Patterns showing highly reflecting parts

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CPC
G01N21/95684

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95684Patterns showing highly reflecting parts

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating coordinate position identification accuracy o...
- Patent number 12,188,880
- Issue date Jan 7, 2025
- Sumco Corporation
- Keiichiro Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing semiconductor products, semiconductor produ...
- Patent number 12,021,052
- Issue date Jun 25, 2024
- STMicroelectronics S.r.l.
- Fulvio Vittorio Fontana
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,971,367
- Issue date Apr 30, 2024
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement apparatus and three-dimensional measu...
- Patent number 11,930,600
- Issue date Mar 12, 2024
- CKD Corporation
- Takayuki Shinyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,892,493
- Issue date Feb 6, 2024
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection apparatus and specimen inspection method
- Patent number 11,781,981
- Issue date Oct 10, 2023
- ACTRO CO., LTD.
- Hak Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,733,180
- Issue date Aug 22, 2023
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,726,126
- Issue date Aug 15, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device that inspects application quality of ad...
- Patent number 11,452,250
- Issue date Sep 20, 2022
- CKD Corporation
- Ikuo Futamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing of curved X-ray gratings
- Patent number 11,421,984
- Issue date Aug 23, 2022
- Koninklijke Philips N.V.
- Andriy Yaroshenko
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Component mounting device
- Patent number 11,357,148
- Issue date Jun 7, 2022
- Yamaha Hatsudoki Kabushiki Kaisha
- Kazushi Takama
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High sensitivity image-based reflectometry
- Patent number 11,156,566
- Issue date Oct 26, 2021
- Applied Materials, Inc.
- Guoheng Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degraded feature identification apparatus, degraded feature identif...
- Patent number 11,157,752
- Issue date Oct 26, 2021
- Pioneer Corporation
- Tomoaki Iwai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting ball grid array-type semiconductor chip package
- Patent number 11,150,198
- Issue date Oct 19, 2021
- Korea Advanced Institute of Science and Technology
- Seungryong Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of a substrate using multiple cameras
- Patent number 11,113,803
- Issue date Sep 7, 2021
- Orbotech Ltd.
- Ofer Saphier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,105,839
- Issue date Aug 31, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Detection of contamination on steel parts using ultraviolet light
- Patent number 11,047,804
- Issue date Jun 29, 2021
- voestalpine Automotive Components Cartersville Inc.
- Wilhelm Weinmeister
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solder paste printing quality inspection system and method
- Patent number 11,029,260
- Issue date Jun 8, 2021
- HONGFUJIN PRECISION ELECTRONICS (CHENGDU) Co., Ltd.
- Zi-Qing Xia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspection device and illumination device
- Patent number 10,984,516
- Issue date Apr 20, 2021
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Soldering quality detection platform
- Patent number 10,955,363
- Issue date Mar 23, 2021
- Tyco Electronics (Shanghai) Co. Ltd.
- Lei Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 10,935,503
- Issue date Mar 2, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the positioning and optical inspection of an...
- Patent number 10,928,333
- Issue date Feb 23, 2021
- VIT
- Nicolas Guillot
- G01 - MEASURING TESTING
Information Patent Grant
Soldering material
- Patent number 10,888,957
- Issue date Jan 12, 2021
- Senju Metal Industry Co., Ltd.
- Hiroyoshi Kawasaki
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Pattern structure inspection device and inspection method
- Patent number 10,852,246
- Issue date Dec 1, 2020
- THE WAVE TALK, INC.
- Young Dug Kim
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system
- Patent number 10,839,538
- Issue date Nov 17, 2020
- Omron Corporation
- Yutaka Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting an object that includes a photo-sensitive polyimide layer
- Patent number 10,823,669
- Issue date Nov 3, 2020
- Camtek Ltd.
- Zehava Ben-Ezer
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection device, appearance inspection method and program
- Patent number 10,794,691
- Issue date Oct 6, 2020
- Omron Corporation
- Hiroyuki Hazeyama
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection system and inspection method
- Patent number 10,796,428
- Issue date Oct 6, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS
- Publication number 20240359269
- Publication date Oct 31, 2024
- Illinois Tool Works Inc.
- William Joshua Becker
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...
- Publication number 20240347495
- Publication date Oct 17, 2024
- STMicroelectronics S.r.l
- Fulvio Vittorio FONTANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nano and Microscale Patterned Surfaces for Centering a Droplet
- Publication number 20240192147
- Publication date Jun 13, 2024
- Thermo Electron Scientific Instruments LLC
- Margaret E. Robinson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20230393185
- Publication date Dec 7, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...
- Publication number 20230204519
- Publication date Jun 29, 2023
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY WITH INCOHERENT HOLOGRAPHY
- Publication number 20230104022
- Publication date Apr 6, 2023
- Celloptic, Inc.
- Gary BROOKER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING COORDINATE POSITION IDENTIFICATION ACCURACY O...
- Publication number 20220373478
- Publication date Nov 24, 2022
- SUMCO CORPORATION
- Keiichiro MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dark-Field Microscopy Imaging Apparatus
- Publication number 20220365000
- Publication date Nov 17, 2022
- Brookhaven Science Associates, LLC
- Mingzhao Liu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING HEALTH OF LOW-COST SENSORS USED IN...
- Publication number 20220349838
- Publication date Nov 3, 2022
- TATA CONSULTANCY SERVICES LIMITED
- PRACHIN LALIT JAIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20220099725
- Publication date Mar 31, 2022
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS AND THREE-DIMENSIONAL MEASU...
- Publication number 20220071073
- Publication date Mar 3, 2022
- CKD CORPORATION
- Takayuki Shinyama
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN INSPECTION APPARATUS AND SPECIMEN INSPECTION METHOD
- Publication number 20210389238
- Publication date Dec 16, 2021
- Industry-University Cooperation Foundation Hanyang University
- Hak Sung KIM
- G01 - MEASURING TESTING
Information Patent Application
HIGH SENSITIVITY IMAGE-BASED REFLECTOMETRY
- Publication number 20210302330
- Publication date Sep 30, 2021
- Applied Materials, Inc.
- Guoheng Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...
- Publication number 20210233884
- Publication date Jul 29, 2021
- STMicroelectronics S.r.l
- Fulvio Vittorio FONTANA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20210172884
- Publication date Jun 10, 2021
- Juki Corporation
- Yasuyuki NURIYA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF CONTAMINATION ON STEEL PARTS USING ULTRAVIOLET LIGHT
- Publication number 20210140896
- Publication date May 13, 2021
- Voestalpine Automotive Components Cartersville Inc.
- Wilhelm WEINMEISTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210048396
- Publication date Feb 18, 2021
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210018450
- Publication date Jan 21, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD
- Publication number 20200292471
- Publication date Sep 17, 2020
- HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
- ZI-QING XIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART DECISION FEEDBACK DEVICE AND METHOD FOR INSPECTING CIRCUIT BOARD
- Publication number 20200225279
- Publication date Jul 16, 2020
- HONGFUJIN PRECISION ELECTRONICS (TIANJIN) CO.,LTD.
- QIAO-ZHONG ZHAO
- G01 - MEASURING TESTING
Information Patent Application
DEGRADED FEATURE IDENTIFICATION APPARATUS, DEGRADED FEATURE IDENTIF...
- Publication number 20200080945
- Publication date Mar 12, 2020
- PIONEER CORPORATION
- Tomoaki IWAI
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
MULTI FUNCTION LIGHTING DEVICE
- Publication number 20200080705
- Publication date Mar 12, 2020
- VALEO NORTH AMERICA, INC.
- Charles Crespin
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...
- Publication number 20200057004
- Publication date Feb 20, 2020
- VIT
- Nicolas GUILLOT
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190362483
- Publication date Nov 28, 2019
- KOH YOUNG TECHNOLOGY INC.
- Seung Ae SEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE, SUBSTRATE INSPECTION METHOD AND METHOD...
- Publication number 20190364707
- Publication date Nov 28, 2019
- CKD CORPORATION
- Ikuo Futamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20190302033
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Tom Marivoet
- G01 - MEASURING TESTING

Patterns showing highly reflecting parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of calibrating coordinate position identification accuracy o...

System and method for monitoring health of low-cost sensors used in...

Cutter analysis and mapping

Method of manufacturing semiconductor products, semiconductor produ...

Inspection device and inspection method

Three-dimensional measurement apparatus and three-dimensional measu...

Apparatus, method and computer program product for defect detection...

Specimen inspection apparatus and specimen inspection method

Inspection device and inspection method

Apparatus, method and computer program product for defect detection...

Substrate inspection device that inspects application quality of ad...

Testing of curved X-ray gratings

Component mounting device

High sensitivity image-based reflectometry

Degraded feature identification apparatus, degraded feature identif...

Method for inspecting ball grid array-type semiconductor chip package

Inspection of a substrate using multiple cameras

Apparatus, method and computer program product for defect detection...

Detection of contamination on steel parts using ultraviolet light

Solder paste printing quality inspection system and method

Image inspection device and illumination device

Soldering quality detection platform

Apparatus, method and computer program product for defect detection...

System and method for the positioning and optical inspection of an...

Soldering material

Pattern structure inspection device and inspection method

Image processing system

Inspecting an object that includes a photo-sensitive polyimide layer

Appearance inspection device, appearance inspection method and program

Inspection system and inspection method

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

CUTTER ANALYSIS AND MAPPING

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION METHOD FOR ELECTRONIC DEVICES

LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS

METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...

Nano and Microscale Patterned Surfaces for Centering a Droplet

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...

OPTICAL METROLOGY WITH INCOHERENT HOLOGRAPHY

METHOD OF CALIBRATING COORDINATE POSITION IDENTIFICATION ACCURACY O...

Dark-Field Microscopy Imaging Apparatus

SYSTEM AND METHOD FOR MONITORING HEALTH OF LOW-COST SENSORS USED IN...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

THREE-DIMENSIONAL MEASUREMENT APPARATUS AND THREE-DIMENSIONAL MEASU...

SPECIMEN INSPECTION APPARATUS AND SPECIMEN INSPECTION METHOD

HIGH SENSITIVITY IMAGE-BASED REFLECTOMETRY

METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...

INSPECTION DEVICE AND INSPECTION METHOD

DETECTION OF CONTAMINATION ON STEEL PARTS USING ULTRAVIOLET LIGHT

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD

SMART DECISION FEEDBACK DEVICE AND METHOD FOR INSPECTING CIRCUIT BOARD

DEGRADED FEATURE IDENTIFICATION APPARATUS, DEGRADED FEATURE IDENTIF...

MULTI FUNCTION LIGHTING DEVICE

SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...

INSPECTION SYSTEM AND INSPECTION METHOD

SUBSTRATE INSPECTION DEVICE, SUBSTRATE INSPECTION METHOD AND METHOD...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...