Probe holders

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G01Q70/02

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Current Industry

G01Q70/02Probe holders

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe chip, scan head, scanning probe microscopy device and use of...
- Patent number 12,117,467
- Issue date Oct 15, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Probe cassette for holding a probe in storage for use in a scanning...
- Patent number 11,709,181
- Issue date Jul 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Probe, method of manufacturing a probe and scanning probe microscop...
- Patent number 11,698,389
- Issue date Jul 11, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning a carrier on a flat surface, and assembly of...
- Patent number 11,650,224
- Issue date May 16, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Surface analysis device
- Patent number 11,499,989
- Issue date Nov 15, 2022
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope probes and methods of manufacturing probes
- Patent number 11,499,990
- Issue date Nov 15, 2022
- Nanosurf AG
- Dominik Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Chip carrier exchanging device and atomic force microscopy apparatu...
- Patent number 11,175,308
- Issue date Nov 16, 2021
- PARK SYSTEMS CORP.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Z-position motion stage for use in a scanning probe microscopy syst...
- Patent number 11,035,879
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Albert Dekker
- G01 - MEASURING TESTING
Information Patent Grant
Handling device for handling a measuring probe
- Patent number 11,022,786
- Issue date Jun 1, 2021
- Anton Paar GmbH
- Norbert Pinno-Rath
- G02 - OPTICS
Information Patent Grant
Device and method for measuring and/or modifying surface features o...
- Patent number 10,908,179
- Issue date Feb 2, 2021
- NEDERLANDSK ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Nozzle inspection method and apparatus
- Patent number 10,890,427
- Issue date Jan 12, 2021
- SUGINO MACHINE LIMITED
- Hiroki Haremaki
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Multi-axis positioning device
- Patent number 10,866,262
- Issue date Dec 15, 2020
- GETEC MICROSCOPY GMBH
- Peter Ziger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning probe microscope
- Patent number 10,802,044
- Issue date Oct 13, 2020
- Shimadzu Corporation
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and testing device
- Patent number 10,782,314
- Issue date Sep 22, 2020
- BOE Technology Group Co., Ltd.
- Pijian Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Numerically controlled rotary probe switching device based on envir...
- Patent number 10,739,377
- Issue date Aug 11, 2020
- Southwest Jiaotong University
- Liang Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Microfluidic cell for atomic force microscopy
- Patent number 10,712,365
- Issue date Jul 14, 2020
- New Jersey Institute of Technology
- Wen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope with pre-alignme...
- Patent number 10,663,484
- Issue date May 26, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
VCSEL-based resonant-cavity-enhanced atomic force microscopy active...
- Patent number 10,663,485
- Issue date May 26, 2020
- ACTOPROBE LLC
- Alexander A. Ukhanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever attachment fitting and scanning probe microscope provide...
- Patent number 10,620,235
- Issue date Apr 14, 2020
- Shimadzu Corporation
- Ryohei Kokawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and method for receiving a probe of a scanning probe m...
- Patent number 10,578,644
- Issue date Mar 3, 2020
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Top-cover for a controlled environmental system, top-cover-set and...
- Patent number 10,545,169
- Issue date Jan 28, 2020
- ETH Zurich
- David Martinez-Martin
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Probe holding table and medical device
- Patent number 10,512,447
- Issue date Dec 24, 2019
- Edan Instruments, Inc.
- Gonghua Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of positioning a carrier on a flat surface, and assembly of...
- Patent number 10,495,667
- Issue date Dec 3, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head of scanning probe microscope
- Patent number 10,422,815
- Issue date Sep 24, 2019
- Institute of Physics, Chinese Academy of Sciences
- Qing Huan
- G01 - MEASURING TESTING
Information Patent Grant
Fixing mechanism actuatable without a tool and which fixes a measur...
- Patent number 10,386,386
- Issue date Aug 20, 2019
- Anton Paar GmbH
- Alberto Gomez-Casado
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy utilizing separable components
- Patent number 10,345,337
- Issue date Jul 9, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy system for mapping high aspect ratio nano...
- Patent number 10,288,643
- Issue date May 14, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Stefan Kuiper
- G01 - MEASURING TESTING
Information Patent Grant
Microfabricated optical probe
- Patent number 10,161,961
- Issue date Dec 25, 2018
- The United States of America, as represented by the Secretary of Commerce
- Vladimir A. Aksyuk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detection device having attached probe
- Patent number 10,145,861
- Issue date Dec 4, 2018
- STROMLINET NANO LIMITED
- En-Te Hwu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method of performing scanning probe microscopy on a subs...
- Patent number 10,067,158
- Issue date Sep 4, 2018
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CASSETTE FOR HOLDING A PROBE
- Publication number 20240027491
- Publication date Jan 25, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
- Publication number 20230213552
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
Detection Device for Scanning Probe Microscope
- Publication number 20230184809
- Publication date Jun 15, 2023
- Vmicro
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...
- Publication number 20230160924
- Publication date May 25, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...
- Publication number 20230046236
- Publication date Feb 16, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CASSETTE FOR HOLDING A PROBE IN STORAGE FOR USE IN A SCANNING...
- Publication number 20220390486
- Publication date Dec 8, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ANALYSIS DEVICE
- Publication number 20210349125
- Publication date Nov 11, 2021
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CHIP, SCAN HEAD, SCANNING PROBE MICROSCOPY DEVICE AND USE OF...
- Publication number 20210278436
- Publication date Sep 9, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
Handling Device for Handling a Measuring Probe
- Publication number 20200326518
- Publication date Oct 15, 2020
- ANTON PAAR GMBH
- Norbert Pinno-Rath
- G01 - MEASURING TESTING
Information Patent Application
Z-POSITION MOTION STAGE FOR USE IN A SCANNING PROBE MICROSCOPY SYST...
- Publication number 20200233013
- Publication date Jul 23, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Albert Dekker
- G01 - MEASURING TESTING
Information Patent Application
MULTI-AXIS POSITIONING DEVICE
- Publication number 20200141971
- Publication date May 7, 2020
- GETEC MICROSCOPY GMBH
- Peter ZIGER
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES
- Publication number 20200124636
- Publication date Apr 23, 2020
- SCUBA PROBE TECHNOLOGIES LLC
- Dominik ZIEGLER
- G01 - MEASURING TESTING
Information Patent Application
Numerically Controlled Rotary Probe Switching Device Based on Envir...
- Publication number 20200096539
- Publication date Mar 26, 2020
- Southwest Jiaotong University
- Liang JIANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...
- Publication number 20200081034
- Publication date Mar 12, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM, AND METHOD FOR MOUNTING AND DEMOU...
- Publication number 20190317127
- Publication date Oct 17, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
NOZZLE INSPECTION METHOD AND APPARATUS
- Publication number 20190187173
- Publication date Jun 20, 2019
- SUGINO MACHINE LIMITED
- Hiroki HAREMAKI
- B08 - CLEANING
Information Patent Application
MICROFLUIDIC CELL FOR ATOMIC FORCE MICROSCOPY
- Publication number 20190072582
- Publication date Mar 7, 2019
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- Wen Zhang
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND TESTING DEVICE
- Publication number 20190064212
- Publication date Feb 28, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Pijian CHENG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180299480
- Publication date Oct 18, 2018
- Shimadzu Corporation
- Masahiro OHTA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING AND/OR MODIFYING SURFACE FEATURES O...
- Publication number 20180238931
- Publication date Aug 23, 2018
- Nerderlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
TOP-COVER FOR A CONTROLLED ENVIRONMENTAL SYSTEM, TOP-COVER-SET AND...
- Publication number 20180224479
- Publication date Aug 9, 2018
- UNIVERSITAT BASEL
- David Martinez-Martin
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM FOR MAPPING HIGH ASPECT RATIO NANO...
- Publication number 20180210008
- Publication date Jul 26, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Stefan Kuiper
- G01 - MEASURING TESTING
Information Patent Application
MICROFABRICATED OPTICAL PROBE
- Publication number 20180210009
- Publication date Jul 26, 2018
- Government of the United States of America, as Represented by the Secretary o...
- Vladimir A. Aksyuk
- G02 - OPTICS
Information Patent Application
PROBE HOLDING TABLE AND MEDICAL DEVICE
- Publication number 20180192992
- Publication date Jul 12, 2018
- Edan Instruments, Inc.
- Gonghua WANG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...
- Publication number 20170146564
- Publication date May 25, 2017
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...
- Publication number 20170131323
- Publication date May 11, 2017
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
Fixing Mechanism Actuatable Without a Tool and Which Fixes a Measur...
- Publication number 20170067935
- Publication date Mar 9, 2017
- ANTON PAAR GMBH
- Alberto Gomez-Casado
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER ATTACHMENT FITTING AND SCANNING PROBE MICROSCOPE PROVIDE...
- Publication number 20160245844
- Publication date Aug 25, 2016
- SHIMADZU CORPORATION
- Ryohei KOKAWA
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT
- Publication number 20150075264
- Publication date Mar 19, 2015
- HYSITRON, INC.
- Syed Amanulla Syed Asif
- G02 - OPTICS
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD OF OPERATING THE SAME
- Publication number 20140380532
- Publication date Dec 25, 2014
- Samsung Electronics Co., Ltd.
- Wan-Sung PARK
- G01 - MEASURING TESTING

Probe holders

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe chip, scan head, scanning probe microscopy device and use of...

Probe cassette for holding a probe in storage for use in a scanning...

Probe, method of manufacturing a probe and scanning probe microscop...

Method of positioning a carrier on a flat surface, and assembly of...

Surface analysis device

Atomic force microscope probes and methods of manufacturing probes

Chip carrier exchanging device and atomic force microscopy apparatu...

Z-position motion stage for use in a scanning probe microscopy syst...

Handling device for handling a measuring probe

Device and method for measuring and/or modifying surface features o...

Nozzle inspection method and apparatus

Multi-axis positioning device

Scanning probe microscope

Probe assembly and testing device

Numerically controlled rotary probe switching device based on envir...

Microfluidic cell for atomic force microscopy

Multiple integrated tips scanning probe microscope with pre-alignme...

VCSEL-based resonant-cavity-enhanced atomic force microscopy active...

Cantilever attachment fitting and scanning probe microscope provide...

Probe system and method for receiving a probe of a scanning probe m...

Top-cover for a controlled environmental system, top-cover-set and...

Probe holding table and medical device

Method of positioning a carrier on a flat surface, and assembly of...

Scanning head of scanning probe microscope

Fixing mechanism actuatable without a tool and which fixes a measur...

Scanning probe microscopy utilizing separable components

Scanning probe microscopy system for mapping high aspect ratio nano...

Microfabricated optical probe

Detection device having attached probe

System and method of performing scanning probe microscopy on a subs...

Patents Applicationslast 30 patents

CASSETTE FOR HOLDING A PROBE

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...

Detection Device for Scanning Probe Microscope

PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...

METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...

PROBE CASSETTE FOR HOLDING A PROBE IN STORAGE FOR USE IN A SCANNING...

SURFACE ANALYSIS DEVICE

PROBE CHIP, SCAN HEAD, SCANNING PROBE MICROSCOPY DEVICE AND USE OF...

Handling Device for Handling a Measuring Probe

Z-POSITION MOTION STAGE FOR USE IN A SCANNING PROBE MICROSCOPY SYST...

MULTI-AXIS POSITIONING DEVICE

ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES

Numerically Controlled Rotary Probe Switching Device Based on Envir...

METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...

SCANNING PROBE MICROSCOPY SYSTEM, AND METHOD FOR MOUNTING AND DEMOU...

NOZZLE INSPECTION METHOD AND APPARATUS

MICROFLUIDIC CELL FOR ATOMIC FORCE MICROSCOPY

PROBE ASSEMBLY AND TESTING DEVICE

SCANNING PROBE MICROSCOPE

DEVICE AND METHOD FOR MEASURING AND/OR MODIFYING SURFACE FEATURES O...

TOP-COVER FOR A CONTROLLED ENVIRONMENTAL SYSTEM, TOP-COVER-SET AND...

SCANNING PROBE MICROSCOPY SYSTEM FOR MAPPING HIGH ASPECT RATIO NANO...

MICROFABRICATED OPTICAL PROBE

PROBE HOLDING TABLE AND MEDICAL DEVICE

METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...

SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...

Fixing Mechanism Actuatable Without a Tool and Which Fixes a Measur...

CANTILEVER ATTACHMENT FITTING AND SCANNING PROBE MICROSCOPE PROVIDE...

MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT

SCANNING PROBE MICROSCOPE AND METHOD OF OPERATING THE SAME