Claims
- 1. A cantilever-free magnetic resonance force microscope comprising:
a magnetically active particle at a first position for producing magnetic field gradient on a sample to be observed, said particle having mutually orthogonal X, Y, Z axes and being spaced away from said sample along said Z axis, said sample interacting with said field gradient to produce forces acting between said particle and sample; electromagnetic means creating magnetic fields for suspending said particle without mechanical support at said first position; detection means for outputting first detection signals corresponding in magnitude to magnitudes of displacement of said particle from said first position; processing means for receiving said first detection signals and converting said first detection signals to control signals, said control signals being input to said magnetic means for suspending said particle to modify said magnetic fields, said particle being returned toward said first position by said electromagnetic means; means for interacting with said samples to change said forces between said sample and said particle and thereby to cause instantaneous displacement of said particle along said Z axis, one said detection signal corresponding to Z-direction displacement of said particle indicating changes of said forces in said Z-direction.
- 2. A microscope as in claim 1, wherein said particle includes one of a permanent magnetic material and a superconductor.
- 3. A microscope as in claim 2, wherein said particle has a shape that is one of spherical, conical, rod-shaped, and needle-shaped.
- 4. A microscope as in claim 3, wherein said electromagnetic means provide positional control, levitation stability, and a potential well with a motional stiffness.
- 5. A microscope as in claim 4, wherein said particle includes a reflective surface, said detection means including electro-optics for tracking said displacement of said particle.
- 6. A microscope as in claim 5, wherein said means for interacting with said sample includes an RF field for exciting magnetic resonance, said electromagnetic means includes means for generating a static magnetic field for magnetic resonance and means including RF pulsed electronic circuits and synchronous detection for detecting magnetic resonance in said sample.
- 7. A microscope as in claim 1, wherein said electromagnetic means includes at least one of coils having current to generate magnetic fields and gradients, voltage activated electrodes generating electric fields and field gradients, passive magnetic and superconducting materials for shaping the fields whereby position, levitation and shape and stiffness of a potential well are electrically controlled.
- 8. A microscope as in claim 7, wherein said processing means uses said detection signals in active feedback to adjust voltages and currents to said coils and electrodes.
- 9. A microscope as in claim 4, wherein said electromagnetic means includes coils having currents to generate electromagnetic fields for positioning and releasing said permanent magnet in said potential well at said first position.
- 10. A microscope as in claim 4, wherein said electromagnetic means includes piezoelectric positioners for control of position of said permanent magnet prior to said releasing.
Parent Case Info
[0001] This application claims the benefit of the U.S. provisional patent application No. 60/373,178.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60373178 |
Apr 2002 |
US |