Sample holders for photometry

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G01J1/0223

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

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G01J1/0223Sample holders for photometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzing apparatus and jig
- Patent number 11,971,295
- Issue date Apr 30, 2024
- Canon Medical Systems Corporation
- Shin Iida
- G01 - MEASURING TESTING
Information Patent Grant
Handheld luminometer and front end platform assembly
- Patent number 11,933,665
- Issue date Mar 19, 2024
- Charm Sciences, Inc.
- Paul E Graham
- G01 - MEASURING TESTING
Information Patent Grant
Chip chuck for supporting light emitting chip under optical inspect...
- Patent number 11,781,904
- Issue date Oct 10, 2023
- MPI Corporation
- Hung-I Lin
- G01 - MEASURING TESTING
Information Patent Grant
Vapor cells for imaging of electromagnetic fields
- Patent number 11,112,298
- Issue date Sep 7, 2021
- Quantum Valley Ideas Laboratories
- Hadi Amarloo
- G01 - MEASURING TESTING
Information Patent Grant
Light detection system and method of using same
- Patent number 11,022,564
- Issue date Jun 1, 2021
- 3M Innovative Properties Company
- Thomas J. Brace
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus including a reaction container holding...
- Patent number 10,753,870
- Issue date Aug 25, 2020
- HITACHI HIGH-TECH CORPORATION
- Yuya Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Light detection system and method of using same
- Patent number 10,613,038
- Issue date Apr 7, 2020
- 3M Innovative Properties Company
- Thomas J. Brace
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Optical pathology systems and methods
- Patent number 10,605,736
- Issue date Mar 31, 2020
- The General Hospital Corporation
- Rahul Sheth
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for measuring illumination characteristics of...
- Patent number 10,584,997
- Issue date Mar 10, 2020
- Verizon Patent and Licensing Inc.
- Chris Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition device for optical compensation
- Patent number 10,508,949
- Issue date Dec 17, 2019
- BOE Technology Group Co., Ltd.
- Dongxu Han
- G01 - MEASURING TESTING
Information Patent Grant
Detecting device for light-emitting property of light source
- Patent number 10,274,761
- Issue date Apr 30, 2019
- BOE Technology Group Co., Ltd.
- Jinku Lv
- G02 - OPTICS
Information Patent Grant
Terahertz wave measuring device, measuring method, and measuring rig
- Patent number 9,784,610
- Issue date Oct 10, 2017
- ARKRAY, Inc.
- Hirohisa Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring illumination characteristics of...
- Patent number 9,746,370
- Issue date Aug 29, 2017
- Sensity Systems Inc.
- Chris Barnard
- G01 - MEASURING TESTING
Information Patent Grant
In store display calibration system
- Patent number 9,702,741
- Issue date Jul 11, 2017
- Apple Inc.
- Jeremiah Mosenge Nyaribo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photometric device and method
- Patent number 9,594,016
- Issue date Mar 14, 2017
- Biosurfit, S.A.
- Joao Manuel De Oliveria Garcia Da Fonseca
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus
- Patent number 9,500,520
- Issue date Nov 22, 2016
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Tomographic scanning apparatus
- Patent number 9,200,948
- Issue date Dec 1, 2015
- Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan
- Meei-Ling Jan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Light source support apparatus and optical radiation characteristic...
- Patent number 9,127,832
- Issue date Sep 8, 2015
- Otsuka Electronics Co., Ltd.
- Hisashi Shiraiwa
- F21 - LIGHTING
Information Patent Grant
Photodetector and jig for sample holder
- Patent number 8,324,561
- Issue date Dec 4, 2012
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring total luminous flux
- Patent number 8,305,576
- Issue date Nov 6, 2012
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing light-emitting devices
- Patent number 7,804,589
- Issue date Sep 28, 2010
- Chroma Ate Inc.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal module brightness measurement apparatus and brightne...
- Patent number 7,426,022
- Issue date Sep 16, 2008
- Funai Electric Co., Ltd.
- Masaharu Oka
- G01 - MEASURING TESTING
Information Patent Grant
Quick attachment fixture and power card for diode-based light devices
- Patent number 7,030,642
- Issue date Apr 18, 2006
- Honeywell International Inc.
- Steve M. Butsch
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for UV measurement
- Patent number 6,815,686
- Issue date Nov 9, 2004
- Riverbend Instruments, Inc.
- Stanley D. Echols
- G01 - MEASURING TESTING
Information Patent Grant
Highly sensitive electronic device for measuring extremely faint li...
- Patent number 5,371,350
- Issue date Dec 6, 1994
- Guido Motolese
- G01 - MEASURING TESTING
Information Patent Grant
Integrating sphere power meter
- Patent number 5,251,004
- Issue date Oct 5, 1993
- PDT Systems, Inc.
- Daniel R. Doiron
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPACE-BASED IMAGING DEVICE AND METHOD OF MANUFACTURE THEREOF
- Publication number 20240010365
- Publication date Jan 11, 2024
- The Johns Hopkins University
- David B. Shrekenhamer
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
DEVICE FOR DETECTING AND ANALYTE IN SAMPLE
- Publication number 20230194336
- Publication date Jun 22, 2023
- SUGENTECH, INC.
- Minwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
CHIP CHUCK AND CHIP SUPPORTING DEVICE FOR OPTICAL INSPECTION
- Publication number 20220170781
- Publication date Jun 2, 2022
- MPI Corporation
- HUNG-I LIN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZING APPARATUS AND JIG
- Publication number 20220099482
- Publication date Mar 31, 2022
- Canon Medical Systems Corporation
- Shin IIDA
- G01 - MEASURING TESTING
Information Patent Application
Vapor Cells for Imaging of Electromagnetic Fields
- Publication number 20210156735
- Publication date May 27, 2021
- Quantum Valley Ideas Laboratories
- Hadi Amarloo
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DETECTION SYSTEM AND METHOD OF USING SAME
- Publication number 20200191727
- Publication date Jun 18, 2020
- 3M Innovative Properties Company
- Thomas J. Brace
- G01 - MEASURING TESTING
Information Patent Application
DATA ACQUISITION DEVICE FOR OPTICAL COMPENSATION
- Publication number 20180031419
- Publication date Feb 1, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Dongxu HAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ILLUMINATION CHARACTERISTICS OF...
- Publication number 20170336253
- Publication date Nov 23, 2017
- Sensity Systems Inc.
- Chris Barnard
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMISSION TESTING DEVICE WITH A SHUTTER
- Publication number 20160327429
- Publication date Nov 10, 2016
- Ismeca Semiconductor Holding SA
- Sylvain VIENOT
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Wave Measuring Device, Measuring Method, and Measuring Rig
- Publication number 20160169735
- Publication date Jun 16, 2016
- ARKRAY, Inc.
- Hirohisa Uchida
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PATHOLOGY SYSTEMS AND METHODS
- Publication number 20160033414
- Publication date Feb 4, 2016
- The General Hospital Corporation
- Rahul Sheth
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHIC SCANNING APPARATUS
- Publication number 20150115143
- Publication date Apr 30, 2015
- MEEI-LING JAN
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMETRIC DEVICE AND METHOD
- Publication number 20150085275
- Publication date Mar 26, 2015
- BIOSURFIT, S.A.
- Joäo Manuel De Oliveira Garcia Da Fonseca
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF ACETONE VIA NANOSTRUCTURE SENSORS
- Publication number 20150073290
- Publication date Mar 12, 2015
- University of Pittsburgh of the Commonwealth System of Higher Education
- Alexander Star
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP
- Publication number 20140159733
- Publication date Jun 12, 2014
- GENESIS PHOTONICS INC.
- TAI-CHENG TSAI
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT FOR MEASURING LED LIGHT SOURCE
- Publication number 20130307549
- Publication date Nov 21, 2013
- FOXCONN TECHNOLOGY CO., LTD.
- TAY-JIAN LIU
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE SUPPORT APPARATUS AND OPTICAL RADIATION CHARACTERISTIC...
- Publication number 20130214120
- Publication date Aug 22, 2013
- Otsuka Electronics Co., Ltd.
- Hisashi SHIRAIWA
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR TESTING LIGHT EMITTING DIODE LAMP
- Publication number 20110231130
- Publication date Sep 22, 2011
- LG Innotek Co., Ltd.
- Sungho Hong
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX
- Publication number 20100296082
- Publication date Nov 25, 2010
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR AND JIG FOR SAMPLE HOLDER
- Publication number 20100108869
- Publication date May 6, 2010
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES
- Publication number 20090309606
- Publication date Dec 17, 2009
- CHROMA ATE INC.
- I-SHIH TSENG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING REFLECTIVITY OF LENS
- Publication number 20080165349
- Publication date Jul 10, 2008
- HON HAI Precision Industry CO., LTD.
- KUAN-TE HUANG
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Characterizing a Light Source
- Publication number 20080062413
- Publication date Mar 13, 2008
- Ian Ashdown
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analysing Visual Properties of a Surface
- Publication number 20070273885
- Publication date Nov 29, 2007
- Akzo Nobel Coatings International B.V.
- Swie Lan Njo
- G01 - MEASURING TESTING
Information Patent Application
Liquid crystal module brightness measurement apparatus and brightne...
- Publication number 20070132986
- Publication date Jun 14, 2007
- Funai Electric Co., Ltd.
- Masaharu Oka
- G02 - OPTICS
Information Patent Application
Quick attachment fixture and power card for diode-based light devices
- Publication number 20050174808
- Publication date Aug 11, 2005
- Steve M. Butsch
- G01 - MEASURING TESTING

Sample holders for photometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automatic analyzing apparatus and jig

Handheld luminometer and front end platform assembly

Chip chuck for supporting light emitting chip under optical inspect...

Vapor cells for imaging of electromagnetic fields

Light detection system and method of using same

Automatic analysis apparatus including a reaction container holding...

Light detection system and method of using same

Optical pathology systems and methods

Method and apparatus for measuring illumination characteristics of...

Data acquisition device for optical compensation

Detecting device for light-emitting property of light source

Terahertz wave measuring device, measuring method, and measuring rig

Method and apparatus for measuring illumination characteristics of...

In store display calibration system

Photometric device and method

Optical measurement apparatus

Tomographic scanning apparatus

Light source support apparatus and optical radiation characteristic...

Photodetector and jig for sample holder

Apparatus and method for measuring total luminous flux

System and method for testing light-emitting devices

Liquid crystal module brightness measurement apparatus and brightne...

Quick attachment fixture and power card for diode-based light devices

Method and apparatus for UV measurement

Highly sensitive electronic device for measuring extremely faint li...

Integrating sphere power meter

Patents Applicationslast 30 patents

SPACE-BASED IMAGING DEVICE AND METHOD OF MANUFACTURE THEREOF

DEVICE FOR DETECTING AND ANALYTE IN SAMPLE

CHIP CHUCK AND CHIP SUPPORTING DEVICE FOR OPTICAL INSPECTION

AUTOMATIC ANALYZING APPARATUS AND JIG

Vapor Cells for Imaging of Electromagnetic Fields

LIGHT DETECTION SYSTEM AND METHOD OF USING SAME

DATA ACQUISITION DEVICE FOR OPTICAL COMPENSATION

METHOD AND APPARATUS FOR MEASURING ILLUMINATION CHARACTERISTICS OF...

LIGHT EMISSION TESTING DEVICE WITH A SHUTTER

Terahertz Wave Measuring Device, Measuring Method, and Measuring Rig

OPTICAL PATHOLOGY SYSTEMS AND METHODS

TOMOGRAPHIC SCANNING APPARATUS

PHOTOMETRIC DEVICE AND METHOD

DETECTION OF ACETONE VIA NANOSTRUCTURE SENSORS

DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP

INSTRUMENT FOR MEASURING LED LIGHT SOURCE

LIGHT SOURCE SUPPORT APPARATUS AND OPTICAL RADIATION CHARACTERISTIC...

TESTING APPARATUS AND METHOD FOR TESTING LIGHT EMITTING DIODE LAMP

APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX

PHOTODETECTOR AND JIG FOR SAMPLE HOLDER

SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES

APPARATUS FOR TESTING REFLECTIVITY OF LENS

Apparatus and Method for Characterizing a Light Source

Method and Device for Analysing Visual Properties of a Surface

Liquid crystal module brightness measurement apparatus and brightne...

Quick attachment fixture and power card for diode-based light devices