Polarisation spectrometry

Industry

CPC
G01J3/447

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/447Polarisation spectrometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Reducing polarization dependent loss (PDL) in a grating-based optic...
- Patent number 12,174,066
- Issue date Dec 24, 2024
- Viavi Solutions Inc.
- Driss Touahri
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable polarization imaging system
- Patent number 12,169,144
- Issue date Dec 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Cooperative polarization skylight background radiation measurement...
- Patent number 12,135,277
- Issue date Nov 5, 2024
- Hefei Institutes of Physical Science, CAS
- Congming Dai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Heat assisted detection and ranging based on spectropolarimetric im...
- Patent number 12,135,240
- Issue date Nov 5, 2024
- Purdue Research Foundation
- Zubin Jacob
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference switch architectures for noncontact sensing of substances
- Patent number 12,085,500
- Issue date Sep 10, 2024
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Optical pumping enhancement of a two-photon spectrometer and a two-...
- Patent number 12,025,495
- Issue date Jul 2, 2024
- Joseph Daniel Vance
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for confocal microscopy using dispersed struct...
- Patent number 11,872,015
- Issue date Jan 16, 2024
- Cylite Pty Ltd
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectrometer including metasurface
- Patent number 11,867,556
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reducing polarization dependent loss (PDL) in a grating-based optic...
- Patent number 11,828,648
- Issue date Nov 28, 2023
- Viavi Solutions Inc.
- Driss Touahri
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for axially-offset differential interference cont...
- Patent number 11,692,877
- Issue date Jul 4, 2023
- Purdue Research Foundation
- Garth Jason Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometry system for thin film imaging
- Patent number 11,668,645
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Emad Zawaideh
- G02 - OPTICS
Information Patent Grant
Cavity-enhanced fourier transform spectroscopy for chiral analysis
- Patent number 11,650,148
- Issue date May 16, 2023
- University of Virginia Patent Foundation
- Brooks Hart Pate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for conformal vision
- Patent number 11,607,136
- Issue date Mar 21, 2023
- ChemImage Corporation
- Matthew Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Optical property evaluation apparatus and optical property evaluati...
- Patent number 11,585,696
- Issue date Feb 21, 2023
- Hamamatsu Photonics K.K.
- Yoshiro Nomoto
- G01 - MEASURING TESTING
Information Patent Grant
Reference switch architectures for noncontact sensing of substances
- Patent number 11,585,749
- Issue date Feb 21, 2023
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Vibrational circular dichroism infrared spectroscopic imaging micro...
- Patent number 11,499,910
- Issue date Nov 15, 2022
- The Board of Trustees of the University of Illinois
- Yamuna Phal
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectropolarimeter
- Patent number 11,499,870
- Issue date Nov 15, 2022
- Bruker Nano, Inc.
- Mazen Zawaideh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Polarization filters having nanograting pattern and plasmonic struc...
- Patent number 11,487,051
- Issue date Nov 1, 2022
- Arizona Board of Regents on behalf of Arizona State University
- Yu Yao
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for coupling out a partial beam having a very sma...
- Patent number 11,402,648
- Issue date Aug 2, 2022
- Jenoptik Optical Systems GmbH
- Stephan Fahr
- G01 - MEASURING TESTING
Information Patent Grant
Spectroreflectometric system provided with a pointer mode for combi...
- Patent number 11,375,894
- Issue date Jul 5, 2022
- ZILIA INC.
- Nicolas Lapointe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
EUV spectroscopic polarimeter
- Patent number 11,313,727
- Issue date Apr 26, 2022
- National Tsing Hua University
- Ming-Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for spectral library training
- Patent number 11,293,802
- Issue date Apr 5, 2022
- ChemImage Corporation
- Alyssa Zrimsek
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor and image pickup apparatus having the same
- Patent number 11,277,552
- Issue date Mar 15, 2022
- Canon Kabushiki Kaisha
- Keita Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser speckle reduction and photo-thermal speckle spectroscopy
- Patent number 11,262,241
- Issue date Mar 1, 2022
- The Government of the United States of America, as represented by the Secreta...
- Robert Furstenberg
- G01 - MEASURING TESTING
Information Patent Grant
Polarization measurement with interference patterns of high spatial...
- Patent number 11,248,955
- Issue date Feb 15, 2022
- Industrial Cooperation Foundation Chonbuk National University
- Daesuk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Cavity-enhanced fourier transform spectroscopy for chiral analysis
- Patent number 11,237,104
- Issue date Feb 1, 2022
- University of Virginia Patent Foundation
- Brooks Hart Pate
- G01 - MEASURING TESTING
Information Patent Grant
Spectral analysis device and spectral analysis method
- Patent number 11,215,507
- Issue date Jan 4, 2022
- Kyoto University
- Takeshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Multiple band multiple polarizer optical device
- Patent number 11,204,508
- Issue date Dec 21, 2021
- Lockheed Martin Corporation
- David R. Twede
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-angle imager
- Patent number 11,193,823
- Issue date Dec 7, 2021
- Stichting Nederlandse Wetenschappelijk Onderzoek Instituten
- Aaldert Hidde Van Amerongen
- G01 - MEASURING TESTING
Information Patent Grant
Sub-millimeter real-time circular dichroism spectrometer with metas...
- Patent number 11,193,829
- Issue date Dec 7, 2021
- Purdue Research Foundation
- Amr Mohammad E Shaltout
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES
- Publication number 20240410822
- Publication date Dec 12, 2024
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BENCH FOR SPECTROSCOPY
- Publication number 20240337534
- Publication date Oct 10, 2024
- Vector Atomic, Inc.
- Martin Machai BOYD
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION INTELLIGENT SENSING SYSTEM AND POLARIZATION INTELLIGEN...
- Publication number 20240337535
- Publication date Oct 10, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- DONG YAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM
- Publication number 20240288309
- Publication date Aug 29, 2024
- Purdue Research Foundation
- Xueji Wang
- G01 - MEASURING TESTING
Information Patent Application
REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTIC...
- Publication number 20240110831
- Publication date Apr 4, 2024
- VIAVI SOLUTIONS INC.
- Driss TOUAHRI
- G01 - MEASURING TESTING
Information Patent Application
POLARIMETRIC IMAGE SENSOR
- Publication number 20240053202
- Publication date Feb 15, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jerome VAILLANT
- G01 - MEASURING TESTING
Information Patent Application
LASER-BASED SUB-DOPPLER CIRCULAR DICHROISM SPECTROSCOPY IN FRC DEVICE
- Publication number 20230384402
- Publication date Nov 30, 2023
- TAE TECHNOLOGIES, INC.
- Marcel Nations
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...
- Publication number 20230341265
- Publication date Oct 26, 2023
- Purdue Research Foundation
- Zubin Jacob
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFRARED MEASUREMENT METHOD AND APPARATUS, COMPUTER DEVICE AND STOR...
- Publication number 20230304921
- Publication date Sep 28, 2023
- NANKAI UNIVERSITY
- MENG-XIN REN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME
- Publication number 20230204422
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jinwoo Ahn
- G01 - MEASURING TESTING
Information Patent Application
Reference Switch Architectures for Noncontact Sensing of Substances
- Publication number 20230204497
- Publication date Jun 29, 2023
- Apple Inc.
- Miikka M. KANGAS
- G01 - MEASURING TESTING
Information Patent Application
CHIRAL PLASMONIC METASURFACES FOR POLARIZATION DETECTION AND MANIPU...
- Publication number 20230136247
- Publication date May 4, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Yu Yao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL I...
- Publication number 20230063843
- Publication date Mar 2, 2023
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION IMAGING SYSTEM AND POLARIZATION IMAGING METHOD
- Publication number 20230034139
- Publication date Feb 2, 2023
- SONY GROUP CORPORATION
- Piergiorgio SARTOR
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic ellipsometry system for thin film imaging
- Publication number 20230010806
- Publication date Jan 12, 2023
- Scientific Computing International
- Emad Zawaideh
- G01 - MEASURING TESTING
Information Patent Application
Optical pumping enhancement of a two-photon spectrometer and a two-...
- Publication number 20220404198
- Publication date Dec 22, 2022
- Joseph Daniel Vance
- G01 - MEASURING TESTING
Information Patent Application
REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTIC...
- Publication number 20220381609
- Publication date Dec 1, 2022
- VIAVI Solutions Inc.
- Driss TOUAHRI
- G01 - MEASURING TESTING
Information Patent Application
CAVITY-ENHANCED FOURIER TRANSFORM SPECTROSCOPY FOR CHIRAL ANALYSIS
- Publication number 20220268699
- Publication date Aug 25, 2022
- Universtiy of Virginia Patent Foundation
- Brooks Hart Pate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECONFIGURABLE POLARIZATION IMAGING SYSTEM
- Publication number 20220268632
- Publication date Aug 25, 2022
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROPERTY EVALUATION APPARATUS AND OPTICAL PROPERTY EVALUATI...
- Publication number 20220120612
- Publication date Apr 21, 2022
- HAMAMATSU PHOTONICS K. K.
- Yoshiro NOMOTO
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR AXIALLY-OFFSET DIFFERENTIAL INTERFERENCE CONT...
- Publication number 20220057266
- Publication date Feb 24, 2022
- Purdue Research Foundation
- Garth Jason Simpson
- G01 - MEASURING TESTING
Information Patent Application
EUV SPECTROSCOPIC POLARIMETER
- Publication number 20220049990
- Publication date Feb 17, 2022
- National Tsing Hua University
- Ming-Chang CHEN
- G01 - MEASURING TESTING
Information Patent Application
VIBRATIONAL CIRCULAR DICHROISM INFRARED SPECTROSCOPIC IMAGING MICRO...
- Publication number 20220018759
- Publication date Jan 20, 2022
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yamuna PHAL
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER INCLUDING METASURFACE
- Publication number 20220011161
- Publication date Jan 13, 2022
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHIRAL PLASMONIC METASURFACES FOR POLARIZATION DETECTION AND MANIPU...
- Publication number 20210348969
- Publication date Nov 11, 2021
- Arizona Board of Regents on behalf of Arizona State University
- Yu Yao
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION GENERATION DEVICE, INFORMATION GENERATION METHOD AND PR...
- Publication number 20210211619
- Publication date Jul 8, 2021
- SONY CORPORATION
- Hajime MIHARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SPECTRAL LIBRARY TRAINING
- Publication number 20210190586
- Publication date Jun 24, 2021
- ChemImage Corporation
- Alyssa ZRIMSEK
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE
- Publication number 20210190676
- Publication date Jun 24, 2021
- YOKOGAWA ELECTRIC CORPORATION
- Kodai MURAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SNAPSHOT MULTISPECTRAL IMAGER FOR MEDICAL APPLICATIONS
- Publication number 20210172797
- Publication date Jun 10, 2021
- Surface Optics Corporation
- Kyle Ryan McCormick
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR COUPLING OUT A PARTIAL BEAM HAVING A VERY SMA...
- Publication number 20210173221
- Publication date Jun 10, 2021
- JENOPTIK OPTICAL SYSTEMS GMBH
- Stephan FAHR
- G01 - MEASURING TESTING

Polarisation spectrometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Reducing polarization dependent loss (PDL) in a grating-based optic...

Reconfigurable polarization imaging system

Cooperative polarization skylight background radiation measurement...

Heat assisted detection and ranging based on spectropolarimetric im...

Reference switch architectures for noncontact sensing of substances

Optical pumping enhancement of a two-photon spectrometer and a two-...

Apparatus and method for confocal microscopy using dispersed struct...

Spectrometer including metasurface

Reducing polarization dependent loss (PDL) in a grating-based optic...

Method and system for axially-offset differential interference cont...

Spectroscopic ellipsometry system for thin film imaging

Cavity-enhanced fourier transform spectroscopy for chiral analysis

System and method for conformal vision

Optical property evaluation apparatus and optical property evaluati...

Reference switch architectures for noncontact sensing of substances

Vibrational circular dichroism infrared spectroscopic imaging micro...

Imaging spectropolarimeter

Polarization filters having nanograting pattern and plasmonic struc...

Method and device for coupling out a partial beam having a very sma...

Spectroreflectometric system provided with a pointer mode for combi...

EUV spectroscopic polarimeter

System and method for spectral library training

Image sensor and image pickup apparatus having the same

Laser speckle reduction and photo-thermal speckle spectroscopy

Polarization measurement with interference patterns of high spatial...

Cavity-enhanced fourier transform spectroscopy for chiral analysis

Spectral analysis device and spectral analysis method

Multiple band multiple polarizer optical device

Multi-angle imager

Sub-millimeter real-time circular dichroism spectrometer with metas...

Patents Applicationslast 30 patents

REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES

OPTICAL BENCH FOR SPECTROSCOPY

POLARIZATION INTELLIGENT SENSING SYSTEM AND POLARIZATION INTELLIGEN...

TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM

REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTIC...

POLARIMETRIC IMAGE SENSOR

LASER-BASED SUB-DOPPLER CIRCULAR DICHROISM SPECTROSCOPY IN FRC DEVICE

HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...

INFRARED MEASUREMENT METHOD AND APPARATUS, COMPUTER DEVICE AND STOR...

IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME

Reference Switch Architectures for Noncontact Sensing of Substances

CHIRAL PLASMONIC METASURFACES FOR POLARIZATION DETECTION AND MANIPU...

METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL I...

POLARIZATION IMAGING SYSTEM AND POLARIZATION IMAGING METHOD

Spectroscopic ellipsometry system for thin film imaging

Optical pumping enhancement of a two-photon spectrometer and a two-...

REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTIC...

CAVITY-ENHANCED FOURIER TRANSFORM SPECTROSCOPY FOR CHIRAL ANALYSIS

RECONFIGURABLE POLARIZATION IMAGING SYSTEM

OPTICAL PROPERTY EVALUATION APPARATUS AND OPTICAL PROPERTY EVALUATI...

METHOD AND SYSTEM FOR AXIALLY-OFFSET DIFFERENTIAL INTERFERENCE CONT...

EUV SPECTROSCOPIC POLARIMETER

VIBRATIONAL CIRCULAR DICHROISM INFRARED SPECTROSCOPIC IMAGING MICRO...

SPECTROMETER INCLUDING METASURFACE

CHIRAL PLASMONIC METASURFACES FOR POLARIZATION DETECTION AND MANIPU...

INFORMATION GENERATION DEVICE, INFORMATION GENERATION METHOD AND PR...

SYSTEM AND METHOD FOR SPECTRAL LIBRARY TRAINING

SPECTROSCOPIC ANALYSIS DEVICE

SNAPSHOT MULTISPECTRAL IMAGER FOR MEDICAL APPLICATIONS

METHOD AND DEVICE FOR COUPLING OUT A PARTIAL BEAM HAVING A VERY SMA...