Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins

Industry

CPC
G01R1/06711

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for processing one or more integrated circuit p...
- Patent number 12,076,833
- Issue date Sep 3, 2024
- Nidec SV Probe Pte. Ltd.
- Son N. Dang
- B24 - GRINDING POLISHING
Information Patent Grant
Integrated circuit package with current sense element
- Patent number 12,066,459
- Issue date Aug 20, 2024
- Texas Instruments Incorporated
- Robert Allan Neidorff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for a test system
- Patent number 12,025,636
- Issue date Jul 2, 2024
- Teradyne, Inc.
- Timothy D. Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Clad wire and method for producing clad wires
- Patent number 12,020,829
- Issue date Jun 25, 2024
- Heraeus Deutschland GmbH & Co. KG
- Marc Rättig
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 12,000,867
- Issue date Jun 4, 2024
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Particle measurement device, three-dimensional shape measurement de...
- Patent number 11,940,463
- Issue date Mar 26, 2024
- Tokyo Seimitsu Co., Ltd.
- Natsumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and focusing probe thereof
- Patent number 11,913,973
- Issue date Feb 27, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and jumper thereof
- Patent number 11,828,789
- Issue date Nov 28, 2023
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Immunity evaluation system and immunity evaluation method
- Patent number 11,609,267
- Issue date Mar 21, 2023
- Hitachi, Ltd.
- Isao Houda
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 11,579,170
- Issue date Feb 14, 2023
- CHROMA ATE INC.
- Chin-Yuan Chang
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system and methods thereof
- Patent number 11,486,899
- Issue date Nov 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Slip-plane MEMs probe for high-density and fine pitch interconnects
- Patent number 11,372,023
- Issue date Jun 28, 2022
- Intel Corporation
- Joe Walczyk
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods of testing multiple dies
- Patent number 11,320,478
- Issue date May 3, 2022
- Texas Instruments Incorporated
- Rubin Ajit Parekhji
- G01 - MEASURING TESTING
Information Patent Grant
Measuring rod for electric meter and electric meter assembly using...
- Patent number 11,307,224
- Issue date Apr 19, 2022
- APPA Technology Corp.
- Shan-Wen Chang
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 11,293,944
- Issue date Apr 5, 2022
- Yamaichi Electronics Co., Ltd.
- Yuji Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Placement stand and electronic device inspecting apparatus
- Patent number 11,221,358
- Issue date Jan 11, 2022
- Tokyo Electron Limited
- Shigeru Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method for inspecting connected pa...
- Patent number 11,143,695
- Issue date Oct 12, 2021
- Denso Corporation
- Hisashi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Optical device, test method, optical transmission and reception dev...
- Patent number 11,143,889
- Issue date Oct 12, 2021
- Fujitsu Optical Components Limited
- Masaki Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring semiconductor device by applying voltage to the...
- Patent number 11,125,803
- Issue date Sep 21, 2021
- Mitsubishi Electric Corporation
- Koji Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe head and electronic device testing system
- Patent number 11,112,430
- Issue date Sep 7, 2021
- Intel Corporation
- Anil Kaza
- G01 - MEASURING TESTING
Information Patent Grant
Contactless coupling between test and measurement system and a devi...
- Patent number 11,041,880
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Low force wafer test probe
- Patent number 11,029,334
- Issue date Jun 8, 2021
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
End effector attachment for testing electronic touchscreen device
- Patent number 11,003,560
- Issue date May 11, 2021
- Walmart Apollo, LLC
- Timothy M. Fenton
- G01 - MEASURING TESTING
Information Patent Grant
Probe, inspection jig, inspection device, and method of manufacturi...
- Patent number 10,962,569
- Issue date Mar 30, 2021
- Nidec-Read Corporation
- Michio Kaida
- G01 - MEASURING TESTING
Information Patent Grant
Slip-plane MEMS probe for high-density and fine pitch interconnects
- Patent number 10,935,573
- Issue date Mar 2, 2021
- Intel Corporation
- Joe Walczyk
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and apparatus used for testing a device under test
- Patent number 10,877,066
- Issue date Dec 29, 2020
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
Transmission line
- Patent number 10,845,411
- Issue date Nov 24, 2020
- TeraView Limited
- Ka Chung Lee
- G01 - MEASURING TESTING
Information Patent Grant
End effector attachment for testing electronic touchscreen device
- Patent number 10,768,203
- Issue date Sep 8, 2020
- Walmart Apollo, LLC
- Timothy M. Fenton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test probe and apparatus for testing printed circuit board
- Patent number 10,718,807
- Issue date Jul 21, 2020
- BOE Technology Group Co., Ltd.
- Kai Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT
- Publication number 20240369598
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER STRUCTURE
- Publication number 20240371805
- Publication date Nov 7, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD
- Publication number 20240255545
- Publication date Aug 1, 2024
- LX Semicon Co., Ltd.
- Min Suk KIM
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
- Publication number 20240142495
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Kosuke FUJII
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...
- Publication number 20230417797
- Publication date Dec 28, 2023
- TOKYO SEIMITSU CO., LTD.
- Natsumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF
- Publication number 20230349951
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20230349953
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-COMPENSATED DIELECTRIC-CONSTANT MEASURING DEVICE
- Publication number 20230304955
- Publication date Sep 28, 2023
- Endress+Hauser SE+Co. KG
- Pablo Ottersbach
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A TEST SYSTEM
- Publication number 20230228794
- Publication date Jul 20, 2023
- Teradyne, Inc.
- Timothy D. Lyons
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND JUMPER THEREOF
- Publication number 20230123340
- Publication date Apr 20, 2023
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROBE PIN RETRIEVAL
- Publication number 20230034452
- Publication date Feb 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- MING-CHENG HSU
- G01 - MEASURING TESTING
Information Patent Application
JIG
- Publication number 20220413014
- Publication date Dec 29, 2022
- Yokowo Co., Ltd.
- Daisuke HOSOKAWA
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED PROBE TIP
- Publication number 20220349917
- Publication date Nov 3, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Immunity Evaluation System and Immunity Evaluation Method
- Publication number 20220268836
- Publication date Aug 25, 2022
- Hitachi, Ltd
- Isao HOUDA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT
- Publication number 20220187337
- Publication date Jun 16, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE APPARATUS
- Publication number 20220178967
- Publication date Jun 9, 2022
- CHROMA ATE INC.
- CHIN-YUAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING DEVICE
- Publication number 20220146553
- Publication date May 12, 2022
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND INSPECTION MODULE
- Publication number 20210341516
- Publication date Nov 4, 2021
- RICHTEK TECHNOLOGY CORPORATION
- Fang-Ling Chuang
- G01 - MEASURING TESTING
Information Patent Application
SLIP-PLANE MEMS PROBE FOR HIGH-DENSITY AND FINE PITCH INTERCONNECTS
- Publication number 20210239734
- Publication date Aug 5, 2021
- Intel Corporation
- Joe Walczyk
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
WAFER TEST SYSTEM AND METHODS THEREOF
- Publication number 20210239736
- Publication date Aug 5, 2021
- NANYA TECHNOLOGY CORPORATION
- CHIA-LIN TSAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
- Publication number 20210199713
- Publication date Jul 1, 2021
- Advantest Corporation
- Yuji SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLACEMENT STAND AND ELECTRONIC DEVICE INSPECTING APPARATUS
- Publication number 20210102991
- Publication date Apr 8, 2021
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PROCESSING ONE OR MORE INTEGRATED CIRCUIT P...
- Publication number 20210078133
- Publication date Mar 18, 2021
- Nidec Motor Corporation
- Son N. Dang
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF TESTING MULTIPLE DIES
- Publication number 20200379031
- Publication date Dec 3, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Rubin Ajit PAREKHJI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE, TEST METHOD, OPTICAL TRANSMISSION AND RECEPTION DEV...
- Publication number 20200371384
- Publication date Nov 26, 2020
- FUJITSU OPTICAL COMPONENTS LIMITED
- Masaki SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE
- Publication number 20200363452
- Publication date Nov 19, 2020
- Walmart Apollo, LLC
- Timothy M. Fenton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE HEAD AND ELECTRONIC DEVICE TESTING SYSTEM
- Publication number 20200309818
- Publication date Oct 1, 2020
- Anil Kaza
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ROD FOR ELECTRIC METER AND ELECTRIC METER ASSEMBLY USING...
- Publication number 20200158765
- Publication date May 21, 2020
- APPA Technology Corp.
- Shan-Wen CHANG
- G01 - MEASURING TESTING
Information Patent Application
SLIP-PLANE MEMS PROBE FOR HIGH-DENSITY AND FINE PITCH INTERCONNECTS
- Publication number 20200103440
- Publication date Apr 2, 2020
- Joe Walczyk
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cantilever probe card and probe module thereof

Methods and systems for processing one or more integrated circuit p...

Integrated circuit package with current sense element

Probe for a test system

Clad wire and method for producing clad wires

Electrical connecting device

Particle measurement device, three-dimensional shape measurement de...

Cantilever probe card device and focusing probe thereof

Test apparatus and jumper thereof

Immunity evaluation system and immunity evaluation method

Probe apparatus

Wafer test system and methods thereof

Slip-plane MEMs probe for high-density and fine pitch interconnects

Methods of testing multiple dies

Measuring rod for electric meter and electric meter assembly using...

Test socket

Placement stand and electronic device inspecting apparatus

Inspection device and inspection method for inspecting connected pa...

Optical device, test method, optical transmission and reception dev...

Method of measuring semiconductor device by applying voltage to the...

Probe head and electronic device testing system

Contactless coupling between test and measurement system and a devi...

Low force wafer test probe

End effector attachment for testing electronic touchscreen device

Probe, inspection jig, inspection device, and method of manufacturi...

Slip-plane MEMS probe for high-density and fine pitch interconnects

Method and apparatus used for testing a device under test

Transmission line

End effector attachment for testing electronic touchscreen device

Test probe and apparatus for testing printed circuit board

Patents Applicationslast 30 patents

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT

WAFER STRUCTURE

PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD

TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...

PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...

CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF

CANTILEVER PROBE CARD AND PROBE MODULE THEREOF

TEMPERATURE-COMPENSATED DIELECTRIC-CONSTANT MEASURING DEVICE

PROBE FOR A TEST SYSTEM

TEST APPARATUS AND JUMPER THEREOF

METHOD FOR PROBE PIN RETRIEVAL

JIG

ISOLATED PROBE TIP

Immunity Evaluation System and Immunity Evaluation Method

INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT

PROBE APPARATUS

ELECTRICAL CONNECTING DEVICE

PROBE PIN AND INSPECTION MODULE

SLIP-PLANE MEMS PROBE FOR HIGH-DENSITY AND FINE PITCH INTERCONNECTS

WAFER TEST SYSTEM AND METHODS THEREOF

ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...

PLACEMENT STAND AND ELECTRONIC DEVICE INSPECTING APPARATUS

METHODS AND SYSTEMS FOR PROCESSING ONE OR MORE INTEGRATED CIRCUIT P...

METHODS OF TESTING MULTIPLE DIES

OPTICAL DEVICE, TEST METHOD, OPTICAL TRANSMISSION AND RECEPTION DEV...

END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE

PROBE HEAD AND ELECTRONIC DEVICE TESTING SYSTEM

MEASURING ROD FOR ELECTRIC METER AND ELECTRIC METER ASSEMBLY USING...

SLIP-PLANE MEMS PROBE FOR HIGH-DENSITY AND FINE PITCH INTERCONNECTS