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Industry

  • CPC
  • G01N2223/622
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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/622paper
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Patents Grantslast 30 patents

  • Information Patent Grant

    Procedure for determining coating rates
    • Patent number 4,458,360
    • Issue date Jul 3, 1984
    • Enso-Gutzeit Oy
    • Heikki Venalainen
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3106641
    • Patent number 3,106,641
    • Issue date Oct 8, 1963
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents