Prisms, wedges

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G01J1/0477

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

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G01J1/0477Prisms, wedges

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Patents Grantslast 30 patents

Information Patent Grant
Light detection systems and methods of use thereof
- Patent number 11,953,420
- Issue date Apr 9, 2024
- Becton, Dickinson and Company
- Jizuo Zou
- G01 - MEASURING TESTING
Information Patent Grant
Target device for characterizing terahertz imaging systems
- Patent number 11,892,620
- Issue date Feb 6, 2024
- Institut National D'Optique
- Alex Paquet
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detection apparatus and information acquisitio...
- Patent number 11,874,162
- Issue date Jan 16, 2024
- Kyocera Corporation
- Eri Takeuchi
- G02 - OPTICS
Information Patent Grant
Optical receiving device and optical sensing device comprising a re...
- Patent number 11,796,385
- Issue date Oct 24, 2023
- SUTENG INNOVATION TECHNOLOGY CO., LTD.
- Zhihong Qi
- G01 - MEASURING TESTING
Information Patent Grant
Optical module
- Patent number 11,616,575
- Issue date Mar 28, 2023
- Hisense Broadband Multimedia Technologies Co., Ltd.
- Dan Li
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter reductant anamorphic beam sampler
- Patent number 11,460,711
- Issue date Oct 4, 2022
- TINTOMETER, GMBH
- Perry Palumbo
- G02 - OPTICS
Information Patent Grant
Laser beam monitoring system
- Patent number 11,366,399
- Issue date Jun 21, 2022
- ASML Netherlands B.V.
- Hendrikus Robertus Marie Van Greevenbroek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bendable substrate with a device
- Patent number 11,181,420
- Issue date Nov 23, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Heinrich Grueger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic device
- Patent number 11,099,062
- Issue date Aug 24, 2021
- BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
- Chaoxi Chen
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Light detection systems and methods of use thereof
- Patent number 10,976,236
- Issue date Apr 13, 2021
- Becton, Dickinson and Company
- Jizuo Zou
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating small right angle prism mirrors involving 3D...
- Patent number 10,841,547
- Issue date Nov 17, 2020
- Himax Technologies Limited
- Han-Yi Kuo
- G02 - OPTICS
Information Patent Grant
Image sensor including color splitting element and method of operat...
- Patent number 10,834,343
- Issue date Nov 10, 2020
- Samsung Electronics Co., Ltd.
- Sunghyun Nam
- G01 - MEASURING TESTING
Information Patent Grant
Scene generation using surface plasmon polaritons
- Patent number 10,788,360
- Issue date Sep 29, 2020
- Truventic, LLC
- Pedro N. Figueiredo
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensing module and electronic apparatus
- Patent number 10,775,233
- Issue date Sep 15, 2020
- PixArt Imaging Inc.
- Hui-Hsuan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Refractive index measuring device and refractive index measuring me...
- Patent number 10,627,346
- Issue date Apr 21, 2020
- Shimadzu Corporation
- Tetsuya Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam profiler unit and laser processing apparatus
- Patent number 10,532,433
- Issue date Jan 14, 2020
- Disco Corporation
- Junichi Kuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Image sensor module with turning prism
- Patent number 10,524,643
- Issue date Jan 7, 2020
- Karl Storz Endovision, Inc.
- Dashiell Birnkrant
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical parameter measurement device and optical parameter measurem...
- Patent number 10,401,219
- Issue date Sep 3, 2019
- BOE Technology Group Co., Ltd.
- Yingying Liu
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter reductant anamorphic beam sampler
- Patent number 10,384,152
- Issue date Aug 20, 2019
- Perry Palumbo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical sensing module and electronic apparatus
- Patent number 10,168,205
- Issue date Jan 1, 2019
- PixArt Imaging Inc.
- Hui-Hsuan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Light beam measurement device, laser apparatus, and light beam sepa...
- Patent number 10,151,640
- Issue date Dec 11, 2018
- Gigaphoton Inc.
- Masato Moriya
- G02 - OPTICS
Information Patent Grant
Array of encoders for alignment measurement
- Patent number 10,078,269
- Issue date Sep 18, 2018
- Nikon Corporation
- Eric Peter Goodwin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light beam measurement device, laser apparatus, and light beam sepa...
- Patent number 9,835,495
- Issue date Dec 5, 2017
- Gigaphoton Inc.
- Masato Moriya
- G02 - OPTICS
Information Patent Grant
Deflecting prism and measuring assembly
- Patent number 9,703,022
- Issue date Jul 11, 2017
- Anton Paar GmbH
- Claus Cagran
- G02 - OPTICS
Information Patent Grant
Sensor arrangement with a silicon-based optical sensor and a substr...
- Patent number 9,595,554
- Issue date Mar 14, 2017
- MAZeT GmbH
- Gunter Siess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting system
- Patent number 9,574,940
- Issue date Feb 21, 2017
- National Central University
- Ching-Cherng Sun
- G01 - MEASURING TESTING
Information Patent Grant
Downpipe sensor system and method for single grain recognition
- Patent number 9,575,210
- Issue date Feb 21, 2017
- Mueller-Elektronik GmbH & Co. KG
- Martin Liebich
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the shape of a wave-front of an...
- Patent number 9,442,006
- Issue date Sep 13, 2016
- Berliner Glas KGaA Herbert Kubatz GmbH & Co.
- Thomas Oberdoerster
- G01 - MEASURING TESTING
Information Patent Grant
Modular optics for scanning engine having beam combining optics wit...
- Patent number 9,329,080
- Issue date May 3, 2016
- Aplle Inc.
- Alexander Shpunt
- G01 - MEASURING TESTING
Information Patent Grant
Image display apparatus having a prism optical system including a p...
- Patent number 9,285,514
- Issue date Mar 15, 2016
- Olympus Corporation
- Koichi Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING SPATIAL CHARACTERISTICS OF OPTI...
- Publication number 20240426655
- Publication date Dec 26, 2024
- VulcanForms Inc.
- Michael von Dadelszen
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
Device and Method for Determining a Focal Point
- Publication number 20240102855
- Publication date Mar 28, 2024
- Primes GmbH Messtechnik für die Produktion mit Laserstrahlung
- Reinhard Kramer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SPACE-BASED IMAGING DEVICE AND METHOD OF MANUFACTURE THEREOF
- Publication number 20240010365
- Publication date Jan 11, 2024
- The Johns Hopkins University
- David B. Shrekenhamer
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
OPTICAL RECEIVING DEVICE AND OPTICAL SENSING DEVICE
- Publication number 20230175885
- Publication date Jun 8, 2023
- SUTENG INNOVATION TECHNOLOGY CO., LTD.
- Zhihong QI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM, OPTICAL SENSING UNIT AND OPTICAL SENSING MODULE
- Publication number 20230065865
- Publication date Mar 2, 2023
- Egis Technology Inc.
- Chen-Wei Fan
- G01 - MEASURING TESTING
Information Patent Application
TARGET DEVICE FOR CHARACTERIZING TERAHERTZ IMAGING SYSTEMS
- Publication number 20210396574
- Publication date Dec 23, 2021
- Institut National D'Optique
- Alex PAQUET
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DETECTION SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20210199559
- Publication date Jul 1, 2021
- Becton, Dickinson and Company
- Jizuo Zou
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS AND INFORMATION ACQUISITIO...
- Publication number 20210181013
- Publication date Jun 17, 2021
- Kyocera Corporation
- Eri TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20200386614
- Publication date Dec 10, 2020
- Beijing Xiaomi Mobile Software Co., Ltd.
- Chaoxi Chen
- G01 - MEASURING TESTING
Information Patent Application
Scene Generation Using Surface Plasmon Polaritons
- Publication number 20200348169
- Publication date Nov 5, 2020
- Truventic, LLC
- Pedro N. Figueiredo
- G01 - MEASURING TESTING
Information Patent Application
Laser Beam Monitoring System
- Publication number 20200341386
- Publication date Oct 29, 2020
- ASML NETHERLANDS B.V.
- Hendrikus Robertus Marie VAN GREEVENBROEK
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE
- Publication number 20200328815
- Publication date Oct 15, 2020
- HISENSE BROADBAND MULTIMEDIA TECHNOLOGIES CO., LTD
- Dan LI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME
- Publication number 20200182688
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Jeonggyu JO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BACKSCATTER REDUCTANT ANAMORPHIC BEAM SAMPLER
- Publication number 20190369406
- Publication date Dec 5, 2019
- TINTOMETER, GMBH
- Perry Palumbo
- G01 - MEASURING TESTING
Information Patent Application
Scene Generation Using Surface Plasmon Polaritons
- Publication number 20190234795
- Publication date Aug 1, 2019
- Truventic, LLC
- Pedro N. Figueiredo
- G01 - MEASURING TESTING
Information Patent Application
PROJECTING SYSTEM, SMALL RIGHT ANGLE PRISM MIRRORS, AND METHOD FOR...
- Publication number 20190215499
- Publication date Jul 11, 2019
- HIMAX TECHNOLOGIES LIMITED
- Han-Yi Kuo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image Sensor Module With Turning Prism
- Publication number 20190133423
- Publication date May 9, 2019
- Karl Storz Endovision, Inc.
- Dashiell Birnkrant
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REFRACTIVE INDEX MEASURING DEVICE AND REFRACTIVE INDEX MEASURING ME...
- Publication number 20190094139
- Publication date Mar 28, 2019
- Shimadzu Corporation
- Tetsuya NAGAI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING MODULE AND ELECTRONIC APPARATUS
- Publication number 20190078931
- Publication date Mar 14, 2019
- PIXART IMAGING INC.
- HUI-HSUAN CHEN
- G01 - MEASURING TESTING
Information Patent Application
LASER BEAM PROFILER UNIT AND LASER PROCESSING APPARATUS
- Publication number 20190061063
- Publication date Feb 28, 2019
- Disco Corporation
- Junichi Kuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL PARAMETER MEASUREMENT DEVICE AND OPTICAL PARAMETER MEASUREM...
- Publication number 20190063992
- Publication date Feb 28, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Yingying LIU
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR INCLUDING COLOR SPLITTING ELEMENT AND METHOD OF OPERAT...
- Publication number 20180131882
- Publication date May 10, 2018
- Samsung Electronics Co., Ltd.
- Sunghyun NAM
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER REDUCTANT ANAMORPHIC BEAM SAMPLER
- Publication number 20170248795
- Publication date Aug 31, 2017
- TINTOMETER, GMBH
- Perry Palumbo
- G02 - OPTICS
Information Patent Application
ARRAY OF ENCODERS FOR ALIGNMENT MEASUREMENT
- Publication number 20170097574
- Publication date Apr 6, 2017
- Nikon Corporation
- ERIC PETER GOODWIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING THE SHAPE OF A WAVE-FRONT OF AN...
- Publication number 20160018259
- Publication date Jan 21, 2016
- Berliner Glas KGaA Herbert Kubatz GmbH & Co.
- Thomas OBERDOERSTER
- G01 - MEASURING TESTING
Information Patent Application
Downpipe sensor and method for single grain recognition
- Publication number 20150293257
- Publication date Oct 15, 2015
- MUELLER-ELEKTRONIK GMBH & CO. KG
- MARTIN LIEBICH
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
DEFLECTING PRISM AND MEASURING ASSEMBLY
- Publication number 20150293274
- Publication date Oct 15, 2015
- ANTON PAAR GMBH
- CLAUS CAGRAN
- G02 - OPTICS
Information Patent Application
MULTI-WAVELENGTH FLAME SCANNING
- Publication number 20150260568
- Publication date Sep 17, 2015
- Honeywell International Inc.
- Joseph S.F. Goh
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING MODULE AND ELECTRONIC APPARATUS
- Publication number 20150008329
- Publication date Jan 8, 2015
- PIXART IMAGING INC.
- HUI-HSUAN CHEN
- G01 - MEASURING TESTING
Information Patent Application
Sensor Arrangement with a Silicon-Based Optical Sensor and a Substr...
- Publication number 20140339663
- Publication date Nov 20, 2014
- MAZeT GmbH
- Gunter SIESS
- G01 - MEASURING TESTING

Prisms, wedges

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Light detection systems and methods of use thereof

Target device for characterizing terahertz imaging systems

Electromagnetic wave detection apparatus and information acquisitio...

Optical receiving device and optical sensing device comprising a re...

Optical module

Backscatter reductant anamorphic beam sampler

Laser beam monitoring system

Bendable substrate with a device

Electronic device

Light detection systems and methods of use thereof

Method for fabricating small right angle prism mirrors involving 3D...

Image sensor including color splitting element and method of operat...

Scene generation using surface plasmon polaritons

Optical sensing module and electronic apparatus

Refractive index measuring device and refractive index measuring me...

Laser beam profiler unit and laser processing apparatus

Image sensor module with turning prism

Optical parameter measurement device and optical parameter measurem...

Backscatter reductant anamorphic beam sampler

Optical sensing module and electronic apparatus

Light beam measurement device, laser apparatus, and light beam sepa...

Array of encoders for alignment measurement

Light beam measurement device, laser apparatus, and light beam sepa...

Deflecting prism and measuring assembly

Sensor arrangement with a silicon-based optical sensor and a substr...

Detecting system

Downpipe sensor system and method for single grain recognition

Method and apparatus for measuring the shape of a wave-front of an...

Modular optics for scanning engine having beam combining optics wit...

Image display apparatus having a prism optical system including a p...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DETERMINING SPATIAL CHARACTERISTICS OF OPTI...

Device and Method for Determining a Focal Point

SPACE-BASED IMAGING DEVICE AND METHOD OF MANUFACTURE THEREOF

OPTICAL RECEIVING DEVICE AND OPTICAL SENSING DEVICE

OPTICAL SYSTEM, OPTICAL SENSING UNIT AND OPTICAL SENSING MODULE

TARGET DEVICE FOR CHARACTERIZING TERAHERTZ IMAGING SYSTEMS

LIGHT DETECTION SYSTEMS AND METHODS OF USE THEREOF

ELECTROMAGNETIC WAVE DETECTION APPARATUS AND INFORMATION ACQUISITIO...

ELECTRONIC DEVICE

Scene Generation Using Surface Plasmon Polaritons

Laser Beam Monitoring System

OPTICAL MODULE

OPTICAL SENSOR DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME

BACKSCATTER REDUCTANT ANAMORPHIC BEAM SAMPLER

Scene Generation Using Surface Plasmon Polaritons

PROJECTING SYSTEM, SMALL RIGHT ANGLE PRISM MIRRORS, AND METHOD FOR...

Image Sensor Module With Turning Prism

REFRACTIVE INDEX MEASURING DEVICE AND REFRACTIVE INDEX MEASURING ME...

OPTICAL SENSING MODULE AND ELECTRONIC APPARATUS

LASER BEAM PROFILER UNIT AND LASER PROCESSING APPARATUS

OPTICAL PARAMETER MEASUREMENT DEVICE AND OPTICAL PARAMETER MEASUREM...

IMAGE SENSOR INCLUDING COLOR SPLITTING ELEMENT AND METHOD OF OPERAT...

BACKSCATTER REDUCTANT ANAMORPHIC BEAM SAMPLER

ARRAY OF ENCODERS FOR ALIGNMENT MEASUREMENT

METHOD AND APPARATUS FOR MEASURING THE SHAPE OF A WAVE-FRONT OF AN...

Downpipe sensor and method for single grain recognition

DEFLECTING PRISM AND MEASURING ASSEMBLY

MULTI-WAVELENGTH FLAME SCANNING

OPTICAL SENSING MODULE AND ELECTRONIC APPARATUS

Sensor Arrangement with a Silicon-Based Optical Sensor and a Substr...