Quiescent current [IDDQ] test or leakage current test

Industry

CPC
G01R31/3008

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3008Quiescent current [IDDQ] test or leakage current test

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Image-capturing unit and image-capturing apparatus
- Patent number 11,974,056
- Issue date Apr 30, 2024
- Nikon Corporation
- Hirofumi Arima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for determining leakage current of a field effect transistor...
- Patent number 11,940,479
- Issue date Mar 26, 2024
- Texas Instruments Incorporated
- Robert Allan Neidorff
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring quiescent current in a switching voltage regul...
- Patent number 11,927,624
- Issue date Mar 12, 2024
- Texas Instruments Incorporated
- Harsh Patel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device reliability evaluation apparatus and semicondu...
- Patent number 11,808,801
- Issue date Nov 7, 2023
- Mitsubishi Electric Corporation
- Chihiro Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Leakage screening based on use-case power prediction
- Patent number 11,768,237
- Issue date Sep 26, 2023
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 11,675,004
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 11,630,150
- Issue date Apr 18, 2023
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of high speed and dynamic configuration of a transceiver system
- Patent number 11,621,770
- Issue date Apr 4, 2023
- Hughes Network Systems, LLC
- Yogesh Sethi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor integrated circuit for detecting leakage current and...
- Patent number 11,391,773
- Issue date Jul 19, 2022
- SUNNYIC CORPORATION
- Sun-Jung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive on-chip power measurement technique
- Patent number 11,215,664
- Issue date Jan 4, 2022
- Apple Inc.
- Ke Yun
- G01 - MEASURING TESTING
Information Patent Grant
Performance testing method and measurement system
- Patent number 11,119,145
- Issue date Sep 14, 2021
- Rohde & Schwarz & GmbH & Co. KG
- Paul Gareth Lloyd
- G01 - MEASURING TESTING
Information Patent Grant
Image-capturing unit and image-capturing apparatus
- Patent number 11,089,223
- Issue date Aug 10, 2021
- Nikon Corporation
- Hirofumi Arima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power transistor leakage current with gate voltage less than threshold
- Patent number 11,085,961
- Issue date Aug 10, 2021
- Texas Instruments Incorporated
- Robert Allan Neidorff
- G01 - MEASURING TESTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 11,067,625
- Issue date Jul 20, 2021
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Back-to-back power switch controller
- Patent number 10,917,086
- Issue date Feb 9, 2021
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Jian Wen
- G01 - MEASURING TESTING
Information Patent Grant
Leakage power characterization at high temperatures for an integrat...
- Patent number 10,884,055
- Issue date Jan 5, 2021
- International Business Machines Corporation
- Diyanesh B. Chinnakkonda Vidyapoornachary
- G01 - MEASURING TESTING
Information Patent Grant
Test methods for packaged integrated circuits
- Patent number 10,859,630
- Issue date Dec 8, 2020
- Silicon Motion, Inc.
- Hung-Sen Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Image-capturing unit and image-capturing apparatus
- Patent number 10,692,916
- Issue date Jun 23, 2020
- Nikon Corporation
- Hirofumi Arima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
IC device authentication using energy characterization
- Patent number 10,684,324
- Issue date Jun 16, 2020
- SAIC
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,665,307
- Issue date May 26, 2020
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage current determination
- Patent number 10,649,040
- Issue date May 12, 2020
- NXP USA, INC.
- Stephan Ollitrault
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
IC device authentication using energy characterization
- Patent number 10,585,139
- Issue date Mar 10, 2020
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leakage current measurement circuit, integrated circuit and system...
- Patent number 10,473,716
- Issue date Nov 12, 2019
- Samsung Electronics Co., Ltd.
- Ghil-Geun Oh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting leakage current of high-power li...
- Patent number 10,310,002
- Issue date Jun 4, 2019
- Hyundai Mobis Co., Ltd.
- Sang Min Kim
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System, method and test layout for detecting leakage current
- Patent number 10,247,766
- Issue date Apr 2, 2019
- Shanghai Huali Microelectronics Corporation
- Fei Luo
- G01 - MEASURING TESTING
Information Patent Grant
Field-effect transistor and associated fault detection device
- Patent number 10,161,989
- Issue date Dec 25, 2018
- Renault S.A.S.
- François Tavernier
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan circuitry with IDDQ verification
- Patent number 10,139,448
- Issue date Nov 27, 2018
- NXP USA, INC.
- John M. Pigott
- G01 - MEASURING TESTING
Information Patent Grant
Leakage power characterization at high temperatures for an integrat...
- Patent number 10,031,180
- Issue date Jul 24, 2018
- International Business Machines Corporation
- Diyanesh B. Chinnakkonda Vidyapoornachary
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit authentication
- Patent number 9,970,986
- Issue date May 15, 2018
- Cryptography Research, Inc.
- Craig E. Hampel
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...
- Publication number 20240353485
- Publication date Oct 24, 2024
- ams-OSRAM International GmbH
- Stefan Kerscher
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD
- Publication number 20240319267
- Publication date Sep 26, 2024
- CANSEMI TECHNOLOGY INC.
- Zeyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR...
- Publication number 20240230748
- Publication date Jul 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...
- Publication number 20240219459
- Publication date Jul 4, 2024
- TEXAS INSTRUMENTS INCORPORATED
- HARSH PATEL
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE CURRENT DETECTION CIRCUIT
- Publication number 20240125848
- Publication date Apr 18, 2024
- SK HYNIX INC.
- Jong Seok JUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...
- Publication number 20230417829
- Publication date Dec 28, 2023
- TEXAS INSTRUMENTS INCORPORATED
- HARSH PATEL
- G01 - MEASURING TESTING
Information Patent Application
LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AN...
- Publication number 20230408577
- Publication date Dec 21, 2023
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
- Publication number 20230273257
- Publication date Aug 31, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
DIODE TEST MODULE FOR MONITORING LEAKAGE CURRENT AND ITS METHOD THE...
- Publication number 20230168298
- Publication date Jun 1, 2023
- Amazing Microelectronic Corp.
- CHIH-TING YEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Leakage Screening Based on Use-Case Power Prediction
- Publication number 20220268835
- Publication date Aug 25, 2022
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Application
Non-Invasive On-Chip Power Measurement Technique
- Publication number 20210396805
- Publication date Dec 23, 2021
- Apple Inc.
- Ke Yun
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
- Publication number 20210356521
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
IMAGE-CAPTURING UNIT AND IMAGE-CAPTURING APPARATUS
- Publication number 20210337142
- Publication date Oct 28, 2021
- Nikon Corporation
- Hirofumi ARIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINATION OF POWER MOSFET LEAKAGE CURRENTS
- Publication number 20210325443
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- G01 - MEASURING TESTING
Information Patent Application
IC Device Authentication Using Energy Characterization
- Publication number 20210311113
- Publication date Oct 7, 2021
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF HIGH SPEED AND DYNAMIC CONFIGURATION OF A TRANSCEIVER SYSTEM
- Publication number 20210199718
- Publication date Jul 1, 2021
- Hughes Network Systems, LLC
- Yogesh SETHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE RELIABILITY EVALUATION APPARATUS AND SEMICONDU...
- Publication number 20210116493
- Publication date Apr 22, 2021
- Mitsubishi Electric Corporation
- Chihiro KAWAHARA
- G01 - MEASURING TESTING
Information Patent Application
Back-To-Back Power Switch Controller
- Publication number 20200366287
- Publication date Nov 19, 2020
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Jian Wen
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT FOR DETECTING LEAKAGE CURRENT AND...
- Publication number 20200333395
- Publication date Oct 22, 2020
- SunnyIC Corporation
- Sun-Jung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PERFORMANCE TESTING METHOD AND MEASUREMENT SYSTEM
- Publication number 20200309847
- Publication date Oct 1, 2020
- Paul Gareth LLOYD
- G01 - MEASURING TESTING
Information Patent Application
IMAGE-CAPTURING UNIT AND IMAGE-CAPTURING APPARATUS
- Publication number 20200273902
- Publication date Aug 27, 2020
- Nikon Corporation
- Hirofumi ARIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC Device Authentication Using Energy Characterization
- Publication number 20200271719
- Publication date Aug 27, 2020
- SAIC
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF POWER MOSFET LEAKAGE CURRENTS
- Publication number 20200200815
- Publication date Jun 25, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20190287634
- Publication date Sep 19, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
LEAKAGE POWER CHARACTERIZATION AT HIGH TEMPERATURES FOR AN INTEGRAT...
- Publication number 20180372797
- Publication date Dec 27, 2018
- International Business Machines Corporation
- Diyanesh B. Chinnakkonda Vidyapoornachary
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE CURRENT MEASUREMENT CIRCUIT, INTEGRATED CIRCUIT AND SYSTEM...
- Publication number 20180356462
- Publication date Dec 13, 2018
- Samsung Electronics Co., Ltd.
- Ghil-Geun OH
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE CURRENT DETERMINATION
- Publication number 20180149689
- Publication date May 31, 2018
- NXP USA, Inc.
- Stephan OLLITRAULT
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS AND METHOD FOR DETECTING LEAKAGE CURRENT OF HIGH-POWER LI...
- Publication number 20180143235
- Publication date May 24, 2018
- HYUNDAI MOBIS CO., LTD.
- Sang Min KIM
- B60 - VEHICLES IN GENERAL
Information Patent Application
FIELD-EFFECT TRANSISTOR AND ASSOCIATED FAULT DETECTION DEVICE
- Publication number 20170192049
- Publication date Jul 6, 2017
- RENAULT S.A.S
- François Tavernier
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE TESTING OF INTEGRATED CIRCUITS
- Publication number 20160266200
- Publication date Sep 15, 2016
- GLOBALFOUNDRIES INC.
- Ricardo Pablo. Mikalo
- G01 - MEASURING TESTING

Quiescent current [IDDQ] test or leakage current test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Power leakage testing

Image-capturing unit and image-capturing apparatus

System for determining leakage current of a field effect transistor...

Method for measuring quiescent current in a switching voltage regul...

Semiconductor device reliability evaluation apparatus and semicondu...

Leakage screening based on use-case power prediction

Method and apparatus for detecting defective logic devices

IC device authentication using energy characterization

Method of high speed and dynamic configuration of a transceiver system

Semiconductor integrated circuit for detecting leakage current and...

Non-invasive on-chip power measurement technique

Performance testing method and measurement system

Image-capturing unit and image-capturing apparatus

Power transistor leakage current with gate voltage less than threshold

IC device authentication using energy characterization

Back-to-back power switch controller

Leakage power characterization at high temperatures for an integrat...

Test methods for packaged integrated circuits

Image-capturing unit and image-capturing apparatus

IC device authentication using energy characterization

Memory devices configured to perform leak checks

Leakage current determination

IC device authentication using energy characterization

Leakage current measurement circuit, integrated circuit and system...

Apparatus and method for detecting leakage current of high-power li...

System, method and test layout for detecting leakage current

Field-effect transistor and associated fault detection device

Scan circuitry with IDDQ verification

Leakage power characterization at high temperatures for an integrat...

Integrated circuit authentication

Patents Applicationslast 30 patents

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...

LEAKAGE TESTING STRUCTURE AND LEAKAGE TESTING METHOD

SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR...

METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...

LEAKAGE CURRENT DETECTION CIRCUIT

METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGUL...

LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AN...

METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES

DIODE TEST MODULE FOR MONITORING LEAKAGE CURRENT AND ITS METHOD THE...

Leakage Screening Based on Use-Case Power Prediction

Non-Invasive On-Chip Power Measurement Technique

METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES

IMAGE-CAPTURING UNIT AND IMAGE-CAPTURING APPARATUS

DETERMINATION OF POWER MOSFET LEAKAGE CURRENTS

IC Device Authentication Using Energy Characterization

METHOD OF HIGH SPEED AND DYNAMIC CONFIGURATION OF A TRANSCEIVER SYSTEM

SEMICONDUCTOR DEVICE RELIABILITY EVALUATION APPARATUS AND SEMICONDU...

Back-To-Back Power Switch Controller

SEMICONDUCTOR INTEGRATED CIRCUIT FOR DETECTING LEAKAGE CURRENT AND...

PERFORMANCE TESTING METHOD AND MEASUREMENT SYSTEM

IMAGE-CAPTURING UNIT AND IMAGE-CAPTURING APPARATUS

IC Device Authentication Using Energy Characterization

DETERMINATION OF POWER MOSFET LEAKAGE CURRENTS

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

LEAKAGE POWER CHARACTERIZATION AT HIGH TEMPERATURES FOR AN INTEGRAT...

LEAKAGE CURRENT MEASUREMENT CIRCUIT, INTEGRATED CIRCUIT AND SYSTEM...

LEAKAGE CURRENT DETERMINATION

APPARATUS AND METHOD FOR DETECTING LEAKAGE CURRENT OF HIGH-POWER LI...

FIELD-EFFECT TRANSISTOR AND ASSOCIATED FAULT DETECTION DEVICE

LEAKAGE TESTING OF INTEGRATED CIRCUITS