Probe characteristics

Industry

CPC
G01Q70/08

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Current Industry

G01Q70/08Probe characteristics

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,708,384
- Issue date Jul 25, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Modular scanning probe microscope head
- Patent number 11,474,127
- Issue date Oct 18, 2022
- Rutgers, The State University of New Jersey
- Angela Coe
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,353,478
- Issue date Jun 7, 2022
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope
- Patent number 11,320,456
- Issue date May 3, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,237,185
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,237,187
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,180,514
- Issue date Nov 23, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Data processing device for scanning probe microscope
- Patent number 10,871,505
- Issue date Dec 22, 2020
- SHIMADZIJ CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Microfabricated optical probe
- Patent number 10,161,961
- Issue date Dec 25, 2018
- The United States of America, as represented by the Secretary of Commerce
- Vladimir A. Aksyuk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 10,072,031
- Issue date Sep 11, 2018
- CBN Nano Technologies, Inc.
- Ralph C. Merkle
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Motion sensor integrated nano-probe N/MEMS apparatus, method, and a...
- Patent number 10,048,289
- Issue date Aug 14, 2018
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,773,634
- Issue date Sep 26, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
- Patent number 9,709,597
- Issue date Jul 18, 2017
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit for test tools and method of manufacturing the same
- Patent number 9,465,048
- Issue date Oct 11, 2016
- Inotera Memories, Inc.
- Wei-Chih Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,383,388
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for low force-noise detection in liquids
- Patent number 9,229,028
- Issue date Jan 5, 2016
- The Regents of the University of California
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement of surface energy components and wettability of reservo...
- Patent number 9,110,094
- Issue date Aug 18, 2015
- Schlumberger Technology Corporation
- Ahmed Gmira
- G01 - MEASURING TESTING
Information Patent Grant
AFM fluid delivery/liquid extraction surface sampling/electrostatic...
- Patent number 9,064,680
- Issue date Jun 23, 2015
- UT-Battelle, LLC
- Gary J. Van Berkel
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
- Patent number 8,756,710
- Issue date Jun 17, 2014
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Grant
Characterization structure for an atomic force microscope tip
- Patent number 8,739,310
- Issue date May 27, 2014
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Johann Foucher
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe, measurement system and method
- Patent number 8,484,755
- Issue date Jul 9, 2013
- The Secretary of State for Innovation, Universities and Skills
- Richard Leach
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chemical sensor with oscillating cantilevered probe
- Patent number 8,367,426
- Issue date Feb 5, 2013
- Board of Regents of the Nevada System of Higher Education, on Behalf of the U...
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing an SPM probe with a scanning tip and with a...
- Patent number 8,209,768
- Issue date Jun 26, 2012
- Nanoworld AG
- Thomas Sulzbach
- G01 - MEASURING TESTING
Information Patent Grant
Chemical sensor with oscillating cantilevered probe and mechanical...
- Patent number 7,521,257
- Issue date Apr 21, 2009
- The Board of Regents of the Nevada System of Higher Education on Behalf of th...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe and method of writing and reading information u...
- Patent number 7,464,584
- Issue date Dec 16, 2008
- Samsung Electronics Co., Ltd.
- Hong-sik Park
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
- Publication number 20230204624
- Publication date Jun 29, 2023
- Park Systems Corp.
- JeongHun AN
- G01 - MEASURING TESTING
Information Patent Application
Detection Device for Scanning Probe Microscope
- Publication number 20230184809
- Publication date Jun 15, 2023
- Vmicro
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF
- Publication number 20220349916
- Publication date Nov 3, 2022
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20220291255
- Publication date Sep 15, 2022
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
- Publication number 20220244288
- Publication date Aug 4, 2022
- Massachusetts Institute of Technology
- Fangzhou XIA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20220107340
- Publication date Apr 7, 2022
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20220106338
- Publication date Apr 7, 2022
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20210349127
- Publication date Nov 11, 2021
- Rutgers, The State University of New Jersey
- Angela Coe
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20210317148
- Publication date Oct 14, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- C07 - ORGANIC CHEMISTRY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20210011052
- Publication date Jan 14, 2021
- GTHERANOSTICS CO., LTD.
- Hidemi SHIGEKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20200141972
- Publication date May 7, 2020
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190383855
- Publication date Dec 19, 2019
- SHIMADZU CORPORATION
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20190317126
- Publication date Oct 17, 2019
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...
- Publication number 20190018039
- Publication date Jan 17, 2019
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Application
MICROFABRICATED OPTICAL PROBE
- Publication number 20180210009
- Publication date Jul 26, 2018
- Government of the United States of America, as Represented by the Secretary o...
- Vladimir A. Aksyuk
- G02 - OPTICS
Information Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
- Publication number 20170148603
- Publication date May 25, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu Kozakai
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT FOR TEST TOOLS AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160282385
- Publication date Sep 29, 2016
- Inotera Memories, Inc.
- WEI-CHIH WANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
NANOTUBE BASED TRANSISTOR STRUCTURE, METHOD OF FABRICATION AND USES...
- Publication number 20160285018
- Publication date Sep 29, 2016
- Yeda Research and Development Co. Ltd.
- Illani SHAHAL
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20150301080
- Publication date Oct 22, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150276797
- Publication date Oct 1, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...
- Publication number 20140366230
- Publication date Dec 11, 2014
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Application
MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...
- Publication number 20140331367
- Publication date Nov 6, 2014
- Amit Lal
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM FLUID DELIVERY/LIQUID EXTRACTION SURFACE SAMPLING/ELECTROSTATIC...
- Publication number 20140326872
- Publication date Nov 6, 2014
- Gary J. VAN BERKEL
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS
- Publication number 20140250553
- Publication date Sep 4, 2014
- The Regents of the University of California
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Application
MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...
- Publication number 20140068823
- Publication date Mar 6, 2014
- Wiejie Wang
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION STRUCTURE FOR AN ATOMIC FORCE MICROSCOPE TIP
- Publication number 20130291236
- Publication date Oct 31, 2013
- Johann Foucher
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHEMICAL SENSOR WITH OSCILLATING CANTILEVERED PROBE
- Publication number 20130139285
- Publication date May 30, 2013
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY

Probe characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and devices for extending a time period until changing a me...

Coated active cantilever probes for use in topography imaging in op...

Apparatus and method for a scanning probe microscope

Systems and methods for mechanosynthesis

Method and apparatus for examining a measuring tip of a scanning pr...

Modular scanning probe microscope head

Methods and devices for extending a time period until changing a me...

Scanning probe microscope

Apparatus and method for a scanning probe microscope

Method and apparatus for examining a measuring tip of a scanning pr...

Systems and methods for mechanosynthesis

Data processing device for scanning probe microscope

Microfabricated optical probe

Systems and methods for mechanosynthesis

Motion sensor integrated nano-probe N/MEMS apparatus, method, and a...

Automated atomic force microscope and the operation thereof

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Miniaturized cantilever probe for scanning probe microscopy and fab...

Probe unit for test tools and method of manufacturing the same

Automated atomic force microscope and the operation thereof

Sensor for low force-noise detection in liquids

Measurement of surface energy components and wettability of reservo...

AFM fluid delivery/liquid extraction surface sampling/electrostatic...

Miniaturized cantilever probe for scanning probe microscopy and fab...

Characterization structure for an atomic force microscope tip

Microprobe, measurement system and method

Chemical sensor with oscillating cantilevered probe

Method of manufacturing an SPM probe with a scanning tip and with a...

Chemical sensor with oscillating cantilevered probe and mechanical...

Semiconductor probe and method of writing and reading information u...

Patents Applicationslast 30 patents

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...

Detection Device for Scanning Probe Microscope

NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

Systems and Methods for Mechanosynthesis

MODULAR SCANNING PROBE MICROSCOPE HEAD

Systems and Methods for Mechanosynthesis

SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

SCANNING PROBE MICROSCOPE

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...

MICROFABRICATED OPTICAL PROBE

Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...

PROBE UNIT FOR TEST TOOLS AND METHOD OF MANUFACTURING THE SAME

NANOTUBE BASED TRANSISTOR STRUCTURE, METHOD OF FABRICATION AND USES...

Automated Atomic Force Microscope and the Operation Thereof

SCANNING PROBE MICROSCOPE

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...

AFM FLUID DELIVERY/LIQUID EXTRACTION SURFACE SAMPLING/ELECTROSTATIC...

SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...

CHARACTERIZATION STRUCTURE FOR AN ATOMIC FORCE MICROSCOPE TIP

CHEMICAL SENSOR WITH OSCILLATING CANTILEVERED PROBE