Particular leg structure or construction or shape; Nanotubes

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

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G01J5/023Particular leg structure or construction or shape; Nanotubes

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Patents Grantslast 30 patents

Information Patent Grant
Bolometer and method for manufacturing same
- Patent number 12,055,440
- Issue date Aug 6, 2024
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,955,504
- Issue date Apr 9, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,824,078
- Issue date Nov 21, 2023
- TELEDYNE FLIR, LLC
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for detecting energy beam
- Patent number 11,709,098
- Issue date Jul 25, 2023
- Tsinghua University
- Ke Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Silicon nitride-carbon nanotube-graphene nanocomposite microbolomet...
- Patent number 11,609,122
- Issue date Mar 21, 2023
- Magnolia Optical Technologies, Inc.
- Ashok K. Sood
- G01 - MEASURING TESTING
Information Patent Grant
Cavity blackbody radiation source and method of making the same
- Patent number 11,460,345
- Issue date Oct 4, 2022
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Cavity blackbody radiation source
- Patent number 11,454,547
- Issue date Sep 27, 2022
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Phononically-enhanced imager (PEI) pixel
- Patent number 11,381,761
- Issue date Jul 5, 2022
- William N. Carr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SMD-enabled infrared thermopile sensor
- Patent number 11,268,861
- Issue date Mar 8, 2022
- Heimann Sensor GmbH
- Jörg Schieferdecker
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a temperature without contact, and infrared...
- Patent number 11,215,509
- Issue date Jan 4, 2022
- Robert Bosch GmbH
- Michael Frank
- G01 - MEASURING TESTING
Information Patent Grant
Microbolometer detectors and arrays for printed photonics applications
- Patent number 11,187,590
- Issue date Nov 30, 2021
- Institut National D'Optique
- Hassane Oulachgar
- G01 - MEASURING TESTING
Information Patent Grant
Method for making blackbody radiation source
- Patent number 11,181,425
- Issue date Nov 23, 2021
- Tsinghua University
- Guang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Terahertz wave detection device and terahertz wave detection system
- Patent number 11,118,977
- Issue date Sep 14, 2021
- Tokyo Institute of Technology
- Yukio Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Passive detectors for imaging systems
- Patent number 11,105,685
- Issue date Aug 31, 2021
- Digital Direct IR, Inc.
- Peter N. Kaufman
- G01 - MEASURING TESTING
Information Patent Grant
Graphene nanomechanical radiation detector
- Patent number 11,099,076
- Issue date Aug 24, 2021
- University of Oregon
- Benjamin J. Alemán
- G01 - MEASURING TESTING
Information Patent Grant
High speed graphene oxide bolometers and methods for manufacturing...
- Patent number 11,085,830
- Issue date Aug 10, 2021
- The Government of the United States of America, as represented by the Secreta...
- Edward Aifer
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-Perot interference filter and light-detecting device
- Patent number 11,054,560
- Issue date Jul 6, 2021
- Hamamatsu Photonics K.K.
- Toshimitsu Kawai
- G02 - OPTICS
Information Patent Grant
Optical filter array
- Patent number 11,049,893
- Issue date Jun 29, 2021
- VIAVI Solutions Inc.
- Georg J. Ockenfuss
- G01 - MEASURING TESTING
Information Patent Grant
Vertical microbolometer contact systems and methods
- Patent number 11,031,432
- Issue date Jun 8, 2021
- FLIR Systems, Inc.
- James L. Dale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Epitaxial graphene quantum dots for high-performance terahertz bolo...
- Patent number 11,029,213
- Issue date Jun 8, 2021
- Georgetown University
- Abdel El Fatimy
- G01 - MEASURING TESTING
Information Patent Grant
Blackbody radiation source
- Patent number 11,002,608
- Issue date May 11, 2021
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Opto-electronic modules and methods of manufacturing the same and a...
- Patent number 11,005,001
- Issue date May 11, 2021
- ams Sensors Singapore Pte. Ltd.
- Hartmut Rudmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Recessed carbon nanotube article and method for making same
- Patent number 10,989,602
- Issue date Apr 27, 2021
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Christopher S. Yung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Patterned focal plane arrays of carbon nanotube thin film bolometer...
- Patent number 10,908,025
- Issue date Feb 2, 2021
- Carbon Solutions, Inc.
- Elena Borisova Bekyarova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector and method for manufacturing a radiation detector
- Patent number 10,900,841
- Issue date Jan 26, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Dirk Weiler
- G01 - MEASURING TESTING
Information Patent Grant
Method for making blackbody radiation source
- Patent number 10,883,882
- Issue date Jan 5, 2021
- Tsinghua University
- Guang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal infrared detector and manufacturing method thereof
- Patent number 10,852,193
- Issue date Dec 1, 2020
- Mitsubishi Electric Corporation
- Takaki Sugino
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for hybrid superconducting medium comprising fi...
- Patent number 10,847,706
- Issue date Nov 24, 2020
- Massachusetts Institute of Technology
- Yachin Ivry
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,645
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,646
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20240339482
- Publication date Oct 10, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTOMECHANICALLY CALIBRATED PHOTONIC THERMOMETER AND CALIBRATING A...
- Publication number 20240328863
- Publication date Oct 3, 2024
- Government of the United States of America, as Represented by the Secretary o...
- Daniel Schaeder Barker
- G01 - MEASURING TESTING
Information Patent Application
IR SENSOR WITH NANO-STRUCTUR
- Publication number 20240230412
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Jangwoo YOU
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE SENSOR
- Publication number 20240159591
- Publication date May 16, 2024
- TDK Corporation
- Maiko KOKUBO
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20240162272
- Publication date May 16, 2024
- Teledyne FLIR, LLC
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230384163
- Publication date Nov 30, 2023
- NEC Corporation
- Mayumi KOSAKA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230160750
- Publication date May 25, 2023
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ ELECTROMAGNETIC RADIATION DETECTOR
- Publication number 20230070738
- Publication date Mar 9, 2023
- Oxford University Innovation Limited
- Michael Benjamin JOHNSTON
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING ENERGY BEAM
- Publication number 20220404205
- Publication date Dec 22, 2022
- TSINGHUA UNIVERSITY
- Ke ZHANG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Thermal detector
- Publication number 20220344561
- Publication date Oct 27, 2022
- Teknologian Tutkimuskeskus VTT Oy
- Aapo Varpula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHONONICALLY-ENHANCED IMAGER (PEI) PIXEL
- Publication number 20220174228
- Publication date Jun 2, 2022
- William N. Carr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSIVE DETECTORS FOR IMAGING SYSTEMS
- Publication number 20220146324
- Publication date May 12, 2022
- DIGITAL DIRECT IR, INC.
- Peter N. KAUFMAN
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20220034720
- Publication date Feb 3, 2022
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20210404878
- Publication date Dec 30, 2021
- FLIR Commercial Systems, Inc.
- Eric A. Kurth
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20210404881
- Publication date Dec 30, 2021
- FLIR Commercial Systems, Inc.
- Eric A. Kurth
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR MANUFACTURING A DEVICE FOR DETECTING ELECTROMAGNETIC RA...
- Publication number 20210347636
- Publication date Nov 11, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Sébastien BECKER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL DETECTION APPARATUS AND METHOD
- Publication number 20210328126
- Publication date Oct 21, 2021
- Nokia Technologies Oy
- David BITAULD
- B82 - NANO-TECHNOLOGY
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20210293627
- Publication date Sep 23, 2021
- FLIR SYSTEMS, INC.
- Eric A. Kurth
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER ARRAY
- Publication number 20210111209
- Publication date Apr 15, 2021
- VIAVI Solutions Inc.
- Georg J. OCKENFUSS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING BLACKBODY RADIATION SOURCE
- Publication number 20210063245
- Publication date Mar 4, 2021
- TSINGHUA UNIVERSITY
- Guang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Epitaxial Graphene Quantum Dots for High-Performance Terahertz Bolo...
- Publication number 20200309602
- Publication date Oct 1, 2020
- GEORGETOWN UNIVERSITY
- Abdel El Fatimy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROBOLOMETER DETECTORS AND ARRAYS FOR PRINTED PHOTONICS APPLICATIONS
- Publication number 20200149973
- Publication date May 14, 2020
- Institut National D'Optique
- Hassane OULACHGAR
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE DETECTION DEVICE AND TERAHERTZ WAVE DETECTION SYSTEM
- Publication number 20200141806
- Publication date May 7, 2020
- TOKYO INSTITUTE OF TECHNOLOGY
- Yukio KAWANO
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE DETECTORS FOR IMAGING SYSTEMS
- Publication number 20200096392
- Publication date Mar 26, 2020
- DIGITAL DIRECT IR, INC.
- Peter N. KAUFMAN
- G01 - MEASURING TESTING
Information Patent Application
RECESSED CARBON NANOTUBE ARTICLE AND METHOD FOR MAKING SAME
- Publication number 20200003622
- Publication date Jan 2, 2020
- Government of the United States of America, as Represented by the Secretary o...
- Christopher S. Yung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
THERMOELECTRIC DEVICE
- Publication number 20190326499
- Publication date Oct 24, 2019
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Olivier BOURGEOIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SMD-enabled infrared thermopile sensor
- Publication number 20190316967
- Publication date Oct 17, 2019
- HEIMANN Sensor GmbH
- Jörg SCHIEFERDECKER
- G01 - MEASURING TESTING
Information Patent Application
Graphene nanomechanical radiation detector
- Publication number 20190277702
- Publication date Sep 12, 2019
- Benjamin J. Alemán
- G01 - MEASURING TESTING
Information Patent Application
MULTISPECTRAL PLASMONIC THERMAL IMAGING DEVICE
- Publication number 20190234801
- Publication date Aug 1, 2019
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Application
MULTISPECTRAL PLASMONIC THERMAL IMAGING DEVICE
- Publication number 20190234800
- Publication date Aug 1, 2019
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING

Particular leg structure or construction or shape; Nanotubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bolometer and method for manufacturing same

Microbolometer systems and methods

Microbolometer systems and methods

Device and method for detecting energy beam

Silicon nitride-carbon nanotube-graphene nanocomposite microbolomet...

Cavity blackbody radiation source and method of making the same

Cavity blackbody radiation source

Phononically-enhanced imager (PEI) pixel

SMD-enabled infrared thermopile sensor

Method for determining a temperature without contact, and infrared...

Microbolometer detectors and arrays for printed photonics applications

Method for making blackbody radiation source

Terahertz wave detection device and terahertz wave detection system

Passive detectors for imaging systems

Graphene nanomechanical radiation detector

High speed graphene oxide bolometers and methods for manufacturing...

Fabry-Perot interference filter and light-detecting device

Optical filter array

Vertical microbolometer contact systems and methods

Epitaxial graphene quantum dots for high-performance terahertz bolo...

Blackbody radiation source

Opto-electronic modules and methods of manufacturing the same and a...

Recessed carbon nanotube article and method for making same

Patterned focal plane arrays of carbon nanotube thin film bolometer...

Radiation detector and method for manufacturing a radiation detector

Method for making blackbody radiation source

Thermal infrared detector and manufacturing method thereof

Systems and methods for hybrid superconducting medium comprising fi...

Multispectral plasmonic thermal imaging device

Multispectral plasmonic thermal imaging device

Patents Applicationslast 30 patents

MICROBOLOMETER SYSTEMS AND METHODS

OPTOMECHANICALLY CALIBRATED PHOTONIC THERMOMETER AND CALIBRATING A...

IR SENSOR WITH NANO-STRUCTUR

ELECTROMAGNETIC WAVE SENSOR

MICROBOLOMETER SYSTEMS AND METHODS

BOLOMETER AND METHOD FOR MANUFACTURING SAME

BOLOMETER AND METHOD FOR MANUFACTURING SAME

TERAHERTZ ELECTROMAGNETIC RADIATION DETECTOR

DEVICE AND METHOD FOR DETECTING ENERGY BEAM

Thermal detector

PHONONICALLY-ENHANCED IMAGER (PEI) PIXEL

PASSIVE DETECTORS FOR IMAGING SYSTEMS

BOLOMETER AND METHOD FOR MANUFACTURING SAME

MICROBOLOMETER SYSTEMS AND METHODS

MICROBOLOMETER SYSTEMS AND METHODS

PROCESS FOR MANUFACTURING A DEVICE FOR DETECTING ELECTROMAGNETIC RA...

OPTICAL DETECTION APPARATUS AND METHOD

MICROBOLOMETER SYSTEMS AND METHODS

OPTICAL FILTER ARRAY

METHOD FOR MAKING BLACKBODY RADIATION SOURCE

Epitaxial Graphene Quantum Dots for High-Performance Terahertz Bolo...

MICROBOLOMETER DETECTORS AND ARRAYS FOR PRINTED PHOTONICS APPLICATIONS

TERAHERTZ WAVE DETECTION DEVICE AND TERAHERTZ WAVE DETECTION SYSTEM

PASSIVE DETECTORS FOR IMAGING SYSTEMS

RECESSED CARBON NANOTUBE ARTICLE AND METHOD FOR MAKING SAME

THERMOELECTRIC DEVICE

SMD-enabled infrared thermopile sensor

Graphene nanomechanical radiation detector

MULTISPECTRAL PLASMONIC THERMAL IMAGING DEVICE

MULTISPECTRAL PLASMONIC THERMAL IMAGING DEVICE