Projection of a pattern, viewing through a pattern

Industry

CPC
G01B11/254

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/254Projection of a pattern, viewing through a pattern

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the mudguard edge of a vehicle on a test bench
- Patent number 12,281,890
- Issue date Apr 22, 2025
- Dürr Assembly Products GmbH
- G01 - MEASURING TESTING
Information Patent Grant
Active optical compressive sensing
- Patent number 12,270,637
- Issue date Apr 8, 2025
- Lockheed Martin Corporation
- Joseph Robert Buck
- G02 - OPTICS
Information Patent Grant
Measurement system and measurement method
- Patent number 12,270,638
- Issue date Apr 8, 2025
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Moving robot and controlling method for the moving robot
- Patent number 12,266,128
- Issue date Apr 1, 2025
- LG Electronics Inc.
- Juno Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structured-light 3D scanning system and method
- Patent number 12,266,124
- Issue date Apr 1, 2025
- Himax Technologies Limited
- Hsueh-Tsung Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for increasing speckle spot density, diffractive optical ele...
- Patent number 12,265,233
- Issue date Apr 1, 2025
- Jiaxing UPhoton Optoelectronics Technology Co., Ltd.
- Peng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection sensor
- Patent number 12,253,353
- Issue date Mar 18, 2025
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring tools
- Patent number 12,226,868
- Issue date Feb 18, 2025
- Dr. Johannes Heidenhain GmbH
- Michael Butzhammer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and device for determining a bending angle on a bending machine
- Patent number 12,214,403
- Issue date Feb 4, 2025
- Bystronic Laser AG
- Kevin Scharfenberg
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Augmented reality ready optical tracking system
- Patent number 12,186,026
- Issue date Jan 7, 2025
- Smith & Nephew, Inc.
- Gaëtan Marti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
User interface for three-dimensional measurement device
- Patent number 12,169,121
- Issue date Dec 17, 2024
- Faro Technologies, Inc.
- Daniel Döring
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser irradiation apparatus, laser irradiation method, container, a...
- Patent number 12,152,873
- Issue date Nov 26, 2024
- Ricoh Company, Ltd.
- Kazuhiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,146,734
- Issue date Nov 19, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional imager and projection device
- Patent number 12,149,099
- Issue date Nov 19, 2024
- Austin Russell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image analysis device, analyis device, shape measurement device, im...
- Patent number 12,140,415
- Issue date Nov 12, 2024
- Nikon Corporation
- Sumito Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,135,204
- Issue date Nov 5, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution pseudo-random dots projector module for depth sensing
- Patent number 12,113,951
- Issue date Oct 8, 2024
- Google LLC
- Xi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Designing and constructing dot projectors for three-dimensional sen...
- Patent number 12,111,147
- Issue date Oct 8, 2024
- ams Sensors Singapore Pte. Ltd.
- Olivier Ripoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 12,078,474
- Issue date Sep 3, 2024
- NEC Corporation
- Shizuo Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement method, device, and storage medium
- Patent number 12,078,475
- Issue date Sep 3, 2024
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Jian Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 12,072,177
- Issue date Aug 27, 2024
- NEC Corporation
- Shizuo Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a contour of a frame groove
- Patent number 12,072,179
- Issue date Aug 27, 2024
- Carl Zeiss Vision International GmbH
- Jörg Carls
- B24 - GRINDING POLISHING
Information Patent Grant
Identification method, projection method and identification system
- Patent number 12,066,283
- Issue date Aug 20, 2024
- Seiko Epson Corporation
- Kohei Yanai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image projection measuring apparatus
- Patent number 12,066,284
- Issue date Aug 20, 2024
- SUBARU CORPORATION
- Takatoshi Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Object recognition apparatus and operation method thereof
- Patent number 12,055,494
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Suyeon Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method and recording medium storing command for inspection
- Patent number 12,051,606
- Issue date Jul 30, 2024
- Koh Young Technology Inc.
- Jung Woo Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for suppressing reflection of binary grating image projectio...
- Patent number 12,044,521
- Issue date Jul 23, 2024
- Zhejiang University
- Zaixing He
- G01 - MEASURING TESTING
Information Patent Grant
Object size estimation apparatus and method
- Patent number 12,031,811
- Issue date Jul 9, 2024
- HL KLEMOVE CORP.
- OhCheol Heo
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining a three-dimensional definition of...
- Patent number 12,031,812
- Issue date Jul 9, 2024
- VIRELUX Inspection Systems Sàrl
- Tom Reichert
- G01 - MEASURING TESTING
Information Patent Grant
Projection system for directing and monitoring activity in large sc...
- Patent number 12,028,504
- Issue date Jul 2, 2024
- Virtek Vision International, Inc.
- Kurt D. Rueb
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL CONTOUR SHAPE MEASURING SYSTEM
- Publication number 20250131595
- Publication date Apr 24, 2025
- YOUNG OPTICS INC.
- Ching-Chao TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INK JET PRINTER
- Publication number 20250128523
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Mamoru Idaka
- G01 - MEASURING TESTING
Information Patent Application
WAFER BOW METROLOGY SYSTEM
- Publication number 20250132180
- Publication date Apr 24, 2025
- TOKYO ELECTRON LIMITED
- Hoyoung KANG
- G01 - MEASURING TESTING
Information Patent Application
INK JET PRINTER
- Publication number 20250128525
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Mamoru Idaka
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND SYSTEM FOR MANUFACTURING THE SAME
- Publication number 20250123570
- Publication date Apr 17, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Wei WANG
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Information Measurement Apparatus, Measurement Me...
- Publication number 20250076036
- Publication date Mar 6, 2025
- Huawei Technologies Co., Ltd
- Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...
- Publication number 20250078297
- Publication date Mar 6, 2025
- NATIONAL SUN YAT-SEN UNIVERSITY
- Wei-hung SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076035
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Tatsuro HOMMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INCREASING SPECKLE SPOT DENSITY, DIFFRACTIVE OPTICAL ELE...
- Publication number 20250053023
- Publication date Feb 13, 2025
- Jiaxing UPhoton Optoelectronics Technology Co., Ltd.
- Peng CHEN
- G01 - MEASURING TESTING
Information Patent Application
MEASURING UNIT AND METHOD FOR OPTICALLY MEASURING OBJECTS
- Publication number 20250035433
- Publication date Jan 30, 2025
- Carl Zeiss GOM Metrology GmbH
- Michael Jörck
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250027766
- Publication date Jan 23, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURED LIGHT CODING METHOD AND SYSTEM FOR THREE-DIMENSIONAL INF...
- Publication number 20250003740
- Publication date Jan 2, 2025
- Alliedstar (Shanghai) Medical Technology Co., Ltd.
- Houhang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...
- Publication number 20240426599
- Publication date Dec 26, 2024
- Nikon Corporation
- Sumito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED LIGHT PATTERN COMBINED WITH PROJECTION OF MARKERS
- Publication number 20240410688
- Publication date Dec 12, 2024
- trinamiX GmbH
- Benjamin REIN
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED-LIGHT-BASED TRENCH PROFILE MEASUREMENT FOR PLANTER ROW UNIT
- Publication number 20240393107
- Publication date Nov 28, 2024
- Deere & Company
- Michio Kise
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
A THREE-DIMENSIONAL MEASURING DEVICE
- Publication number 20240310165
- Publication date Sep 19, 2024
- DENSO WAVE INCORPORATED
- Yusuke MITANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D SCANNER WITH STRUCTURED LIGHT PATTERN PROJECTOR AND METHOD OF US...
- Publication number 20240288267
- Publication date Aug 29, 2024
- CREAFORM INC.
- Jean-Nicolas Ouellet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING AN OBJECT IN A ROAD SURFACE, METHOD FOR AUTONO...
- Publication number 20240273916
- Publication date Aug 15, 2024
- VALEO VISION
- Mickael MIMOUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE FOR THREE-DIMENSIONAL SCANNER AND THREE-DIMENSIONAL SCANNER
- Publication number 20240263939
- Publication date Aug 8, 2024
- KEYENCE CORPORATION
- Yuji MIYAKI
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING DEVICE
- Publication number 20240255278
- Publication date Aug 1, 2024
- Mitsubishi Electric Corporation
- Yuya ARAI
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD 3D SCANNER
- Publication number 20240255277
- Publication date Aug 1, 2024
- CREAFORM INC.
- Nicolas Lebrun
- G01 - MEASURING TESTING
Information Patent Application
FISHEYE LENS DOT PROJECTOR
- Publication number 20240241388
- Publication date Jul 18, 2024
- Lumentum Operations LLC
- James CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO MONITOR ENVIRONMENTS
- Publication number 20240221417
- Publication date Jul 4, 2024
- The Nielsen Company (US), LLC
- Morris Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20240200935
- Publication date Jun 20, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM PROVIDING SHAPE FROM SHADING
- Publication number 20240175677
- Publication date May 30, 2024
- HEXAGON TECHNOLOGY CENTER GMBH
- Zheng YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH DATA MEASUREMENT HEAD, DEPTH DATA COMPUTING DEVICE, AND CORRE...
- Publication number 20240169570
- Publication date May 23, 2024
- SHANGHAI PERCIPIO TECHNOLOGY LIMITED
- Minjie WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRIPE PROJECTION SYSTEM
- Publication number 20240168369
- Publication date May 23, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Christian Schleith
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT METHOD, DEVICE, AND STORAGE MEDIUM
- Publication number 20240159521
- Publication date May 16, 2024
- Guangdong University of Technology
- Jian GAO
- G06 - COMPUTING CALCULATING COUNTING

Projection of a pattern, viewing through a pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring the mudguard edge of a vehicle on a test bench

Active optical compressive sensing

Measurement system and measurement method

Moving robot and controlling method for the moving robot

Structured-light 3D scanning system and method

Method for increasing speckle spot density, diffractive optical ele...

Surface inspection sensor

Device and method for measuring tools

Method and device for determining a bending angle on a bending machine

Augmented reality ready optical tracking system

User interface for three-dimensional measurement device

Laser irradiation apparatus, laser irradiation method, container, a...

Apparatus and method for determining three-dimensional shape of object

Three-dimensional imager and projection device

Image analysis device, analyis device, shape measurement device, im...

Apparatus and method for determining three-dimensional shape of object

High-resolution pseudo-random dots projector module for depth sensing

Designing and constructing dot projectors for three-dimensional sen...

Three-dimensional shape measuring apparatus, three-dimensional shap...

Three-dimensional measurement method, device, and storage medium

Three-dimensional shape measuring apparatus, three-dimensional shap...

Method and apparatus for determining a contour of a frame groove

Identification method, projection method and identification system

Image projection measuring apparatus

Object recognition apparatus and operation method thereof

Apparatus, method and recording medium storing command for inspection

Method for suppressing reflection of binary grating image projectio...

Object size estimation apparatus and method

Method and system for determining a three-dimensional definition of...

Projection system for directing and monitoring activity in large sc...

Patents Applicationslast 30 patents

THREE-DIMENSIONAL CONTOUR SHAPE MEASURING SYSTEM

INK JET PRINTER

WAFER BOW METROLOGY SYSTEM

INK JET PRINTER

SEMICONDUCTOR STRUCTURE AND SYSTEM FOR MANUFACTURING THE SAME

Three-Dimensional Information Measurement Apparatus, Measurement Me...

TOPOGRAPHICAL INSPECTION

SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...

OPTICAL DISPLACEMENT METER

METHOD FOR INCREASING SPECKLE SPOT DENSITY, DIFFRACTIVE OPTICAL ELE...

MEASURING UNIT AND METHOD FOR OPTICALLY MEASURING OBJECTS

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

STRUCTURED LIGHT CODING METHOD AND SYSTEM FOR THREE-DIMENSIONAL INF...

IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...

STRUCTURED LIGHT PATTERN COMBINED WITH PROJECTION OF MARKERS

STRUCTURED-LIGHT-BASED TRENCH PROFILE MEASUREMENT FOR PLANTER ROW UNIT

A THREE-DIMENSIONAL MEASURING DEVICE

3D SCANNER WITH STRUCTURED LIGHT PATTERN PROJECTOR AND METHOD OF US...

METHOD FOR DETECTING AN OBJECT IN A ROAD SURFACE, METHOD FOR AUTONO...

PROBE FOR THREE-DIMENSIONAL SCANNER AND THREE-DIMENSIONAL SCANNER

SHAPE MEASURING DEVICE

HANDHELD 3D SCANNER

FISHEYE LENS DOT PROJECTOR

METHODS AND APPARATUS TO MONITOR ENVIRONMENTS

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MEASURING SYSTEM PROVIDING SHAPE FROM SHADING

DEPTH DATA MEASUREMENT HEAD, DEPTH DATA COMPUTING DEVICE, AND CORRE...

STRIPE PROJECTION SYSTEM

THREE-DIMENSIONAL MEASUREMENT METHOD, DEVICE, AND STORAGE MEDIUM