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Processing in the Fourier or frequency domain when not imaged in the frequency domain
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G01B9/02084
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/02084
Processing in the Fourier or frequency domain when not imaged in the frequency domain
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Patents Grants
last 30 patents
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Patent Grant
Method and device for analog in situ laser process monitoring
Patent number
12,209,860
Issue date
Jan 28, 2025
UNIVERSITAET BAYREUTH
Georg Herink
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
Patent number
12,196,540
Issue date
Jan 14, 2025
Zhejiang University of Technology
Qiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Metrology method and apparatus for of determining a complex-valued...
Patent number
12,164,233
Issue date
Dec 10, 2024
ASML Netherlands B.V.
Alexander Prasetya Konijnenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical interference measuring apparatus and optical interference m...
Patent number
12,000,699
Issue date
Jun 4, 2024
Topcon Corporation
Homare Momiyama
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods improving optical coherence tomography (OCT) im...
Patent number
11,892,291
Issue date
Feb 6, 2024
LightLab Imaging, Inc.
Chih-Hao Liu
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring interfaces of an optical element
Patent number
11,808,656
Issue date
Nov 7, 2023
FOGALE NANOTECH
Alain Courteville
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomography with dispersed structured illumination
Patent number
11,725,927
Issue date
Aug 15, 2023
Cylite Pty Ltd
Steven James Frisken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Homodyne encoder system with adaptive path length matching
Patent number
11,703,318
Issue date
Jul 18, 2023
United States of America as represented by the Secretary of the Navy
Kyle Robert Drexler
G01 - MEASURING TESTING
Information
Patent Grant
Local shape deviation in a semiconductor specimen
Patent number
11,686,571
Issue date
Jun 27, 2023
Applied Materials Israel Ltd.
Roman Kris
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
11,675,208
Issue date
Jun 13, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Ellipsometer
Patent number
11,493,322
Issue date
Nov 8, 2022
Samsung Electronics Co., Ltd.
Yasuhiro Hidaka
G01 - MEASURING TESTING
Information
Patent Grant
Method for photocopying a sequence of cut surfaces inside a light-s...
Patent number
11,482,044
Issue date
Oct 25, 2022
VISOTEC GMBH
Helge Sudkamp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for measuring the thickness and refractive ind...
Patent number
11,466,978
Issue date
Oct 11, 2022
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Young-sik Ghim
G01 - MEASURING TESTING
Information
Patent Grant
Multi-spectral feature sensing techniques and sensors for determini...
Patent number
11,385,130
Issue date
Jul 12, 2022
Ryan Seeley
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection of vibrations
Patent number
11,371,878
Issue date
Jun 28, 2022
Elbit Systems Land and C4I Ltd.
Ilya Leizerson
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomography with dispersed structured illumination
Patent number
11,193,752
Issue date
Dec 7, 2021
Cylite Pty Ltd
Steven James Frisken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method, device and electronic apparatus for estimating physical par...
Patent number
11,156,450
Issue date
Oct 26, 2021
BEIJING INSTITUTE OF TECHNOLOGY
Mingfeng Lu
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric distance measurement based on compression of chirpe...
Patent number
11,098,997
Issue date
Aug 24, 2021
Kam C. Lau
G01 - MEASURING TESTING
Information
Patent Grant
Method for real-time inspection of structural components
Patent number
11,022,429
Issue date
Jun 1, 2021
Triad National Security, LLC
Nicholas D. Stull
G01 - MEASURING TESTING
Information
Patent Grant
Laser doppler vibrometry for eye surface vibration measurement to d...
Patent number
10,925,767
Issue date
Feb 23, 2021
LUTRONIC VISION INC
Seth Adrian Miller
G01 - MEASURING TESTING
Information
Patent Grant
Imaging apparatus and imaging method
Patent number
10,801,830
Issue date
Oct 13, 2020
SCREEN Holdings Co., Ltd.
Keisuke Kato
G01 - MEASURING TESTING
Information
Patent Grant
Dual-edge sampling with k-clock to avoid aliasing in optical cohere...
Patent number
10,767,973
Issue date
Sep 8, 2020
Alcon Inc.
Bing Wang
G01 - MEASURING TESTING
Information
Patent Grant
Methods to improve axial resolution in optical coherence tomography
Patent number
10,716,476
Issue date
Jul 21, 2020
Nanyang Technological University
Xinyu Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for exposing at least one sectional face inside a...
Patent number
10,682,052
Issue date
Jun 16, 2020
Medizinisches Laserzentrum Luebeck GmbH
Peter Koch
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Metrology of multi-layer stacks
Patent number
10,591,284
Issue date
Mar 17, 2020
Zygo Corporation
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Grant
Code-modulated phased-array interferometric imaging
Patent number
10,551,162
Issue date
Feb 4, 2020
North Carolina State University
Brian Floyd
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomographic imaging based image processing appara...
Patent number
10,548,480
Issue date
Feb 4, 2020
SCREEN Holdings Co., Ltd.
Naoki Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for phase resolved heterodyne shearographic measurements
Patent number
10,473,452
Issue date
Nov 12, 2019
UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
James D. Perea
G01 - MEASURING TESTING
Information
Patent Grant
Single shot full-field reflection phase microscopy
Patent number
10,451,402
Issue date
Oct 22, 2019
Massachusetts Institute of Technology
Zahid Yaqoob
G01 - MEASURING TESTING
Information
Patent Grant
Modular interferometric telescope
Patent number
10,422,625
Issue date
Sep 24, 2019
The Boeing Company
David Roderick Gerwe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SCANNING OVERLAY METROLOGY WITH HIGH SIGNAL TO NOISE RATIO
Publication number
20240280914
Publication date
Aug 22, 2024
KLA Corporation
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Application
Method of Processing Interferometry Signal, and Associated Interfer...
Publication number
20240053136
Publication date
Feb 15, 2024
Selene RODD-ROUTLEY
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING THE DIAMETER OF FILAMENT DIFFRACTION FRINGES B...
Publication number
20230366674
Publication date
Nov 16, 2023
ZHEJIANG UNIVERSITY OF TECHNOLOGY
Qiang LIN
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...
Publication number
20230349688
Publication date
Nov 2, 2023
SANTEC CORPORATION
Hiroyuki ITOH
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFEROMETRIC RANGE SENSOR
Publication number
20230314122
Publication date
Oct 5, 2023
Omron Corporation
Masayuki HAYAKAWA
G02 - OPTICS
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230288185
Publication date
Sep 14, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OPERATING AN OPTICAL TOMOGRAPHIC IMAGING APPARATUS
Publication number
20230213328
Publication date
Jul 6, 2023
DELAWAVE, INC.
Kenji TAIRA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230084871
Publication date
Mar 16, 2023
Omron Corporation
Kazuya KIMURA
G01 - MEASURING TESTING
Information
Patent Application
LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN
Publication number
20230069303
Publication date
Mar 2, 2023
APPLIED MATERIALS ISRAEL LTD.
Roman KRIS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
Publication number
20220357236
Publication date
Nov 10, 2022
FOGALE NANOTECH
Alain COURTEVILLE
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY METHOD AND APPARATUS FOR OF DETERMINING A COMPLEX-VALUED...
Publication number
20220299888
Publication date
Sep 22, 2022
ASML NETHERLANDS B.V.
Alexander Prasetya KONIJNENBERG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods Improving Optical Coherence Tomography (OCT) Im...
Publication number
20220260360
Publication date
Aug 18, 2022
LightLab Imaging, Inc.
Chih-Hao Liu
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
Publication number
20220228850
Publication date
Jul 21, 2022
TOPCON CORPORATION
Homare MOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
Publication number
20220221266
Publication date
Jul 14, 2022
TOPCON CORPORATION
Homare MOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH DISPERSED STRUCTURED ILLUMINATION
Publication number
20220065616
Publication date
Mar 3, 2022
Cylite Pty Ltd
Steven James FRISKEN
G01 - MEASURING TESTING
Information
Patent Application
ELLIPSOMETER
Publication number
20220003535
Publication date
Jan 6, 2022
Samsung Electronics Co., Ltd.
Yasuhiro HIDAKA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR IN SITU PROCESS MONITORING
Publication number
20210396508
Publication date
Dec 23, 2021
Universitaet Bayreuth
Georg HERINK
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SWEPT SOURCE OPTICAL COHERENCE TOMOGRAPHY IMAGING SYSTEM
Publication number
20210348912
Publication date
Nov 11, 2021
OPTOS PLC
Miguel Angel Preciado
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MULTI-SPECTRAL FEATURE SENSING TECHNIQUES AND SENSORS
Publication number
20210231526
Publication date
Jul 29, 2021
Ryan Seeley
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PHOTOCOPYING A SEQUENCE OF CUT SURFACES INSIDE A LIGHT-S...
Publication number
20210034863
Publication date
Feb 4, 2021
Visotec GmbH
Helge Sudkamp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LASER DOPPLER VIBROMETRY FOR EYE SURFACE VIBRATION MEASUREMENT TO D...
Publication number
20210000645
Publication date
Jan 7, 2021
Xinova, LLC
Seth Adrian MILLER
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHOD, DEVICE AND ELECTRONIC APPARATUS FOR ESTIMATING PHYSICAL PAR...
Publication number
20200355487
Publication date
Nov 12, 2020
Beijing Institute of Technology
Mingfeng LU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH DISPERSED STRUCTURED ILLUMINATION
Publication number
20200103215
Publication date
Apr 2, 2020
Cylite Pty Ltd
Steven James FRISKEN
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
IMAGING APPARATUS AND IMAGING METHOD
Publication number
20200096312
Publication date
Mar 26, 2020
SCREEN HOLDINGS C., LTD,
Keisuke KATO
G01 - MEASURING TESTING
Information
Patent Application
LENSLESS IMAGING WITH REDUCED APERTURE
Publication number
20190271534
Publication date
Sep 5, 2019
John Farah
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY OF MULTI-LAYER STACKS
Publication number
20190265023
Publication date
Aug 29, 2019
Zygo Corporation
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DETECTION OF VIBRATIONS
Publication number
20190212187
Publication date
Jul 11, 2019
ELBIT SYSTEMS LAND AND C4I LTD.
Ilya LEIZERSON
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REAL-TIME INSPECTION OF STRUCTURAL COMPONENTS
Publication number
20190186898
Publication date
Jun 20, 2019
Triad National Security, LLC
Nicholas D. Stull
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR THE OPTICAL INSPECTION AND MEASUREMENT OF A F...
Publication number
20190137265
Publication date
May 9, 2019
Unity Semiconductor
Jean-François BOULANGER
G01 - MEASURING TESTING
Information
Patent Application
DUAL-EDGE SAMPLING WITH K-CLOCK TO AVOID ALIASING IN OPTICAL COHERE...
Publication number
20190128659
Publication date
May 2, 2019
Novartis AG
Bing Wang
G01 - MEASURING TESTING