Sample handling device or method

Industry

CPC
G01Q30/20

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/20Sample handling device or method

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying sample position in atomic forc...
- Patent number 11,761,981
- Issue date Sep 19, 2023
- Park Systems Corp.
- JeongHun An
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with a sample holder fed with electromagn...
- Patent number 11,674,976
- Issue date Jun 13, 2023
- ALCATERA INC.
- Marco Farina
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 11,668,729
- Issue date Jun 6, 2023
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Grant
Battery electrode analysis method
- Patent number 11,650,223
- Issue date May 16, 2023
- LG Energy Solution, Ltd.
- Byung Hee Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Holder system
- Patent number 11,635,446
- Issue date Apr 25, 2023
- Winbond Electronics Corp.
- Hsueh-Cheng Liao
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing a specimen for scanning capacitance microscopy
- Patent number 11,619,650
- Issue date Apr 4, 2023
- MSSCORPS CO., LTD.
- Chi-Lun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis device
- Patent number 11,499,989
- Issue date Nov 15, 2022
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Modular scanning probe microscope head
- Patent number 11,474,127
- Issue date Oct 18, 2022
- Rutgers, The State University of New Jersey
- Angela Coe
- G01 - MEASURING TESTING
Information Patent Grant
Multifunctional nanoprobes for scanning probe microscopy
- Patent number 11,454,648
- Issue date Sep 27, 2022
- GETEC MICROSCOPY GMBH
- Harald Plank
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wide-field scanning probe microscope combined with an apparatus for...
- Patent number 11,237,186
- Issue date Feb 1, 2022
- Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System”
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 11,162,975
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe nanotomograph comprising an optical analysis module
- Patent number 11,150,266
- Issue date Oct 19, 2021
- NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for chemical mapping by selective dissolution
- Patent number 11,143,581
- Issue date Oct 12, 2021
- University of Huddersfield
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for producing a moulding of surface properties
- Patent number 11,014,273
- Issue date May 25, 2021
- Technische Universität Darmstadt
- Lars-Oliver Heim
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Surface analyzer
- Patent number 10,996,238
- Issue date May 4, 2021
- Shimadzu Corporation
- Keita Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Sample container mounting member and sample container sealing method
- Patent number 10,830,791
- Issue date Nov 10, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for holding a sample for use with an atomic force mic...
- Patent number 10,823,756
- Issue date Nov 3, 2020
- Universitat Basel
- Marko Loparic
- G01 - MEASURING TESTING
Information Patent Grant
Biosensor for the detection of a biological target, and method for...
- Patent number 10,794,932
- Issue date Oct 6, 2020
- Her Majesty the Queen in Right of Canada, as Represented by The Minster of Na...
- Zhe She
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the shape of a sample tip for atom probe tom...
- Patent number 10,746,759
- Issue date Aug 18, 2020
- Imec VZW
- Kristof Paredis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for generating three-dimensional image of poly...
- Patent number 10,740,948
- Issue date Aug 11, 2020
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G01 - MEASURING TESTING
Information Patent Grant
Non-local scanning probes for scanning probe microscopy
- Patent number 10,739,378
- Issue date Aug 11, 2020
- The Trustees of Columbia University In the City of New York
- Daniel Vincent Esposito
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope combined with a device for acting on a pr...
- Patent number 10,690,698
- Issue date Jun 23, 2020
- Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System”
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Methods for stabilizing biological and soft materials for atom prob...
- Patent number 10,684,308
- Issue date Jun 16, 2020
- Gregory Hirsch
- G01 - MEASURING TESTING
Information Patent Grant
Micro-localisation method and device for an imaging instrument and...
- Patent number 10,565,428
- Issue date Feb 18, 2020
- HORIBA FRANCE SAS
- Olivier Acher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Peakforce photothermal-based detection of IR nanoabsorption
- Patent number 10,520,426
- Issue date Dec 31, 2019
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy system for mapping nanostructures on a su...
- Patent number 10,451,650
- Issue date Oct 22, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Stefan Kuiper
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head of scanning probe microscope
- Patent number 10,422,815
- Issue date Sep 24, 2019
- Institute of Physics, Chinese Academy of Sciences
- Qing Huan
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...
- Publication number 20240272197
- Publication date Aug 15, 2024
- Technische Universitat Wien
- Markus VALTINER
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Surface Analysis Device
- Publication number 20230296644
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Ritsuo FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...
- Publication number 20230110754
- Publication date Apr 13, 2023
- OSAKA UNIVERSITY
- Yasuhiro SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A SPECIMEN FOR SCANNING CAPACITANCE MICROSCOPY
- Publication number 20230098264
- Publication date Mar 30, 2023
- MSSCORPS CO., LTD.
- CHI-LUN LIU
- G01 - MEASURING TESTING
Information Patent Application
HOLDER SYSTEM
- Publication number 20220413006
- Publication date Dec 29, 2022
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
Atomic Force Microscope
- Publication number 20220236301
- Publication date Jul 28, 2022
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...
- Publication number 20220206039
- Publication date Jun 30, 2022
- Park Systems Corp.
- JeongHun AN
- G05 - CONTROLLING REGULATING
Information Patent Application
MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY
- Publication number 20220163560
- Publication date May 26, 2022
- GETec Microscopy GmbH
- Harald Plank
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGN...
- Publication number 20220074968
- Publication date Mar 10, 2022
- ALCATERA LLC
- Marco Farina
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ANALYSIS DEVICE
- Publication number 20210349125
- Publication date Nov 11, 2021
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20210349127
- Publication date Nov 11, 2021
- Rutgers, The State University of New Jersey
- Angela Coe
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
- Publication number 20210302466
- Publication date Sep 30, 2021
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Battery Electrode Analysis Method
- Publication number 20210231704
- Publication date Jul 29, 2021
- LG CHEM, LTD.
- Byung Hee Choi
- G01 - MEASURING TESTING
Information Patent Application
Surface Analyzer
- Publication number 20200319229
- Publication date Oct 8, 2020
- Shimadzu Corporation
- Keita FUJINO
- G01 - MEASURING TESTING
Information Patent Application
Biosensor for the Detection of a Biological Target, and Method for...
- Publication number 20200225262
- Publication date Jul 16, 2020
- THE GOVERNING COUNCIL OF THE UNIVERSITY OF TORONTO
- Zhe She
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Chemical Mapping by Selective Dissolution
- Publication number 20190368992
- Publication date Dec 5, 2019
- University of Huddersfield
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD
- Publication number 20190353680
- Publication date Nov 21, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
NON-LOCAL SCANNING PROBES FOR SCANNING PROBE MICROSCOPY
- Publication number 20190324055
- Publication date Oct 24, 2019
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Daniel Vincent Esposito
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...
- Publication number 20190317125
- Publication date Oct 17, 2019
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Fulong Ning
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...
- Publication number 20190277881
- Publication date Sep 12, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
WIDE-FIELD SCANNING PROBE MICROSCOPE COMBINED WITH AN APPARATUS FOR...
- Publication number 20190219610
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE
- Publication number 20190219608
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PR...
- Publication number 20190219609
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
MICRO-LOCALISATION METHOD AND DEVICE FOR AN IMAGING INSTRUMENT AND...
- Publication number 20190122026
- Publication date Apr 25, 2019
- HORIBA FRANCE SAS
- Olivier ACHER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING HEAD OF SCANNING PROBE MICROSCOPE
- Publication number 20190056429
- Publication date Feb 21, 2019
- INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
- Qing Huan
- G01 - MEASURING TESTING
Information Patent Application
Frequency Comb Feedback Control for Scanning Probe Microscopy
- Publication number 20180364278
- Publication date Dec 20, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM FOR MAPPING NANOSTRUCTURES ON A SU...
- Publication number 20180203038
- Publication date Jul 19, 2018
- Nederlandse Organisatie voor toegepast-natuuwetenschappelijk onderzoek TNO
- Stefan Kuiper
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR PRODUCING A MOULDING OF SURFACE PROPERTIES
- Publication number 20180169911
- Publication date Jun 21, 2018
- TECHNISCHE UNIVERSITAT DARMSTADT
- Lars-Oliver Heim
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Sample handling device or method

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nano robotic system for high throughput single cell DNA sequencing

Vibration component measurement device, Kelvin probe force microsco...

Method and apparatus for identifying sample position in atomic forc...

Scanning probe microscope with a sample holder fed with electromagn...

Atomic force microscope

Battery electrode analysis method

Holder system

Method of preparing a specimen for scanning capacitance microscopy

Surface analysis device

Modular scanning probe microscope head

Multifunctional nanoprobes for scanning probe microscopy

Wide-field scanning probe microscope combined with an apparatus for...

Surface analyzer

Scanning probe nanotomograph comprising an optical analysis module

Method and apparatus for chemical mapping by selective dissolution

Device and method for producing a moulding of surface properties

Surface analyzer

Sample container mounting member and sample container sealing method

Sample holder for holding a sample for use with an atomic force mic...

Biosensor for the detection of a biological target, and method for...

Method for determining the shape of a sample tip for atom probe tom...

Apparatus and method for generating three-dimensional image of poly...

Non-local scanning probes for scanning probe microscopy

Scanning probe microscope combined with a device for acting on a pr...

Methods for stabilizing biological and soft materials for atom prob...

Micro-localisation method and device for an imaging instrument and...

Peakforce photothermal-based detection of IR nanoabsorption

Scanning probe microscopy system for mapping nanostructures on a su...

Scanning head of scanning probe microscope

Modular atomic force microscope with environmental controls

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

Surface Analysis Device

VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...

METHOD OF PREPARING A SPECIMEN FOR SCANNING CAPACITANCE MICROSCOPY

HOLDER SYSTEM

Atomic Force Microscope

METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...

MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY

SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGN...

SURFACE ANALYSIS DEVICE

MODULAR SCANNING PROBE MICROSCOPE HEAD

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

Battery Electrode Analysis Method

Surface Analyzer

Biosensor for the Detection of a Biological Target, and Method for...

Method and Apparatus for Chemical Mapping by Selective Dissolution

SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD

NON-LOCAL SCANNING PROBES FOR SCANNING PROBE MICROSCOPY

MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...

METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...

WIDE-FIELD SCANNING PROBE MICROSCOPE COMBINED WITH AN APPARATUS FOR...

SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE

SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PR...

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

MICRO-LOCALISATION METHOD AND DEVICE FOR AN IMAGING INSTRUMENT AND...

SCANNING HEAD OF SCANNING PROBE MICROSCOPE

Frequency Comb Feedback Control for Scanning Probe Microscopy

SCANNING PROBE MICROSCOPY SYSTEM FOR MAPPING NANOSTRUCTURES ON A SU...

DEVICE AND METHOD FOR PRODUCING A MOULDING OF SURFACE PROPERTIES