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G01S7/486
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PHYSICS
G01
Measuring instruments
G01S
RADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01S7/00
Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
Current Industry
G01S7/486
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Patents Grants
last 30 patents
Information
Patent Grant
Light receiving element and ranging system
Patent number
12,203,807
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
LIDAR pulse elongation
Patent number
12,204,053
Issue date
Jan 21, 2025
Waymo LLC
Luke Wachter
G01 - MEASURING TESTING
Information
Patent Grant
System and method for entangled state identification using metadata
Patent number
12,206,459
Issue date
Jan 21, 2025
Qubit Moving and Storage, LLC
Gary Vacon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector array detection with hadamard pattern scanning
Patent number
12,204,051
Issue date
Jan 21, 2025
BEIJING VOYAGER TECHNOLOGY CO., LTD.
Yue Lu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Lidar receiver circuit having redundancy to bypass failure
Patent number
12,204,055
Issue date
Jan 21, 2025
Elmos Semiconductor SE
André Srowig
G01 - MEASURING TESTING
Information
Patent Grant
Integrated device for temporal binning of received photons
Patent number
12,203,854
Issue date
Jan 21, 2025
Quantum-Si Incorporated
Jonathan M. Rothberg
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Detection device, detection system, detection method, and storage m...
Patent number
12,203,744
Issue date
Jan 21, 2025
Nikon Corporation
Yoshihiro Nakagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Phase noise and methods of correction in multi-frequency mode lidar
Patent number
12,204,052
Issue date
Jan 21, 2025
Sense Photonics, Inc.
Dietrich Dehlinger
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving device and distance measuring device
Patent number
12,204,024
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Yasuhiro Shinozuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Safety laser scanner and related method for adjusting distance meas...
Patent number
12,204,027
Issue date
Jan 21, 2025
Datalogic IP Tech S.r.l.
Salvatore Valerio Cani
G01 - MEASURING TESTING
Information
Patent Grant
Distance detection device
Patent number
12,196,855
Issue date
Jan 14, 2025
SZ DJI Technology Co., Ltd
Huai Huang
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR signal acquisition
Patent number
12,196,889
Issue date
Jan 14, 2025
VELODYNE LIDAR USA, INC.
David S. Hall
G01 - MEASURING TESTING
Information
Patent Grant
Underwater mono-static laser imaging
Patent number
12,196,861
Issue date
Jan 14, 2025
Raytheon Company
Matthew D. Thoren
G01 - MEASURING TESTING
Information
Patent Grant
Distance image acquisition apparatus and distance image acquisition...
Patent number
12,189,031
Issue date
Jan 7, 2025
FUJIFILM Corporation
Tomonori Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Processing system for LIDAR measurements
Patent number
12,189,038
Issue date
Jan 7, 2025
Ouster, Inc.
Angus Pacala
G01 - MEASURING TESTING
Information
Patent Grant
Distance-measuring imaging device
Patent number
12,189,063
Issue date
Jan 7, 2025
NUVOTON TECHNOLOGY CORPORATION JAPAN
Toshiaki Ozeki
G01 - MEASURING TESTING
Information
Patent Grant
Optical distance measuring device
Patent number
12,189,057
Issue date
Jan 7, 2025
Denso Corporation
Noriyuki Ozaki
G01 - MEASURING TESTING
Information
Patent Grant
Stacked filter assembly for optical integrated circuit package with...
Patent number
12,189,064
Issue date
Jan 7, 2025
STMICROELECTRONICS INTERNATIONAL N.V.
Colin Campbell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distance measurement device, camera, inspection adjustment device,...
Patent number
12,181,578
Issue date
Dec 31, 2024
TOPPAN Holdings Inc.
Masanori Nagase
G01 - MEASURING TESTING
Information
Patent Grant
CMOS image sensor for direct time of flight measurement
Patent number
12,181,610
Issue date
Dec 31, 2024
TELEDYNE INNOVACIONES MICROELECTRONICAS SLU
Rafael Dominguez Castro
G01 - MEASURING TESTING
Information
Patent Grant
Distance measuring device, camera, and method for adjusting drive o...
Patent number
12,181,609
Issue date
Dec 31, 2024
TOPPAN Holdings Inc.
Masanori Nagase
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight to distance calculator
Patent number
12,181,611
Issue date
Dec 31, 2024
ams International AG
Thomas Jessenig
G01 - MEASURING TESTING
Information
Patent Grant
Lidar sensor for optically detecting a field of vision, working dev...
Patent number
12,174,298
Issue date
Dec 24, 2024
Robert Bosch GmbH
Reiner Schnitzer
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric conversion apparatus and system having photodiodes to...
Patent number
12,177,593
Issue date
Dec 24, 2024
Canon Kabushiki Kaisha
Kenzo Tojima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated lidar target simulation scanning systems and methods
Patent number
12,174,296
Issue date
Dec 24, 2024
Keysight Technologies, Inc.
Chan Fong Tan
G01 - MEASURING TESTING
Information
Patent Grant
High contrast grating for highly reflective mems surface for LiDAR
Patent number
12,174,316
Issue date
Dec 24, 2024
BEIJING VOYAGER TECHNOLOGY CO., LTD.
Yue Lu
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving element, ranging module, and electronic apparatus
Patent number
12,176,373
Issue date
Dec 24, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Yoshiki Ebiko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adaptive coding for lidar systems
Patent number
12,169,254
Issue date
Dec 17, 2024
HESAI TECHNOLOGY CO., LTD.
Xuezhou Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Lidar receiving apparatus, lidar system and laser ranging method
Patent number
12,169,253
Issue date
Dec 17, 2024
SUTENG INNOVATION TECHNOLOGY CO., LTD.
Shen Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive processing in time of flight imaging
Patent number
12,164,035
Issue date
Dec 10, 2024
Microsoft Technology Licensing, LLC
Sergio Ortiz Egea
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HISTOGRAM GENERATING CIRCUIT, OPTICAL RANGEFINDER, HISTOGRAM GENERA...
Publication number
20250028032
Publication date
Jan 23, 2025
HOKUYO AUTOMATIC CO., LTD.
Kunihiro YASUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFICATION OF A NOISE POINT USED FOR LIDAR, AND LIDA...
Publication number
20250028033
Publication date
Jan 23, 2025
Hesai Technology Co., Ltd.
Xiaotong ZHOU
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT SENSOR AND ELECTRONIC DEVICE
Publication number
20250028051
Publication date
Jan 23, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Michiel TIMMERMANS
G01 - MEASURING TESTING
Information
Patent Application
AVALANCHE PHOTODIODE SENSOR AND DISTANCE MEASURING DEVICE
Publication number
20250031484
Publication date
Jan 23, 2025
Sony Semiconductor Solutions Corporation
Shinichiro YAGI
G01 - MEASURING TESTING
Information
Patent Application
LIDAR DEVICE COMPRISING A PLURALITY OF BEAM STEERING CELLS FOR STEE...
Publication number
20250020783
Publication date
Jan 16, 2025
SOS Lab co., Ltd
Jun Hwan JANG
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND INFORMATION PROCESSING METHOD
Publication number
20250020808
Publication date
Jan 16, 2025
SONY GROUP CORPORATION
YIWEN ZHU
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD FOR LIDAR, COMPUTER STORAGE MEDIUM AND LIDAR
Publication number
20250020778
Publication date
Jan 16, 2025
Hesai Technology Co., Ltd.
Feng LIANG
G01 - MEASURING TESTING
Information
Patent Application
LIDAR System with Dynamic Resolution
Publication number
20250012903
Publication date
Jan 9, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Ivan KOUDAR
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM
Publication number
20250012907
Publication date
Jan 9, 2025
ams-OSRAM lnternational GmbH
Farhang GHASEMI AFSHAR
G01 - MEASURING TESTING
Information
Patent Application
DEPTH IMAGING DEVICE, PACKAGE, MODULE, AND DEPTH IMAGING SYSTEM
Publication number
20250012925
Publication date
Jan 9, 2025
NUVOTON TECHNOLOGY CORPORATION JAPAN
Hideki KAWAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR LOCATING A TARGET BY MEANS OF A DETECTOR HAVING A PLURAL...
Publication number
20250012900
Publication date
Jan 9, 2025
SAFRAN ELECTRONICS & DEFENSE
Pascal JUNIQUE
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT METHOD
Publication number
20250012902
Publication date
Jan 9, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Maarten KUIJK
G01 - MEASURING TESTING
Information
Patent Application
MULTISPECTRAL RANGING AND IMAGING SYSTEMS
Publication number
20250012629
Publication date
Jan 9, 2025
Ouster, Inc.
Angus Pacala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME-OF-FLIGHT RISING EDGE ADAPTIVE CROSS-TALK CORRECTION
Publication number
20250012901
Publication date
Jan 9, 2025
STMicroelectronics International N.V.
Andreas Assmann
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIAL CORRELATOR FILTER FOR EFFICIENT TOF PEAK FINDING
Publication number
20250012926
Publication date
Jan 9, 2025
STMicroelectroniics (Research & development) Limited
Andreas Assmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DEPTH IMAGE SENSING DEVICE, IMAGE SIGNAL PROCESSOR AND IMAGE SIGNAL...
Publication number
20250008235
Publication date
Jan 2, 2025
SK HYNIX INC.
Toshiaki NAGAI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LIDAR Systems with Improved Time-To-Digital Conversion Circuitry
Publication number
20250004110
Publication date
Jan 2, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Anthony Richard HUGGETT
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, CONTROL METHOD, PROGRAM, AND STORAGE...
Publication number
20250004138
Publication date
Jan 2, 2025
PIONEER CORPORATION
Makoto MATSUMARU
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION ELEMENT
Publication number
20250004111
Publication date
Jan 2, 2025
Sony Semiconductor Solutions Corporation
YASUNORI TSUKUDA
G01 - MEASURING TESTING
Information
Patent Application
RAPIDLY TUNEABLE DIODE LIDAR FOR METHANE DETECTION
Publication number
20250003872
Publication date
Jan 2, 2025
QLM Technology Ltd
Xiao Ai
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR ARRAY BASED LIDAR SYSTEMS WITH REDUCED IN...
Publication number
20250004109
Publication date
Jan 2, 2025
SOS Lab co., Ltd
Jamie E. Retterath
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE IMAGE CAPTURING DEVICE AND DISTANCE IMAGE CAPTURING METHOD
Publication number
20250004113
Publication date
Jan 2, 2025
TOPPAN Holdings Inc.
Takahiro AKUTSU
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTING DEVICE AND ELECTRONIC DEVICE
Publication number
20250006764
Publication date
Jan 2, 2025
Sony Semiconductor Solutions Corporation
Kyohei MIZUTA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS OF PERFORMING LIGHT DETECTION AND RANGING (LIDAR) USING TIM...
Publication number
20250004131
Publication date
Jan 2, 2025
The Government of the United States of America, as represented by the Secreta...
Joshua B. Beun
G01 - MEASURING TESTING
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING APPARATUS
Publication number
20240426982
Publication date
Dec 26, 2024
TOPPAN Holdings Inc.
Yu OOKUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CROSSTALK CALIBRATION FOR DIRECT TIME-OF-FLIGHT SENSOR
Publication number
20240426985
Publication date
Dec 26, 2024
STMicroelectronics International N.V.
Thomas Perotto
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING SYSTEM, AND DISTANCE...
Publication number
20240426983
Publication date
Dec 26, 2024
Sony Semiconductor Solutions Corporation
TAKESHI OYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING RETURNED LIGHT SIGNALS FROM INTERNAL REFERENCE TARGET
Publication number
20240426986
Publication date
Dec 26, 2024
LUMINAR, LLC
Liviu I. Voicu
G01 - MEASURING TESTING
Information
Patent Application
TIME OF FLIGHT SENSOR FOR CALIBRATING DETECTION DEVIATION
Publication number
20240426991
Publication date
Dec 26, 2024
PIXART IMAGING INC.
Tso-Sheng TSAI
G01 - MEASURING TESTING
Information
Patent Application
Object Detection Method And System
Publication number
20240427017
Publication date
Dec 26, 2024
Hyundai Motor Company
Mi Rim Noh
G06 - COMPUTING CALCULATING COUNTING