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G01N2201/0636
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/0636
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Patents Grants
last 30 patents
Information
Patent Grant
Seamless integrating cavity of monolithic fumed silica
Patent number
11,971,347
Issue date
Apr 30, 2024
Southwest Research Institute
Thomas Moore
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
Patent number
11,965,836
Issue date
Apr 23, 2024
PROOV STATION
Gabriel Tissandier
G01 - MEASURING TESTING
Information
Patent Grant
Quantum enhanced magneto-optical microscopy and spectroscopy
Patent number
11,953,432
Issue date
Apr 9, 2024
UT-Battelle, LLC
Benjamin J. Lawrie
G01 - MEASURING TESTING
Information
Patent Grant
Measurement light source and measuring arrangement for detecting a...
Patent number
11,953,426
Issue date
Apr 9, 2024
CARL ZEISS SPECTROSCOPY GMBH
Joerg Margraf
G01 - MEASURING TESTING
Information
Patent Grant
Modulation interferometric imaging systems and methods
Patent number
11,946,867
Issue date
Apr 2, 2024
Memorial Sloan Kettering Cancer Center
Alexandros Pertsinidis
G01 - MEASURING TESTING
Information
Patent Grant
Device of complex gas mixture detection based on optical-path-adjus...
Patent number
11,933,724
Issue date
Mar 19, 2024
HUBEI UNIVERSITY OF TECHNOLOGY
Yin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Micro mirror arrays for measuring electromagnetic radiation
Patent number
11,933,722
Issue date
Mar 19, 2024
CALUMINO PTY LTD
Marek Steffanson
G01 - MEASURING TESTING
Information
Patent Grant
Multi-mode illumination system
Patent number
11,927,533
Issue date
Mar 12, 2024
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Grant
Optical water-quality detection apparatus
Patent number
11,913,876
Issue date
Feb 27, 2024
Industrial Technology Research Institute
Chia-Jung Chang
G01 - MEASURING TESTING
Information
Patent Grant
System of measuring image of pattern in scanning type EUV mask
Patent number
11,914,282
Issue date
Feb 27, 2024
Samsung Electronics Co., Ltd.
Donggun Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Molecular beacon-based optical gene biosensor employing retro-refle...
Patent number
11,913,064
Issue date
Feb 27, 2024
Ajou University Industry-Academic Cooperation Foundation
Hyun-Chul Yoon
G01 - MEASURING TESTING
Information
Patent Grant
Real-time spectral analysis through high-speed spectral classification
Patent number
11,913,877
Issue date
Feb 27, 2024
Jasco Corporation
Koshi Nagamori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Illumination device for a spectrophotometer having integrated mixin...
Patent number
11,906,357
Issue date
Feb 20, 2024
X-Rite Europe GmbH
Mark Wegmüller
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for imaging enabling high resolution
Patent number
11,906,443
Issue date
Feb 20, 2024
GREEN OPTICS CO., LTD.
Hyun Il Cho
G01 - MEASURING TESTING
Information
Patent Grant
System and method of providing incoherent coupling of a laser into...
Patent number
11,892,399
Issue date
Feb 6, 2024
NIKIRA LABS INC.
Manish Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Endotoxin testing assay and method of same
Patent number
11,892,397
Issue date
Feb 6, 2024
Board of Regents, The University of Texas System
Jing Yong Ye
G01 - MEASURING TESTING
Information
Patent Grant
Detection device and detection method
Patent number
11,892,407
Issue date
Feb 6, 2024
Wistron Corporation
Yi Fan Hsieh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Downhole laser system with an improved laser output production and...
Patent number
11,885,746
Issue date
Jan 30, 2024
United States Department of Energy
Dustin McIntyre
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Raman spectroscopy method and apparatus using broadband excitation...
Patent number
11,879,846
Issue date
Jan 23, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
Optical system and plane spectroscopic device
Patent number
11,880,025
Issue date
Jan 23, 2024
Canon Kabushiki Kaisha
Takashi Sukegawa
G02 - OPTICS
Information
Patent Grant
Systems and methods for blood analysis
Patent number
11,867,613
Issue date
Jan 9, 2024
COR HEALTH, INC.
Robert G. Messerschmidt
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Portable apparatus for detecting early crop diseases based on spati...
Patent number
11,861,897
Issue date
Jan 2, 2024
JIANGSU UNIVERSITY
Aichen Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Accurate raman spectroscopy
Patent number
11,860,104
Issue date
Jan 2, 2024
Nova Ltd.
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Extended solid angle turbidity sensor
Patent number
11,860,096
Issue date
Jan 2, 2024
YSI, Inc.
Kevin Flanagan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Apparatus and method for measuring phase of extreme ultraviolet (EU...
Patent number
11,852,583
Issue date
Dec 26, 2023
Samsung Electronics Co., Ltd.
Jongju Park
G01 - MEASURING TESTING
Information
Patent Grant
Laser induced breakdown spectroscopy of liquid
Patent number
11,835,464
Issue date
Dec 5, 2023
Applied Spectra, Inc.
Alexander A. Bol′shakov
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting containers using multiple radiatio...
Patent number
11,828,712
Issue date
Nov 28, 2023
Industrial Dynamic Company, Ltd
Christian Beck
G01 - MEASURING TESTING
Information
Patent Grant
Ultraviolet-visible absorption spectroscopy for gemstone identifica...
Patent number
11,828,703
Issue date
Nov 28, 2023
Gemological Institute of America, Inc. (GIA)
Hiroshi Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel excitation and emission for miniaturized, planar fluor...
Patent number
11,828,697
Issue date
Nov 28, 2023
VERILY LIFE SCIENCES LLC
Supriyo Sinha
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Fully compensated optical gas sensing system and apparatus
Patent number
11,821,836
Issue date
Nov 21, 2023
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Inspection System
Publication number
20240142388
Publication date
May 2, 2024
MA micro automation GmbH
Bodo Ergert
G01 - MEASURING TESTING
Information
Patent Application
PHASE RETRIEVAL
Publication number
20240133807
Publication date
Apr 25, 2024
APPLIED MATERIALS ISRAEL LTD.
Benny Kirshner
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY
Publication number
20240126058
Publication date
Apr 18, 2024
Arizona Board of Regents on behalf of The University of Arizona
Dongkyun Kang
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection System and Method
Publication number
20240125713
Publication date
Apr 18, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Hao Chun Yang
G01 - MEASURING TESTING
Information
Patent Application
LASER CRYSTALLIZATION MONITORING DEVICE AND METHOD OF LASER CRYSTAL...
Publication number
20240118221
Publication date
Apr 11, 2024
SAMSUNG DISPLAY CO., LTD.
JI-HWAN KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF
Publication number
20240119577
Publication date
Apr 11, 2024
Casi Vision Technology (Luoyang) Co., Ltd.
Feng Lei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Autofluorescence Photothermal Characterization Systems and Methods
Publication number
20240118208
Publication date
Apr 11, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
SENSOR CHIP ASSEMBLY AND METHODS TO MANUFACTURE THE SAME
Publication number
20240110871
Publication date
Apr 4, 2024
Quantum-Si Incorporated
Jonathan C. Schultz
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20240102936
Publication date
Mar 28, 2024
YOKOGAWA ELECTRIC CORPORATION
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL DETECTION METHOD AND DEVICE FOR RED TIDE ALGAE BA...
Publication number
20240102922
Publication date
Mar 28, 2024
Zhejiang University
Xiaoping WANG
G01 - MEASURING TESTING
Information
Patent Application
MULTI-FLUORESCENCE IMAGE ACQUISITION SYSTEM AND METHOD, AND APPLICA...
Publication number
20240094127
Publication date
Mar 21, 2024
SHANGHAI RUIYU BIOTECH CO., LTD.
Haohan XIA
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20240085333
Publication date
Mar 14, 2024
NOVA LTD
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ASSESSING A DEPRESSION, IN PARTICULAR A BORE, IN A WORKP...
Publication number
20240085170
Publication date
Mar 14, 2024
3D.aero GmbH
Werner NEDDERMEYER
G01 - MEASURING TESTING
Information
Patent Application
FULLY COMPENSATED OPTICAL GAS SENSING SYSTEM AND APPARATUS
Publication number
20240085318
Publication date
Mar 14, 2024
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Application
CONCENTRATION MEASURING DEVICE
Publication number
20240085313
Publication date
Mar 14, 2024
ATIK CO., LTD.
Youngho HONG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ALIGNMENT COMPENSATION SYSTEM FOR A GAS DETECTION SYSTEM
Publication number
20240077411
Publication date
Mar 7, 2024
Universiteit Gent
Giorgio Signorello
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR MANUFACTURING...
Publication number
20240071795
Publication date
Feb 29, 2024
Mitsubishi Electric Corporation
Motoki IINUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
Publication number
20240060880
Publication date
Feb 22, 2024
HITACHI HIGH-TECH CORPORATION
Masahiro WATANABE
G02 - OPTICS
Information
Patent Application
ULTRAVIOLET-VISIBLE ABSORPTION SPECTROSCOPY FOR GEMSTONE IDENTIFICA...
Publication number
20240060879
Publication date
Feb 22, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Hiroshi TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM COMPRISING ANS OPTICAL MULTIPLEXER
Publication number
20240053259
Publication date
Feb 15, 2024
X-RITE EUROPE GMBH
Peter EHBETS
G01 - MEASURING TESTING
Information
Patent Application
Real-Time Detection of Deflections and Ruptures of EUV Pellicle Mem...
Publication number
20240053281
Publication date
Feb 15, 2024
Intel Corporation
John Ferdinand MAGANA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING CHEMICAL COMPOUNDS IN SOIL
Publication number
20240044786
Publication date
Feb 8, 2024
S4 Mobile Laboratories, LLC
Lamalani SUAREZ
G01 - MEASURING TESTING
Information
Patent Application
Microscopic Raman Device
Publication number
20240044800
Publication date
Feb 8, 2024
Shimadzu Corporation
Tomoyo TAO
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE MULTIFUNCTION SPECTROSCOPY ANALYZER
Publication number
20240035960
Publication date
Feb 1, 2024
Ivan Araujo Dayrell
G01 - MEASURING TESTING
Information
Patent Application
NITRIC OXIDE MEASUREMENT
Publication number
20240027336
Publication date
Jan 25, 2024
NINOX MEDICAL LTD.
Dmitry MEDVEDEV
G01 - MEASURING TESTING
Information
Patent Application
HAND-HELD SCANNING PROBE AND OPTICAL SCANNING SYSTEM
Publication number
20240027331
Publication date
Jan 25, 2024
OPXION TECHNOLOGY INC.
MENG-TSAN TSAI
G01 - MEASURING TESTING
Information
Patent Application
Integrated cat's-eye tunable laser spectroscopy system and method
Publication number
20240019363
Publication date
Jan 18, 2024
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20240019375
Publication date
Jan 18, 2024
NOVA LTD
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240011915
Publication date
Jan 11, 2024
SEMES CO., LTD.
Hark Ryong KIM
G01 - MEASURING TESTING
Information
Patent Application
PANEL INSPECTION DEVICE AND METHOD FOR INSPECTING A PANEL
Publication number
20240011920
Publication date
Jan 11, 2024
QIOPTIQ PHOTONICS GMBH & CO. KG
Achim Zirkel
G01 - MEASURING TESTING