Polarisation (electromagnetic beams)

Industry

CPC
H01J2237/2455

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2455Polarisation (electromagnetic beams)

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection tool, lithographic apparatus, electron beam source and a...
- Patent number 11,243,179
- Issue date Feb 8, 2022
- ASML Netherlands B.V.
- Erwin Paul Smakman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method for analyzing secondary ele...
- Patent number 11,170,972
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin polarimeter
- Patent number 11,139,143
- Issue date Oct 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coherence measuring device for spin-polarized electron beam and met...
- Patent number 9,881,767
- Issue date Jan 30, 2018
- National University Corporation Nagoya University
- Makoto Kuwahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image type electron spin polarimeter
- Patent number 9,741,533
- Issue date Aug 22, 2017
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Shan Qiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generation of charged particle vortex waves
- Patent number 9,153,412
- Issue date Oct 6, 2015
- Universiteit Antwerpen
- Johan Verbeeck
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 8,841,615
- Issue date Sep 23, 2014
- National University Corporation Nagoya University
- Nobuo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for producing and using multiple electron beams w...
- Patent number 8,680,488
- Issue date Mar 25, 2014
- Benjamin McMorran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,536,773
- Issue date Sep 17, 2013
- Carl Zeiss Microscopy GmbH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,436,302
- Issue date May 7, 2013
- Carl Zeiss Microscopy GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin-polarized electron source
- Patent number 8,344,354
- Issue date Jan 1, 2013
- National University Corporation Nagoya University
- Toru Ujihara
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,173,963
- Issue date May 8, 2012
- Carl Zeizz NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin polarized ion beam generation apparatus and scattering spectro...
- Patent number 8,017,920
- Issue date Sep 13, 2011
- Japan Science and Technology Agency
- Taku Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle spin polarimeter, microscope, and photoelectron sp...
- Patent number 7,985,952
- Issue date Jul 26, 2011
- Hitachi, Ltd.
- Teruo Kohashi
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 7,902,506
- Issue date Mar 8, 2011
- Carl Zeiss NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spin analyzer
- Patent number 6,639,218
- Issue date Oct 28, 2003
- Hokkaido University
- Koichi Mukasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and electron microscopy method
- Patent number 5,936,244
- Issue date Aug 10, 1999
- Hitachi, Ltd.
- Yusuke Yajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 5,448,064
- Issue date Sep 5, 1995
- Hitachi, Ltd.
- Hideo Matsuyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE
- Publication number 20240249911
- Publication date Jul 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230274907
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN POLARIMETER
- Publication number 20210074509
- Publication date Mar 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...
- Publication number 20200402762
- Publication date Dec 24, 2020
- Hitachi High-Tech Corporation
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...
- Publication number 20200249181
- Publication date Aug 6, 2020
- ASML NETHERLANDS B.V.
- Erwin Paul SMAKMAN
- G01 - MEASURING TESTING
Information Patent Application
COHERENCE MEASURING DEVICE FOR SPIN-POLARIZED ELECTRON BEAM AND MET...
- Publication number 20170309446
- Publication date Oct 26, 2017
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Makoto KUWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE TYPE ELECTRON SPIN POLARIMETER
- Publication number 20160172157
- Publication date Jun 16, 2016
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- SHAN QIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATION OF CHARGED PARTICLE VORTEX WAVES
- Publication number 20140346354
- Publication date Nov 27, 2014
- Johan Verbeeck
- G01 - MEASURING TESTING
Information Patent Application
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
- Publication number 20140131574
- Publication date May 15, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130009058
- Publication date Jan 10, 2013
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Nobuo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...
- Publication number 20130001445
- Publication date Jan 3, 2013
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120248959
- Publication date Oct 4, 2012
- CARL ZEISS NTS GMBH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PRODUCING AND USING MULTIPLE ELECTRON BEAMS W...
- Publication number 20120153144
- Publication date Jun 21, 2012
- Benjamin McMorran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20110233402
- Publication date Sep 29, 2011
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN-POLARIZED ELECTRON SOURCE
- Publication number 20110089397
- Publication date Apr 21, 2011
- Toru Ujihara
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SPIN POLARIZED ION BEAM GENERATION APPARATUS AND SCATTERING SPECTRO...
- Publication number 20100044564
- Publication date Feb 25, 2010
- Taku Suziki
- G01 - MEASURING TESTING
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20080296509
- Publication date Dec 4, 2008
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...
- Publication number 20080217533
- Publication date Sep 11, 2008
- Teruo KOHASHI
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN
- Publication number 20070194230
- Publication date Aug 23, 2007
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron spin analyzer
- Publication number 20020003213
- Publication date Jan 10, 2002
- Koichi Mukasa
- H01 - BASIC ELECTRIC ELEMENTS

Polarisation (electromagnetic beams)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-contact angle measuring apparatus

Inspection tool, lithographic apparatus, electron beam source and a...

Scanning electron microscope and method for analyzing secondary ele...

Spin polarimeter

Coherence measuring device for spin-polarized electron beam and met...

Image type electron spin polarimeter

Generation of charged particle vortex waves

Electron microscope

System and method for producing and using multiple electron beams w...

Electron beam source and method of manufacturing the same

Phase-shifting element and particle beam device having a phase-shif...

Spin-polarized electron source

Phase-shifting element and particle beam device having a phase-shif...

Spin polarized ion beam generation apparatus and scattering spectro...

Charged particle spin polarimeter, microscope, and photoelectron sp...

Phase-shifting element and particle beam device having a phase-shif...

Transmission electron microscope

Electron spin analyzer

Electron microscope and electron microscopy method

Scanning electron microscope

Patents Applicationslast 30 patents

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

CHARGED PARTICLE BEAM DEVICE

SPIN POLARIMETER

SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...

INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...

COHERENCE MEASURING DEVICE FOR SPIN-POLARIZED ELECTRON BEAM AND MET...

IMAGE TYPE ELECTRON SPIN POLARIMETER

GENERATION OF CHARGED PARTICLE VORTEX WAVES

CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY

ELECTRON MICROSCOPE

PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

SYSTEM AND METHOD FOR PRODUCING AND USING MULTIPLE ELECTRON BEAMS W...

Phase-shifting element and particle beam device having a phase-shif...

SPIN-POLARIZED ELECTRON SOURCE

SPIN POLARIZED ION BEAM GENERATION APPARATUS AND SCATTERING SPECTRO...

Phase-shifting element and particle beam device having a phase-shif...

CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...

Transmission electron microscope

INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN

Electron spin analyzer