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Photoluminescence of semiconductors
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating or analysing materials by the use of optical means
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G01N21/6489
Photoluminescence of semiconductors
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Patents Grants
last 30 patents
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Patent Grant
Analysis of defects of at least one type from among a plurality of...
Patent number
11,982,623
Issue date
May 14, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Patrick-Jeremy Dahan
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the thermal donor concentration of a semicon...
Patent number
11,946,869
Issue date
Apr 2, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Torbjørn Mehl
G01 - MEASURING TESTING
Information
Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
Patent number
11,927,535
Issue date
Mar 12, 2024
Applied Materials, Inc.
Avishek Ghosh
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring the trap density in a 2-dimensional semiconduc...
Patent number
11,898,958
Issue date
Feb 13, 2024
Imec VZW
Alessandra Leonhardt
G01 - MEASURING TESTING
Information
Patent Grant
Optical near-field metrology
Patent number
11,815,347
Issue date
Nov 14, 2023
KLA-Tencor Corporation
Yuri Paskover
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical systems and methods of characterizing high-k dielectrics
Patent number
11,808,706
Issue date
Nov 7, 2023
California Institute of Technology
Philippe C. Adell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of the electrostatic potential of nanoparticles
Patent number
11,796,472
Issue date
Oct 24, 2023
Northwestern University
Chen He
G01 - MEASURING TESTING
Information
Patent Grant
Luminescence imaging for sensing and/or authentication
Patent number
11,726,037
Issue date
Aug 15, 2023
C2Sense, Inc.
Timothy Manning Swager
G01 - MEASURING TESTING
Information
Patent Grant
Proteomic assay using quantum sensors
Patent number
11,698,373
Issue date
Jul 11, 2023
Somalogic Operating Co., Inc.
Jason Paul Cleveland
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting contamination of thin-films
Patent number
11,686,683
Issue date
Jun 27, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Chung-Liang Cheng
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus with closed loop feedback for forming a nanostructured th...
Patent number
11,682,738
Issue date
Jun 20, 2023
John Arthur deVos
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
Patent number
11,662,317
Issue date
May 30, 2023
Applied Materials, Inc.
Avishek Ghosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for sample measurement
Patent number
11,614,405
Issue date
Mar 28, 2023
Quantum Diamond Technologies Inc.
Colin B. Connolly
G01 - MEASURING TESTING
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Patent Grant
Hydrophilic coatings of plasmonic metals to enable low volume metal...
Patent number
11,561,180
Issue date
Jan 24, 2023
University of Maryland, Baltimore County
Chris D. Geddes
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation method of metal contamination
Patent number
11,538,721
Issue date
Dec 27, 2022
Globalwafers Japan Co., Ltd
Nobue Araki
C30 - CRYSTAL GROWTH
Information
Patent Grant
Excitation and photoluminescence detection device
Patent number
11,506,608
Issue date
Nov 22, 2022
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Benoit Racine
G01 - MEASURING TESTING
Information
Patent Grant
Authentication of quantum dot security inks
Patent number
11,493,444
Issue date
Nov 8, 2022
UbiQD, Inc.
Hunter McDaniel
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting light-emitting diodes and inspection apparatus
Patent number
11,474,144
Issue date
Oct 18, 2022
Industrial Technology Research Institute
Yan-Rung Lin
G01 - MEASURING TESTING
Information
Patent Grant
Bulk liquid tagging, identifying and authentication
Patent number
11,391,674
Issue date
Jul 19, 2022
Dotz Nano Ltd.
Michael Shtein
G01 - MEASURING TESTING
Information
Patent Grant
Biological substance detection method
Patent number
11,378,517
Issue date
Jul 5, 2022
Konica Minolta, Inc.
Kensaku Takanashi
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation method and manufacturing method of SiC epitaxial wafer
Patent number
11,315,839
Issue date
Apr 26, 2022
Showa Denko K.K.
Yoshitaka Nishihara
C30 - CRYSTAL GROWTH
Information
Patent Grant
Optical inspection apparatus
Patent number
11,300,768
Issue date
Apr 12, 2022
Samsung Display Co., Ltd.
Yong Woon Lim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for forming a nanostructured thin film with porosity grad...
Patent number
11,302,830
Issue date
Apr 12, 2022
John Arthur deVos
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Plasmonic nanoparticles, methods of making plasmonic nanoparticles...
Patent number
11,275,089
Issue date
Mar 15, 2022
Ravinder Jain
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Proteomic assay using quantum sensors
Patent number
11,249,080
Issue date
Feb 15, 2022
SomaLogic, Inc.
Jason Paul Cleveland
G01 - MEASURING TESTING
Information
Patent Grant
Method for photoluminescence measurement of a sample
Patent number
11,237,110
Issue date
Feb 1, 2022
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Renaud Varache
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for identifying features
Patent number
11,199,501
Issue date
Dec 14, 2021
UTICA LEASECO, LLC
Vineet Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating carbon concentration
Patent number
11,175,231
Issue date
Nov 16, 2021
Shin-Etsu Handotai Co., Ltd.
Yasushi Mizusawa
G01 - MEASURING TESTING
Information
Patent Grant
Control of the electrostatic potential of nanoparticles
Patent number
11,150,185
Issue date
Oct 19, 2021
Northwestern University
Chen He
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Methods of manufacturing a light source carrier and an electronic d...
Patent number
11,150,189
Issue date
Oct 19, 2021
Innolux Corporation
Wan-Ting Ke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LUMINESCENCE IMAGING FOR SENSING AND/OR AUTHENTICATION
Publication number
20240077420
Publication date
Mar 7, 2024
C2Sense, Inc.
Timothy Manning Swager
G01 - MEASURING TESTING
Information
Patent Application
PHOTOLUMINESCENCE FOR SEMICONDUCTOR YIELD RELATED APPLICATIONS
Publication number
20240044799
Publication date
Feb 8, 2024
KLA Corporation
James Xu
G01 - MEASURING TESTING
Information
Patent Application
A NANOSCALE OPTICAL BIOSENSOR BASED ON MATERIAL-ASSOCIATED SINGLE W...
Publication number
20240019374
Publication date
Jan 18, 2024
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
Oded SHOSEYOV
B82 - NANO-TECHNOLOGY
Information
Patent Application
PHOTOLUMINESCENCE MEASUREMENT DEVICE
Publication number
20230400418
Publication date
Dec 14, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Renaud VARACHE
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
OPTICAL SENSOR FOR REMOTE TEMPERATURE MEASUREMENTS
Publication number
20230395408
Publication date
Dec 7, 2023
TOKYO ELECTRON LIMITED
Ivan MALEEV
G01 - MEASURING TESTING
Information
Patent Application
AUTO FOCUS SYSTEM FOR INSPECTION OF HIGH-DENSITY PARTS
Publication number
20230366823
Publication date
Nov 16, 2023
Velocity Image Processing LLC
Robert P. Bishop
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
Publication number
20230349896
Publication date
Nov 2, 2023
SomaLogic Operating Co., Inc.
Jason Paul CLEVELAND
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING CONTAMINATION OF THIN-FILMS
Publication number
20230296523
Publication date
Sep 21, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chung-Liang CHENG
B82 - NANO-TECHNOLOGY
Information
Patent Application
METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY
Publication number
20230266247
Publication date
Aug 24, 2023
Applied Materials, Inc.
Avishek GHOSH
G01 - MEASURING TESTING
Information
Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC MODULES
Publication number
20230238919
Publication date
Jul 27, 2023
NewSouth Innovations Pty Limited
Oliver KUNZ
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
ELECTROMAGNETIC RADIATION SOURCE AND LIGHT SOAKING SYSTEM COMPRISIN...
Publication number
20230197307
Publication date
Jun 22, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Arnaud KINFACK LEOGA
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230109887
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G01 - MEASURING TESTING
Information
Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230113093
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FACET REGION DETECTION METHOD AND WAFER GENERATION METHOD
Publication number
20220410305
Publication date
Dec 29, 2022
Disco Corporation
Satoshi GENDA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
COMPOSITIONS AND METHODS BASED ON DIFFUSION OF FLUOROPHORES
Publication number
20220404281
Publication date
Dec 22, 2022
Scintimetrics, Inc.
Christopher Gordon ATWOOD
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITION AND METHOD FOR MONITORING LIPID
Publication number
20220276171
Publication date
Sep 1, 2022
Memorial Sloan-Kettering Cancer Center
Prakrit JENA
B82 - NANO-TECHNOLOGY
Information
Patent Application
EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER
Publication number
20220223482
Publication date
Jul 14, 2022
SHOWA DENKO K.K.
Yoshitaka Nishihara
C30 - CRYSTAL GROWTH
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20220196551
Publication date
Jun 23, 2022
Hamamatsu Photonics K.K.
Tomonori NAKAMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICON...
Publication number
20220050055
Publication date
Feb 17, 2022
COMMISSARIAT A L'ENERGIE ATOMIQUET ET AUX ENERGIES ALTERNATIVES
Torbjørn MEHL
G01 - MEASURING TESTING
Information
Patent Application
Control of the Electrostatic Potential of Nanoparticles
Publication number
20220042911
Publication date
Feb 10, 2022
Northwestern University
Chen He
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHODS AND APPARATUS FOR SAMPLE MEASUREMENT
Publication number
20220042913
Publication date
Feb 10, 2022
Quantum Diamond Technologies Inc.
Colin B. Connolly
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS
Publication number
20220003678
Publication date
Jan 6, 2022
California Institute of Technology
Philippe C. Adell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MEASURING THE TRAP DENSITY IN A 2-DIMENSIONAL SEMICONDUC...
Publication number
20210356399
Publication date
Nov 18, 2021
IMEC vzw
Alessandra Leonhardt
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING CONTAMINATION OF THIN-FILMS
Publication number
20210341390
Publication date
Nov 4, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Chung-Liang CHENG
B82 - NANO-TECHNOLOGY
Information
Patent Application
ANALYSIS OF DEFECTS OF AT LEAST ONE TYPE FROM AMONG A PLURALITY OF...
Publication number
20210310955
Publication date
Oct 7, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Patrick-Jeremy DAHAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL INSPECTION APPARATUS
Publication number
20210239959
Publication date
Aug 5, 2021
SAMSUNG DISPLAY CO., LTD.
Yong Woon LIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY
Publication number
20210208077
Publication date
Jul 8, 2021
Applied Materials, Inc.
Avishek GHOSH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CANCER CELL DETECTION AND IMAGING SYSTEM, PROCESS AND PRODUCT
Publication number
20210172953
Publication date
Jun 10, 2021
MASTER DYNAMIC LIMITED
Ka Wing CHENG
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR SAMPLE MEASUREMENT
Publication number
20210131966
Publication date
May 6, 2021
Quantum Diamond Technologies Inc.
Colin B. Connolly
G01 - MEASURING TESTING
Information
Patent Application
EXCITATION AND PHOTOLUMINESCENCE DETECTION DEVICE
Publication number
20210131969
Publication date
May 6, 2021
Commissarat à I'Énergie Atomique et aux Énergies Alternatives
Benoit Racine
G01 - MEASURING TESTING