General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

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Patents Grantslast 30 patents

Information Patent Grant
Active noise isolation for tunneling applications (ANITA)
- Patent number 12,188,960
- Issue date Jan 7, 2025
- The Penn State Research Foundation
- Eric Hudson
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Probe chip, scan head, scanning probe microscopy device and use of...
- Patent number 12,117,467
- Issue date Oct 15, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Micro probe array device and manufacturing method of the device
- Patent number 12,109,409
- Issue date Oct 8, 2024
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of providing a MEMS device comprising a pyramidal protrusion...
- Patent number 12,013,415
- Issue date Jun 18, 2024
- SmartTip B.V.
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
- Patent number 11,970,392
- Issue date Apr 30, 2024
- Zhejiang University
- Huan Hu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
- Patent number 11,719,719
- Issue date Aug 8, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Probe cassette for holding a probe in storage for use in a scanning...
- Patent number 11,709,181
- Issue date Jul 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,708,384
- Issue date Jul 25, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe, method of manufacturing a probe and scanning probe microscop...
- Patent number 11,698,389
- Issue date Jul 11, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning a carrier on a flat surface, and assembly of...
- Patent number 11,650,224
- Issue date May 16, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,592,463
- Issue date Feb 28, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope, scan head and method
- Patent number 11,592,460
- Issue date Feb 28, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Diamond probe hosting an atomic sized defect
- Patent number 11,592,462
- Issue date Feb 28, 2023
- President and Fellows of Harvard College
- Xu Zhou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240426870
- Publication date Dec 26, 2024
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY DEVICE AND METHOD
- Publication number 20240410962
- Publication date Dec 12, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas MOHTASHAMI
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...
- Publication number 20240393363
- Publication date Nov 28, 2024
- Nearfield Instruments B.V.
- Massoud Hemmasian Ettefagh
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
Method for processing a measuring probe for recording surface prope...
- Publication number 20240241152
- Publication date Jul 18, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Christopher Seiji KLEY
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Substrate Comprising Multiple Tips for Scann...
- Publication number 20240175896
- Publication date May 30, 2024
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
CASSETTE FOR HOLDING A PROBE
- Publication number 20240027491
- Publication date Jan 25, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
- Publication number 20240002220
- Publication date Jan 4, 2024
- ZHEJIANG UNIVERSITY
- Huan HU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
A Method of Manufacturing a MEMS Device
- Publication number 20230416080
- Publication date Dec 28, 2023
- Cytosurge AG
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
- Publication number 20230417795
- Publication date Dec 28, 2023
- University of Central Florida Research Foundation, Inc.
- Laurene Tetard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
- Publication number 20230324433
- Publication date Oct 12, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
- Publication number 20230213552
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING...
- Publication number 20230213551
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
- Publication number 20230204625
- Publication date Jun 29, 2023
- NEXT-TIP, S.L.
- Belén SANZ SANZ
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
- Publication number 20230204624
- Publication date Jun 29, 2023
- Park Systems Corp.
- JeongHun AN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection Device for Scanning Probe Microscope
- Publication number 20230184809
- Publication date Jun 15, 2023
- Vmicro
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...
- Publication number 20230160924
- Publication date May 25, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING

General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Active noise isolation for tunneling applications (ANITA)

Nanoscale scanning sensors

Nano robotic system for high throughput single cell DNA sequencing

Probe chip, scan head, scanning probe microscopy device and use of...

Micro probe array device and manufacturing method of the device

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Method of providing a MEMS device comprising a pyramidal protrusion...

Methods and devices for extending a time period until changing a me...

Self-packing three-arm thermal scanning probe for micro-nano manufa...

Debris removal from high aspect structures

Large radius probe

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Coated active cantilever probes for use in topography imaging in op...

Probe for scanning probe microscope and binary state scanning probe...

Nanoscale scanning sensors

Apparatus and method for a scanning probe microscope

Integrated dual-probe rapid in-situ switching measurement method an...

Method and apparatus for measuring magnetic field strength

Device and method for analyzing a defect of a photolithographic mas...

Metrology probe with built-in angle and method of fabrication thereof

Probe cassette for holding a probe in storage for use in a scanning...

Systems and methods for mechanosynthesis

Probe, method of manufacturing a probe and scanning probe microscop...

Method and apparatus for examining a measuring tip of a scanning pr...

Method of positioning a carrier on a flat surface, and assembly of...

Atomic force microscopy cantilever, system and method

Initiating and monitoring the evolution of single electrons within...

Systems and methods for mechanosynthesis

Scanning probe microscope, scan head and method

Diamond probe hosting an atomic sized defect

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE

METROLOGY DEVICE AND METHOD

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

Method for processing a measuring probe for recording surface prope...

Method for Producing a Substrate Comprising Multiple Tips for Scann...

Scanning Probe Microscope, Sample Observation Processing System, an...

SCANNING PROBE MICROSCOPE

OPTOMECHANICAL TRANSDUCER

NANOSCALE SCANNING SENSORS

CASSETTE FOR HOLDING A PROBE

SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...

A Method of Manufacturing a MEMS Device

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...

A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING...

SCANNING PROBE MICROSCOPE (SPM) TIP

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

Detection Device for Scanning Probe Microscope

PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...