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Radiation diagrams of aerials; Antenna testing in general
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G01R29/10
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R29/00
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
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G01R29/10
Radiation diagrams of aerials; Antenna testing in general
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Patents Grants
last 30 patents
Information
Patent Grant
Fault detection device
Patent number
11,971,439
Issue date
Apr 30, 2024
Denso Corporation
Bunsei Murakami
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Anechoic chamber and construction method thereof
Patent number
11,959,952
Issue date
Apr 16, 2024
BEIJING ORIENT INSTITUTE OF MEASUREMENT AND TEST
Zibin He
G01 - MEASURING TESTING
Information
Patent Grant
Contactless microstrip to waveguide transition
Patent number
11,959,954
Issue date
Apr 16, 2024
GAPWAVES AB
Hanna Karlsson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhanced anechoic chamber
Patent number
11,959,955
Issue date
Apr 16, 2024
ARGO AI, LLC
Jonathan C. Berry
G01 - MEASURING TESTING
Information
Patent Grant
Sense and react tunable radio frequency systems
Patent number
11,956,935
Issue date
Apr 9, 2024
The United States of America, as represented by the Secretary of the Navy
Zachary A. Sechrist
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system
Patent number
11,933,829
Issue date
Mar 19, 2024
Rohde & Schwarz GmbH & Co. KG
Corbett Rowell
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method and device
Patent number
11,933,828
Issue date
Mar 19, 2024
Huawei Technologies Co., Ltd.
Yi Tang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mobile terminal testing device and mobile terminal testing method
Patent number
11,927,615
Issue date
Mar 12, 2024
Anritsu Corporation
Hideyuki Endo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use embedded patterns and S-parameters of a...
Patent number
11,921,144
Issue date
Mar 5, 2024
Keysight Technologies, Inc.
Murthy S. Murali Upmaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test apparatus and test method
Patent number
11,921,140
Issue date
Mar 5, 2024
Anritsu Corporation
Tomohiko Maruo
G01 - MEASURING TESTING
Information
Patent Grant
Phased array over the air testing
Patent number
11,916,302
Issue date
Feb 27, 2024
Tektronix, Inc.
Donald J. Dalebroux
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-axis test equipment
Patent number
11,892,492
Issue date
Feb 6, 2024
Milliwave Silicon Solutions, Inc.
JeanMarc Laurent
G01 - MEASURING TESTING
Information
Patent Grant
Over the air (OTA) chip testing system
Patent number
11,879,925
Issue date
Jan 23, 2024
Johnstech International Corporation
Mike Andres
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Arrangement and method for testing a 4.5G or a 5G base station
Patent number
11,879,922
Issue date
Jan 23, 2024
Orbis Systems Oy
Mika Kiiskilä
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for performing measurements of antenna under test...
Patent number
11,879,924
Issue date
Jan 23, 2024
Keysight Technologies, Inc.
Zhu Wen
G01 - MEASURING TESTING
Information
Patent Grant
Method, device, system and terminal for measuring total radiation p...
Patent number
11,879,926
Issue date
Jan 23, 2024
XI'AN ZHONGXING NEW SOFTWARE CO., LTD
Hua Gao
G01 - MEASURING TESTING
Information
Patent Grant
System and method for the automated validation of a semi-anechoic c...
Patent number
11,867,739
Issue date
Jan 9, 2024
Phillip C. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Multipurpose millimeter-wave radio frequency system and methods of use
Patent number
11,867,738
Issue date
Jan 9, 2024
The Board of Regents of the University of Oklahoma
Jorge Luis Salazar-Cerreno
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Device for testing antenna module comprising plurality of antenna e...
Patent number
11,848,715
Issue date
Dec 19, 2023
Samsung Electronics Co., Ltd.
Byungchul Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device for measuring beamforming signal having plurality...
Patent number
11,835,566
Issue date
Dec 5, 2023
Samsung Electronics Co., Ltd.
Ilpyo Hong
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for using pulsed radio frequency (RF) signals and...
Patent number
11,835,563
Issue date
Dec 5, 2023
LITEPOINT CORPORATION
Minh-Chau Huynh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Field probe and method for conducting antenna measurements
Patent number
11,835,565
Issue date
Dec 5, 2023
Rohde & Schwarz GmbH & Co. KG
Mert Celik
G01 - MEASURING TESTING
Information
Patent Grant
Transmission absorbing structure and antenna in-band characteristic...
Patent number
11,828,781
Issue date
Nov 28, 2023
38TH RESEARCH INSTITUTE, CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
Xiaopeng Lu
G01 - MEASURING TESTING
Information
Patent Grant
In-field millimeter-wave phased array radiation pattern estimation...
Patent number
11,824,272
Issue date
Nov 21, 2023
International Business Machines Corporation
Alberto Valdes Garcia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple-band compact, near-field-to-far-field and direct far-field...
Patent number
11,815,539
Issue date
Nov 14, 2023
EMITE INGENIERIA S.L.
David Agapito Sanchez Hernandez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
Patent number
11,802,904
Issue date
Oct 31, 2023
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus, and device of reconstructing non-kronecker struc...
Patent number
11,802,898
Issue date
Oct 31, 2023
Beijing University of Posts & Telecommunications
Yong Li
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method(s) for wet radome characterization and radar c...
Patent number
11,796,580
Issue date
Oct 24, 2023
The Board of Regents of the University of Oklahoma
Jorge Luis Salazar Cerreno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test apparatus of antenna array
Patent number
11,789,055
Issue date
Oct 17, 2023
Advantest Corporation
Koji Asami
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic stirrer and reflection chamber
Patent number
11,789,056
Issue date
Oct 17, 2023
TDK Corporation
Masataka Midori
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR THE AUTOMATED VALIDATION OF A SEMI-ANECHOIC C...
Publication number
20240142507
Publication date
May 2, 2024
Phillip C. MILLER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR TESTING DYNAMIC BEAM ADAPTIVE RADIO RESOUR...
Publication number
20240146430
Publication date
May 2, 2024
Nokia Technologies Oy
Dimitri GOLD
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TEST SYSTEM AND TEST METHOD
Publication number
20240125833
Publication date
Apr 18, 2024
Rohde& Schwarz GmbH & Co. KG
Reiner Stuhlfauth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR IMPORTING ANTENNA CONFIGURATION
Publication number
20240106552
Publication date
Mar 28, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Byron-Lim Timothy STEFFAN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OVER THE AIR (OTA) TESTING OF AN ANTENNA IN PACKAGE (AIP) DEVICE IN...
Publication number
20240061030
Publication date
Feb 22, 2024
Advantest Corporation
José Moreira
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TESTER AND METHOD FOR WLAN HANDOVER (ROAMING) PERFORMANCE
Publication number
20240056841
Publication date
Feb 15, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Mahmud NASEEF
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATING RADIO PERFORMANCE
Publication number
20240056201
Publication date
Feb 15, 2024
MEDIATEK INC.
Shih-Wei HSIEH
G01 - MEASURING TESTING
Information
Patent Application
A SUPPORT STRUCTURE FOR A DEVICE UNDER TEST ALLOWING ROTATION
Publication number
20240044962
Publication date
Feb 8, 2024
Verkotan Oy
Pertti MÄKIKYRÖ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THE AUTOMATED VALIDATION OF A SEMI-ANECHOIC C...
Publication number
20240036095
Publication date
Feb 1, 2024
Phillip C. MILLER
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
Publication number
20240027519
Publication date
Jan 25, 2024
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Application
MOBILITY ATTENUATION TESTING EQUIPMENT FOR 5G HIGH BAND
Publication number
20240019474
Publication date
Jan 18, 2024
Telefonaktiebolaget LM Ericsson (publ)
Haitao SUN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CORRELATION-BASED ENTROPY EXTRACTION SOLUTION FOR MIMO SYSTEMS
Publication number
20240012040
Publication date
Jan 11, 2024
EV-TECHNOLOGIES
Sidina WANE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING ARRAY PATH OF BEAM FORMING TES...
Publication number
20230421270
Publication date
Dec 28, 2023
INNOWIRELESS CO., LTD.
Young Su KWAK
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
3D REAL-TIME ANTENNA CHARACTERIZATION
Publication number
20230408566
Publication date
Dec 21, 2023
Technische Universiteit Delft
Marco SPIRITO
G01 - MEASURING TESTING
Information
Patent Application
RADIO WAVE DEVICE TESTING SYSTEM HAVING IMPROVED SIGNAL TRANSMISSIO...
Publication number
20230400493
Publication date
Dec 14, 2023
National Radio Research Agency
KANG WOOK KIM
G01 - MEASURING TESTING
Information
Patent Application
LEARNING METHOD, WIRELESS QUALITY ESTIMATION METHOD, LEARNING DEVIC...
Publication number
20230388812
Publication date
Nov 30, 2023
Nippon Telegraph and Telephone Corporation
Keisuke WAKAO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ANTENNA TEST SYSTEM
Publication number
20230366918
Publication date
Nov 16, 2023
Agera Precison Co.
Meng-Hua TSAI
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY ANTENNA MEASUREMENT SYSTEM
Publication number
20230358796
Publication date
Nov 9, 2023
Nippon Telegraph and Telephone Corporation
Go Itami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTENNA TESTING DEVICE FOR HIGH FREQUENCY ANTENNAS
Publication number
20230333150
Publication date
Oct 19, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Chi-Chang LAI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD OF FOCUSING RADIO WAVE ENERGY
Publication number
20230324446
Publication date
Oct 12, 2023
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Won Young SONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSMISSION ABSORBING STRUCTURE AND ANTENNA IN-BAND CHARACTERISTIC...
Publication number
20230324444
Publication date
Oct 12, 2023
38th Research Institute, China Electronics Technology Group Corporation
Xiaopeng LU
G01 - MEASURING TESTING
Information
Patent Application
RADIO FREQUENCY DETECTOR FOR TEST CHAMBER
Publication number
20230308194
Publication date
Sep 28, 2023
Communications Test Design, Inc.
Paul Casale
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD FOR PERFORMNG MEASUREMENTS OF ANTENNA UNDER TEST...
Publication number
20230258703
Publication date
Aug 17, 2023
Keysight Technologies, Inc.
Zhu Wen
G01 - MEASURING TESTING
Information
Patent Application
System and Method for using Pulsed Radio Frequency (RF) Signals and...
Publication number
20230258702
Publication date
Aug 17, 2023
Minh-Chau Huynh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
RADIO TERMINAL TEST APPARATUS AND RADIO TERMINAL TEST METHOD
Publication number
20230254055
Publication date
Aug 10, 2023
Anritsu Corporation
Takasumi IKEBE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ATOM-BASED CLOSED-LOOP CONTROL FOR ELECTROMAGNETIC RADIATION MEASUR...
Publication number
20230243881
Publication date
Aug 3, 2023
Rydberg Technologies Inc.
David A. ANDERSON
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION DEVICE OF RADIO COMMUNICATION MODULE
Publication number
20230228799
Publication date
Jul 20, 2023
FUJIKURA LTD.
Yuki Suto
G01 - MEASURING TESTING
Information
Patent Application
TESTING BASE
Publication number
20230152361
Publication date
May 18, 2023
TMY Technology Inc.
Su-Wei Chang
G01 - MEASURING TESTING
Information
Patent Application
MULTI-AXIS TEST EQUIPMENT
Publication number
20230133841
Publication date
May 4, 2023
MILLIWAVE SILICON SOLUTIONS, INC.
JeanMarc Laurent
G01 - MEASURING TESTING
Information
Patent Application
OVER-THE-AIR MEASUREMENT SYSTEM
Publication number
20230123894
Publication date
Apr 20, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Andreas Raith
H01 - BASIC ELECTRIC ELEMENTS