in Integrated Circuits

DEVICE TESTING SYSTEM AND DEVICE TESTING METHOD

TEST DEVICE PERFORMING TEST OPERATION ON LATCH CIRCUIT, OPERATING M...

CONFIGURABLE MULTILAYERED OVERRIDE SYSTEM AND METHOD FOR CIRCUMVENT...

SCAN FLIP-FLOP

ARCHITECTURE FOR TESTING MULTIPLE SCAN CHAINS

DEVICES AND METHODS FOR TESTING DIES WITH OFF-DIE CLOCKS

ERROR DETECTION SYSTEM APPLICABLE TO RTL MODULE AND OPERATION METHO...

SELF-FUNCTIONAL DETECTION SYSTEM FOR TAP CONTROLLER AND METHOD THEREOF

METHOD AND MACHINE FOR FACTORY TESTING OF INTEGRATED CIRCUITS USING...

Apparatus and Method for Clock Frequency Estimation With Subsets of...

Device and Method for Measuring a Duty Cycle of a Clock Signal

MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER

Apparatus and Method for Clock Frequency Estimation With Delayed Me...

CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...

ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS

CHIP AND CHIP TESTING METHOD

DEVICE ACCESS PORT SELECTION

TESTING CIRCUIT

APPARATUSES AND METHODS FOR JITTER MEASUREMENT

Supply Chain Security for Chiplets

TESTING METHOD AND MEMORY MODULE UNDER TEST

ELECTRONIC DEVICE

CHIP TESTING METHOD AND APPARATUS

METHOD OF MONITORING A CLOCK SIGNAL