Reducing effect of parasitic reflections

Industry

CPC
G01B9/02059

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02059Reducing effect of parasitic reflections

Industries

Patents Grantslast 30 patents

Information Patent Grant
Reflective condensing interferometer
- Patent number 11,473,895
- Issue date Oct 18, 2022
- National Applied Research Laboratories
- Yi-Cheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Eliminating internal reflections in an interferometric endpoint det...
- Patent number 11,421,977
- Issue date Aug 23, 2022
- Applied Materials, Inc.
- Lei Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cyclic error measurements and calibration procedures in interferome...
- Patent number 11,287,242
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
OCT system and OCT method
- Patent number 11,236,986
- Issue date Feb 1, 2022
- Haag-Streit AG
- Peter Stalder
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
- Patent number 11,236,985
- Issue date Feb 1, 2022
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
OCT system and OCT method
- Patent number 11,193,754
- Issue date Dec 7, 2021
- Haag-Streit AG
- Peter Stalder
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography system
- Patent number 11,022,424
- Issue date Jun 1, 2021
- SVISION IMAGING LIMITED
- Xing Wei
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer
- Patent number 10,670,461
- Issue date Jun 2, 2020
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography (OCT) system having integrated detecto...
- Patent number 10,488,177
- Issue date Nov 26, 2019
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining a 3D structure of an object
- Patent number 10,393,501
- Issue date Aug 27, 2019
- VOCO GmbH
- Alexander Knüttel
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and method that measure shape of surface whil...
- Patent number 10,260,867
- Issue date Apr 16, 2019
- Canon Kabushiki Kaisha
- Takahiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing apparatus for eliminating object reflection noise...
- Patent number 10,209,177
- Issue date Feb 19, 2019
- Sony Corporation
- Masaaki Hara
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography laser with integrated clock
- Patent number 10,184,783
- Issue date Jan 22, 2019
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Grant
Tomographic image capturing apparatus and method with noise reducti...
- Patent number 10,126,112
- Issue date Nov 13, 2018
- Canon Kabushiki Kaisha
- Toshiharu Sumiya
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 10,113,859
- Issue date Oct 30, 2018
- SCREEN Holdings Co., Ltd.
- Kenji Ueyama
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal filter for interferometric system
- Patent number 10,018,461
- Issue date Jul 10, 2018
- Joshua Noel Hogan
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,006,755
- Issue date Jun 26, 2018
- Hitachi-LG Data Storage, Inc.
- Hiroyuki Minemura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Microscopy system with auto-focus adjustment by low-coherence inter...
- Patent number 9,989,749
- Issue date Jun 5, 2018
- Thorlabs, Inc.
- Alex Cable
- G02 - OPTICS
Information Patent Grant
Microscopy system with auto-focus adjustment by low-coherence inter...
- Patent number 9,869,852
- Issue date Jan 16, 2018
- Thorlabs, Inc.
- Alex Cable
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography laser with integrated clock
- Patent number 9,791,261
- Issue date Oct 17, 2017
- Axsun Technologies, Inc.
- Dale C. Flanders
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing interference from scattered light/reflected lig...
- Patent number 9,658,052
- Issue date May 23, 2017
- Fudan University
- Bo Jia
- G02 - OPTICS
Information Patent Grant
Dual beam splitter interferometer measuring 3 degrees of freedom, s...
- Patent number 9,518,816
- Issue date Dec 13, 2016
- University of Rochester
- Jonathan D. Ellis
- G01 - MEASURING TESTING
Information Patent Grant
Optimized device for swept source optical coherence domain reflecto...
- Patent number 9,492,077
- Issue date Nov 15, 2016
- Carl Zeiss Meditec AG
- Ralf Ebersbach
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measurement apparatus for measuring a target using signal,...
- Patent number 9,423,238
- Issue date Aug 23, 2016
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography laser with integrated clock
- Patent number 9,417,051
- Issue date Aug 16, 2016
- Axsun Technologies LLC
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 9,188,424
- Issue date Nov 17, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Non-harmonic cyclic error compensation in interferometric encoder s...
- Patent number 9,146,093
- Issue date Sep 29, 2015
- Zygo Corporation
- Frank C. Demarest
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 9,140,537
- Issue date Sep 22, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 8,885,172
- Issue date Nov 11, 2014
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and distance calculation method therefor
- Patent number 8,724,114
- Issue date May 13, 2014
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
- Publication number 20230168077
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20230108466
- Publication date Apr 6, 2023
- Carl Zeiss SMT GMBH
- Regina CHRIST
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...
- Publication number 20220260359
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- Stephan Zschaeck
- G01 - MEASURING TESTING
Information Patent Application
OCT SYSTEM AND OCT METHOD
- Publication number 20210223025
- Publication date Jul 22, 2021
- HAAG-STREIT AG
- Peter Stalder
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OCT SYSTEM AND OCT METHOD
- Publication number 20210199420
- Publication date Jul 1, 2021
- HAAG-STREIT AG
- Peter Stalder
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REFLECTIVE CONDENSING INTERFEROMETER
- Publication number 20210172722
- Publication date Jun 10, 2021
- NATIONAL APPLIED RESEARCH LABORATORIES
- YI-CHENG LIU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20210148691
- Publication date May 20, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
ELIMINATING INTERNAL REFLECTIONS IN AN INTERFEROMETRIC ENDPOINT DET...
- Publication number 20200124399
- Publication date Apr 23, 2020
- APPLIED MATERIALS, INC.
- Lei LIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CYCLIC ERROR MEASUREMENTS AND CALIBRATION PROCEDURES IN INTERFEROME...
- Publication number 20190265019
- Publication date Aug 29, 2019
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20190113329
- Publication date Apr 18, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
Reference signal filter for interferometric system
- Publication number 20180328712
- Publication date Nov 15, 2018
- Joshua Noel Hogan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL INTERFEROMETER
- Publication number 20180217001
- Publication date Aug 2, 2018
- Hamamatsu Photonics K.K.
- Yoshihisa WARASHINA
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography Laser with Integrated Clock
- Publication number 20180051978
- Publication date Feb 22, 2018
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Application
Reference signal filter for interferometric system
- Publication number 20170370699
- Publication date Dec 28, 2017
- Joshua Noel Hogan
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTER...
- Publication number 20170343787
- Publication date Nov 30, 2017
- THORLABS, INC.
- Alex CABLE
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20150043005
- Publication date Feb 12, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20140244196
- Publication date Aug 28, 2014
- Canon Kabushiki Kaisha
- Ippei Uchida
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20140176962
- Publication date Jun 26, 2014
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Integrated Optical Coherence Tomography System
- Publication number 20140125987
- Publication date May 8, 2014
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography Laser with Integrated Clock
- Publication number 20140016135
- Publication date Jan 16, 2014
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZED DEVICE FOR SWEPT SOURCE OPTICAL COHERENCE DOMAIN REFLECTO...
- Publication number 20130308097
- Publication date Nov 21, 2013
- Carl Zeiss Meditec AG
- Ralf Ebersbach
- G01 - MEASURING TESTING
Information Patent Application
NON-HARMONIC CYCLIC ERROR COMPENSATION IN INTERFEROMETRIC ENCODER S...
- Publication number 20130278914
- Publication date Oct 24, 2013
- Zygo Corporation
- Frank C. Demarest
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD USING INTERFEROMETER AND NON-TRANSITORY TANGIBLE...
- Publication number 20130204576
- Publication date Aug 8, 2013
- Canon Kabushiki Kaisha
- Hiroshi OKUDA
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETER WITH TILTED MIRRORS
- Publication number 20120327424
- Publication date Dec 27, 2012
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20120320381
- Publication date Dec 20, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki Okada
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND MEASUREMENT METHOD
- Publication number 20120212746
- Publication date Aug 23, 2012
- Canon Kabushiki Kaisha
- Akihiro HATADA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20120194824
- Publication date Aug 2, 2012
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
Integrated Optical Coherence Tomography System
- Publication number 20120170046
- Publication date Jul 5, 2012
- Axsun Technologies, Inc.
- Dale C. Flanders
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH PARABOLOIDAL ILLUMINATION AND IMAGING OPTIC AND...
- Publication number 20120154819
- Publication date Jun 21, 2012
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR
- Publication number 20120127477
- Publication date May 24, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING

Reducing effect of parasitic reflections

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Reflective condensing interferometer

Eliminating internal reflections in an interferometric endpoint det...

Cyclic error measurements and calibration procedures in interferome...

OCT system and OCT method

Systems and methods for cyclic error correction in a heterodyne int...

OCT system and OCT method

Optical coherence tomography system

Optical interferometer

Optical coherence tomography (OCT) system having integrated detecto...

Device for determining a 3D structure of an object

Measurement apparatus and method that measure shape of surface whil...

Signal processing apparatus for eliminating object reflection noise...

Optical coherence tomography laser with integrated clock

Tomographic image capturing apparatus and method with noise reducti...

Imaging apparatus and imaging method

Reference signal filter for interferometric system

Optical measurement apparatus and optical measurement method

Microscopy system with auto-focus adjustment by low-coherence inter...

Microscopy system with auto-focus adjustment by low-coherence inter...

Optical coherence tomography laser with integrated clock

Method for reducing interference from scattered light/reflected lig...

Dual beam splitter interferometer measuring 3 degrees of freedom, s...

Optimized device for swept source optical coherence domain reflecto...

Optical measurement apparatus for measuring a target using signal,...

Optical coherence tomography laser with integrated clock

Interferometer

Non-harmonic cyclic error compensation in interferometric encoder s...

Interferometric heterodyne optical encoder system

Interferometric heterodyne optical encoder system

Interferometer and distance calculation method therefor

Patents Applicationslast 30 patents

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...

OCT SYSTEM AND OCT METHOD

OCT SYSTEM AND OCT METHOD

REFLECTIVE CONDENSING INTERFEROMETER

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

ELIMINATING INTERNAL REFLECTIONS IN AN INTERFEROMETRIC ENDPOINT DET...

CYCLIC ERROR MEASUREMENTS AND CALIBRATION PROCEDURES IN INTERFEROME...

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

Reference signal filter for interferometric system

OPTICAL INTERFEROMETER

Optical Coherence Tomography Laser with Integrated Clock

Reference signal filter for interferometric system

MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTER...

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

MEASURING APPARATUS

Interferometer

Integrated Optical Coherence Tomography System

Optical Coherence Tomography Laser with Integrated Clock

OPTIMIZED DEVICE FOR SWEPT SOURCE OPTICAL COHERENCE DOMAIN REFLECTO...

NON-HARMONIC CYCLIC ERROR COMPENSATION IN INTERFEROMETRIC ENCODER S...

MEASUREMENT METHOD USING INTERFEROMETER AND NON-TRANSITORY TANGIBLE...

DOUBLE PASS INTERFEROMETER WITH TILTED MIRRORS

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

INTERFEROMETER AND MEASUREMENT METHOD

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

Integrated Optical Coherence Tomography System

INTERFEROMETER WITH PARABOLOIDAL ILLUMINATION AND IMAGING OPTIC AND...

INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR