Probes, their manufacture, or their related instrumentation

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G01Q60/16

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/16Probes, their manufacture, or their related instrumentation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MEMS nanopositioner and method of fabrication
- Patent number 11,973,441
- Issue date Apr 30, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Nano-indent process for creating single photon emitters in a two-di...
- Patent number 11,705,535
- Issue date Jul 18, 2023
- The Government of the United States of America, as represented by the Secreta...
- Berend T. Jonker
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Quantum dot microscope apparatus comprising a nanoscale semiconduct...
- Patent number 11,693,024
- Issue date Jul 4, 2023
- Board of Trustees of Michigan State University
- Stuart Holden Tessmer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,237,188
- Issue date Feb 1, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,169,177
- Issue date Nov 9, 2021
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Device integrated with scanning probe for optical nanofocusing and...
- Patent number 11,054,440
- Issue date Jul 6, 2021
- The Regents of the University of California
- Ming Liu
- G01 - MEASURING TESTING
Information Patent Grant
Handling device for handling a measuring probe
- Patent number 11,022,786
- Issue date Jun 1, 2021
- Anton Paar GmbH
- Norbert Pinno-Rath
- G02 - OPTICS
Information Patent Grant
Sharpening method for probe tip of atomic force microscope (AFM)
- Patent number 11,016,120
- Issue date May 25, 2021
- YANSHAN UNIVERSITY
- Jianchao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever attachment fitting and scanning probe microscope provide...
- Patent number 10,620,235
- Issue date Apr 14, 2020
- Shimadzu Corporation
- Ryohei Kokawa
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel current control apparatus and tunnel current control method
- Patent number 10,591,509
- Issue date Mar 17, 2020
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe inspector
- Patent number 10,585,115
- Issue date Mar 10, 2020
- Samsung Electronics Co., Ltd.
- Duck Mahn Oh
- G01 - MEASURING TESTING
Information Patent Grant
High magnetic field scanning probe microscope employing liquid heli...
- Patent number 10,539,590
- Issue date Jan 21, 2020
- FUDAN UNIVERSITY
- Shiwei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Miniature device for ultra high sensitivity and stability probing i...
- Patent number 10,520,527
- Issue date Dec 31, 2019
- The Regents of the University of California
- Xiaoqing Pan
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel current control apparatus and tunnel current control method
- Patent number 10,451,651
- Issue date Oct 22, 2019
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon scanning-tunneling chemical mapping (SPSTM) system
- Patent number 10,436,813
- Issue date Oct 8, 2019
- Institute for Electronics and Information Technology in Tianjin Tsinghua Univ...
- Thomas L. Ferrell
- G01 - MEASURING TESTING
Information Patent Grant
Frequency comb feedback control for scanning probe microscopy
- Patent number 10,401,383
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 10,060,948
- Issue date Aug 28, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Method of aligning a first article relative to a second article
- Patent number 10,025,207
- Issue date Jul 17, 2018
- Universitat Kassel
- Ivo Rangelow
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Nanoantenna scanning probe tip, and fabrication methods
- Patent number 10,012,674
- Issue date Jul 3, 2018
- The Regents of the University of California
- Tyler Jamison Dill
- G01 - MEASURING TESTING
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,773,634
- Issue date Sep 26, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
- Patent number 9,366,694
- Issue date Jun 14, 2016
- Ecole Polytechnique
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Grant
Radio-frequency reflectometry scanning tunneling microscope
- Patent number 9,304,146
- Issue date Apr 5, 2016
- NATIONAL TAIWAN UNIVERSITY
- Woei-Wu Pai
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for coupling high-frequency energy to and/or from...
- Patent number 9,075,081
- Issue date Jul 7, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope assembly, reactor, and system
- Patent number 8,893,309
- Issue date Nov 18, 2014
- The Regents of the University of California
- Feng Tao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Radio-frequency reflectometry scanning tunneling microscope
- Patent number 8,863,311
- Issue date Oct 14, 2014
- NATIONAL TAIWAN UNIVERSITY
- Woei-Wu Pai
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous topographic and elemental chemical and magnetic contra...
- Patent number 8,850,611
- Issue date Sep 30, 2014
- UChicago Argonne, LLC
- Volker Rose
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring the force interaction that is caused by a sample
- Patent number 8,832,860
- Issue date Sep 9, 2014
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 8,499,621
- Issue date Aug 6, 2013
- Victor B. Kley
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEMS Nanopositioner and Method of Fabrication
- Publication number 20240283378
- Publication date Aug 22, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
- Publication number 20230194566
- Publication date Jun 22, 2023
- The Regents of the University of California
- Shenkai Wang
- G01 - MEASURING TESTING
Information Patent Application
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20230176088
- Publication date Jun 8, 2023
- Rutgers, The State University of New Jersey
- Angela M. COE
- G01 - MEASURING TESTING
Information Patent Application
MEMS Nanopositioner and Method of Fabrication
- Publication number 20220368249
- Publication date Nov 17, 2022
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20220128595
- Publication date Apr 28, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
Quantum Dot Microscope Apparatus
- Publication number 20220120784
- Publication date Apr 21, 2022
- Board of Trustees of Michigan State University
- Stuart Holden TESSMER
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
- Publication number 20210302466
- Publication date Sep 30, 2021
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nano-indent Process for Creating Single Photon Emitters in a Two-di...
- Publication number 20210109127
- Publication date Apr 15, 2021
- The Government of the United States of America, as represented by the Secreta...
- Berend T. Jonker
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)
- Publication number 20210025919
- Publication date Jan 28, 2021
- The Penn State Research Foundation
- Eric Hudson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SUPERIMPOSING AT LEAST TWO IMAGES OF A PHOTOL...
- Publication number 20200409255
- Publication date Dec 31, 2020
- Carl Zeiss SMT GMBH
- Gilles Tabbone
- G01 - MEASURING TESTING
Information Patent Application
Handling Device for Handling a Measuring Probe
- Publication number 20200326518
- Publication date Oct 15, 2020
- ANTON PAAR GMBH
- Norbert Pinno-Rath
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND...
- Publication number 20200309815
- Publication date Oct 1, 2020
- The Regents of the University of California
- Ming LIU
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20190219611
- Publication date Jul 18, 2019
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
MINIATURE DEVICE FOR ULTRA HIGH SENSITIVITY AND STABILITY PROBING I...
- Publication number 20190187174
- Publication date Jun 20, 2019
- The Regents of the University of California
- Xiaoqing Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE INSPECTOR
- Publication number 20190170788
- Publication date Jun 6, 2019
- Samsung Electronics Co., Ltd.
- Duck Mahn Oh
- G02 - OPTICS
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20190120873
- Publication date Apr 25, 2019
- STC.UNM
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
- Publication number 20190064210
- Publication date Feb 28, 2019
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...
- Publication number 20190025339
- Publication date Jan 24, 2019
- Fudan University
- Shiwei WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOTUBE BASED TRANSISTOR STRUCTURE, METHOD OF FABRICATION AND USES...
- Publication number 20190018041
- Publication date Jan 17, 2019
- Yeda Research and Development Co. Ltd.
- Shahal ILANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Frequency Comb Feedback Control for Scanning Probe Microscopy
- Publication number 20180364278
- Publication date Dec 20, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20180328960
- Publication date Nov 15, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for carrier profiling of semiconductors utiliz...
- Publication number 20180172727
- Publication date Jun 21, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
- Publication number 20170148603
- Publication date May 25, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu Kozakai
- G01 - MEASURING TESTING
Information Patent Application
NANOANTENNA SCANNING PROBE TIP, AND FABRICATION METHODS
- Publication number 20170115323
- Publication date Apr 27, 2017
- The Regents of the University of California
- Tyler Jamison Dill
- G01 - MEASURING TESTING
Information Patent Application
Variable Temperature Scanning Tunneling Microscope
- Publication number 20170102408
- Publication date Apr 13, 2017
- Washington State University
- Kerry W. Hipps
- G01 - MEASURING TESTING
Information Patent Application
RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE
- Publication number 20150026847
- Publication date Jan 22, 2015
- National Taiwan University
- Woei-Wu PAI
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS TOPOGRAPHIC AND ELEMENTAL CHEMICAL AND MAGNETIC CONTRA...
- Publication number 20140259235
- Publication date Sep 11, 2014
- UChicago Argonne, LLC
- Volker Rose
- B82 - NANO-TECHNOLOGY

Probes, their manufacture, or their related instrumentation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

MEMS nanopositioner and method of fabrication

Nano-indent process for creating single photon emitters in a two-di...

Quantum dot microscope apparatus comprising a nanoscale semiconduct...

Scanning probe and electron microscope probes and their manufacture

Scanning probe and electron microscope probes and their manufacture

Device integrated with scanning probe for optical nanofocusing and...

Handling device for handling a measuring probe

Sharpening method for probe tip of atomic force microscope (AFM)

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Cantilever attachment fitting and scanning probe microscope provide...

Tunnel current control apparatus and tunnel current control method

Scanning probe inspector

High magnetic field scanning probe microscope employing liquid heli...

Miniature device for ultra high sensitivity and stability probing i...

Tunnel current control apparatus and tunnel current control method

Surface plasmon scanning-tunneling chemical mapping (SPSTM) system

Frequency comb feedback control for scanning probe microscopy

Scanning probe and electron microscope probes and their manufacture

Method of aligning a first article relative to a second article

Nanoantenna scanning probe tip, and fabrication methods

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Microscope having a multimode local probe, tip-enhanced raman micro...

Radio-frequency reflectometry scanning tunneling microscope

Method and means for coupling high-frequency energy to and/or from...

Scanning tunneling microscope assembly, reactor, and system

Radio-frequency reflectometry scanning tunneling microscope

Simultaneous topographic and elemental chemical and magnetic contra...

Method for measuring the force interaction that is caused by a sample

Scanning probe microscopy inspection and modification system

Patents Applicationslast 30 patents

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

MEMS Nanopositioner and Method of Fabrication

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

MEMS Nanopositioner and Method of Fabrication

Scanning Probe and Electron Microscope Probes and Their Manufacture

Quantum Dot Microscope Apparatus

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Nano-indent Process for Creating Single Photon Emitters in a Two-di...

ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)

METHOD AND DEVICE FOR SUPERIMPOSING AT LEAST TWO IMAGES OF A PHOTOL...

Handling Device for Handling a Measuring Probe

DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND...

Scanning Probe and Electron Microscope Probes and Their Manufacture

MINIATURE DEVICE FOR ULTRA HIGH SENSITIVITY AND STABILITY PROBING I...

SCANNING PROBE INSPECTOR

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD

HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...

NANOTUBE BASED TRANSISTOR STRUCTURE, METHOD OF FABRICATION AND USES...

Frequency Comb Feedback Control for Scanning Probe Microscopy

Scanning Probe and Electron Microscope Probes and Their Manufacture

Method and Apparatus for carrier profiling of semiconductors utiliz...

Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...

NANOANTENNA SCANNING PROBE TIP, AND FABRICATION METHODS

Variable Temperature Scanning Tunneling Microscope

RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE

SIMULTANEOUS TOPOGRAPHIC AND ELEMENTAL CHEMICAL AND MAGNETIC CONTRA...