related to environmental aspects other than temperature

Industry

CPC
G01R31/2881

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Chip testing method and apparatus, and electronic equipment
- Patent number 12,044,724
- Issue date Jul 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hang Gao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 12,025,656
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an X and Y location of a surface particle
- Patent number 11,959,961
- Issue date Apr 16, 2024
- Orbotech Ltd.
- Robert Barnett
- B08 - CLEANING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 11,953,545
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe assembly and micro vacuum probe station comprising same
- Patent number 11,867,753
- Issue date Jan 9, 2024
- Nextron Corporation
- Hakbeom Moon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing an object within a dry gas environment
- Patent number 11,860,083
- Issue date Jan 2, 2024
- Samsung Electronics Co, Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test apparatus
- Patent number 11,614,350
- Issue date Mar 28, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing fluctuation induced by single particle ir...
- Patent number 11,525,857
- Issue date Dec 13, 2022
- Peking University
- Xia An
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting failure parameters of semiconductor devices subjected to...
- Patent number 11,493,548
- Issue date Nov 8, 2022
- UChicago Argonne, LLC
- Moinuddin Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Signal transmission system
- Patent number 11,391,772
- Issue date Jul 19, 2022
- GESELLSCHAFT FÜR GERÄTEBAU MBH
- Hans-Jörg Hübner
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a circuit which is optimized for protection ag...
- Patent number 11,378,616
- Issue date Jul 5, 2022
- Safran Electronics & Defense
- Cédric Autie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing the hermetic seal of a package
- Patent number 11,353,503
- Issue date Jun 7, 2022
- STMicroelectronics S.r.l.
- Paolo Aranzulla
- G01 - MEASURING TESTING
Information Patent Grant
Device and system for testing magnetic devices
- Patent number 11,162,999
- Issue date Nov 2, 2021
- Melexis Technologies SA
- Olivier Dubrulle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
State detecting system and state detecting method
- Patent number 11,156,650
- Issue date Oct 26, 2021
- Hitachi, Ltd.
- Ryohei Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 10,908,209
- Issue date Feb 2, 2021
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic capacitance measuring device
- Patent number 10,837,991
- Issue date Nov 17, 2020
- Tokyo Electron Limited
- Kippei Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 10,823,778
- Issue date Nov 3, 2020
- Tokyo Electron Limited
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method for inspecting influence of installation environm...
- Patent number 10,643,909
- Issue date May 5, 2020
- Disco Corporation
- Hiroyuki Yoshihara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Anechoic chamber for testing a device under test
- Patent number 10,605,857
- Issue date Mar 31, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Herbrig
- G01 - MEASURING TESTING
Information Patent Grant
Portable device for soft errors testing
- Patent number 10,578,669
- Issue date Mar 3, 2020
- Deny Hanan
- G01 - MEASURING TESTING
Information Patent Grant
Dew resistant module for test socket and electronic component testi...
- Patent number 10,520,528
- Issue date Dec 31, 2019
- CHROMA ATE INC.
- Xin-Yi Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing air tightness
- Patent number 10,508,969
- Issue date Dec 17, 2019
- CHROMA ATE INC.
- Po-Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component carrying device and electronic component inspe...
- Patent number 10,451,673
- Issue date Oct 22, 2019
- Seiko Epson Corporation
- Daisuke Kirihara
- G01 - MEASURING TESTING
Information Patent Grant
Soft error rate calculation device and calculation method for semic...
- Patent number 10,401,424
- Issue date Sep 3, 2019
- Hitachi, Ltd.
- Takumi Uezono
- G01 - MEASURING TESTING
Information Patent Grant
Circuits, methods, and computer programs to detect mechanical stres...
- Patent number 10,352,812
- Issue date Jul 16, 2019
- Infineon Technologies AG
- Dirk Hammerschmidt
- G01 - MEASURING TESTING
Information Patent Grant
Lifting system, method for electrical testing, vibration damper, an...
- Patent number 10,355,622
- Issue date Jul 16, 2019
- Siemens Aktiengesellschaft
- Georg Bachmaier
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing wafers
- Patent number 10,295,591
- Issue date May 21, 2019
- Texas Instruments Incorporated
- Takeki Andoh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...
- Publication number 20250012855
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20240345156
- Publication date Oct 17, 2024
- Mitsubishi Electric Corporation
- Takuya YOSHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240219455
- Publication date Jul 4, 2024
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC EQUIPMENT
- Publication number 20240183899
- Publication date Jun 6, 2024
- Total Quality Systems
- Bryan Steadman
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD AND ABNORMAL SOUND DETECTION SYSTEM
- Publication number 20240151768
- Publication date May 9, 2024
- GLOBALWAFERS CO., LTD.
- Yue-Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN X AND Y LOCATION OF A SURFACE PARTICLE
- Publication number 20230324454
- Publication date Oct 12, 2023
- ORBOTECH LTD.
- Robert Barnett
- B08 - CLEANING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD
- Publication number 20220381818
- Publication date Dec 1, 2022
- SEMES CO., LTD.
- Hyuk Ju LEE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR ACOUSTICALLY TESTING MEMS DEVICES
- Publication number 20220365131
- Publication date Nov 17, 2022
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Tobias FRITSCH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20220349935
- Publication date Nov 3, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING FLUCTUATION INDUCED BY SINGLE PARTICLE IR...
- Publication number 20220276299
- Publication date Sep 1, 2022
- Peking University
- Xia AN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP TESTING METHOD AND APPARATUS, AND ELECTRONIC EQUIPMENT
- Publication number 20220236322
- Publication date Jul 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Hang Gao
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND MICRO VACUUM PROBE STATION COMPRISING SAME
- Publication number 20220137123
- Publication date May 5, 2022
- NEXTRON CORPORATION
- Hakbeom MOON
- G01 - MEASURING TESTING
Information Patent Application
Predicting Failure Parameters of Semiconductor Devices Subjected to...
- Publication number 20220065919
- Publication date Mar 3, 2022
- UChicago Argonne, LLC
- Moinuddin Ahmed
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A CIRCUIT WHICH IS OPTIMIZED FOR PROTECTION AG...
- Publication number 20210247441
- Publication date Aug 12, 2021
- Safran Electronics & Defence
- Cédric AUTIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT
- Publication number 20210175848
- Publication date Jun 10, 2021
- Miasolé Equipment Integration (Fujian) Co., Ltd.
- Shengtao MA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MODULE INCLUDING SEMICONDUCTOR PACKAGE AND SEMICONDUC...
- Publication number 20210080501
- Publication date Mar 18, 2021
- Samsung Electronics Co., Ltd.
- Seyoung WON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL TRANSMISSION SYSTEM
- Publication number 20210033664
- Publication date Feb 4, 2021
- Gesellschaft für Gerätebau mbH
- Hans-Jörg HÜBNER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND SYSTEM FOR TESTING MAGNETIC DEVICES
- Publication number 20200081057
- Publication date Mar 12, 2020
- Melexis Technologies SA
- Olivier DUBRULLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATE DETECTING SYSTEM AND STATE DETECTING METHOD
- Publication number 20200033390
- Publication date Jan 30, 2020
- Hitachi, Ltd
- Ryohei MATSUI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING THE HERMETIC SEAL OF A PACKAGE
- Publication number 20200003831
- Publication date Jan 2, 2020
- STMicroelectronics S.r.l.
- Paolo ARANZULLA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20190041454
- Publication date Feb 7, 2019
- TOKYO ELECTRON LIMITED
- Shuji AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE DEVICE FOR SOFT ERRORS TESTING
- Publication number 20190011495
- Publication date Jan 10, 2019
- Deny HANAN
- G01 - MEASURING TESTING
Information Patent Application
ANECHOIC CHAMBER FOR TESTING A DEVICE UNDER TEST
- Publication number 20180340975
- Publication date Nov 29, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus HERBRIG
- G01 - MEASURING TESTING
Information Patent Application
SOFT ERROR RATE CALCULATION DEVICE AND CALCULATION METHOD FOR SEMIC...
- Publication number 20180149695
- Publication date May 31, 2018
- Hitachi, Ltd
- Takumi UEZONO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MODULE INCLUDING SEMICONDUCTOR PACKAGE AND SEMICONDUC...
- Publication number 20180088173
- Publication date Mar 29, 2018
- Samsung Electronics Co., Ltd.
- Seyoung WON
- G01 - MEASURING TESTING

related to environmental aspects other than temperature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chip testing method and apparatus, and electronic equipment

Semiconductor module including semiconductor package and semiconduc...

Method of determining an X and Y location of a surface particle

Semiconductor module including semiconductor package and semiconduc...

Probe assembly and micro vacuum probe station comprising same

Apparatus and method of testing an object within a dry gas environment

Integrated circuit margin measurement and failure prediction device

Sensor test apparatus

Method for characterizing fluctuation induced by single particle ir...

Predicting failure parameters of semiconductor devices subjected to...

Testing system

Signal transmission system

Integrated circuit margin measurement and failure prediction device

Method for producing a circuit which is optimized for protection ag...

Method for testing the hermetic seal of a package

Device and system for testing magnetic devices

State detecting system and state detecting method

Semiconductor module including semiconductor package and semiconduc...

Electrostatic capacitance measuring device

Inspection system

Inspecting method for inspecting influence of installation environm...

Anechoic chamber for testing a device under test

Portable device for soft errors testing

Dew resistant module for test socket and electronic component testi...

Method and device for testing air tightness

Electronic component carrying device and electronic component inspe...

Soft error rate calculation device and calculation method for semic...

Circuits, methods, and computer programs to detect mechanical stres...

Lifting system, method for electrical testing, vibration damper, an...

Method and device for testing wafers

Patents Applicationslast 30 patents

SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...

WAFER TEST SYSTEM AND METHODS

TEST APPARATUS FOR SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...

ELECTRONICS TESTER

TESTING OF ELECTRONIC EQUIPMENT

SIGNAL PROCESSING METHOD AND ABNORMAL SOUND DETECTION SYSTEM

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

METHOD OF DETERMINING AN X AND Y LOCATION OF A SURFACE PARTICLE

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD

METHODS AND APPARATUSES FOR ACOUSTICALLY TESTING MEMS DEVICES

INTEGRATED CIRCUIT PAD FAILURE DETECTION

METHOD FOR CHARACTERIZING FLUCTUATION INDUCED BY SINGLE PARTICLE IR...

CHIP TESTING METHOD AND APPARATUS, AND ELECTRONIC EQUIPMENT

PROBE ASSEMBLY AND MICRO VACUUM PROBE STATION COMPRISING SAME

Predicting Failure Parameters of Semiconductor Devices Subjected to...

TESTING SYSTEM

METHOD FOR PRODUCING A CIRCUIT WHICH IS OPTIMIZED FOR PROTECTION AG...

WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT

SEMICONDUCTOR MODULE INCLUDING SEMICONDUCTOR PACKAGE AND SEMICONDUC...

SIGNAL TRANSMISSION SYSTEM

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

DEVICE AND SYSTEM FOR TESTING MAGNETIC DEVICES

STATE DETECTING SYSTEM AND STATE DETECTING METHOD

METHOD FOR TESTING THE HERMETIC SEAL OF A PACKAGE

INSPECTION SYSTEM

PORTABLE DEVICE FOR SOFT ERRORS TESTING

ANECHOIC CHAMBER FOR TESTING A DEVICE UNDER TEST

SOFT ERROR RATE CALCULATION DEVICE AND CALCULATION METHOD FOR SEMIC...

SEMICONDUCTOR MODULE INCLUDING SEMICONDUCTOR PACKAGE AND SEMICONDUC...