Reflection diffraction [RHEED]

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H01J2237/255

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

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H01J2237/255Reflection diffraction [RHEED]

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Patents Grantslast 30 patents

Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 11,728,126
- Issue date Aug 15, 2023
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with plural X-ray detectors for acquiring eleme...
- Patent number 10,002,741
- Issue date Jun 19, 2018
- Industrial Technology Research Institute
- Fu-Rong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring EBSP patterns
- Patent number 9,618,463
- Issue date Apr 11, 2017
- FEI Company
- Marek Uncovský
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of applying small-angle electron scattering to...
- Patent number 9,390,888
- Issue date Jul 12, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material analysis of a microscopic element
- Patent number 8,546,756
- Issue date Oct 1, 2013
- Applied Materials Israel, Ltd.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hierarchical clustering using correlation metric and spatial contin...
- Patent number 8,280,887
- Issue date Oct 2, 2012
- Sandia Corporation
- Christopher L. Stork
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope with curved axes
- Patent number 7,205,542
- Issue date Apr 17, 2007
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for cleaning an analytical instrument while op...
- Patent number 6,667,475
- Issue date Dec 23, 2003
- Applied Materials, Inc.
- Shachar Parran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system
- Patent number 6,573,509
- Issue date Jun 3, 2003
- Oxford Instruments Analytical Limited
- Ian Radley
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Method of determining average crystallite size of material and appa...
- Patent number 6,420,701
- Issue date Jul 16, 2002
- Canon Kabushiki Kaisha
- Hiroyuki Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-induced electron emission microscopy
- Patent number 6,291,823
- Issue date Sep 18, 2001
- Sandia Corporation
- Barney L. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for imaging a particle beam
- Patent number 6,198,095
- Issue date Mar 6, 2001
- Staib Instruments GmbH
- Philippe Staib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collimator for high takeoff angle energy dispersive spectroscopy (E...
- Patent number 5,847,388
- Issue date Dec 8, 1998
- Noran Instruments, Inc.
- Steven J. Foote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold finger design in an energy dispersive x-ray analyzer
- Patent number 5,821,176
- Issue date Oct 13, 1998
- Philips Electronics North America Corporation
- Lun-Shu Ray Yeh
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method and apparatus for mechanically cooling energy dispersive X-r...
- Patent number 5,816,052
- Issue date Oct 6, 1998
- Noran Instruments, Inc.
- Steven J. Foote
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Closed cycle gas cryogenically cooled radiation detector
- Patent number 5,811,816
- Issue date Sep 22, 1998
- U.S. Philips Corporation
- Brian William Gallagher
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method for identifying surface atoms of solid sample and apparatus...
- Patent number 5,635,716
- Issue date Jun 3, 1997
- International Superconductivity Technology Center
- Ziyuan Liu
- G01 - MEASURING TESTING
Information Patent Grant
Closed cycle gas cryogenically cooled radiation detector
- Patent number 5,552,608
- Issue date Sep 3, 1996
- Philips Electronics North America Corporation
- Brian W. Gallagher
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Surface analyzing and processing apparatus
- Patent number 5,440,122
- Issue date Aug 8, 1995
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reflection electron diffractometer and method for observing microsc...
- Patent number 5,093,573
- Issue date Mar 3, 1992
- Nobuo Mikoshiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20230335370
- Publication date Oct 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
- Publication number 20140131574
- Publication date May 15, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL ANALYSYS OF A MICROSCOPIC ELEMENT
- Publication number 20110024622
- Publication date Feb 3, 2011
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection system
- Publication number 20020117628
- Publication date Aug 29, 2002
- Ian Radley
- G01 - MEASURING TESTING

Reflection diffraction [RHEED]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

3D metrology from 3D datacube created from stack of registered imag...

Electron microscope with plural X-ray detectors for acquiring eleme...

Method of acquiring EBSP patterns

Apparatus and method of applying small-angle electron scattering to...

System and method for material analysis of a microscopic element

Hierarchical clustering using correlation metric and spatial contin...

Scanning electron microscope with curved axes

Method and apparatus for cleaning an analytical instrument while op...

Detection system

Method of determining average crystallite size of material and appa...

Ion-induced electron emission microscopy

Apparatus and method for imaging a particle beam

Collimator for high takeoff angle energy dispersive spectroscopy (E...

Cold finger design in an energy dispersive x-ray analyzer

Method and apparatus for mechanically cooling energy dispersive X-r...

Closed cycle gas cryogenically cooled radiation detector

Method for identifying surface atoms of solid sample and apparatus...

Closed cycle gas cryogenically cooled radiation detector

Surface analyzing and processing apparatus

Reflection electron diffractometer and method for observing microsc...

Patents Applicationslast 30 patents

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY

SYSTEM AND METHOD FOR MATERIAL ANALYSYS OF A MICROSCOPIC ELEMENT

Detection system