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G01N2223/605

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analyzing diffraction pattern of mixture, and...
- Patent number 12,031,927
- Issue date Jul 9, 2024
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring total cross-sectional phase fractio...
- Patent number 11,808,719
- Issue date Nov 7, 2023
- SEA PIONEERS TECHNOLOGIES CO., LTD.
- Jige Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for determining the microstructure of a metal pro...
- Patent number 11,249,037
- Issue date Feb 15, 2022
- SMS group GMBH
- Mostafa Biglari
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 10,962,489
- Issue date Mar 30, 2021
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Method for displaying measurement results from x-ray diffraction me...
- Patent number 10,801,976
- Issue date Oct 13, 2020
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction analysis method and X-ray diffraction analysis ap...
- Patent number 10,712,294
- Issue date Jul 14, 2020
- Fujitsu Limited
- Shuuichi Doi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inducing high-speed variable-tilt wobble m...
- Patent number 10,634,626
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, surface analyzer, and image processing...
- Patent number 10,593,072
- Issue date Mar 17, 2020
- Jeol Ltd.
- Naoki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for materials analysis
- Patent number 10,458,929
- Issue date Oct 29, 2019
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Electron probe microanalyzer and storage medium
- Patent number 10,410,825
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Hiroshi Sakamae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-energy spectrum X-ray grating-based imaging system and imagin...
- Patent number 10,267,753
- Issue date Apr 23, 2019
- Nutech Company Limited
- Li Zhang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for materials analysis
- Patent number 10,161,887
- Issue date Dec 25, 2018
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Crystalline phase identification method, crystalline phase identifi...
- Patent number 10,161,888
- Issue date Dec 25, 2018
- Rigaku Corporation
- Yukiko Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for identifying crystalline phases, a corres...
- Patent number 10,126,256
- Issue date Nov 13, 2018
- Bruker Nano GmbH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for fluid phase fraction determination using X...
- Patent number 9,448,189
- Issue date Sep 20, 2016
- Schlumberger Technology Corporation
- Roman Vladimirovich Korkin
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring thickness of Fe—Zn alloy phase of galvannealed...
- Patent number 9,417,197
- Issue date Aug 16, 2016
- Nippon Steel & Sumitomo Metal Corporation
- Makoto Nakazawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the quantitative composition of a powder sample
- Patent number 8,520,802
- Issue date Aug 27, 2013
- Bruker Axs GmbH
- Arnt Kern
- G01 - MEASURING TESTING
Information Patent Grant
Crystal phase identification
- Patent number 6,326,619
- Issue date Dec 4, 2001
- Sandia Corporation
- Joseph R. Michael
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomographic image magnification process, system and apparatus...
- Patent number 5,245,648
- Issue date Sep 14, 1993
- The United States of America as represented by the United States Department o...
- John H. Kinney
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for material analysis
- Patent number 4,476,386
- Issue date Oct 9, 1984
- Commonwealth Scientific and Industrial Research Organization
- Alan F. Reid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230137130
- Publication date May 4, 2023
- JEOL Ltd.
- Kouta Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scatter Diagram Display Device, Scatter Diagram Display Method, and...
- Publication number 20230083479
- Publication date Mar 16, 2023
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYZING DIFFRACTIONPATTERN OF MIXTURE, AND...
- Publication number 20220187225
- Publication date Jun 16, 2022
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING TOTAL CROSS-SECTIONAL PHASE FRACTIO...
- Publication number 20210325320
- Publication date Oct 21, 2021
- Sea Pioneers Technologies Co., Ltd.
- Jige CHEN
- G01 - MEASURING TESTING
Information Patent Application
FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATIO...
- Publication number 20210033549
- Publication date Feb 4, 2021
- Central Iron & Steel Research Institute
- Weihao Wan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...
- Publication number 20210020272
- Publication date Jan 21, 2021
- Oxford University Innovation Limited
- Andrew Leslie GODWIN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPY ANALYSIS METHOD
- Publication number 20210010956
- Publication date Jan 14, 2021
- Commissariat a I'Energie Atomique et aux Energies Alternatives
- Nicolas BERNIER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...
- Publication number 20200096459
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...
- Publication number 20190292624
- Publication date Sep 26, 2019
- SMS group GMBH
- Mostafa BIGLARI
- C21 - METALLURGY OF IRON
Information Patent Application
SYSTEMS AND METHODS FOR MATERIALS ANALYSIS
- Publication number 20190086343
- Publication date Mar 21, 2019
- United Technologies Corporation
- luliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Application
OPALINE FLUX-CALCINED DIATOMITE PRODUCTS
- Publication number 20190054444
- Publication date Feb 21, 2019
- EP MINERALS, LLC
- Peter E. Lenz
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DIATOMITE PRODUCTS
- Publication number 20190054445
- Publication date Feb 21, 2019
- EP MINERALS, LLC
- Peter E. Lenz
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
X-RAY DIFFRACTION ANALYSIS METHOD AND X-RAY DIFFRACTION ANALYSIS AP...
- Publication number 20180356354
- Publication date Dec 13, 2018
- Fujitsu Limited
- Shuuichi Doi
- G01 - MEASURING TESTING
Information Patent Application
Crystalline Phase Identification Method, Crystalline Phase Identifi...
- Publication number 20170343492
- Publication date Nov 30, 2017
- Rigaku Corporation
- Yukiko Ikeda
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ENERGY SPECTRUM X-RAY GRATING-BASED IMAGING SYSTEM AND IMAGIN...
- Publication number 20170234811
- Publication date Aug 17, 2017
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR IDENTIFYING CRYSTALLINE PHASES, A CORRES...
- Publication number 20170167991
- Publication date Jun 15, 2017
- BRUKER NANO GMBH
- Thomas Schwager
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Fluid Phase Fraction Determination Using X...
- Publication number 20140355737
- Publication date Dec 4, 2014
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Roman Vladimirovich Korkin
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140254763
- Publication date Sep 11, 2014
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING FORMATION AND PHASE TRANSITION CHARACTERISTIC O...
- Publication number 20120276571
- Publication date Nov 1, 2012
- Seung Woo Lee
- G01 - MEASURING TESTING
Information Patent Application
Method for determining the quantitative composition of a powder sample
- Publication number 20120002787
- Publication date Jan 5, 2012
- Bruker AXS GmbH
- Arnt Kern
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

Method and device for analyzing diffraction pattern of mixture, and...

Method for improving an EBSD/TKD map

System and method for in-situ X-ray diffraction-based real-time mon...

Diffraction device and method for non-destructive testing of intern...

Device and method for measuring total cross-sectional phase fractio...

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Electron microscopy analysis method

Device and method for determining the microstructure of a metal pro...

Quantitative phase analysis device, quantitative phase analysis met...

Method for displaying measurement results from x-ray diffraction me...

X-ray diffraction analysis method and X-ray diffraction analysis ap...

Apparatus and method for inducing high-speed variable-tilt wobble m...

Image processing apparatus, surface analyzer, and image processing...

Systems and methods for materials analysis

Electron probe microanalyzer and storage medium

Multi-energy spectrum X-ray grating-based imaging system and imagin...

Systems and methods for materials analysis

Crystalline phase identification method, crystalline phase identifi...

Method and arrangement for identifying crystalline phases, a corres...

Apparatus and method for fluid phase fraction determination using X...

Method of measuring thickness of Fe—Zn alloy phase of galvannealed...

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray diffraction method of mapping grain structures in a crystalli...

Method for determining the quantitative composition of a powder sample

Crystal phase identification

X-ray tomographic image magnification process, system and apparatus...

Method and apparatus for material analysis

Patents Applicationslast 30 patents

Phase Analyzer, Sample Analyzer, and Analysis Method

Scatter Diagram Display Device, Scatter Diagram Display Method, and...

METHOD AND DEVICE FOR ANALYZING DIFFRACTIONPATTERN OF MIXTURE, AND...

DEVICE AND METHOD FOR MEASURING TOTAL CROSS-SECTIONAL PHASE FRACTIO...

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATIO...

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...

ELECTRON MICROSCOPY ANALYSIS METHOD

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...

DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...

SYSTEMS AND METHODS FOR MATERIALS ANALYSIS

OPALINE FLUX-CALCINED DIATOMITE PRODUCTS

DIATOMITE PRODUCTS

X-RAY DIFFRACTION ANALYSIS METHOD AND X-RAY DIFFRACTION ANALYSIS AP...

Crystalline Phase Identification Method, Crystalline Phase Identifi...

MULTI-ENERGY SPECTRUM X-RAY GRATING-BASED IMAGING SYSTEM AND IMAGIN...

METHOD AND ARRANGEMENT FOR IDENTIFYING CRYSTALLINE PHASES, A CORRES...

Apparatus and Method for Fluid Phase Fraction Determination Using X...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

METHOD OF ANALYZING FORMATION AND PHASE TRANSITION CHARACTERISTIC O...

Method for determining the quantitative composition of a powder sample