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G01N2201/0636

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/0636Reflectors

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for live projection imaging for fluorescence mi...
- Patent number 12,366,740
- Issue date Jul 22, 2025
- The Board of Regents of the University of Texas System
- Reto Fiolka
- G01 - MEASURING TESTING
Information Patent Grant
Phase retrieval
- Patent number 12,366,525
- Issue date Jul 22, 2025
- Applied Materials Israel Ltd.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device and gas detection method
- Patent number 12,345,631
- Issue date Jul 1, 2025
- Kabushiki Kaisha Toshiba
- Yasutomo Shiomi
- G01 - MEASURING TESTING
Information Patent Grant
Fully compensated optical gas sensing system and apparatus
- Patent number 12,345,632
- Issue date Jul 1, 2025
- Analog Devices, Inc.
- Shrenik Deliwala
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Dissolved gas sensing system and method
- Patent number 12,332,169
- Issue date Jun 17, 2025
- Woods Hole Oceanographic Institution
- Jason Kapit
- G01 - MEASURING TESTING
Information Patent Grant
System for, and calibration and testing of directed beam ellipsomet...
- Patent number 12,332,163
- Issue date Jun 17, 2025
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Dual lens inspection device
- Patent number 12,332,181
- Issue date Jun 17, 2025
- Sun Yang Optics Development Co., Ltd.
- Sheng Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for multi-view episcopic selective plane illumina...
- Patent number 12,320,966
- Issue date Jun 3, 2025
- CZ Biohub SF, LLC.
- Bin Yang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-mode illumination system
- Patent number 12,320,749
- Issue date Jun 3, 2025
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of ambient gas sensing in a vehicle
- Patent number 12,313,536
- Issue date May 27, 2025
- Joyson Safety Systems Acquisition LLC
- Salvatore Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Seamless integrating cavity of monolithic fumed silica
- Patent number 12,298,235
- Issue date May 13, 2025
- Southwest Research Institute
- Thomas Moore
- G01 - MEASURING TESTING
Information Patent Grant
Coating condition detection method, coating condition detection dev...
- Patent number 12,297,143
- Issue date May 13, 2025
- Sumitomo Electric Industries, Ltd.
- Tadashi Enomoto
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
System and method for reducing sample noise using selective markers
- Patent number 12,298,254
- Issue date May 13, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
Miniature multispectral detection system having multiple spectromet...
- Patent number 12,292,376
- Issue date May 6, 2025
- LIGHTSENSE TECHNOLOGY, INC.
- Wade Martin Poteet
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic Raman device
- Patent number 12,287,290
- Issue date Apr 29, 2025
- Shimadzu Corporation
- Tomoyo Tao
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence scanning system for analytical ultracentrifugation
- Patent number 12,287,265
- Issue date Apr 29, 2025
- The United States of America, as represented by the Secretary, Department of...
- Peter W. Schuck
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-track Raman well plate reader
- Patent number 12,281,986
- Issue date Apr 22, 2025
- Horiba Instruments Incorporated
- Nicolas Vezard
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device
- Patent number 12,270,759
- Issue date Apr 8, 2025
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G01 - MEASURING TESTING
Information Patent Grant
Clinical spectrophotometer for general chemistry, immuno-assay and...
- Patent number 12,269,032
- Issue date Apr 8, 2025
- In Diagnostics, Inc.
- Octavian Florescu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Wafer defect detection device
- Patent number 12,265,038
- Issue date Apr 1, 2025
- PlayNitride Display Co., Ltd.
- Yi-Chia Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and water quality analysis system
- Patent number 12,265,028
- Issue date Apr 1, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Issei Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Broadband pulsed light source apparatus and spectroscopic measureme...
- Patent number 12,259,317
- Issue date Mar 25, 2025
- Ushio Denki Kabushiki Kaisha
- Junki Sahara
- G01 - MEASURING TESTING
Information Patent Grant
Light-source apparatus, inspection apparatus, and adjustment method
- Patent number 12,259,339
- Issue date Mar 25, 2025
- Lasertec Corporation
- Jun Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Biological sample image collection device and gene sequencer
- Patent number 12,259,310
- Issue date Mar 25, 2025
- BGI SHENZHEN
- Zhonghai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting chemical compounds in soil
- Patent number 12,241,829
- Issue date Mar 4, 2025
- S4 Mobile Laboratories, LLC
- Lamalani Suarez
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 12,216,045
- Issue date Feb 4, 2025
- Shimadzu Corporation
- Tatsuya Ikehara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE
- Publication number 20250237607
- Publication date Jul 24, 2025
- Cerillo, Inc.
- Kevin Seitter
- G01 - MEASURING TESTING
Information Patent Application
TEST OBJECT ANALYSIS METHOD
- Publication number 20250237608
- Publication date Jul 24, 2025
- HAMAMTSU PHOTONICS K.K.
- Kazuhiko FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
- Publication number 20250224342
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Tomoharu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...
- Publication number 20250224345
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jun Taek OH
- G01 - MEASURING TESTING
Information Patent Application
COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING
- Publication number 20250216327
- Publication date Jul 3, 2025
- Renesas Electronics America Inc.
- Mohammad Taghi FATHI
- G01 - MEASURING TESTING
Information Patent Application
OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS
- Publication number 20250205745
- Publication date Jun 26, 2025
- PFU Limited
- Masanobu HONGO
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM
- Publication number 20250208059
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...
- Publication number 20250208047
- Publication date Jun 26, 2025
- Justin Moretto
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEMS AND RELATED METHODS
- Publication number 20250208053
- Publication date Jun 26, 2025
- Gemological Institute of America, Inc.
- Zhen WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Modulator, Laser Interferometer, And Spectroscopic Apparatus
- Publication number 20250198913
- Publication date Jun 19, 2025
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Mirror Movement Mechanism And Interferometer
- Publication number 20250198922
- Publication date Jun 19, 2025
- SEIKO EPSON CORPORATION
- Koji CHINDO
- G01 - MEASURING TESTING
Information Patent Application
MULTIPASS ABSORPTION CELL
- Publication number 20250189433
- Publication date Jun 12, 2025
- Alpes Lasers SA
- Richard MAULINI
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- Karthickraj Muthuramalingam
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...
- Publication number 20250189445
- Publication date Jun 12, 2025
- TSINGHUA UNIVERSITY
- Ziran ZHAO
- G01 - MEASURING TESTING
Information Patent Application
NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...
- Publication number 20250172496
- Publication date May 29, 2025
- Erica BELMONT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
power transformer fault detection device
- Publication number 20250146932
- Publication date May 8, 2025
- Zhejiang Wanli University
- Danjiang Chen
- G01 - MEASURING TESTING
Information Patent Application
EXCHANGEABLE SPARK UNIT, SYSTEM AND CALIBRATION METHOD
- Publication number 20250146944
- Publication date May 8, 2025
- Heraeus Electro-Nite International N.V.
- Luc VRANCKX
- G01 - MEASURING TESTING
Information Patent Application
SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING
- Publication number 20250137920
- Publication date May 1, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250130172
- Publication date Apr 24, 2025
- NOVA LTD
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHAMBER BASE WITH INTEGRATED REFLECTIVE SURFACES FOR PARTIC...
- Publication number 20250123204
- Publication date Apr 17, 2025
- Honeywell International Inc.
- Massimo Bressanutti
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250116605
- Publication date Apr 10, 2025
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...
- Publication number 20250110052
- Publication date Apr 3, 2025
- Kai ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME
- Publication number 20250110324
- Publication date Apr 3, 2025
- Shimadzu Corporation
- Yuka MORITANI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC PHOTONIC SENSOR
- Publication number 20250110379
- Publication date Apr 3, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Loïc LAPLATINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
Electronic Devices With Relative Humidity Sensors
- Publication number 20250102425
- Publication date Mar 27, 2025
- Apple Inc.
- Fehmi Civitci
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102434
- Publication date Mar 27, 2025
- Lasertec Corporation
- Mizuki KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
- Publication number 20250093261
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL IMAGING
- Publication number 20250076189
- Publication date Mar 6, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Jussi SOUKKAMÄKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...
- Publication number 20250076186
- Publication date Mar 6, 2025
- Government of the United States of America, as Represented by the Secretary o...
- Young Jong Lee
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for live projection imaging for fluorescence mi...

Phase retrieval

Gas detection device and gas detection method

Fully compensated optical gas sensing system and apparatus

Method and apparatus for determination of textile fiber composition

Dissolved gas sensing system and method

System for, and calibration and testing of directed beam ellipsomet...

Dual lens inspection device

Inspection system for manufactured components

Method and system for multi-view episcopic selective plane illumina...

Multi-mode illumination system

Systems and methods of ambient gas sensing in a vehicle

Measurement system and method for obtaining information about a sample

Seamless integrating cavity of monolithic fumed silica

Coating condition detection method, coating condition detection dev...

System and method for reducing sample noise using selective markers

Miniature multispectral detection system having multiple spectromet...

Microscopic Raman device

Fluorescence scanning system for analytical ultracentrifugation

Ultra-micro defect detection apparatus and detection method thereof

Multi-track Raman well plate reader

Gas detection device

Clinical spectrophotometer for general chemistry, immuno-assay and...

Wafer defect detection device

Optical measurement device and water quality analysis system

Broadband pulsed light source apparatus and spectroscopic measureme...

Light-source apparatus, inspection apparatus, and adjustment method

Biological sample image collection device and gene sequencer

Method and apparatus for detecting chemical compounds in soil

Measurement apparatus

Patents Applicationslast 30 patents

AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE

TEST OBJECT ANALYSIS METHOD

OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE

WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...

COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING

OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS

MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM

MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...

IMAGING SYSTEMS AND RELATED METHODS

Optical Modulator, Laser Interferometer, And Spectroscopic Apparatus

Mirror Movement Mechanism And Interferometer

MULTIPASS ABSORPTION CELL

RADIATION EMITTER AND MEASUREMENT SYSTEM

TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...

NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...

power transformer fault detection device

EXCHANGEABLE SPARK UNIT, SYSTEM AND CALIBRATION METHOD

SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING

ACCURATE RAMAN SPECTROSCOPY

OPTICAL CHAMBER BASE WITH INTEGRATED REFLECTIVE SURFACES FOR PARTIC...

ACCURATE RAMAN SPECTROSCOPY

INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...

RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME

INTERFEROMETRIC PHOTONIC SENSOR

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

Electronic Devices With Relative Humidity Sensors

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...

METHOD AND APPARATUS FOR SPECTRAL IMAGING

LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...