rocking curve analysis

Industry

CPC
G01N2223/331

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/331rocking curve analysis

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of crystallite size distribution in polycrystalline mat...
- Patent number 11,397,154
- Issue date Jul 26, 2022
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,079,345
- Issue date Aug 3, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inducing high-speed variable-tilt wobble m...
- Patent number 10,634,626
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Integrated reciprocal space mapping for simultaneous lattice parame...
- Patent number 9,864,075
- Issue date Jan 9, 2018
- Jonathan Giencke
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining surface orientation of single crystal wafer
- Patent number 9,678,023
- Issue date Jun 13, 2017
- Korea Research Institute of Standards and Science
- Chang Soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting backlash and slip
- Patent number 9,329,144
- Issue date May 3, 2016
- Korea Institute of Science and Technology
- Man-Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterization of a spherically bent crystal for Kα X-...
- Patent number 9,001,968
- Issue date Apr 7, 2015
- Lawrence Livermore National Security, LLC
- Nathan Kugland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20210063326
- Publication date Mar 4, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...
- Publication number 20200096459
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alp...
- Publication number 20130108022
- Publication date May 2, 2013
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Nathan Kugland
- G01 - MEASURING TESTING

rocking curve analysis

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

Apparatus for inspecting semiconductor device and method for inspec...

Measurement of crystallite size distribution in polycrystalline mat...

X-ray inspection device

Apparatus and method for inducing high-speed variable-tilt wobble m...

Integrated reciprocal space mapping for simultaneous lattice parame...

Method of determining surface orientation of single crystal wafer

Apparatus and method for detecting backlash and slip

Method for characterization of a spherically bent crystal for Kα X-...

Patents Applicationslast 30 patents

X-RAY INSPECTION DEVICE

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...

METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alp...