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G01S7/486
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01S
RADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01S7/00
Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
Current Industry
G01S7/486
Receivers
Industries
Overview
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Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Dynamic receiver gain control for LiDAR system
Patent number
12,222,456
Issue date
Feb 11, 2025
GUANGZHOU WOYA LAIDELING TECHNOLOGY CO., LTD.
Yue Lu
G01 - MEASURING TESTING
Information
Patent Grant
Integrated lidar image-sensor devices and systems and related metho...
Patent number
12,222,454
Issue date
Feb 11, 2025
Sense Photonics, Inc.
Hod Finkelstein
G01 - MEASURING TESTING
Information
Patent Grant
Time of flight apparatus and method
Patent number
12,222,455
Issue date
Feb 11, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Manuel Amaya-Benitez
G01 - MEASURING TESTING
Information
Patent Grant
Protective mask for an optical receiver
Patent number
12,222,240
Issue date
Feb 11, 2025
Luminar Technologies, Inc.
Justin Robert Woodruff
G01 - MEASURING TESTING
Information
Patent Grant
Airborne topo-bathy lidar system and methods thereof
Patent number
12,222,459
Issue date
Feb 11, 2025
WOOLPERT, INC.
Nathan Lee Hopper
G01 - MEASURING TESTING
Information
Patent Grant
Optimized time of flight vision camera for a multi-camera environment
Patent number
12,222,453
Issue date
Feb 11, 2025
TELEDYNE E2V SEMICONDUCTORS SAS
Pierre Fereyre
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for adaptive range coverage using LIDAR
Patent number
12,222,452
Issue date
Feb 11, 2025
Waymo LLC
Mark Alexander Shand
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR system design to mitigate LIDAR cross-talk
Patent number
12,222,457
Issue date
Feb 11, 2025
AURORA OPERATIONS, INC.
Soren Juelsgaard
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for a time-to-digital converter
Patent number
12,210,321
Issue date
Jan 28, 2025
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Anthony Richard Huggett
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric conversion device, photodetection system, and movable...
Patent number
12,210,101
Issue date
Jan 28, 2025
Canon Kabushiki Kaisha
Shintaro Maekawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
LiDAR device
Patent number
12,210,125
Issue date
Jan 28, 2025
Samsung Electronics Co., Ltd.
Jungwoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving element and ranging system
Patent number
12,203,807
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
LIDAR pulse elongation
Patent number
12,204,053
Issue date
Jan 21, 2025
Waymo LLC
Luke Wachter
G01 - MEASURING TESTING
Information
Patent Grant
System and method for entangled state identification using metadata
Patent number
12,206,459
Issue date
Jan 21, 2025
Qubit Moving and Storage, LLC
Gary Vacon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector array detection with hadamard pattern scanning
Patent number
12,204,051
Issue date
Jan 21, 2025
BEIJING VOYAGER TECHNOLOGY CO., LTD.
Yue Lu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Lidar receiver circuit having redundancy to bypass failure
Patent number
12,204,055
Issue date
Jan 21, 2025
Elmos Semiconductor SE
André Srowig
G01 - MEASURING TESTING
Information
Patent Grant
Integrated device for temporal binning of received photons
Patent number
12,203,854
Issue date
Jan 21, 2025
Quantum-Si Incorporated
Jonathan M. Rothberg
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Detection device, detection system, detection method, and storage m...
Patent number
12,203,744
Issue date
Jan 21, 2025
Nikon Corporation
Yoshihiro Nakagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Phase noise and methods of correction in multi-frequency mode lidar
Patent number
12,204,052
Issue date
Jan 21, 2025
Sense Photonics, Inc.
Dietrich Dehlinger
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving device and distance measuring device
Patent number
12,204,024
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Yasuhiro Shinozuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Safety laser scanner and related method for adjusting distance meas...
Patent number
12,204,027
Issue date
Jan 21, 2025
Datalogic IP Tech S.r.l.
Salvatore Valerio Cani
G01 - MEASURING TESTING
Information
Patent Grant
Distance detection device
Patent number
12,196,855
Issue date
Jan 14, 2025
SZ DJI Technology Co., Ltd
Huai Huang
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR signal acquisition
Patent number
12,196,889
Issue date
Jan 14, 2025
VELODYNE LIDAR USA, INC.
David S. Hall
G01 - MEASURING TESTING
Information
Patent Grant
Underwater mono-static laser imaging
Patent number
12,196,861
Issue date
Jan 14, 2025
Raytheon Company
Matthew D. Thoren
G01 - MEASURING TESTING
Information
Patent Grant
Distance image acquisition apparatus and distance image acquisition...
Patent number
12,189,031
Issue date
Jan 7, 2025
FUJIFILM Corporation
Tomonori Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Processing system for LIDAR measurements
Patent number
12,189,038
Issue date
Jan 7, 2025
Ouster, Inc.
Angus Pacala
G01 - MEASURING TESTING
Information
Patent Grant
Distance-measuring imaging device
Patent number
12,189,063
Issue date
Jan 7, 2025
NUVOTON TECHNOLOGY CORPORATION JAPAN
Toshiaki Ozeki
G01 - MEASURING TESTING
Information
Patent Grant
Optical distance measuring device
Patent number
12,189,057
Issue date
Jan 7, 2025
Denso Corporation
Noriyuki Ozaki
G01 - MEASURING TESTING
Information
Patent Grant
Stacked filter assembly for optical integrated circuit package with...
Patent number
12,189,064
Issue date
Jan 7, 2025
STMICROELECTRONICS INTERNATIONAL N.V.
Colin Campbell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distance measurement device, camera, inspection adjustment device,...
Patent number
12,181,578
Issue date
Dec 31, 2024
TOPPAN Holdings Inc.
Masanori Nagase
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTODETECTION DEVICE AND RANGING DEVICE
Publication number
20250052865
Publication date
Feb 13, 2025
Sony Semiconductor Solutions Corporation
SOZO YOKOGAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING
Publication number
20250052681
Publication date
Feb 13, 2025
Illumina, Inc.
Hod Finkelstein
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
RANGING DEVICE
Publication number
20250052871
Publication date
Feb 13, 2025
Canon Kabushiki Kaisha
YUUTA OOSHIMA
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED WIDE-FIELD-OF-VIEW LIDAR
Publication number
20250052866
Publication date
Feb 13, 2025
Centre National de la Recherche Scientifique
Jean-Paul CROMIERES
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL TRANSMITTING AND RECEIVING SYSTEM AND METHOD THEREOF
Publication number
20250052870
Publication date
Feb 13, 2025
Hesai Technology Co., Ltd.
Guofeng SHEN
G01 - MEASURING TESTING
Information
Patent Application
A SYSTEM AND METHOD FOR LIDAR BLOCKAGE DETECTION
Publication number
20250052872
Publication date
Feb 13, 2025
Innoviz Technologies Ltd.
Yuval Yifat
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENT APPARATUS AND DISTANCE MEASUREMENT METHOD
Publication number
20250052898
Publication date
Feb 13, 2025
PIONEER CORPORATION
Kenichiro HOSOI
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE
Publication number
20250052902
Publication date
Feb 13, 2025
Koito Manufacturing Co., Ltd.
Masayuki TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
DEPTH MAPPING SENSING APPARATUS
Publication number
20250052863
Publication date
Feb 13, 2025
Bandwidth10, LTD.
Carlos Fernando Rondina Mateus
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF THREE-DIMENSIONAL IMAGING
Publication number
20250047826
Publication date
Feb 6, 2025
nLIGHT, Inc.
Paul S. Banks
G01 - MEASURING TESTING
Information
Patent Application
WIDE-DYNAMIC-RANGE SPLIT-DETECTOR LIDAR PHOTORECEIVER
Publication number
20250044422
Publication date
Feb 6, 2025
ALLEGRO MICROSYSTEMS, LLC
Andrew S. Huntington
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
Publication number
20250044423
Publication date
Feb 6, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Victor BELOKONSKIY
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD FOR LIDAR, COMPUTER STORAGE MEDIUM AND LIDAR
Publication number
20250044425
Publication date
Feb 6, 2025
Hesai Technology Co., Ltd.
Congbo SHI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENT APPARATUS, DETERMINATION APPARATUS, DETERMINAT...
Publication number
20250044430
Publication date
Feb 6, 2025
PIONEER CORPORATION
Kenichiro HOSOI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENT APPARATUS
Publication number
20250044424
Publication date
Feb 6, 2025
PIONEER CORPORATION
Kenichiro HOSOI
G01 - MEASURING TESTING
Information
Patent Application
ENHANCING DEPTH REPRESENTATIONS BASED ON AMPLITUDES OF TIME-OF-FLIG...
Publication number
20250044451
Publication date
Feb 6, 2025
QUALCOMM Incorporated
Li Hong
G01 - MEASURING TESTING
Information
Patent Application
PHOTODETECTION DEVICE AND DISTANCE MEASURING SYSTEM
Publication number
20250040269
Publication date
Jan 30, 2025
Sony Semiconductor Solutions Corporation
TATSUKI NISHINO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIDAR AND DETECTION METHOD THEREOF, AND READABLE STORAGE MEDIUM
Publication number
20250035756
Publication date
Jan 30, 2025
Hesai Technology Co., Ltd.
Congbo SHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL RANGING DEVICE
Publication number
20250035757
Publication date
Jan 30, 2025
DENSO CORPORATION
Kosuke NIIMURA
G01 - MEASURING TESTING
Information
Patent Application
RANGE IMAGING APPARATUS AND RANGE IMAGING METHOD
Publication number
20250035790
Publication date
Jan 30, 2025
TOPPAN Holdings Inc.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT CIRCUITRY AND TIME-OF-FLIGHT READOUT METHOD
Publication number
20250039582
Publication date
Jan 30, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Qing DING
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEMS, METHODS, AND MEDIA FOR SINGLE PHOTON DEPTH IMAGING WITH IM...
Publication number
20250035750
Publication date
Jan 30, 2025
Wisconsin Alumni Research Foundation
Felipe Gutierrez Barragan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTOELECTRONIC COMPONENT AND LIDAR SYSTEM
Publication number
20250035755
Publication date
Jan 30, 2025
ams-OSRAM International GmbH
Hubert HALBRITTER
G01 - MEASURING TESTING
Information
Patent Application
Optoelectronic sensor and method of detecting objects in a monitore...
Publication number
20250035785
Publication date
Jan 30, 2025
SICK AG
Gerold FEISE
G01 - MEASURING TESTING
Information
Patent Application
HISTOGRAM GENERATING CIRCUIT, OPTICAL RANGEFINDER, HISTOGRAM GENERA...
Publication number
20250028032
Publication date
Jan 23, 2025
HOKUYO AUTOMATIC CO., LTD.
Kunihiro YASUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFICATION OF A NOISE POINT USED FOR LIDAR, AND LIDA...
Publication number
20250028033
Publication date
Jan 23, 2025
Hesai Technology Co., Ltd.
Xiaotong ZHOU
G01 - MEASURING TESTING
Information
Patent Application
AVALANCHE PHOTODIODE SENSOR AND DISTANCE MEASURING DEVICE
Publication number
20250031484
Publication date
Jan 23, 2025
Sony Semiconductor Solutions Corporation
Shinichiro YAGI
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT SENSOR AND ELECTRONIC DEVICE
Publication number
20250028051
Publication date
Jan 23, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Michiel TIMMERMANS
G01 - MEASURING TESTING
Information
Patent Application
LIDAR DEVICE COMPRISING A PLURALITY OF BEAM STEERING CELLS FOR STEE...
Publication number
20250020783
Publication date
Jan 16, 2025
SOS Lab co., Ltd
Jun Hwan JANG
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND INFORMATION PROCESSING METHOD
Publication number
20250020808
Publication date
Jan 16, 2025
SONY GROUP CORPORATION
YIWEN ZHU
G01 - MEASURING TESTING