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G01N2201/0636

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/0636Reflectors

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Patents Grantslast 30 patents

Information Patent Grant
Broadband pulsed light source apparatus and spectroscopic measureme...
- Patent number 12,259,317
- Issue date Mar 25, 2025
- Ushio Denki Kabushiki Kaisha
- Junki Sahara
- G01 - MEASURING TESTING
Information Patent Grant
Light-source apparatus, inspection apparatus, and adjustment method
- Patent number 12,259,339
- Issue date Mar 25, 2025
- Lasertec Corporation
- Jun Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Biological sample image collection device and gene sequencer
- Patent number 12,259,310
- Issue date Mar 25, 2025
- BGI SHENZHEN
- Zhonghai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting chemical compounds in soil
- Patent number 12,241,829
- Issue date Mar 4, 2025
- S4 Mobile Laboratories, LLC
- Lamalani Suarez
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 12,216,045
- Issue date Feb 4, 2025
- Shimadzu Corporation
- Tatsuya Ikehara
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform spectrometer and method of Fourier transform spec...
- Patent number 12,216,047
- Issue date Feb 4, 2025
- The University of Manchester
- Nawapong Unsuree
- G01 - MEASURING TESTING
Information Patent Grant
Real-time detection of deflections and ruptures of EUV pellicle mem...
- Patent number 12,209,975
- Issue date Jan 28, 2025
- Intel Corporation
- John Ferdinand Magana
- G01 - MEASURING TESTING
Information Patent Grant
Polar-azimuth spectral imaging and analysis device with modular sam...
- Patent number 12,203,850
- Issue date Jan 21, 2025
- Florida Polytechnic University
- Nathan Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element super resolution optical inspection system
- Patent number 12,203,857
- Issue date Jan 21, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
High throughput snapshot spectral encoding device for fluorescence...
- Patent number 12,196,679
- Issue date Jan 14, 2025
- University of Southern California
- Francesco Cutrale
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe comprising a waveguide and method for real-time and i...
- Patent number 12,196,676
- Issue date Jan 14, 2025
- CHRYSALABS INC.
- Gabriel Mangeat
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus
- Patent number 12,181,691
- Issue date Dec 31, 2024
- Disco Corporation
- Nobuyuki Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Plasma treatment apparatus, a method of monitoring a process of man...
- Patent number 12,170,233
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing package, optical module and method for detecting light
- Patent number 12,169,170
- Issue date Dec 17, 2024
- Advanced Semiconductor Engineering, Inc.
- Wei-Hao Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,163,892
- Issue date Dec 10, 2024
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device, gas detection system, and gas detection method
- Patent number 12,163,881
- Issue date Dec 10, 2024
- NEC Platforms, Ltd.
- Fujio Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Digital mirror device based code-division multiplexed Raman optical...
- Patent number 12,163,891
- Issue date Dec 10, 2024
- CytoVeris, Inc.
- Alan Kersey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Adjustable extended focus raman system
- Patent number 12,158,425
- Issue date Dec 3, 2024
- Thermo Scientific Portable Analytical Instruments Inc.
- Malcolm C. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensors using non-dispersive infrared materials
- Patent number 12,158,418
- Issue date Dec 3, 2024
- Lumileds LLC
- Florent Gregoire Monestier
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,152,993
- Issue date Nov 26, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and focal position adjustment method
- Patent number 12,135,295
- Issue date Nov 5, 2024
- NuFlare Technology, Inc.
- Masaya Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous detection system and detection method for trace nitroge...
- Patent number 12,123,825
- Issue date Oct 22, 2024
- Anhui University of Science and Technology
- Huawei Jin
- G01 - MEASURING TESTING
Information Patent Grant
Retro-reflectometer for measuring retro-reflectivity of objects in...
- Patent number 12,117,395
- Issue date Oct 15, 2024
- Waymo LLC
- Hui Seong Son
- G01 - MEASURING TESTING
Information Patent Grant
Multi-well plate readers and methods of their use
- Patent number 12,105,023
- Issue date Oct 1, 2024
- QUELLTX, INC.
- Gabriel Benito Borja
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Single-beam photothermal measurement apparatus and measurement meth...
- Patent number 12,099,002
- Issue date Sep 24, 2024
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Shijie Liu
- G01 - MEASURING TESTING
Information Patent Grant
Sample container with integrated internal reflection element
- Patent number 12,083,519
- Issue date Sep 10, 2024
- DXCOVER LIMITED
- Matthew Baker
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Specimen processing apparatus, specimen measurement system and meth...
- Patent number 12,076,724
- Issue date Sep 3, 2024
- Sysmex Corporation
- Kazuhiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Excitation light irradiating apparatus and excitation light irradia...
- Patent number 12,066,392
- Issue date Aug 20, 2024
- Sumida Corporation
- Masateru Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency fluorometer
- Patent number 12,061,149
- Issue date Aug 13, 2024
- YSI, Inc.
- Kevin Flanagan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
Electronic Devices With Relative Humidity Sensors
- Publication number 20250102425
- Publication date Mar 27, 2025
- Apple Inc.
- Fehmi Civitci
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102434
- Publication date Mar 27, 2025
- Lasertec Corporation
- Mizuki KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
- Publication number 20250093261
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL IMAGING
- Publication number 20250076189
- Publication date Mar 6, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Jussi SOUKKAMÄKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...
- Publication number 20250076186
- Publication date Mar 6, 2025
- Government of the United States of America, as Represented by the Secretary o...
- Young Jong Lee
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...
- Publication number 20250067680
- Publication date Feb 27, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Hoon SONG
- G01 - MEASURING TESTING
Information Patent Application
Active Transmission Measurement of Optical Metasurface during Etch...
- Publication number 20250050453
- Publication date Feb 13, 2025
- GAMDAN Optics, Inc.
- Thomas C Hutchens
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PORTABLE INSTRUMENT FOR MEASURING GAS CONCENTRATION
- Publication number 20250052670
- Publication date Feb 13, 2025
- HEALTHY PHOTON (NINGBO) TECHNOLOGY CO., LTD.
- Yin WANG
- G01 - MEASURING TESTING
Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for Multi-Modal Polarization Holographic Spect...
- Publication number 20250035538
- Publication date Jan 30, 2025
- The University of Hong Kong
- Yanmin ZHU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS
- Publication number 20250027874
- Publication date Jan 23, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Takeshi SAWADA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD
- Publication number 20250020587
- Publication date Jan 16, 2025
- L'Oreal
- Benjamin ASKENAZI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20250012712
- Publication date Jan 9, 2025
- Horiba, Ltd.
- Kohei TACHIBANA
- G01 - MEASURING TESTING
Information Patent Application
MILKING SYSTEM WITH SAMPLING AND ANALYSIS
- Publication number 20250012729
- Publication date Jan 9, 2025
- Lely Patent N.V.
- Johannes Adriaan DRONKERT
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250012726
- Publication date Jan 9, 2025
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
Measurement of Bidirectional Reflectance Distribution
- Publication number 20250003875
- Publication date Jan 2, 2025
- Datacolor Inc.
- Zhiling Xu
- G01 - MEASURING TESTING
Information Patent Application
Gas Absorption Spectrometer
- Publication number 20240418636
- Publication date Dec 19, 2024
- Shimadzu Corporation
- Yuta KAWASHIMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CELL AND OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF...
- Publication number 20240410823
- Publication date Dec 12, 2024
- Nikira Labs Inc.
- John Brian Leen
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR ABSORPTION-SPECTROSCOPIC GAS MEASUREMENT, USE...
- Publication number 20240410820
- Publication date Dec 12, 2024
- M & C TechGroup Germany GmbH
- Johann Georges des Aulnois
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYZER AND OPTICAL ANALYSIS SYSTEM THEREFOR
- Publication number 20240402076
- Publication date Dec 5, 2024
- Dalian Mega Crystal Biological Technology Co., Ltd.
- Yi-sheng TING
- G01 - MEASURING TESTING
Information Patent Application
DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...
- Publication number 20240402080
- Publication date Dec 5, 2024
- SKYLA Corporation
- Chua-Zu Huang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF PHOTOLUMINESCENCE IN A DROPLET
- Publication number 20240402084
- Publication date Dec 5, 2024
- Advanced Nano Technologies Limited
- Norman McMillan
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER FOR RECEIVING SEMICONDUCTOR DEVICE
- Publication number 20240387216
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HSU TUNG YEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SENSOR DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240385118
- Publication date Nov 21, 2024
- Mitsubishi Electric Corporation
- Akihiro FUJIE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE SURFACE INSPECTION DEVICE
- Publication number 20240372161
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Hongjae KO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPIC IMAGING APPARATUS AND ILLUMINATION CHIP THEREOF, IMAGIN...
- Publication number 20240369489
- Publication date Nov 7, 2024
- BGI SHENZHEN
- Fan ZHOU
- G01 - MEASURING TESTING
Information Patent Application
AUTOFLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY
- Publication number 20240361243
- Publication date Oct 31, 2024
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RA...
- Publication number 20240353335
- Publication date Oct 24, 2024
- Wasatch Photonics, Inc.
- David John Creasey
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Broadband pulsed light source apparatus and spectroscopic measureme...

Light-source apparatus, inspection apparatus, and adjustment method

Biological sample image collection device and gene sequencer

Method and apparatus for detecting chemical compounds in soil

Measurement apparatus

Fourier transform spectrometer and method of Fourier transform spec...

Real-time detection of deflections and ruptures of EUV pellicle mem...

Polar-azimuth spectral imaging and analysis device with modular sam...

Multi-element super resolution optical inspection system

High throughput snapshot spectral encoding device for fluorescence...

Optical probe comprising a waveguide and method for real-time and i...

Inspecting apparatus

Plasma treatment apparatus, a method of monitoring a process of man...

Sensing package, optical module and method for detecting light

Accurate Raman spectroscopy

Gas detection device, gas detection system, and gas detection method

Digital mirror device based code-division multiplexed Raman optical...

Adjustable extended focus raman system

Gas sensors using non-dispersive infrared materials

Accurate Raman spectroscopy

Defect inspection device

Inspection apparatus and focal position adjustment method

Synchronous detection system and detection method for trace nitroge...

Retro-reflectometer for measuring retro-reflectivity of objects in...

Multi-well plate readers and methods of their use

Single-beam photothermal measurement apparatus and measurement meth...

Sample container with integrated internal reflection element

Specimen processing apparatus, specimen measurement system and meth...

Excitation light irradiating apparatus and excitation light irradia...

Swept frequency fluorometer

Patents Applicationslast 30 patents

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

Electronic Devices With Relative Humidity Sensors

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...

METHOD AND APPARATUS FOR SPECTRAL IMAGING

LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...

Active Transmission Measurement of Optical Metasurface during Etch...

PORTABLE INSTRUMENT FOR MEASURING GAS CONCENTRATION

DUAL LENS INSPECTION DEVICE

Method and apparatus for Multi-Modal Polarization Holographic Spect...

OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS

DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

MILKING SYSTEM WITH SAMPLING AND ANALYSIS

INSPECTION APPARATUS AND INSPECTION METHOD

Measurement of Bidirectional Reflectance Distribution

Gas Absorption Spectrometer

SEMICONDUCTOR MEASUREMENT APPARATUS

CELL AND OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF...

MEASURING DEVICE FOR ABSORPTION-SPECTROSCOPIC GAS MEASUREMENT, USE...

OPTICAL ANALYZER AND OPTICAL ANALYSIS SYSTEM THEREFOR

DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...

MEASUREMENT OF PHOTOLUMINESCENCE IN A DROPLET

CONTAINER FOR RECEIVING SEMICONDUCTOR DEVICE

OPTICAL SENSOR DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

ELECTRODE SURFACE INSPECTION DEVICE

MICROSCOPIC IMAGING APPARATUS AND ILLUMINATION CHIP THEREOF, IMAGIN...

AUTOFLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY

IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RA...