Other arc discharge ion sources using an applied magnetic field

Industry

CPC
H01J49/126

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/126Other arc discharge ion sources using an applied magnetic field

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 11,742,194
- Issue date Aug 29, 2023
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,430,647
- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 11,049,707
- Issue date Jun 29, 2021
- IonSense, Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,910,208
- Issue date Feb 2, 2021
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 10,643,833
- Issue date May 5, 2020
- IonSense, Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,636,644
- Issue date Apr 28, 2020
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 10,134,575
- Issue date Nov 20, 2018
- IonSense, Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation system having beam angle control in drift and dece...
- Patent number 10,037,877
- Issue date Jul 31, 2018
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 9,960,029
- Issue date May 1, 2018
- IonSense, Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 9,514,923
- Issue date Dec 6, 2016
- Ionsense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 8,963,101
- Issue date Feb 24, 2015
- IonSense, Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 8,822,949
- Issue date Sep 2, 2014
- Ionsense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for quadrupole mass spectrometer
- Patent number 5,153,432
- Issue date Oct 6, 1992
- Gerard Devant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode ion source
- Patent number 4,303,865
- Issue date Dec 1, 1981
- Commonwealth Scientific and Industrial Research Organization
- Donald L. Swingler
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Sputtered particle flow source for isotopically selective ionization
- Patent number 3,955,090
- Issue date May 4, 1976
- Exxon Nuclear Company, Inc.
- Eugene R. Astley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3885155
- Patent number 3,885,155
- Issue date May 20, 1975
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3723730
- Patent number 3,723,730
- Issue date Mar 27, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3610923
- Patent number 3,610,923
- Issue date Oct 5, 1971
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
3432709
- Patent number 3,432,709
- Issue date Mar 11, 1969
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3406283
- Patent number 3,406,283
- Issue date Oct 15, 1968
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3382359
- Patent number 3,382,359
- Issue date May 7, 1968
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3313935
- Patent number 3,313,935
- Issue date Apr 11, 1967
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3287589
- Patent number 3,287,589
- Issue date Nov 22, 1966
- G01 - MEASURING TESTING
Information Patent Grant
3272983
- Patent number 3,272,983
- Issue date Sep 13, 1966
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3260844
- Patent number 3,260,844
- Issue date Jul 12, 1966
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3115575
- Patent number 3,115,575
- Issue date Dec 24, 1963
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2926251
- Patent number 2,926,251
- Issue date Feb 23, 1960
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2903586
- Patent number 2,903,586
- Issue date Sep 8, 1959
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20210327699
- Publication date Oct 21, 2021
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20210305037
- Publication date Sep 30, 2021
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20200303175
- Publication date Sep 24, 2020
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20200258733
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20190080894
- Publication date Mar 14, 2019
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20180226240
- Publication date Aug 9, 2018
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20140346348
- Publication date Nov 27, 2014
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20130280812
- Publication date Oct 24, 2013
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20120199735
- Publication date Aug 9, 2012
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING

Other arc discharge ion sources using an applied magnetic field

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and approaches for semiconductor metrology and surface anal...

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for thermal assisted desorption ionization sys...

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for thermal assisted desorption ionization sys...

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for thermal assisted desorption ionization sys...

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for thermal assisted desorption ionization sys...

Ion implantation system having beam angle control in drift and dece...

Apparatus and method for thermal assisted desorption ionization sys...

Apparatus and method for thermal assisted desorption ionization sys...

Apparatus and method for thermal assisted desorption ionization sys...

Apparatus and method for thermal assisted desorption ionization sys...

Ion source for quadrupole mass spectrometer

Cold cathode ion source

Sputtered particle flow source for isotopically selective ionization

3885155

3723730

3610923

3432709

3406283

3382359

3313935

3287589

3272983

3260844

3115575

2926251

2903586

Patents Applicationslast 30 patents

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...