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H01J2237/1514

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/1514Prisms

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Interference optical system unit, charged particle beam interferenc...
- Patent number 10,770,264
- Issue date Sep 8, 2020
- Riken
- Yoh Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference electron microscope
- Patent number 8,785,851
- Issue date Jul 22, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for measuring nanoscale deformations
- Patent number 8,502,143
- Issue date Aug 6, 2013
- Centre National de la Recherche Scientifique
- Martin Hytch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Twin beam charged particle column and method of operating thereof
- Patent number 8,378,299
- Issue date Feb 19, 2013
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 8,362,428
- Issue date Jan 29, 2013
- Medical Research Council
- John Berriman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method for observing specimen...
- Patent number 8,193,494
- Issue date Jun 5, 2012
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 7,923,685
- Issue date Apr 12, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer
- Patent number 7,872,755
- Issue date Jan 18, 2011
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Phase plate for electron microscope and method for manufacturing same
- Patent number 7,851,757
- Issue date Dec 14, 2010
- Nagayama IP Holdings, LLC
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron interferometer or electron microscope
- Patent number 7,816,648
- Issue date Oct 19, 2010
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography system
- Patent number 7,791,023
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer having three electron biprisms
- Patent number 7,750,298
- Issue date Jul 6, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam equipment
- Patent number 7,655,905
- Issue date Feb 2, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and combined illumination lens
- Patent number 7,601,957
- Issue date Oct 13, 2009
- National University Corporation Kyoto Institute of Technology
- Hisamitsu Endoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer
- Patent number 7,538,323
- Issue date May 26, 2009
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic electron microscope
- Patent number 7,518,111
- Issue date Apr 14, 2009
- Hitachi, Ltd.
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method, manufacturing method of semiconductor...
- Patent number 7,504,625
- Issue date Mar 17, 2009
- Kabushiki Kaisha Toshiba
- Yuichiro Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning interference electron microscope
- Patent number 7,417,227
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope equipped with magnetic microprobe
- Patent number 7,241,995
- Issue date Jul 10, 2007
- TOHOKU UNIVERSITY
- Daisuke Shindo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for improving spatial resolution of electron holo...
- Patent number 7,102,145
- Issue date Sep 5, 2006
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography method
- Patent number 7,015,469
- Issue date Mar 21, 2006
- Jeol USA, Inc.
- Yun-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and three-dimensional observing me...
- Patent number 7,012,253
- Issue date Mar 14, 2006
- Nagoya University
- Takayoshi Tanji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference measuring device
- Patent number 6,950,195
- Issue date Sep 27, 2005
- Hitachi, Ltd.
- Junji Endo
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope equipped with electron biprism
- Patent number 6,759,656
- Issue date Jul 6, 2004
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography microscope
- Patent number 6,617,580
- Issue date Sep 9, 2003
- UT-Battelle, LLC
- Edgar Voelkl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography transmission electron microscope
- Patent number 6,573,501
- Issue date Jun 3, 2003
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam SEM for sidewall imaging
- Patent number 6,566,655
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam illumination of blanking aperture array
- Patent number 6,157,039
- Issue date Dec 5, 2000
- Etec Systems, Inc.
- Marian Mankos
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY
- Publication number 20240347314
- Publication date Oct 17, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...
- Publication number 20190295816
- Publication date Sep 26, 2019
- Riken
- Yoh IWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE ELECTRON MICROSCOPE
- Publication number 20130313432
- Publication date Nov 28, 2013
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Biprism Device and Electron Beam Device
- Publication number 20120241612
- Publication date Sep 27, 2012
- HITACHI LTD
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWIN BEAM CHARGED PARTICLE COLUMN AND METHOD OF OPERATING THEREOF
- Publication number 20110220795
- Publication date Sep 15, 2011
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Jürgen FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR OBSERVING SPECIMEN...
- Publication number 20110031395
- Publication date Feb 10, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPONENT FOR MANIPULATING A STREAM OF CHARGED PARTICLES
- Publication number 20110001057
- Publication date Jan 6, 2011
- SGE ANALYTICAL SCIENCES PTY LTD
- Richard Stresau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method, Device and System for Measuring Nanoscale Deformations
- Publication number 20100252735
- Publication date Oct 7, 2010
- Martin Hytch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20100230591
- Publication date Sep 16, 2010
- John Berriman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20090273789
- Publication date Nov 5, 2009
- Riken
- Ken Harada
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20090206256
- Publication date Aug 20, 2009
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Plate for Electron Microscope and Method for Manufacturing Same
- Publication number 20090168142
- Publication date Jul 2, 2009
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC ELECTRON MICROSCOPE
- Publication number 20090078869
- Publication date Mar 26, 2009
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam equipment
- Publication number 20090045339
- Publication date Feb 19, 2009
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
Electron Interferometer or Electron Microscope
- Publication number 20080302965
- Publication date Dec 11, 2008
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20080258058
- Publication date Oct 23, 2008
- Ken Harada
- G02 - OPTICS
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Combined Illumination Lens
- Publication number 20080149833
- Publication date Jun 26, 2008
- Hisamitsu Endoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron Beam Holography Observation Apparatus
- Publication number 20080067375
- Publication date Mar 20, 2008
- Hiroto Kasai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interferometer
- Publication number 20070272861
- Publication date Nov 29, 2007
- RIKEN
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate inspection method, manufacturing method of semiconductor...
- Publication number 20060243907
- Publication date Nov 2, 2006
- Yuichiro Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning interference electron microscope
- Publication number 20060124850
- Publication date Jun 15, 2006
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for improving spatial resolution of electron holo...
- Publication number 20060097167
- Publication date May 11, 2006
- International Business Machines Corporation
- Anthony G. Domenicucci
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron microscope equipped with magnetic microprobe
- Publication number 20050274889
- Publication date Dec 15, 2005
- TOHOKU UNIVERSITY
- Daisuke Shindo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron holography method
- Publication number 20040195506
- Publication date Oct 7, 2004
- IBM Corporation
- Yun-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission electron microscope and three-dimensional observing me...
- Publication number 20040144923
- Publication date Jul 29, 2004
- NAGOYA UNIVERSITY
- Takayoshi Tanji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interference measuring device
- Publication number 20030160969
- Publication date Aug 28, 2003
- Junji Endo
- G01 - MEASURING TESTING
Information Patent Application
Design for an electron holography microscope
- Publication number 20030122075
- Publication date Jul 3, 2003
- Edgar Voelkl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope equipped with electron biprism
- Publication number 20020084412
- Publication date Jul 4, 2002
- JEOL Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Interference optical system unit, charged particle beam interferenc...

Electron microscope for magnetic field measurement and magnetic fie...

Interference electron microscope

Method, device and system for measuring nanoscale deformations

Twin beam charged particle column and method of operating thereof

Transmission electron microscope

Transmission electron microscope and method for observing specimen...

Electron beam device

Interferometer

Phase plate for electron microscope and method for manufacturing same

Electron interferometer or electron microscope

Electron holography system

Transmission electron microscope

Interferometer having three electron biprisms

Charged particle beam equipment

Electron microscope and combined illumination lens

Interferometer

Magnetic electron microscope

Substrate inspection method, manufacturing method of semiconductor...

Scanning interference electron microscope

Electron microscope equipped with magnetic microprobe

System and method for improving spatial resolution of electron holo...

Electron holography method

Transmission electron microscope and three-dimensional observing me...

Interference measuring device

Electron microscope equipped with electron biprism

Electron holography microscope

Holography transmission electron microscope

Multi-beam SEM for sidewall imaging

Charged particle beam illumination of blanking aperture array

Patents Applicationslast 30 patents

TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY

INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...

ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...

INTERFERENCE ELECTRON MICROSCOPE

Electron Beam Biprism Device and Electron Beam Device

TWIN BEAM CHARGED PARTICLE COLUMN AND METHOD OF OPERATING THEREOF

TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR OBSERVING SPECIMEN...

COMPONENT FOR MANIPULATING A STREAM OF CHARGED PARTICLES

Method, Device and System for Measuring Nanoscale Deformations

TRANSMISSION ELECTRON MICROSCOPE

Interferometer

ELECTRON BEAM DEVICE

Phase Plate for Electron Microscope and Method for Manufacturing Same

MAGNETIC ELECTRON MICROSCOPE

Charged particle beam equipment

Electron Interferometer or Electron Microscope

Interferometer

Transmission electron microscope

Electron Microscope and Combined Illumination Lens

Electron Beam Holography Observation Apparatus

Interferometer

Substrate inspection method, manufacturing method of semiconductor...

Scanning interference electron microscope

System and method for improving spatial resolution of electron holo...

Electron microscope equipped with magnetic microprobe

Electron holography method

Transmission electron microscope and three-dimensional observing me...

Interference measuring device

Design for an electron holography microscope

Electron microscope equipped with electron biprism