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CPC
G01J2003/2836

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/2836Programming unit

Industries

Patents Grantslast 30 patents

Information Patent Grant
Imaging assisted scanning spectroscopy for gem identification
- Patent number 12,085,511
- Issue date Sep 10, 2024
- Gemological Institute of America, Inc. (GIA)
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Spectrally resolved imaging for agricultural product assessment
- Patent number 11,982,616
- Issue date May 14, 2024
- Headwall Photonics Inc.
- Kwok-Keung Wong
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of imaging with multi-domain image sensor
- Patent number 11,982,527
- Issue date May 14, 2024
- QUALCOMM Incorporated
- Yun-Chieh Chang
- G01 - MEASURING TESTING
Information Patent Grant
Rolling principal component analysis for dynamic process monitoring...
- Patent number 11,920,980
- Issue date Mar 5, 2024
- Viavi Solutions Inc.
- Lan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and non-tra...
- Patent number 11,892,281
- Issue date Feb 6, 2024
- Otsuka Electronics Co., Ltd.
- Shiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Cellphone-based raman spectrometer system for the detection and ide...
- Patent number 11,879,777
- Issue date Jan 23, 2024
- The Texas A&M University System
- Peter M. Rentzepis
- G01 - MEASURING TESTING
Information Patent Grant
Blending process end point detection
- Patent number 11,860,035
- Issue date Jan 2, 2024
- Viavi Solutions Inc.
- Chang Meng Hsiung
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for spectral model explanation
- Patent number 11,852,532
- Issue date Dec 26, 2023
- Coretronic Corporation
- Feng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and methods of use
- Patent number 11,796,389
- Issue date Oct 24, 2023
- Viavi Solutions Inc.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging assisted scanning spectroscopy for gem identification
- Patent number 11,754,506
- Issue date Sep 12, 2023
- Gemological Institute of America, Inc. (GIA)
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Remote spectrometer control system
- Patent number 11,619,547
- Issue date Apr 4, 2023
- GREENTROPISM
- Pierre Gauvain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer spectral modulation spectrometer
- Patent number 11,609,117
- Issue date Mar 21, 2023
- ams AG
- Ruitao Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Learning method, management device, and management program
- Patent number 11,556,853
- Issue date Jan 17, 2023
- Tokyo Electron Limited
- Yuki Kataoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of conformal spectral library training
- Patent number 11,525,733
- Issue date Dec 13, 2022
- ChemImage Corporation
- Patrick J. Treado
- G01 - MEASURING TESTING
Information Patent Grant
Imaging assisted scanning spectroscopy for gem identification
- Patent number 11,499,920
- Issue date Nov 15, 2022
- Gemological Institute of America, Inc. (GIA)
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,378,451
- Issue date Jul 5, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and methods of use
- Patent number 11,237,051
- Issue date Feb 1, 2022
- VIAVI Solutions Inc.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-spectral gas analyzer system with multiple sets of spectral s...
- Patent number 11,022,545
- Issue date Jun 1, 2021
- Konica Minolta Business Solutions U.S.A., Inc.
- Leiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
Detection and classification of light sources using a diffraction g...
- Patent number 10,830,642
- Issue date Nov 10, 2020
- Mobileye Vision Technologies Ltd.
- Gideon Stein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor device and methods of use
- Patent number 10,768,047
- Issue date Sep 8, 2020
- VIAVI Solutions Inc.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for fluid composition characterization
- Patent number 9,921,204
- Issue date Mar 20, 2018
- Weatherford Technology Holdings, LLC
- Hamed Chok
- E21 - EARTH DRILLING MINING
Information Patent Grant
Moving platform borne infrared image-spectrum associated detection...
- Patent number 9,921,102
- Issue date Mar 20, 2018
- Huazhong University of Science and Technology
- Tianxu Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optimized orthonormal system and method for reducing dimensionality...
- Patent number 8,948,540
- Issue date Feb 3, 2015
- Raytheon Company
- Ian S. Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Optimized orthonormal system and method for reducing dimensionality...
- Patent number 8,675,989
- Issue date Mar 18, 2014
- Raytheon Company
- Ian S. Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device comprising photoelectric conversion element an...
- Patent number 7,791,012
- Issue date Sep 7, 2010
- Semiconductor Energy Laboratory Co., Ltd.
- Atsushi Hirose
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectrophotometer
- Patent number 6,999,168
- Issue date Feb 14, 2006
- Shimadzu Corporation
- Junki Ishimoto
- G01 - MEASURING TESTING
Information Patent Grant
Programmable standard for use in an apparatus and process for the n...
- Patent number 5,748,308
- Issue date May 5, 1998
- Abbott Laboratories
- John M. Lindberg
- G01 - MEASURING TESTING
Information Patent Grant
Current meter
- Patent number 4,620,148
- Issue date Oct 28, 1986
- Baird Corporation
- Arthur L. Davison
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
- Publication number 20240385119
- Publication date Nov 21, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G01 - MEASURING TESTING
Information Patent Application
COLORANT COMPENSATION USING RELATIVE COLORANT VOLUMES
- Publication number 20240308233
- Publication date Sep 19, 2024
- Hewlett-Packard Development Company, L.P.
- Jan Morovic
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...
- Publication number 20240302210
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Woo-Shik KIM
- G01 - MEASURING TESTING
Information Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
- Publication number 20240167872
- Publication date May 23, 2024
- VIAVI SOLUTIONS INC.
- Lan SUN
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING GAS QUANTITY IN A PIXEL BASED ON SPECTRAL MATCHED FILTERING
- Publication number 20240077416
- Publication date Mar 7, 2024
- Maxar Technologies Holdings Inc.
- Joseph Christy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING PARTICLES OF INTEREST USING SPECT...
- Publication number 20240027266
- Publication date Jan 25, 2024
- Hyperspectral Corp.
- Euan F. Mowat
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE AND METHODS OF USE
- Publication number 20240027267
- Publication date Jan 25, 2024
- VIAVI SOLUTIONS INC.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE
- Publication number 20240027269
- Publication date Jan 25, 2024
- TSINGHUA UNIVERSITY
- Kaiyu CUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
- Publication number 20240011833
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Akihiro Nojima
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
- Publication number 20230366830
- Publication date Nov 16, 2023
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DUAL COMB SPECTROSCOPY
- Publication number 20230349761
- Publication date Nov 2, 2023
- Government of the United States of America, as Represented by the Secretary o...
- Ian Robert Coddington
- G01 - MEASURING TESTING
Information Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
- Publication number 20230243699
- Publication date Aug 3, 2023
- VIAVI Solutions Inc.
- Lan SUN
- G01 - MEASURING TESTING
Information Patent Application
BLENDING PROCESS END POINT DETECTION
- Publication number 20230204417
- Publication date Jun 29, 2023
- VIAVI Solutions Inc.
- Chang Meng HSIUNG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM
- Publication number 20230175889
- Publication date Jun 8, 2023
- VIAVI SOLUTIONS INC.
- William D. HOUCK
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINANT CORRECTION IN AN IMAGING SYSTEM
- Publication number 20230082539
- Publication date Mar 16, 2023
- SPECTRICITY
- Jonathan Borremans
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
- Publication number 20230082604
- Publication date Mar 16, 2023
- Tsung-Han TSAI
- G01 - MEASURING TESTING
Information Patent Application
CELLPHONE-BASED RAMAN SPECTROMETER SYSTEM FOR THE DETECTION AND IDE...
- Publication number 20230003577
- Publication date Jan 5, 2023
- Peter M. Rentzepis
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20220349752
- Publication date Nov 3, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND NON-TRA...
- Publication number 20220316862
- Publication date Oct 6, 2022
- Otsuka Electronics Co., Ltd.
- Shiro KAWAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRALLY RESOLVED IMAGING FOR AGRICULTURAL PRODUCT ASSESSMENT
- Publication number 20220291120
- Publication date Sep 15, 2022
- Headwall Photonics Inc.
- Kwok-Keung Wong
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR SPECTRAL MODEL EXPLANATION
- Publication number 20220170790
- Publication date Jun 2, 2022
- CORETRONIC CORPORATION
- Feng Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTIMIZING OUTPUT RESULT OF SPECTROMETER AND ELECTRONIC...
- Publication number 20220163387
- Publication date May 26, 2022
- CORETRONIC CORPORATION
- Feng Wang
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE AND METHODS OF USE
- Publication number 20220155145
- Publication date May 19, 2022
- VIAVI Solutions Inc.
- William D. HOUCK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF CONFORMAL SPECTRAL LIBRARY TRAINING
- Publication number 20220018713
- Publication date Jan 20, 2022
- ChemImage Corporation
- Patrick J. TREADO
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
- Publication number 20210302322
- Publication date Sep 30, 2021
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-LAYER SPECTRAL MODULATION SPECTROMETER
- Publication number 20210293619
- Publication date Sep 23, 2021
- ams AG
- Ruitao Zheng
- G01 - MEASURING TESTING
Information Patent Application
A DETECTION SYSTEM FOR DETECTING MATTER AND DISTINGUISHING SPECIFIC...
- Publication number 20210270792
- Publication date Sep 2, 2021
- Photonic Detection Systems Pty Ltd
- Kamal ALAMEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR DEVICE AND METHODS OF USE
- Publication number 20200400494
- Publication date Dec 24, 2020
- VIAVI Solutions Inc.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNING METHOD, MANAGEMENT DEVICE, AND MANAGEMENT PROGRAM
- Publication number 20200342357
- Publication date Oct 29, 2020
- TOKYO ELECTRON LIMITED
- Yuki KATAOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR DEVICE AND METHODS OF USE
- Publication number 20190250034
- Publication date Aug 15, 2019
- VIAVI Solutions Inc.
- William D. Houck
- G06 - COMPUTING CALCULATING COUNTING

Programming unit

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging assisted scanning spectroscopy for gem identification

Spectrally resolved imaging for agricultural product assessment

Systems and methods of imaging with multi-domain image sensor

Rolling principal component analysis for dynamic process monitoring...

Optical measurement system, optical measurement method, and non-tra...

Cellphone-based raman spectrometer system for the detection and ide...

Blending process end point detection

Electronic device and method for spectral model explanation

Bandgap measurements of patterned film stacks using spectroscopic m...

Sensor device and methods of use

Imaging assisted scanning spectroscopy for gem identification

Remote spectrometer control system

Multi-layer spectral modulation spectrometer

Learning method, management device, and management program

Systems and methods of conformal spectral library training

Imaging assisted scanning spectroscopy for gem identification

Bandgap measurements of patterned film stacks using spectroscopic m...

Sensor device and methods of use

Multi-spectral gas analyzer system with multiple sets of spectral s...

Detection and classification of light sources using a diffraction g...

Sensor device and methods of use

System and method for fluid composition characterization

Moving platform borne infrared image-spectrum associated detection...

Optimized orthonormal system and method for reducing dimensionality...

Optimized orthonormal system and method for reducing dimensionality...

Semiconductor device comprising photoelectric conversion element an...

Spectrophotometer

Programmable standard for use in an apparatus and process for the n...

Current meter

Patents Applicationslast 30 patents

IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION

COLORANT COMPENSATION USING RELATIVE COLORANT VOLUMES

METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...

ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...

ESTIMATING GAS QUANTITY IN A PIXEL BASED ON SPECTRAL MATCHED FILTERING

SYSTEMS AND METHODS FOR DETECTING PARTICLES OF INTEREST USING SPECT...

SENSOR DEVICE AND METHODS OF USE

RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE

SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD

IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION

APPARATUS AND METHOD FOR DUAL COMB SPECTROSCOPY

ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...

BLENDING PROCESS END POINT DETECTION

OPTICAL SYSTEM

ILLUMINANT CORRECTION IN AN IMAGING SYSTEM

IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION

CELLPHONE-BASED RAMAN SPECTROMETER SYSTEM FOR THE DETECTION AND IDE...

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND NON-TRA...

SPECTRALLY RESOLVED IMAGING FOR AGRICULTURAL PRODUCT ASSESSMENT

ELECTRONIC DEVICE AND METHOD FOR SPECTRAL MODEL EXPLANATION

METHOD FOR OPTIMIZING OUTPUT RESULT OF SPECTROMETER AND ELECTRONIC...

SENSOR DEVICE AND METHODS OF USE

SYSTEMS AND METHODS OF CONFORMAL SPECTRAL LIBRARY TRAINING

IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION

MULTI-LAYER SPECTRAL MODULATION SPECTROMETER

A DETECTION SYSTEM FOR DETECTING MATTER AND DISTINGUISHING SPECIFIC...

SENSOR DEVICE AND METHODS OF USE

LEARNING METHOD, MANAGEMENT DEVICE, AND MANAGEMENT PROGRAM

SENSOR DEVICE AND METHODS OF USE