Probes, their manufacture, or their related instrumentation

Industry

CPC
G01Q60/38

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/38Probes, their manufacture, or their related instrumentation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and control unit for demodulation
- Patent number 11,946,949
- Issue date Apr 2, 2024
- Technische Universitat Wien
- Dominik Kohl
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for simultaneous independent motion measurement o...
- Patent number 11,892,471
- Issue date Feb 6, 2024
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
- Patent number 11,852,654
- Issue date Dec 26, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting mechanical and magnetic features with nanoscal...
- Patent number 11,835,547
- Issue date Dec 5, 2023
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
3D multipurpose scanning microscopy probes
- Patent number 11,815,527
- Issue date Nov 14, 2023
- New York University
- Mohammad A. Qasaimeh
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring damage of a substrate caused by an electron beam
- Patent number 11,774,381
- Issue date Oct 3, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
- Patent number 11,719,719
- Issue date Aug 8, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nano-indent process for creating single photon emitters in a two-di...
- Patent number 11,705,535
- Issue date Jul 18, 2023
- The Government of the United States of America, as represented by the Secreta...
- Berend T. Jonker
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,703,523
- Issue date Jul 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 11,668,730
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Thermally stable, drift resistant probe for a scanning probe micros...
- Patent number 11,644,480
- Issue date May 9, 2023
- Bruker Nano, Inc.
- Jeffrey K. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM imaging with real time drift correction
- Patent number 11,604,210
- Issue date Mar 14, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Diamond probe hosting an atomic sized defect
- Patent number 11,592,462
- Issue date Feb 28, 2023
- President and Fellows of Harvard College
- Xu Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
- Patent number 11,561,453
- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Torsion wing probe assembly
- Patent number 11,555,827
- Issue date Jan 17, 2023
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Pattern height information correction system and pattern height inf...
- Patent number 11,448,663
- Issue date Sep 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,448,664
- Issue date Sep 20, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,353,478
- Issue date Jun 7, 2022
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy beam input to atom probe specimens from multiple angles
- Patent number 11,340,256
- Issue date May 24, 2022
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for analyzing impact and puncture resistance
- Patent number 11,313,879
- Issue date Apr 26, 2022
- Dow Global Technologies LLC
- Donald L. McCarty
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING DEFECT OF MASK
- Publication number 20240219826
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Yoonki HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
CASSETTE FOR HOLDING A PROBE
- Publication number 20240027491
- Publication date Jan 25, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEA...
- Publication number 20230408544
- Publication date Dec 21, 2023
- Shanghai Ideaoptics Corp., Ltd.
- Tongyu Li
- G01 - MEASURING TESTING
Information Patent Application
IN SITU MECHANICAL CHARACTERIZATION OF A SAMPLE STRAIN
- Publication number 20230393170
- Publication date Dec 7, 2023
- Board of Regents of the University of Nebraska
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD FOR MEASURING CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEA...
- Publication number 20230324434
- Publication date Oct 12, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
- Publication number 20230324433
- Publication date Oct 12, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
BLADE EDGE TIP MEASUREMENT
- Publication number 20230314470
- Publication date Oct 5, 2023
- The Gillette Company LLC
- Jason Scott Slattery
- B24 - GRINDING POLISHING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
- Publication number 20230213552
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR QUANTIFYING DEGREE OF BLENDING OF VIRGIN AND...
- Publication number 20230213550
- Publication date Jul 6, 2023
- Tongji University
- Liping LIU
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
- Publication number 20230204625
- Publication date Jun 29, 2023
- NEXT-TIP, S.L.
- Belén SANZ SANZ
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
- Publication number 20230204624
- Publication date Jun 29, 2023
- Park Systems Corp.
- JeongHun AN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...
- Publication number 20230168275
- Publication date Jun 1, 2023
- National Cheng Kung University
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
Large Radius Probe
- Publication number 20230021148
- Publication date Jan 19, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
- Publication number 20230019239
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT O...
- Publication number 20230020068
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Real Time Drift Correction
- Publication number 20230009857
- Publication date Jan 12, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
Metrology Probe with Built-In Angle and Method of Fabrication Thereof
- Publication number 20220404392
- Publication date Dec 22, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE
- Publication number 20220357360
- Publication date Nov 10, 2022
- ACTOPROBE LLC
- ALEXANDER A. UKHANOV
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20220291255
- Publication date Sep 15, 2022
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS

Probes, their manufacture, or their related instrumentation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and devices for extending a time period until changing a me...

Large radius probe

Method and control unit for demodulation

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Method and device for simultaneous independent motion measurement o...

Cantilever with a collocated piezoelectric actuator-sensor pair

Method for detecting mechanical and magnetic features with nanoscal...

3D multipurpose scanning microscopy probes

Nanoscale scanning sensors

Integrated dual-probe rapid in-situ switching measurement method an...

Method for measuring damage of a substrate caused by an electron beam

Method and apparatus for measuring magnetic field strength

Device and method for analyzing a defect of a photolithographic mas...

Metrology probe with built-in angle and method of fabrication thereof

AFM imaging with creep correction

Nano-indent process for creating single photon emitters in a two-di...

Method and apparatus for detecting ferroelectric signal

High speed atomic force profilometry of large areas

Thermally stable, drift resistant probe for a scanning probe micros...

Atomic force microscopy cantilever, system and method

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

AFM imaging with real time drift correction

Diamond probe hosting an atomic sized defect

Truncated non-linear interferometer-based sensor system

Torsion wing probe assembly

Pattern height information correction system and pattern height inf...

Large radius probe

Methods and devices for extending a time period until changing a me...

Energy beam input to atom probe specimens from multiple angles

Device for analyzing impact and puncture resistance

Patents Applicationslast 30 patents

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

METHOD OF REMOVING DEFECT OF MASK

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

NANOSCALE SCANNING SENSORS

CASSETTE FOR HOLDING A PROBE

METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEA...

IN SITU MECHANICAL CHARACTERIZATION OF A SAMPLE STRAIN

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

METHOD FOR MEASURING CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEA...

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...

BLADE EDGE TIP MEASUREMENT

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...

METHOD AND SYSTEM FOR QUANTIFYING DEGREE OF BLENDING OF VIRGIN AND...

SCANNING PROBE MICROSCOPE (SPM) TIP

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...

METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

Large Radius Probe

INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...

METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT O...

AFM Imaging with Real Time Drift Correction

NANOSCALE SCANNING SENSORS

Metrology Probe with Built-In Angle and Method of Fabrication Thereof

AFM Imaging with Creep Correction

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...