Resonance

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G01Q60/52

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/52Resonance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning sensor having a spin defect
- Patent number 11,293,940
- Issue date Apr 5, 2022
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for magnetic resonance imaging
- Patent number 10,809,333
- Issue date Oct 20, 2020
- The University of Melbourne
- Roger John Ordidge
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 10,753,990
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance force detection apparatus and associated methods
- Patent number 10,746,824
- Issue date Aug 18, 2020
- Universiteit Leiden
- Arthur den Haan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for magnetic resonance imaging using slice select...
- Patent number 10,564,240
- Issue date Feb 18, 2020
- The University of Melbourne
- Roger John Ordidge
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for magnetic resonance imaging using nitrogen-vac...
- Patent number 9,702,900
- Issue date Jul 11, 2017
- President and Fellows of Harvard College
- Amir Yacoby
- G01 - MEASURING TESTING
Information Patent Grant
Probe for magnetic resonance force microscopy and method thereof
- Patent number 9,678,186
- Issue date Jun 13, 2017
- The United States of America as represented by the Secretary of the Army
- Dimitri Arthur Alexson
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field value measuring device and method for measuring magn...
- Patent number 9,482,692
- Issue date Nov 1, 2016
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Surface scanning radio frequency antenna for magnetic resonance for...
- Patent number 9,128,157
- Issue date Sep 8, 2015
- The United States of America as represented by the Secretary of the Army
- Doran Smith
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for mechanically robust thermal isolation of components
- Patent number 9,081,029
- Issue date Jul 14, 2015
- The United States of America as represented by the Secretary of the Army
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for performing magnetic resonance force microscopy on lar...
- Patent number 8,549,661
- Issue date Oct 1, 2013
- The United States of America as represented by the Secretary of the Army
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic resonance force detection apparatus and associated methods
- Patent number 8,164,333
- Issue date Apr 24, 2012
- International Business Machines Corporation
- Daniel Rugar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spin-torque probe microscope
- Patent number 8,069,492
- Issue date Nov 29, 2011
- Seagate Technology LLC
- Haiwen Xi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,752,899
- Issue date Jul 13, 2010
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,743,648
- Issue date Jun 29, 2010
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,615,739
- Issue date Nov 10, 2009
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,608,820
- Issue date Oct 27, 2009
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,462,270
- Issue date Dec 9, 2008
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance force microscope
- Patent number 7,400,144
- Issue date Jul 15, 2008
- Jeol Ltd.
- Shigenori Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,305,869
- Issue date Dec 11, 2007
- U.S. Department of Energy
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,214,303
- Issue date May 8, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high resolution nuclear magnetic resonance...
- Patent number 7,199,584
- Issue date Apr 3, 2007
- Research Foundation of the City University of New York
- Carlos Meriles
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube cantilever probes for nanoscale magnetic microscopy
- Patent number 6,887,365
- Issue date May 3, 2005
- Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-free magnetic resonance force microscope
- Patent number 6,836,112
- Issue date Dec 28, 2004
- Michael J. Hennessy
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance force microscope for the study of biological sys...
- Patent number 6,683,451
- Issue date Jan 27, 2004
- Wayne State University
- Gregory J. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance force microscopy with oscillator actuation
- Patent number 6,181,131
- Issue date Jan 30, 2001
- University of Washington
- Kelly Bruland
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,939,715
- Issue date Aug 17, 1999
- Jeol Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic resonance method and apparatus for detecting an atomic str...
- Patent number 5,619,139
- Issue date Apr 8, 1997
- Bruker Analytische Messtechnik GmbH
- Karoly Holczer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mechanical detection and imaging of magnetic resonance by magnetic...
- Patent number 5,266,896
- Issue date Nov 30, 1993
- International Business Machines Corporation
- Daniel Rugar
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
Scanning Sensor Having a Spin Defect
- Publication number 20210140996
- Publication date May 13, 2021
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20200386832
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
A MAGNETIC RESONANCE FORCE DETECTION APPARATUS AND ASSOCIATED METHODS
- Publication number 20190072623
- Publication date Mar 7, 2019
- Universiteit Leiden
- Arthur den HAAN
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Magnetic Resonance Imaging Using Nitrogen-Vac...
- Publication number 20170038411
- Publication date Feb 9, 2017
- Amir Yacobi
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD VALUE MEASURING DEVICE AND METHOD FOR MEASURING MAGN...
- Publication number 20160109478
- Publication date Apr 21, 2016
- AKITA UNIVERSITY
- Hitoshi SAITO
- G01 - MEASURING TESTING
Information Patent Application
AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...
- Publication number 20140237690
- Publication date Aug 21, 2014
- Purdue Research Foundation
- Corey P. Neu
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR MECHANICALLY ROBUST THERMAL ISOLATION OF COMPONENTS
- Publication number 20130198913
- Publication date Aug 1, 2013
- U.S. Army Research Laboratory
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR PERFORMING MAGNETIC RESONANCE FORCE MICROSCOPY ON LAR...
- Publication number 20130198914
- Publication date Aug 1, 2013
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Application
SURFACE SCANNING RADIO FREQUENCY ANTENNA FOR MAGNETIC RESONANCE FOR...
- Publication number 20130193963
- Publication date Aug 1, 2013
- Doran Smith
- G01 - MEASURING TESTING
Information Patent Application
MECHANICAL OSCILLATOR
- Publication number 20120133448
- Publication date May 31, 2012
- John Francis Gregg
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MAGNETIC RESONANCE FORCE DETECTION APPARATUS AND ASSOCIATED METHODS
- Publication number 20100301854
- Publication date Dec 2, 2010
- Daniel Rugar
- G01 - MEASURING TESTING
Information Patent Application
SPIN-TORQUE PROBE MICROSCOPE
- Publication number 20090242764
- Publication date Oct 1, 2009
- Seagate Technology LLC
- Haiwen Xi
- G01 - MEASURING TESTING
Information Patent Application
SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE
- Publication number 20080173812
- Publication date Jul 24, 2008
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20070235340
- Publication date Oct 11, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Magnetic resonance force microscope
- Publication number 20070216412
- Publication date Sep 20, 2007
- JEOL Ltd.
- Shigenori Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for high resolution nuclear magnetic resonance...
- Publication number 20060273794
- Publication date Dec 7, 2006
- Carlos Meriles
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20050241375
- Publication date Nov 3, 2005
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Nanotube cantilever probes for nanoscale magnetic microscopy
- Publication number 20040113621
- Publication date Jun 17, 2004
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-free magnetic resonance force microscope
- Publication number 20040056657
- Publication date Mar 25, 2004
- Michael J. Hennessy
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for measuring magnetic field strength

Scanning sensor having a spin defect

Method and system for magnetic resonance imaging

Method and apparatus for measuring magnetic field strength

Magnetic resonance force detection apparatus and associated methods

Method and system for magnetic resonance imaging using slice select...

Method and system for magnetic resonance imaging using nitrogen-vac...

Probe for magnetic resonance force microscopy and method thereof

Magnetic field value measuring device and method for measuring magn...

Surface scanning radio frequency antenna for magnetic resonance for...

Apparatus for mechanically robust thermal isolation of components

Apparatus for performing magnetic resonance force microscopy on lar...

Magnetic resonance force detection apparatus and associated methods

Spin-torque probe microscope

Spin microscope based on optically detected magnetic resonance

Spin microscope based on optically detected magnetic resonance

Spin microscope based on optically detected magnetic resonance

Spin microscope based on optically detected magnetic resonance

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic resonance force microscope

Spin microscope based on optically detected magnetic resonance

Cantilever probes for nanoscale magnetic and atomic force microscopy

Method and apparatus for high resolution nuclear magnetic resonance...

Nanotube cantilever probes for nanoscale magnetic microscopy

Cantilever-free magnetic resonance force microscope

Magnetic resonance force microscope for the study of biological sys...

Magnetic resonance force microscopy with oscillator actuation

Scanning probe microscope

Magnetic resonance method and apparatus for detecting an atomic str...

Mechanical detection and imaging of magnetic resonance by magnetic...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

Scanning Sensor Having a Spin Defect

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

A MAGNETIC RESONANCE FORCE DETECTION APPARATUS AND ASSOCIATED METHODS

Method And System For Magnetic Resonance Imaging Using Nitrogen-Vac...

MAGNETIC FIELD VALUE MEASURING DEVICE AND METHOD FOR MEASURING MAGN...

AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...

APPARATUS FOR MECHANICALLY ROBUST THERMAL ISOLATION OF COMPONENTS

APPARATUS FOR PERFORMING MAGNETIC RESONANCE FORCE MICROSCOPY ON LAR...

SURFACE SCANNING RADIO FREQUENCY ANTENNA FOR MAGNETIC RESONANCE FOR...

MECHANICAL OSCILLATOR

MAGNETIC RESONANCE FORCE DETECTION APPARATUS AND ASSOCIATED METHODS

SPIN-TORQUE PROBE MICROSCOPE

SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic resonance force microscope

Method and apparatus for high resolution nuclear magnetic resonance...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Nanotube cantilever probes for nanoscale magnetic microscopy

Cantilever-free magnetic resonance force microscope