related to electrical aspects

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CPC
G01R31/2879

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Patents Grantslast 30 patents

Information Patent Grant
Testing method and testing system
- Patent number 12,216,155
- Issue date Feb 4, 2025
- Realtek Semiconductor Corporation
- Yi-Nan Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for fault detection and reporting through seria...
- Patent number 12,169,218
- Issue date Dec 17, 2024
- Maxim Integrated Products, Inc.
- Ling Liu
- G01 - MEASURING TESTING
Information Patent Grant
Secure testing mode
- Patent number 12,105,139
- Issue date Oct 1, 2024
- Advanced Micro Devices, Inc.
- Vidyashankar Viswanathan
- G01 - MEASURING TESTING
Information Patent Grant
Electrical device
- Patent number 12,078,687
- Issue date Sep 3, 2024
- AMS-OSRAM INTERNATIONAL GMBH
- Dirk Becker
- G01 - MEASURING TESTING
Information Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
- Patent number 12,078,672
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Xiaopeng Qu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for wafer-level testing
- Patent number 12,066,484
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 12,025,655
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 12,025,656
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method
- Patent number 12,007,436
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Exposure monitor device
- Patent number 11,988,708
- Issue date May 21, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 11,982,707
- Issue date May 14, 2024
- Samsung Electronics Co., Ltd.
- Junsik Park
- G01 - MEASURING TESTING
Information Patent Grant
Test method
- Patent number 11,982,701
- Issue date May 14, 2024
- Fuji Electric Co., Ltd.
- Shuhei Tatemichi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage tracking circuit and method of operating the same
- Patent number 11,959,960
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiang-Hui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 11,953,545
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining charge pump efficiency using clock edge counting
- Patent number 11,927,635
- Issue date Mar 12, 2024
- SanDisk Technologies LLC
- Keyur Payak
- G01 - MEASURING TESTING
Information Patent Grant
Testing machine and testing method
- Patent number 11,892,499
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kang Lv
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosing multicycle transition faults and/or defects with AT-spee...
- Patent number 11,892,501
- Issue date Feb 6, 2024
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,860,225
- Issue date Jan 2, 2024
- Renesas Electronics Corporation
- Fukumi Unokuchi
- G01 - MEASURING TESTING
Information Patent Grant
Circuit containing a transformer and corresponding method
- Patent number 11,841,394
- Issue date Dec 12, 2023
- Infineon Technologies AG
- Marcus Nuebling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and inspection method for s...
- Patent number 11,808,807
- Issue date Nov 7, 2023
- Hitachi Astemo, Ltd.
- Akeo Satoh
- G01 - MEASURING TESTING
Information Patent Grant
Heterogenous voltage-based testing via on-chip voltage regulator ci...
- Patent number 11,808,805
- Issue date Nov 7, 2023
- NVIDIA Corporation
- Francisco Da Silva
- G01 - MEASURING TESTING
Information Patent Grant
Real-time, in-situ reliability monitoring in an integrated circuit
- Patent number 11,774,490
- Issue date Oct 3, 2023
- MARVELL ASIA PTE. LTD.
- Runzi Chang
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method
- Patent number 11,768,235
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for wafer-level testing
- Patent number 11,754,621
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Touch safe DC powering for remote loads
- Patent number 11,733,285
- Issue date Aug 22, 2023
- Alpha Technologies Ltd.
- Rifat Siddique
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Exposure monitor device
- Patent number 11,686,763
- Issue date Jun 27, 2023
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Contact and socket device for burning-in and testing semiconductor IC
- Patent number 11,668,744
- Issue date Jun 6, 2023
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force deflection and resistance testing system and method of use
- Patent number 11,668,731
- Issue date Jun 6, 2023
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for early lifetime failure detection system
- Patent number 11,662,376
- Issue date May 30, 2023
- Intel Corporation
- Ketul B. Sutaria
- G01 - MEASURING TESTING
Information Patent Grant
High current device testing apparatus and systems
- Patent number 11,656,273
- Issue date May 23, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ANALYSIS
- Publication number 20240426901
- Publication date Dec 26, 2024
- The Regents of the University of Michigan
- Al-Thaddeus Avestruz
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE FAULT DETECTION IN WELL SYSTEM USING SPREAD SPECTRUM TIME...
- Publication number 20240401473
- Publication date Dec 5, 2024
- Halliburton Energy Services, Inc.
- Jonathon N. Joubran
- E21 - EARTH DRILLING MINING
Information Patent Application
LIFETIME INDICATOR SYSTEM
- Publication number 20240377453
- Publication date Nov 14, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20240361382
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20240361380
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
FORCE/MEASURE CURRENT GAIN TRIMMING
- Publication number 20240337686
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Tanmay Neema
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT
- Publication number 20240337694
- Publication date Oct 10, 2024
- MONTAGE TECHNOLOGY CO., LTD.
- Dongming LOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
- Publication number 20240310434
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION...
- Publication number 20240280631
- Publication date Aug 22, 2024
- Mitsubishi Electric Corporation
- Yusuke YAMAKAJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC POWER MEASUREMENT CIRCUIT
- Publication number 20240255568
- Publication date Aug 1, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Kazuhito TANAKA
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME
- Publication number 20240255569
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiang-Hui CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFE...
- Publication number 20240210466
- Publication date Jun 27, 2024
- Intel Corporation
- Andres MALDONADO
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING A CORRELATION BETWEEN POWER DISTURBANCES AND DATA ERORS...
- Publication number 20240192272
- Publication date Jun 13, 2024
- Teradyne, Inc.
- Christopher C. JONES
- G01 - MEASURING TESTING
Information Patent Application
SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20240175922
- Publication date May 30, 2024
- Rohm Co., Ltd.
- Ryosuke SUMII
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...
- Publication number 20240159822
- Publication date May 16, 2024
- Global Unichip Corporation
- Ting-Hao WANG
- G01 - MEASURING TESTING
Information Patent Application
PEAK POWER PACKAGE TRACKING
- Publication number 20240142515
- Publication date May 2, 2024
- ADVANCED MICRO DEVICES, INC.
- Amanullah Samit
- G01 - MEASURING TESTING
Information Patent Application
RUBBER SOCKET WITH BUILT-IN COMPONENT
- Publication number 20240125845
- Publication date Apr 18, 2024
- TSE CO., LTD
- Seon A. KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR RELIABILITY DETECTION AND POWER MANAGEMENT
- Publication number 20240090800
- Publication date Mar 21, 2024
- STMicroelectronics S.r.l.
- Stefano Paolo RIVOLTA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...
- Publication number 20240077530
- Publication date Mar 7, 2024
- KIOXIA Corporation
- Tetsuharu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
125V SWITCH GLITCH MITIGATION
- Publication number 20240036114
- Publication date Feb 1, 2024
- Analog Devices International Unlimited Company
- David Aherne
- G01 - MEASURING TESTING
Information Patent Application
STRESS TESTING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE
- Publication number 20230384366
- Publication date Nov 30, 2023
- WINBOND ELECTRONICS CORP.
- Nobuhiro ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20230375614
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung HSIEH
- G01 - MEASURING TESTING
Information Patent Application
REDUCING DIGITAL TEMPERATURE SENSOR ERROR WITH MACHINE LEARNING
- Publication number 20230366923
- Publication date Nov 16, 2023
- Intel Corporation
- Sarah Shahraini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXPOSURE MONITOR DEVICE
- Publication number 20230366924
- Publication date Nov 16, 2023
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20230366925
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING
- Publication number 20230349972
- Publication date Nov 2, 2023
- KEYUR PAYAK
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM, METHOD OF TESTING DISPLAY CELL USING THE SAME, AND DIS...
- Publication number 20230316966
- Publication date Oct 5, 2023
- SAMSUNG DISPLAY CO., LTD.
- Go Eun CHA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST SYSTEM SUPPORT COMPONENT EXCHANGE SYSTEM AND METHOD
- Publication number 20230314499
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20230273239
- Publication date Aug 31, 2023
- KIOXIA Corporation
- Hideaki MURAKAMI
- G01 - MEASURING TESTING

related to electrical aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Testing method and testing system

Systems and methods for fault detection and reporting through seria...

Secure testing mode

Electrical device

Heat spreaders for use in semiconductor device testing, such as bur...

Method and device for wafer-level testing

Method and system for wafer-level testing

Semiconductor module including semiconductor package and semiconduc...

Test circuit and method

Exposure monitor device

Semiconductor device

Test method

Voltage tracking circuit and method of operating the same

Semiconductor module including semiconductor package and semiconduc...

Determining charge pump efficiency using clock edge counting

Testing machine and testing method

Diagnosing multicycle transition faults and/or defects with AT-spee...

Method of manufacturing semiconductor device

Circuit containing a transformer and corresponding method

Semiconductor integrated circuit device and inspection method for s...

Heterogenous voltage-based testing via on-chip voltage regulator ci...

Real-time, in-situ reliability monitoring in an integrated circuit

Test circuit and method

Method and device for wafer-level testing

Touch safe DC powering for remote loads

Exposure monitor device

Contact and socket device for burning-in and testing semiconductor IC

Force deflection and resistance testing system and method of use

Apparatus and method for early lifetime failure detection system

High current device testing apparatus and systems

Patents Applicationslast 30 patents

TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...

TEMPERATURE ANALYSIS

DOWNHOLE FAULT DETECTION IN WELL SYSTEM USING SPREAD SPECTRUM TIME...

LIFETIME INDICATOR SYSTEM

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

FORCE/MEASURE CURRENT GAIN TRIMMING

TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT

METHOD AND SYSTEM FOR WAFER-LEVEL TESTING

IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION...

ELECTRIC POWER MEASUREMENT CIRCUIT

VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME

ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFE...

DETERMINING A CORRELATION BETWEEN POWER DISTURBANCES AND DATA ERORS...

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...

PEAK POWER PACKAGE TRACKING

RUBBER SOCKET WITH BUILT-IN COMPONENT

SENSOR RELIABILITY DETECTION AND POWER MANAGEMENT

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...

125V SWITCH GLITCH MITIGATION

STRESS TESTING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE

TEST CIRCUIT AND METHOD

REDUCING DIGITAL TEMPERATURE SENSOR ERROR WITH MACHINE LEARNING

EXPOSURE MONITOR DEVICE

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING

TEST SYSTEM, METHOD OF TESTING DISPLAY CELL USING THE SAME, AND DIS...

TEST SYSTEM SUPPORT COMPONENT EXCHANGE SYSTEM AND METHOD

TEST BOARD AND METHOD FOR TESTING SEMICONDUCTOR DEVICE