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CPC
G01N2223/622
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/622
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Patents Grants
last 30 patents
Information
Patent Grant
Procedure for determining coating rates
Patent number
4,458,360
Issue date
Jul 3, 1984
Enso-Gutzeit Oy
Heikki Venalainen
G01 - MEASURING TESTING
Information
Patent Grant
3106641
Patent number
3,106,641
Issue date
Oct 8, 1963
G01 - MEASURING TESTING