Power aspects

Industry

CPC
G01R31/31721

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31721Power aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Telephone connector to audio connector mapping and leveling device
- Patent number 12,140,633
- Issue date Nov 12, 2024
- Tony Dux
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Module and method for initializing and calibrating a product during...
- Patent number 11,953,551
- Issue date Apr 9, 2024
- Continental Automotive Technologies GmbH
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power circuit and testing device
- Patent number 11,946,971
- Issue date Apr 2, 2024
- Chongqing HKC Optoelectronics Technology Co., Ltd.
- Wenxin Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Single pin DFT architecture for USBPD ICs
- Patent number 11,933,841
- Issue date Mar 19, 2024
- SILICONCH SYSTEMS PVT LTD
- Munnangi Sirisha
- G01 - MEASURING TESTING
Information Patent Grant
Board adapter device, test method, system, apparatus, and device, a...
- Patent number 11,933,842
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Techniques to enable integrated circuit debug across low power states
- Patent number 11,933,843
- Issue date Mar 19, 2024
- Intel Corporation
- Keith A. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing an integrated circuit and testing system
- Patent number 11,879,933
- Issue date Jan 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting perturbations in a logic circuit and logic cir...
- Patent number 11,879,938
- Issue date Jan 23, 2024
- Nagravision SARL
- Jean-Marie Martin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus, and method for testing of an electrical system
- Patent number 11,874,335
- Issue date Jan 16, 2024
- OneStep Power Solutions Inc.
- Mark Craig
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuit screening system and circuit screening method
- Patent number 11,852,682
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
System-on-a-chip testing for energy harvesting devices
- Patent number 11,841,397
- Issue date Dec 12, 2023
- ARM Limited
- Fernando Garcia Redondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply glitch detection
- Patent number 11,824,436
- Issue date Nov 21, 2023
- Apple Inc.
- Xiao Pu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for controlling unit specific junction tempera...
- Patent number 11,808,813
- Issue date Nov 7, 2023
- Intel Corporation
- Mahesh Deshmane
- G01 - MEASURING TESTING
Information Patent Grant
Smart storage of shutdown LBIST status
- Patent number 11,796,591
- Issue date Oct 24, 2023
- Ambarella International LP
- Praveen Jaini
- G01 - MEASURING TESTING
Information Patent Grant
Wafer scale testing using a 2 signal JTAG interface
- Patent number 11,782,091
- Issue date Oct 10, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormality detection method and abnormality detection apparatus
- Patent number 11,762,035
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Tomoya Bessho
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, power verification circuit and power verificati...
- Patent number 11,763,912
- Issue date Sep 19, 2023
- Nuvoton Technology Corporation
- Liang-Chuan Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Power system component testing using a power system emulator-based...
- Patent number 11,754,637
- Issue date Sep 12, 2023
- University of Tennessee Research Foundation
- Fei Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing lifetime of surface state carrier of semiconductor
- Patent number 11,719,739
- Issue date Aug 8, 2023
- Tongji University
- Qian Cheng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Multi-bit flip-flop with power saving feature
- Patent number 11,714,125
- Issue date Aug 1, 2023
- Mediatek Inc.
- Kin-Hooi Dia
- G01 - MEASURING TESTING
Information Patent Grant
Embedded test apparatus for high speed interfaces
- Patent number 11,703,542
- Issue date Jul 18, 2023
- Infineon Technologies AG
- Dietmar Koenig
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test pattern generation circuitry in multi power domain s...
- Patent number 11,680,982
- Issue date Jun 20, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 11,675,004
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for reducing interference of power on/off to har...
- Patent number 11,644,502
- Issue date May 9, 2023
- ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO., LTD.
- Zhihua Ge
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and method for measuring a device under test
- Patent number 11,639,965
- Issue date May 2, 2023
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for adjusting a setup of testing a device under te...
- Patent number 11,630,146
- Issue date Apr 18, 2023
- Rohde & Schwarz GmbH & Co. KG
- Simon Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method to a memory device
- Patent number 11,598,806
- Issue date Mar 7, 2023
- NANYA TECHNOLOGY CORPORATION
- Yu-Wei Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Method for real-time firmware configuration and debugging apparatus
- Patent number 11,585,850
- Issue date Feb 21, 2023
- Realtek Semiconductor Corp.
- Yue-Feng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wafer scale testing using a 2 signal JTAG interface
- Patent number 11,561,258
- Issue date Jan 24, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Load testing device
- Patent number 11,555,861
- Issue date Jan 17, 2023
- Tatsumi Ryoki Co., Ltd
- Toyoshi Kondo
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...
- Publication number 20240426899
- Publication date Dec 26, 2024
- Rohm Co., Ltd.
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
STORAGE SYSTEM AND AN OPERATING METHOD THEREOF
- Publication number 20240353486
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Ganggyu LEE
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Utilizing Idle Computing Capacity
- Publication number 20240329133
- Publication date Oct 3, 2024
- Tapster Robotics, Inc.
- Jason Randolph Huggins
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20240319266
- Publication date Sep 26, 2024
- LAPIS Technology Co., Ltd.
- Takahiro YONEDA
- G01 - MEASURING TESTING
Information Patent Application
PORs TESTING IN MULTIPLE POWER DOMAIN DEVICES
- Publication number 20240264229
- Publication date Aug 8, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Latchup Detector and Clock Loss Detector
- Publication number 20240248134
- Publication date Jul 25, 2024
- Omni Design Technologies, Inc.
- Manar Ibrahim El-Chammas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETERMINING A CORRELATION BETWEEN POWER DISTURBANCES AND DATA ERORS...
- Publication number 20240192272
- Publication date Jun 13, 2024
- Teradyne, Inc.
- Christopher C. JONES
- G01 - MEASURING TESTING
Information Patent Application
SCAN FLIP-FLOP, SCAN CHAIN CIRCUIT INCLUDING THE SAME, AND CONTROL...
- Publication number 20240142521
- Publication date May 2, 2024
- Research & Business Foundation Sungkyunkwan University
- Changyoun Im
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR PERFORMING CLOCK GATING IN ELECTRO...
- Publication number 20240110976
- Publication date Apr 4, 2024
- Realtek Semiconductor Corp.
- Ching-Feng Huang
- G01 - MEASURING TESTING
Information Patent Application
Functional Circuit Block Harvesting in Computer Systems
- Publication number 20240103074
- Publication date Mar 28, 2024
- Apple Inc.
- Peter A. Lisherness
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
- Publication number 20240094288
- Publication date Mar 21, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20240094281
- Publication date Mar 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...
- Publication number 20240094287
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND/OR APPARATUS FOR CONTROLLING A POWER SIGNAL
- Publication number 20240053401
- Publication date Feb 15, 2024
- ARM Limited
- Chi-Hsiang Huang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...
- Publication number 20240012052
- Publication date Jan 11, 2024
- Rohm Co., Ltd.
- Kyoji MARUMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD TO DETECT OVERLOAD RESOLUTIONS FOR AIRCRAFT ENERGY MANAGEMEN...
- Publication number 20230400495
- Publication date Dec 14, 2023
- Collins Aerospace Ireland, Limited
- Marcello TORCHIO
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
METHOD FOR GENERATING A SIGNAL TEST SPECIFICATION, DATA PROCESSING...
- Publication number 20230384371
- Publication date Nov 30, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Herdin
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD
- Publication number 20230314506
- Publication date Oct 5, 2023
- STMicroelectronics International N.V.
- Roberto Colombo
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...
- Publication number 20230288480
- Publication date Sep 14, 2023
- Intel Corporation
- Mahesh DESHMANE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
- Publication number 20230273257
- Publication date Aug 31, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
GLITCH DETECTOR WITH HIGH RELIABILITY
- Publication number 20230228813
- Publication date Jul 20, 2023
- MEDIATEK INC.
- Tze-Chien Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING
- Publication number 20230213579
- Publication date Jul 6, 2023
- MEDIATEK INC.
- Pin-Wen CHEN
- G01 - MEASURING TESTING
Information Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
- Publication number 20230160959
- Publication date May 25, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, A...
- Publication number 20230134661
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST PATTERN GENERATION CIRCUITRY IN MULTI POWER DOMAIN S...
- Publication number 20230128466
- Publication date Apr 27, 2023
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
- Publication number 20230070575
- Publication date Mar 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
CURRENT LOAD CIRCUIT AND CHIP FOR TESTING POWER SUPPLY CIRCUIT
- Publication number 20230037496
- Publication date Feb 9, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- HAN-CHIEH HSIEH
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR DETECTING PERTURBATIONS IN A LOGIC CIRCUIT AND LOGIC CIR...
- Publication number 20230027416
- Publication date Jan 26, 2023
- NAGRAVISION SARL
- Jean-Marie MARTIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20230003790
- Publication date Jan 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM-ON-A-CHIP TESTING FOR ENERGY HARVESTING DEVICES
- Publication number 20230003795
- Publication date Jan 5, 2023
- ARM Limited
- Fernando Garcia Redondo
- G06 - COMPUTING CALCULATING COUNTING

Power aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Telephone connector to audio connector mapping and leveling device

Module and method for initializing and calibrating a product during...

Power circuit and testing device

Single pin DFT architecture for USBPD ICs

Board adapter device, test method, system, apparatus, and device, a...

Techniques to enable integrated circuit debug across low power states

Method of testing an integrated circuit and testing system

Method for detecting perturbations in a logic circuit and logic cir...

System, apparatus, and method for testing of an electrical system

Circuit screening system and circuit screening method

System-on-a-chip testing for energy harvesting devices

Power supply glitch detection

Apparatus and method for controlling unit specific junction tempera...

Smart storage of shutdown LBIST status

Wafer scale testing using a 2 signal JTAG interface

Abnormality detection method and abnormality detection apparatus

Integrated circuit, power verification circuit and power verificati...

Power system component testing using a power system emulator-based...

Method for testing lifetime of surface state carrier of semiconductor

Multi-bit flip-flop with power saving feature

Embedded test apparatus for high speed interfaces

Automatic test pattern generation circuitry in multi power domain s...

Method and apparatus for detecting defective logic devices

Circuit and method for reducing interference of power on/off to har...

Measurement device and method for measuring a device under test

Test arrangement for adjusting a setup of testing a device under te...

Test apparatus and test method to a memory device

Method for real-time firmware configuration and debugging apparatus

Wafer scale testing using a 2 signal JTAG interface

Load testing device

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...

STORAGE SYSTEM AND AN OPERATING METHOD THEREOF

System and Method for Utilizing Idle Computing Capacity

INTEGRATED CIRCUIT

PORs TESTING IN MULTIPLE POWER DOMAIN DEVICES

Latchup Detector and Clock Loss Detector

DETERMINING A CORRELATION BETWEEN POWER DISTURBANCES AND DATA ERORS...

SCAN FLIP-FLOP, SCAN CHAIN CIRCUIT INCLUDING THE SAME, AND CONTROL...

ELECTRONIC DEVICE AND METHOD FOR PERFORMING CLOCK GATING IN ELECTRO...

Functional Circuit Block Harvesting in Computer Systems

CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...

SYSTEM, METHOD AND/OR APPARATUS FOR CONTROLLING A POWER SIGNAL

MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...

METHOD TO DETECT OVERLOAD RESOLUTIONS FOR AIRCRAFT ENERGY MANAGEMEN...

METHOD FOR GENERATING A SIGNAL TEST SPECIFICATION, DATA PROCESSING...

PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD

APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...

METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES

GLITCH DETECTOR WITH HIGH RELIABILITY

CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING

WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE

BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, A...

AUTOMATIC TEST PATTERN GENERATION CIRCUITRY IN MULTI POWER DOMAIN S...

CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD

CURRENT LOAD CIRCUIT AND CHIP FOR TESTING POWER SUPPLY CIRCUIT

METHOD FOR DETECTING PERTURBATIONS IN A LOGIC CIRCUIT AND LOGIC CIR...

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

SYSTEM-ON-A-CHIP TESTING FOR ENERGY HARVESTING DEVICES