Reference interferometer

Industry

CPC
G01B2290/60

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

Current Industry

G01B2290/60Reference interferometer

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for correcting optical path length measurement er...
- Patent number 11,920,928
- Issue date Mar 5, 2024
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Optical deflector parameter measurement device, method, and program
- Patent number 11,656,073
- Issue date May 23, 2023
- Nippon Telegraph and Telephone Corporation
- Masahiro Ueno
- G01 - MEASURING TESTING
Information Patent Grant
System and method of phase-locked fiber interferometry
- Patent number 11,644,301
- Issue date May 9, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Aaron Michael Katzenmeyer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reflective condensing interferometer
- Patent number 11,473,895
- Issue date Oct 18, 2022
- National Applied Research Laboratories
- Yi-Cheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
- Patent number 11,333,487
- Issue date May 17, 2022
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Retro-interferometer having active readjustment
- Patent number 11,326,950
- Issue date May 10, 2022
- BRUKER OPTICS GMBH & CO. KG
- Axel Keens
- G02 - OPTICS
Information Patent Grant
Method for monitoring time-dependent properties of light during sca...
- Patent number 11,262,185
- Issue date Mar 1, 2022
- OPTORES GMBH
- Robert Huber
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Differential sinusoidal phase modulation laser interferometric nano...
- Patent number 11,255,655
- Issue date Feb 22, 2022
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for robust single-shot interferometry
- Patent number 11,231,269
- Issue date Jan 25, 2022
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Phase-sensitive optical coherence tomography to measure optical abe...
- Patent number 10,966,607
- Issue date Apr 6, 2021
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for phase stabilized swept-source optical coh...
- Patent number 10,788,310
- Issue date Sep 29, 2020
- Kabushiki Kaisha Topcon
- Zhenguo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement of multilayer structures
- Patent number 10,761,021
- Issue date Sep 1, 2020
- Lumetrics, Inc
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Compact and low cost beam launcher using planar lightwave circuit
- Patent number 10,718,915
- Issue date Jul 21, 2020
- California Institute of Technology
- Feng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Swept-source optical coherence tomography (SS-OCT) phase stabilizat...
- Patent number 10,627,212
- Issue date Apr 21, 2020
- Kabushiki Kaisha Topcon
- Jonathan J. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring a cavity by means of interference spectroscopy
- Patent number 10,627,210
- Issue date Apr 21, 2020
- Björn Habrich
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive optical coherence tomography using multiple...
- Patent number 10,591,275
- Issue date Mar 17, 2020
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for signal processing in optical coherence tomography by mea...
- Patent number 10,488,179
- Issue date Nov 26, 2019
- Heidelberg Engineering GmbH
- Björn Martensen
- G01 - MEASURING TESTING
Information Patent Grant
Large range, high resolution interferometer for wide range of sensi...
- Patent number 10,488,266
- Issue date Nov 26, 2019
- Honeywell International Inc.
- Lee K. Strandjord
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive optical coherence tomography using multiple...
- Patent number 10,480,924
- Issue date Nov 19, 2019
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus for a dynamic multi-axis heterodyne interferometric vibro...
- Patent number 10,386,171
- Issue date Aug 20, 2019
- United States of America, as represented by the Secretary of the Army
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Grant
System for performing dual path, two-dimensional optical coherence...
- Patent number 10,288,407
- Issue date May 14, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES, LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography microscopy apparatus and method for de...
- Patent number 10,215,552
- Issue date Feb 26, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Robert Snel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical sectioning apparatus using advanced optical interference mi...
- Patent number 10,151,572
- Issue date Dec 11, 2018
- ACUSOLUTIONS INC.
- Chien-Chung Tsai
- G02 - OPTICS
Information Patent Grant
Method of air refractive index correction for absolute long distanc...
- Patent number 10,024,647
- Issue date Jul 17, 2018
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Associated interferometers using multi-fiber optic delay lines
- Patent number 10,006,754
- Issue date Jun 26, 2018
- Lumetrics, Inc
- Donald S. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive optical coherence tomography using multiple...
- Patent number 9,885,557
- Issue date Feb 6, 2018
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and apparatus for swept-source optical coherence tomography
- Patent number 9,702,687
- Issue date Jul 11, 2017
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ER...
- Publication number 20220357146
- Publication date Nov 10, 2022
- TOKYO ELECTRON LIMITED
- Kenji NAGAI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...
- Publication number 20220260359
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- Stephan Zschaeck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20220205775
- Publication date Jun 30, 2022
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFERENCE DEVICE
- Publication number 20210293523
- Publication date Sep 23, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE CONDENSING INTERFEROMETER
- Publication number 20210172722
- Publication date Jun 10, 2021
- NATIONAL APPLIED RESEARCH LABORATORIES
- YI-CHENG LIU
- G01 - MEASURING TESTING
Information Patent Application
COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...
- Publication number 20210123716
- Publication date Apr 29, 2021
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT
- Publication number 20210033381
- Publication date Feb 4, 2021
- Bruker Optik GmbH
- Axel KEENS
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR PHASE STABILIZED SWEPT-SOURCE OPTICAL COH...
- Publication number 20200400421
- Publication date Dec 24, 2020
- KABUSHIKI KAISHA TOPCON
- Zhenguo Wang
- G01 - MEASURING TESTING
Information Patent Application
System for Performing Dual Path, Two- Dimensional Optical Coherence...
- Publication number 20190226829
- Publication date Jul 25, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR SIGNAL PROCESSING IN OPTICAL COHERENCE TOMOGRAPHY BY MEA...
- Publication number 20190063897
- Publication date Feb 28, 2019
- HEIDELBERG ENGINEERING GMBH
- Björn MARTENSEN
- G01 - MEASURING TESTING
Information Patent Application
MEMEASURING A CAVITY BY MEANS OF INTERFERENCE SPECTROSCOPY
- Publication number 20190056213
- Publication date Feb 21, 2019
- Björn Habrich
- G01 - MEASURING TESTING
Information Patent Application
COMPACT AND LOW COST BEAM LAUNCHER USING PLANAR LIGHTWAVE CIRCUIT
- Publication number 20180364431
- Publication date Dec 20, 2018
- California Institute of Technology
- Feng Zhao
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SECTIONING APPARATUS USING ADVANCED OPTICAL INTERFERENCE MI...
- Publication number 20180347960
- Publication date Dec 6, 2018
- AcuSolutions Inc.
- Chien-Chung TSAI
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION SENSITIVE OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20180156596
- Publication date Jun 7, 2018
- Case Western Reserve University
- Hui Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF AIR REFRACTIVE INDEX CORRECTION FOR ABSOLUTE LONG DISTANC...
- Publication number 20180045500
- Publication date Feb 15, 2018
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Swept-Source Optical Coherence Tomography
- Publication number 20180003482
- Publication date Jan 4, 2018
- LightLab Imaging, Inc.
- Joseph M. Schmitt
- G01 - MEASURING TESTING
Information Patent Application
System for Performing Dual Path, Two-Dimensional Optical Coherence...
- Publication number 20170261308
- Publication date Sep 14, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES
- Publication number 20170102222
- Publication date Apr 13, 2017
- LUMETRICS, INC.
- Donald S. GIBSON
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND ARTICLE MANUFACTURING METHOD
- Publication number 20140307263
- Publication date Oct 16, 2014
- Canon Kabushiki Kaisha
- Akihiro HATADA
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MEASURING APPARATUS AND INTERFERENCE MEASURING METHOD
- Publication number 20140160490
- Publication date Jun 12, 2014
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
POSITION MONITORING SYSTEM WITH REDUCED NOISE
- Publication number 20140098375
- Publication date Apr 10, 2014
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PHASE MEASUREMENTS
- Publication number 20130265585
- Publication date Oct 10, 2013
- Christopher Fang-Yen
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20130268225
- Publication date Oct 10, 2013
- Canon Kabushiki Kaisha
- Hiroshi OKUDA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...
- Publication number 20130229664
- Publication date Sep 5, 2013
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING ARTICLE
- Publication number 20130222785
- Publication date Aug 29, 2013
- Canon Kabushiki Kaisha
- Takamasa SASAKI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING DISTANCE
- Publication number 20130148129
- Publication date Jun 13, 2013
- Isis Innovation Limited
- Matthew Warden
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20130063728
- Publication date Mar 14, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20120327425
- Publication date Dec 27, 2012
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MATERIAL SENSING APPARATUS INCLUDING ADJUSTABLE REF...
- Publication number 20120281232
- Publication date Nov 8, 2012
- Harris Corporation, Corporation of the State of Delaware
- Robert M. MONTGOMERY
- G01 - MEASURING TESTING

Reference interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device for measuring a substrate and method for correcting cyclic e...

System and method for correcting optical path length measurement er...

Interferometer system, method of determining a mode hop of a laser...

Optical deflector parameter measurement device, method, and program

System and method of phase-locked fiber interferometry

Reflective condensing interferometer

Laser interference device

Common path mode fiber tip diffraction interferometer for wavefront...

Retro-interferometer having active readjustment

Method for monitoring time-dependent properties of light during sca...

Differential sinusoidal phase modulation laser interferometric nano...

Arrangement and method for robust single-shot interferometry

Phase-sensitive optical coherence tomography to measure optical abe...

Methods and apparatus for phase stabilized swept-source optical coh...

Apparatus and method for measurement of multilayer structures

Compact and low cost beam launcher using planar lightwave circuit

Swept-source optical coherence tomography (SS-OCT) phase stabilizat...

Measuring a cavity by means of interference spectroscopy

Polarization sensitive optical coherence tomography using multiple...

Method for signal processing in optical coherence tomography by mea...

Large range, high resolution interferometer for wide range of sensi...

Polarization sensitive optical coherence tomography using multiple...

Apparatus for a dynamic multi-axis heterodyne interferometric vibro...

System for performing dual path, two-dimensional optical coherence...

Optical coherence tomography microscopy apparatus and method for de...

Optical sectioning apparatus using advanced optical interference mi...

Method of air refractive index correction for absolute long distanc...

Associated interferometers using multi-fiber optic delay lines

Polarization sensitive optical coherence tomography using multiple...

Methods and apparatus for swept-source optical coherence tomography

Patents Applicationslast 30 patents

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ER...

DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

LASER INTERFERENCE DEVICE

REFLECTIVE CONDENSING INTERFEROMETER

COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...

RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT

METHODS AND APPARATUS FOR PHASE STABILIZED SWEPT-SOURCE OPTICAL COH...

System for Performing Dual Path, Two- Dimensional Optical Coherence...

METHOD FOR SIGNAL PROCESSING IN OPTICAL COHERENCE TOMOGRAPHY BY MEA...

MEMEASURING A CAVITY BY MEANS OF INTERFERENCE SPECTROSCOPY

COMPACT AND LOW COST BEAM LAUNCHER USING PLANAR LIGHTWAVE CIRCUIT

OPTICAL SECTIONING APPARATUS USING ADVANCED OPTICAL INTERFERENCE MI...

POLARIZATION SENSITIVE OPTICAL COHERENCE TOMOGRAPHY

METHOD OF AIR REFRACTIVE INDEX CORRECTION FOR ABSOLUTE LONG DISTANC...

Methods and Apparatus for Swept-Source Optical Coherence Tomography

System for Performing Dual Path, Two-Dimensional Optical Coherence...

ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES

MEASURING APPARATUS AND ARTICLE MANUFACTURING METHOD

INTERFERENCE MEASURING APPARATUS AND INTERFERENCE MEASURING METHOD

POSITION MONITORING SYSTEM WITH REDUCED NOISE

SYSTEMS AND METHODS FOR PHASE MEASUREMENTS

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...

MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING ARTICLE

APPARATUS AND METHOD FOR MEASURING DISTANCE

MEASURING APPARATUS

GRAZING INCIDENCE INTERFEROMETER

INTERFEROMETRIC MATERIAL SENSING APPARATUS INCLUDING ADJUSTABLE REF...