Photoluminescence of semiconductors

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CPC
G01N21/6489

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

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G01N21/6489Photoluminescence of semiconductors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus comprising a first imager imaging fluorescence...
- Patent number 12,072,289
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of defects of at least one type from among a plurality of...
- Patent number 11,982,623
- Issue date May 14, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Patrick-Jeremy Dahan
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the thermal donor concentration of a semicon...
- Patent number 11,946,869
- Issue date Apr 2, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Torbjørn Mehl
- G01 - MEASURING TESTING
Information Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
- Patent number 11,927,535
- Issue date Mar 12, 2024
- Applied Materials, Inc.
- Avishek Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the trap density in a 2-dimensional semiconduc...
- Patent number 11,898,958
- Issue date Feb 13, 2024
- Imec VZW
- Alessandra Leonhardt
- G01 - MEASURING TESTING
Information Patent Grant
Optical near-field metrology
- Patent number 11,815,347
- Issue date Nov 14, 2023
- KLA-Tencor Corporation
- Yuri Paskover
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of the electrostatic potential of nanoparticles
- Patent number 11,796,472
- Issue date Oct 24, 2023
- Northwestern University
- Chen He
- G01 - MEASURING TESTING
Information Patent Grant
Luminescence imaging for sensing and/or authentication
- Patent number 11,726,037
- Issue date Aug 15, 2023
- C2Sense, Inc.
- Timothy Manning Swager
- G01 - MEASURING TESTING
Information Patent Grant
Proteomic assay using quantum sensors
- Patent number 11,698,373
- Issue date Jul 11, 2023
- Somalogic Operating Co., Inc.
- Jason Paul Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting contamination of thin-films
- Patent number 11,686,683
- Issue date Jun 27, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Liang Cheng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus with closed loop feedback for forming a nanostructured th...
- Patent number 11,682,738
- Issue date Jun 20, 2023
- John Arthur deVos
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
- Patent number 11,662,317
- Issue date May 30, 2023
- Applied Materials, Inc.
- Avishek Ghosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for sample measurement
- Patent number 11,614,405
- Issue date Mar 28, 2023
- Quantum Diamond Technologies Inc.
- Colin B. Connolly
- G01 - MEASURING TESTING
Information Patent Grant
Hydrophilic coatings of plasmonic metals to enable low volume metal...
- Patent number 11,561,180
- Issue date Jan 24, 2023
- University of Maryland, Baltimore County
- Chris D. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method of metal contamination
- Patent number 11,538,721
- Issue date Dec 27, 2022
- Globalwafers Japan Co., Ltd
- Nobue Araki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Excitation and photoluminescence detection device
- Patent number 11,506,608
- Issue date Nov 22, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benoit Racine
- G01 - MEASURING TESTING
Information Patent Grant
Authentication of quantum dot security inks
- Patent number 11,493,444
- Issue date Nov 8, 2022
- UbiQD, Inc.
- Hunter McDaniel
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting light-emitting diodes and inspection apparatus
- Patent number 11,474,144
- Issue date Oct 18, 2022
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Bulk liquid tagging, identifying and authentication
- Patent number 11,391,674
- Issue date Jul 19, 2022
- Dotz Nano Ltd.
- Michael Shtein
- G01 - MEASURING TESTING
Information Patent Grant
Biological substance detection method
- Patent number 11,378,517
- Issue date Jul 5, 2022
- Konica Minolta, Inc.
- Kensaku Takanashi
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method and manufacturing method of SiC epitaxial wafer
- Patent number 11,315,839
- Issue date Apr 26, 2022
- Showa Denko K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Optical inspection apparatus
- Patent number 11,300,768
- Issue date Apr 12, 2022
- Samsung Display Co., Ltd.
- Yong Woon Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for forming a nanostructured thin film with porosity grad...
- Patent number 11,302,830
- Issue date Apr 12, 2022
- John Arthur deVos
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Plasmonic nanoparticles, methods of making plasmonic nanoparticles...
- Patent number 11,275,089
- Issue date Mar 15, 2022
- Ravinder Jain
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Proteomic assay using quantum sensors
- Patent number 11,249,080
- Issue date Feb 15, 2022
- SomaLogic, Inc.
- Jason Paul Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
Method for photoluminescence measurement of a sample
- Patent number 11,237,110
- Issue date Feb 1, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Renaud Varache
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for identifying features
- Patent number 11,199,501
- Issue date Dec 14, 2021
- UTICA LEASECO, LLC
- Vineet Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating carbon concentration
- Patent number 11,175,231
- Issue date Nov 16, 2021
- Shin-Etsu Handotai Co., Ltd.
- Yasushi Mizusawa
- G01 - MEASURING TESTING
Information Patent Grant
Control of the electrostatic potential of nanoparticles
- Patent number 11,150,185
- Issue date Oct 19, 2021
- Northwestern University
- Chen He
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR DETECTION OF CHEMICALS USING OPTICAL SENSORS
- Publication number 20240410830
- Publication date Dec 12, 2024
- University Court of the University of St. Andrews
- Ross N GILLANDERS
- G01 - MEASURING TESTING
Information Patent Application
Determining Properties of Samples Using Quantum Sensing
- Publication number 20240377328
- Publication date Nov 14, 2024
- The University of Melbourne
- Gawain MCCOLL
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240361244
- Publication date Oct 31, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240337603
- Publication date Oct 10, 2024
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD, APPARATUS AND DEVICE, AND COMPUTER-READABL...
- Publication number 20240319099
- Publication date Sep 26, 2024
- JI HUA LABORATORY
- Zhaoming HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...
- Publication number 20240283402
- Publication date Aug 22, 2024
- NewSouth Innovations Pty Limited
- Oliver KUNZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20240192139
- Publication date Jun 13, 2024
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION LINE GENERATION BY DOUBLE-DUTY DIFFUSION
- Publication number 20240184022
- Publication date Jun 6, 2024
- COGNEX CORPORATION
- Thomas Ruhnau
- G01 - MEASURING TESTING
Information Patent Application
SiC SUBSTRATE SiC COMPOSITE SUBSTRATE
- Publication number 20240186380
- Publication date Jun 6, 2024
- NGK Insulators, Ltd.
- Yuki URATA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240175825
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE
- Publication number 20240168080
- Publication date May 23, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE DETECTION OF NANOPRODUCTS
- Publication number 20240159679
- Publication date May 16, 2024
- Fondazione Istituto Italiano Di Tecnologia
- Athanasia ATHANASIOU
- G01 - MEASURING TESTING
Information Patent Application
LUMINESCENCE IMAGING FOR SENSING AND/OR AUTHENTICATION
- Publication number 20240077420
- Publication date Mar 7, 2024
- C2Sense, Inc.
- Timothy Manning Swager
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE FOR SEMICONDUCTOR YIELD RELATED APPLICATIONS
- Publication number 20240044799
- Publication date Feb 8, 2024
- KLA Corporation
- James Xu
- G01 - MEASURING TESTING
Information Patent Application
A NANOSCALE OPTICAL BIOSENSOR BASED ON MATERIAL-ASSOCIATED SINGLE W...
- Publication number 20240019374
- Publication date Jan 18, 2024
- Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
- Oded SHOSEYOV
- B82 - NANO-TECHNOLOGY
Information Patent Application
PHOTOLUMINESCENCE MEASUREMENT DEVICE
- Publication number 20230400418
- Publication date Dec 14, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Renaud VARACHE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OPTICAL SENSOR FOR REMOTE TEMPERATURE MEASUREMENTS
- Publication number 20230395408
- Publication date Dec 7, 2023
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- G01 - MEASURING TESTING
Information Patent Application
AUTO FOCUS SYSTEM FOR INSPECTION OF HIGH-DENSITY PARTS
- Publication number 20230366823
- Publication date Nov 16, 2023
- Velocity Image Processing LLC
- Robert P. Bishop
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
- Publication number 20230349896
- Publication date Nov 2, 2023
- SomaLogic Operating Co., Inc.
- Jason Paul CLEVELAND
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING CONTAMINATION OF THIN-FILMS
- Publication number 20230296523
- Publication date Sep 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Liang CHENG
- B82 - NANO-TECHNOLOGY
Information Patent Application
METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY
- Publication number 20230266247
- Publication date Aug 24, 2023
- Applied Materials, Inc.
- Avishek GHOSH
- G01 - MEASURING TESTING
Information Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC MODULES
- Publication number 20230238919
- Publication date Jul 27, 2023
- NewSouth Innovations Pty Limited
- Oliver KUNZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTROMAGNETIC RADIATION SOURCE AND LIGHT SOAKING SYSTEM COMPRISIN...
- Publication number 20230197307
- Publication date Jun 22, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Arnaud KINFACK LEOGA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230109887
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G01 - MEASURING TESTING
Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230113093
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACET REGION DETECTION METHOD AND WAFER GENERATION METHOD
- Publication number 20220410305
- Publication date Dec 29, 2022
- Disco Corporation
- Satoshi GENDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
COMPOSITIONS AND METHODS BASED ON DIFFUSION OF FLUOROPHORES
- Publication number 20220404281
- Publication date Dec 22, 2022
- Scintimetrics, Inc.
- Christopher Gordon ATWOOD
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITION AND METHOD FOR MONITORING LIPID
- Publication number 20220276171
- Publication date Sep 1, 2022
- Memorial Sloan-Kettering Cancer Center
- Prakrit JENA
- B82 - NANO-TECHNOLOGY
Information Patent Application
EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER
- Publication number 20220223482
- Publication date Jul 14, 2022
- SHOWA DENKO K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220196551
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING

Photoluminescence of semiconductors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection apparatus comprising a first imager imaging fluorescence...

Analysis of defects of at least one type from among a plurality of...

Method for determining the thermal donor concentration of a semicon...

Metrology for OLED manufacturing using photoluminescence spectroscopy

Method for measuring the trap density in a 2-dimensional semiconduc...

Optical near-field metrology

Optical systems and methods of characterizing high-k dielectrics

Control of the electrostatic potential of nanoparticles

Luminescence imaging for sensing and/or authentication

Proteomic assay using quantum sensors

System and method for detecting contamination of thin-films

Apparatus with closed loop feedback for forming a nanostructured th...

Metrology for OLED manufacturing using photoluminescence spectroscopy

Methods and apparatus for sample measurement

Hydrophilic coatings of plasmonic metals to enable low volume metal...

Evaluation method of metal contamination

Excitation and photoluminescence detection device

Authentication of quantum dot security inks

Method for inspecting light-emitting diodes and inspection apparatus

Bulk liquid tagging, identifying and authentication

Biological substance detection method

Evaluation method and manufacturing method of SiC epitaxial wafer

Optical inspection apparatus

Apparatus for forming a nanostructured thin film with porosity grad...

Plasmonic nanoparticles, methods of making plasmonic nanoparticles...

Proteomic assay using quantum sensors

Method for photoluminescence measurement of a sample

Methods and systems for identifying features

Method for evaluating carbon concentration

Control of the electrostatic potential of nanoparticles

Patents Applicationslast 30 patents

APPARATUS AND METHODS FOR DETECTION OF CHEMICALS USING OPTICAL SENSORS

Determining Properties of Samples Using Quantum Sensing

INSPECTION APPARATUS AND INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT DETECTION METHOD, APPARATUS AND DEVICE, AND COMPUTER-READABL...

OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...

MEASUREMENT DEVICE

ILLUMINATION LINE GENERATION BY DOUBLE-DUTY DIFFUSION

SiC SUBSTRATE SiC COMPOSITE SUBSTRATE

MEASURING DEVICE

INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE

METHOD FOR THE DETECTION OF NANOPRODUCTS

LUMINESCENCE IMAGING FOR SENSING AND/OR AUTHENTICATION

PHOTOLUMINESCENCE FOR SEMICONDUCTOR YIELD RELATED APPLICATIONS

A NANOSCALE OPTICAL BIOSENSOR BASED ON MATERIAL-ASSOCIATED SINGLE W...

PHOTOLUMINESCENCE MEASUREMENT DEVICE

OPTICAL SENSOR FOR REMOTE TEMPERATURE MEASUREMENTS

AUTO FOCUS SYSTEM FOR INSPECTION OF HIGH-DENSITY PARTS

PROTEOMIC ASSAY USING QUANTUM SENSORS

SYSTEM AND METHOD FOR DETECTING CONTAMINATION OF THIN-FILMS

METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY

OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC MODULES

ELECTROMAGNETIC RADIATION SOURCE AND LIGHT SOAKING SYSTEM COMPRISIN...

DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...

DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...

FACET REGION DETECTION METHOD AND WAFER GENERATION METHOD

COMPOSITIONS AND METHODS BASED ON DIFFUSION OF FLUOROPHORES

COMPOSITION AND METHOD FOR MONITORING LIPID

EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER

INSPECTION APPARATUS AND INSPECTION METHOD