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Reducing or preventing effect of tilt or misalignment
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G01B9/02061
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/02061
Reducing or preventing effect of tilt or misalignment
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Patents Grants
last 30 patents
Information
Patent Grant
Device for interferometric distance measurement
Patent number
11,885,607
Issue date
Jan 30, 2024
Dr. Johannes Heidenhain GmbH
Herbert Huber-Lenk
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for improved OCT measurements
Patent number
10,571,243
Issue date
Feb 25, 2020
Carl Zeiss Meditec, Inc.
Matthew J. Everett
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Position measurement system, interferometer and lithographic apparatus
Patent number
10,289,011
Issue date
May 14, 2019
ASML Netherlands B.V.
Engelbertus Antonius Fransiscus Van Der Pasch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Light detection module for OCT device and OCT device
Patent number
10,168,140
Issue date
Jan 1, 2019
Hamamatsu Photonics K.K.
Kenji Makino
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus, lithography apparatus, and method of manufac...
Patent number
10,095,125
Issue date
Oct 9, 2018
Canon Kabushiki Kaisha
Hiroshi Okuda
G02 - OPTICS
Information
Patent Grant
Displacement detection apparatus
Patent number
10,066,924
Issue date
Sep 4, 2018
DMG MORI CO., LTD.
Kenji Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
Laser heterodyne interferometric straightness measurement apparatus...
Patent number
9,863,753
Issue date
Jan 9, 2018
Zhejiang Sci-Tech University
Benyong Chen
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer having two transparent plates in parallel for making...
Patent number
9,797,704
Issue date
Oct 24, 2017
Dr. Johannes Heidenhain GmbH
Markus Meissner
G01 - MEASURING TESTING
Information
Patent Grant
Device for interferential distance measurement
Patent number
9,739,598
Issue date
Aug 22, 2017
Dr. Johannes Heidenhain GmbH
Ralph Joerger
G01 - MEASURING TESTING
Information
Patent Grant
Device for distance measurement
Patent number
9,400,168
Issue date
Jul 26, 2016
Dr. Johannes Heidenhain GmbH
Walter Huber
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus including multi-wavelength interferometer
Patent number
9,372,068
Issue date
Jun 21, 2016
Canon Kabushiki Kaisha
Akihiro Hatada
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for high-precision optical determination of distan...
Patent number
9,310,183
Issue date
Apr 12, 2016
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
System and method for setting up secondary reflective optic
Patent number
9,279,658
Issue date
Mar 8, 2016
Exelis, Inc.
Steven Paul Maffett
G01 - MEASURING TESTING
Information
Patent Grant
Supporting structure for a movable mirror, method for reducing the...
Patent number
9,170,397
Issue date
Oct 27, 2015
Gasera Ltd.
Jyrki Kauppinen
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer
Patent number
9,127,924
Issue date
Sep 8, 2015
Dr. Johannes Heidenhain GmbH
Markus Meissner
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and fourier-transform spectroscopic analyzer
Patent number
9,109,869
Issue date
Aug 18, 2015
Konica Minolta, Inc.
Yusuke Hirao
G01 - MEASURING TESTING
Information
Patent Grant
Device for determining distance interferometrically
Patent number
9,068,811
Issue date
Jun 30, 2015
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Multi-wavelength interferometer, measurement apparatus, and measure...
Patent number
9,062,957
Issue date
Jun 23, 2015
Canon Kabushiki Kaisha
Akihiro Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Method and arrangement for robust interferometry for detecting a fe...
Patent number
8,934,104
Issue date
Jan 13, 2015
Universitaet Stuttgart
Klaus Koerner
G01 - MEASURING TESTING
Information
Patent Grant
Grazing incidence interferometer
Patent number
8,913,250
Issue date
Dec 16, 2014
Mitutoyo Corporation
Reiya Ootao
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric distance measurement device using a scanning plate...
Patent number
8,797,546
Issue date
Aug 5, 2014
Dr. Johannes Heidenhain GmbH
Walter Huber
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for acquiring position with a confocal Fabry-Pero...
Patent number
8,773,666
Issue date
Jul 8, 2014
attocube Systems AG
Khaled Karrai
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam interferometer displacement measuring system utilized in...
Patent number
8,441,649
Issue date
May 14, 2013
National Yunlin University of Science and Technology
Yung-Cheng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer
Patent number
8,253,943
Issue date
Aug 28, 2012
The University of Birmingham
Clive C. Speake
G01 - MEASURING TESTING
Information
Patent Grant
Optical tomographic imaging apparatus including a beam scattering s...
Patent number
8,213,020
Issue date
Jul 3, 2012
FUJIFILM Corporation
Kiichi Kato
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical tomographic imaging system
Patent number
8,174,701
Issue date
May 8, 2012
FUJIFILM Corporation
Tadashi Masuda
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical rotary adapter and optical tomographic imaging system using...
Patent number
8,055,107
Issue date
Nov 8, 2011
FUJIFILM Corporation
Tadashi Masuda
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical rotary adaptor and optical tomographic imaging apparatus us...
Patent number
7,924,428
Issue date
Apr 12, 2011
FUJIFILM Corporation
Masahiro Toida
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Image amplifying, servo-loop controlled, point diffraction interometer
Patent number
7,633,630
Issue date
Dec 15, 2009
Northrop Grumman Corporation
Peter Y. M. Livingston
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis interferometers and methods and systems using multi-axis...
Patent number
7,548,322
Issue date
Jun 16, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
Publication number
20240369345
Publication date
Nov 7, 2024
Martin Berz
G01 - MEASURING TESTING
Information
Patent Application
Method of Processing Interferometry Signal, and Associated Interfer...
Publication number
20240053136
Publication date
Feb 15, 2024
Selene RODD-ROUTLEY
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
Publication number
20230108466
Publication date
Apr 6, 2023
Carl Zeiss SMT GMBH
Regina CHRIST
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT
Publication number
20220276040
Publication date
Sep 1, 2022
Dr. Johannes Heidenhain Gmbh
Herbert HUBER-LENK
G01 - MEASURING TESTING
Information
Patent Application
METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN I...
Publication number
20220034645
Publication date
Feb 3, 2022
Martin BERZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR IMPROVED OCT MEASUREMENTS
Publication number
20190056214
Publication date
Feb 21, 2019
Carl Zeiss Meditec, Inc.
Matthew J. EVERETT
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
POSITION MEASUREMENT SYSTEM, INTERFEROMETER AND LITHOGRAPHIC APPARATUS
Publication number
20180224757
Publication date
Aug 9, 2018
ASML NETHERLANDS B.V.
Engelbertus Antonius Fransiscus VAN DER PASCH
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DISPLACEMENT DETECTION APPARATUS
Publication number
20170350689
Publication date
Dec 7, 2017
DMG MORI CO., LTD.
Kenji MATSUSHITA
G01 - MEASURING TESTING
Information
Patent Application
Interferometer
Publication number
20140376002
Publication date
Dec 25, 2014
Markus Meissner
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DISTANCE MEASUREMENT
Publication number
20130335746
Publication date
Dec 19, 2013
Walter Huber
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER AND FOURIER-TRANSFORM SPECTROSCOPIC ANALYZER
Publication number
20130222790
Publication date
Aug 29, 2013
KONICA MINOLTA INC
Yusuke Hirao
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS INCLUDING MULTI-WAVELENGTH INTERFEROMETER
Publication number
20130155414
Publication date
Jun 20, 2013
Canon Kabushiki Kaisha
Akihiro Hatada
G01 - MEASURING TESTING
Information
Patent Application
MULTI-WAVELENGTH INTERFEROMETER, MEASUREMENT APPARATUS, AND MEASURE...
Publication number
20130100458
Publication date
Apr 25, 2013
Canon Kabushiki Kaisha
Akihiro Yamada
G01 - MEASURING TESTING
Information
Patent Application
Device for Determining Distance Interferometrically
Publication number
20130057872
Publication date
Mar 7, 2013
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
GRAZING INCIDENCE INTERFEROMETER
Publication number
20120327425
Publication date
Dec 27, 2012
Mitutoyo Corporation
Reiya Ootao
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ARRANGEMENT FOR ROBUST INTERFEROMETRY
Publication number
20120307258
Publication date
Dec 6, 2012
UNIVERSITAET STUTTGART
Klaus Koerner
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC DISTANCE MEASUREMENT DEVICE
Publication number
20120242994
Publication date
Sep 27, 2012
Johannes Heidenhain GmbH
Walter Huber
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ACQUIRING POSITION WITH A CONFOCAL FABRY-PERO...
Publication number
20110211199
Publication date
Sep 1, 2011
ATTOCUBE SYSTEMS AG
Khaled KARRAI
G01 - MEASURING TESTING
Information
Patent Application
SUPPORTING STRUCTURE FOR A MOVABLE MIRROR, METHOD FOR REDUCING THE...
Publication number
20110205545
Publication date
Aug 25, 2011
GASERA LTD
Jyrki Kauppinen
G02 - OPTICS
Information
Patent Application
Multi-beam interferometer displacement measuring system utilized in...
Publication number
20110157598
Publication date
Jun 30, 2011
NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY
Yung-Cheng WANG
G01 - MEASURING TESTING
Information
Patent Application
Interferometer
Publication number
20100238456
Publication date
Sep 23, 2010
Clive Christopher Speake
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TOMOGRAPHIC IMAGING APPARATUS AND OPTICAL PROBE
Publication number
20100002240
Publication date
Jan 7, 2010
Kiichi Kato
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL ROTARY ADAPTER AND OPTICAL TOMOGRAPHIC IMAGING SYSTEM USING...
Publication number
20090251704
Publication date
Oct 8, 2009
FUJIFILM CORPORATION
Tadashi MASUDA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL ROTARY ADAPTOR AND OPTICAL TOMOGRAPHIC IMAGING APPARATUS US...
Publication number
20090244545
Publication date
Oct 1, 2009
FUJIFILM CORPORATION
Masahiro TOIDA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL TOMOGRAPHIC IMAGING SYSTEM
Publication number
20090086213
Publication date
Apr 2, 2009
FUJIFILM CORPORATION
Tadashi MASUDA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Multi-Axis Interferometers and Methods and Systems Using Multi-Axis...
Publication number
20080117428
Publication date
May 22, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Image amplifying, servo-loop controlled, point diffraction interometer
Publication number
20080037030
Publication date
Feb 14, 2008
Peter Y. M. Livingston
G01 - MEASURING TESTING
Information
Patent Application
Interferometer for measurement of dome-like objects
Publication number
20070019207
Publication date
Jan 25, 2007
William P. Kuhn
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and methods for reducing non-cyclic non-linear errors in...
Publication number
20070002330
Publication date
Jan 4, 2007
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Tilt compensated interferometers
Publication number
20060238769
Publication date
Oct 26, 2006
Christopher J. Manning
G01 - MEASURING TESTING