printed circuit board [PCB]

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CPC
G01N2223/6113

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/6113printed circuit board [PCB]

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
Inspection position identification method, three-dimensional image...
- Patent number 11,835,475
- Issue date Dec 5, 2023
- Saki Corporation
- Takuma Hirayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
- Patent number 11,733,185
- Issue date Aug 22, 2023
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Anti-vibration fixturing system for nondestructive testing
- Patent number 11,555,793
- Issue date Jan 17, 2023
- International Business Machines Corporation
- Theron Lee Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Inspection position identification method, three-dimensional image...
- Patent number 11,422,099
- Issue date Aug 23, 2022
- Saki Corporation
- Takuma Hirayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining tilt angle in patterned arrays of high aspect-ratio str...
- Patent number 11,181,489
- Issue date Nov 23, 2021
- Lam Research Corporation
- William Dean Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,948,425
- Issue date Mar 16, 2021
- Nordson Corporation
- William T. Walker
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 10,908,103
- Issue date Feb 2, 2021
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system to automatically inspect parts using x-rays
- Patent number 10,823,685
- Issue date Nov 3, 2020
- Creative Electron, Inc.
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for checking an electronic component
- Patent number 10,571,413
- Issue date Feb 25, 2020
- YXLON International GmbH
- Keith Bryant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,473,596
- Issue date Nov 12, 2019
- Shimadzu Corporation
- Goro Kambe
- G01 - MEASURING TESTING
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 10,445,875
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,393,675
- Issue date Aug 27, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
Radiation image acquisition system
- Patent number 10,234,406
- Issue date Mar 19, 2019
- Hamamatsu Photonics K.K.
- Mototsugu Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,215,716
- Issue date Feb 26, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
Fixture to support reel-to-reel inspection of semiconductor devices...
- Patent number 10,167,155
- Issue date Jan 1, 2019
- Raytheon Company
- Stephen T. Fasolino
- G01 - MEASURING TESTING
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 9,990,708
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Void evaluation apparatus and void evaluation method in the solder
- Patent number 9,965,849
- Issue date May 8, 2018
- Osaka University
- Takashi Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the measurement of a measurement object by means of X-ra...
- Patent number 9,885,676
- Issue date Feb 6, 2018
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Volker Roessiger
- G01 - MEASURING TESTING
Information Patent Grant
Masks that selectively attentuate radiation for inspection of print...
- Patent number 9,869,643
- Issue date Jan 16, 2018
- Cisco Technology, Inc.
- ShiJie Wen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,810,649
- Issue date Nov 7, 2017
- Hitachi High-Tech Science Corporation
- Toshiyuki Takahara
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Overlay error measuring device and computer program
- Patent number 9,696,150
- Issue date Jul 4, 2017
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern shape evaluation device and method
- Patent number 9,679,371
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Shindo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation image acquisition system
- Patent number 9,500,600
- Issue date Nov 22, 2016
- Hamamatsu Photonics K.K.
- Mototsugu Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic apparatus and an image processing method therefore
- Patent number 9,476,844
- Issue date Oct 25, 2016
- Shimadzu Corporation
- Yusuke Tagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and a system for recognizing voids in a bump
- Patent number 9,335,283
- Issue date May 10, 2016
- XWINSYS LTD.
- Micha Geffen
- G01 - MEASURING TESTING
Information Patent Grant
Complex inspection device for printed-substrate
- Patent number 9,329,139
- Issue date May 3, 2016
- Yamaha Hatsudoki Kabushiki Kaisha
- Yasumichi Itou
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray inspection device
- Patent number 9,322,790
- Issue date Apr 26, 2016
- Yamaha Hatsudoki Kabushiki Kaisha
- Naonobu Ookawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray inspection method and device
- Patent number 9,256,930
- Issue date Feb 9, 2016
- Yamaha Hatsudoki Kabushiki Kaisha
- Yoshikuni Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANTI-VIBRATION FIXTURING SYSTEM FOR NONDESTRUCTIVE TESTING
- Publication number 20230039471
- Publication date Feb 9, 2023
- International Business Machines Corporation
- Theron Lee Lewis
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION POSITION IDENTIFICATION METHOD, THREE-DIMENSIONAL IMAGE...
- Publication number 20220291147
- Publication date Sep 15, 2022
- SAKI CORPORATION
- Takuma HIRAYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING LOCAL ELECTRIC FIELDS
- Publication number 20210080411
- Publication date Mar 18, 2021
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Keshav Moreshwar Dani
- G01 - MEASURING TESTING
Information Patent Application
Method to Automatically Inspect Parts Using X-Rays
- Publication number 20210055235
- Publication date Feb 25, 2021
- CREATIVE ELECTRON, INC.
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System to Automatically Inspect Parts Using X-Rays
- Publication number 20190219525
- Publication date Jul 18, 2019
- Guilherme Cardoso
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE X-RAY TOMOSYNTHESIS FOR RAPID ANALYSIS OF INTEGRATED CIRC...
- Publication number 20190206652
- Publication date Jul 4, 2019
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G01 - MEASURING TESTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20180247400
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHECKING AN ELECTRONIC COMPONENT
- Publication number 20180136145
- Publication date May 17, 2018
- YXLON INTERNATIONAL GMBH
- Keith BRYANT
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170011973
- Publication date Jan 12, 2017
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20140334605
- Publication date Nov 13, 2014
- YAMAHA HATSUDOKI KABUSHIKI KAISHA
- Naonobu Ookawa
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC PEAK TRACKING IN X-RAY PHOTOELECTRON SPECTROSCOPY MEASUREME...
- Publication number 20140264015
- Publication date Sep 18, 2014
- International Business Machines Corporation
- Bing Sun
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC APPARATUS AND AN IMAGE PROCESSING METHOD THEREFORE
- Publication number 20140205058
- Publication date Jul 24, 2014
- Shimadzu Corporation
- Yusuke TAGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A SYSTEM FOR RECOGNIZING VOIDS IN A BUMP
- Publication number 20140161224
- Publication date Jun 12, 2014
- XWINSYS LTD.
- MICHA Geffen
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION APPARATUS
- Publication number 20130272497
- Publication date Oct 17, 2013
- Horiba, Ltd.
- Satoru GOTO
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspector
- Publication number 20130195244
- Publication date Aug 1, 2013
- X-RAY INSPECTOR
- Yoshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PLANAR IMAGING ON SEMICONDUCTOR CHIPS USING FOCUSED ION BEAM
- Publication number 20130068948
- Publication date Mar 21, 2013
- INOTERA MEMORIES, INC.
- BI-JEN CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20110255660
- Publication date Oct 20, 2011
- Omron Corporation
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20110249795
- Publication date Oct 13, 2011
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, X-RAY INSPECTION METHOD, X-RAY INSPECTI...
- Publication number 20110222655
- Publication date Sep 15, 2011
- Omron Corporation
- Kiyoshi Murakami
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
- Publication number 20100329532
- Publication date Dec 30, 2010
- OMRON CORPORATION
- Masayuki Masuda
- G01 - MEASURING TESTING

printed circuit board [PCB]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample holder, system and method

Inspection position identification method, three-dimensional image...

Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...

Anti-vibration fixturing system for nondestructive testing

Inspection position identification method, three-dimensional image...

Determining tilt angle in patterned arrays of high aspect-ratio str...

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

X-ray inspection apparatus for inspecting semiconductor wafers

X-ray fluorescence spectrometer

Method and system to automatically inspect parts using x-rays

Method for checking an electronic component

X-ray inspection apparatus

Pattern-measuring apparatus and semiconductor-measuring system

X-ray inspection apparatus

Radiation image acquisition system

X-ray inspection apparatus for inspecting semiconductor wafers

Fixture to support reel-to-reel inspection of semiconductor devices...

Pattern-measuring apparatus and semiconductor-measuring system

Void evaluation apparatus and void evaluation method in the solder

Method for the measurement of a measurement object by means of X-ra...

Masks that selectively attentuate radiation for inspection of print...

X-ray fluorescence analyzer

Overlay error measuring device and computer program

Pattern shape evaluation device and method

Radiation image acquisition system

Radiographic apparatus and an image processing method therefore

Method and a system for recognizing voids in a bump

Complex inspection device for printed-substrate

X-ray inspection device

X-ray inspection method and device

Patents Applicationslast 30 patents

ANTI-VIBRATION FIXTURING SYSTEM FOR NONDESTRUCTIVE TESTING

INSPECTION POSITION IDENTIFICATION METHOD, THREE-DIMENSIONAL IMAGE...

METHOD OF GENERATING LOCAL ELECTRIC FIELDS

Method to Automatically Inspect Parts Using X-Rays

Method and System to Automatically Inspect Parts Using X-Rays

NANOSCALE X-RAY TOMOSYNTHESIS FOR RAPID ANALYSIS OF INTEGRATED CIRC...

Pattern-Measuring Apparatus and Semiconductor-Measuring System

METHOD FOR CHECKING AN ELECTRONIC COMPONENT

X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS

X-RAY INSPECTION DEVICE

DYNAMIC PEAK TRACKING IN X-RAY PHOTOELECTRON SPECTROSCOPY MEASUREME...

RADIOGRAPHIC APPARATUS AND AN IMAGE PROCESSING METHOD THEREFORE

METHOD AND A SYSTEM FOR RECOGNIZING VOIDS IN A BUMP

X-RAY DETECTION APPARATUS

X-Ray Inspector

METHOD OF PLANAR IMAGING ON SEMICONDUCTOR CHIPS USING FOCUSED ION BEAM

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY INSPECTION APPARATUS, X-RAY INSPECTION METHOD, X-RAY INSPECTI...

X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD