Sample holders for pyrometry; Cleaning of sample

Industry

CPC
G01J5/0255

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

Current Industry

G01J5/0255Sample holders for pyrometry; Cleaning of sample

Industries

Patents Grantslast 30 patents

Information Patent Grant
Long-wave infrared detecting element, long-wave infrared detecting...
- Patent number 11,614,364
- Issue date Mar 28, 2023
- Samsung Electronics Co., Ltd.
- Dongkyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder and lock-in thermography system with such
- Patent number 10,690,607
- Issue date Jun 23, 2020
- NANOLOCKIN GMBH
- Christophe A. Monnier
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Integrated substrate temperature measurement on high temperature ce...
- Patent number 10,510,567
- Issue date Dec 17, 2019
- Applied Materials, Inc.
- Yizhen Zhang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of examining a substrate and corresponding device
- Patent number 10,488,354
- Issue date Nov 26, 2019
- Infineon Technologies AG
- Christoph Wolfgruber
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the thermal analysis of a sample and/or for t...
- Patent number 10,302,497
- Issue date May 28, 2019
- Netzsch-Gerätebau GmbH
- Martin Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Thermographic analysis of polymeric materials
- Patent number 10,078,063
- Issue date Sep 18, 2018
- Colormatrix Holdings, Inc.
- Phillip Brannon
- G01 - MEASURING TESTING
Information Patent Grant
Optical method for detecting displacements and strains at ultra-hig...
- Patent number 9,400,237
- Issue date Jul 26, 2016
- The United States of America as represented by the administrator of the Natio...
- Russell W. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Sensor arrangement for the measuring of parameters in melted material
- Patent number 9,366,578
- Issue date Jun 14, 2016
- Heraeus Electro-Nite International N.V.
- Jan Cuypers
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Devices and methods for infrared (IR) based quantitation of biomole...
- Patent number 9,018,584
- Issue date Apr 28, 2015
- EMD Millipore Corporation
- Elena Chernokalskaya
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement apparatus, method of measuring temperature...
- Patent number 9,002,674
- Issue date Apr 7, 2015
- Tokyo Electron Limited
- Masayuki Moroi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Immersion lance for analysis of melts and liquids
- Patent number 7,748,258
- Issue date Jul 6, 2010
- Heraeus Electro-Nite International N.V.
- Ralph Sattmann
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-intrusive thermal monitor
- Patent number 7,726,876
- Issue date Jun 1, 2010
- Entegris, Inc.
- Marc Laverdiere
- G01 - MEASURING TESTING
Information Patent Grant
System and method for enabling temperature measurement using a pyro...
- Patent number 7,473,032
- Issue date Jan 6, 2009
- Honeywell International Inc.
- Michael J. Worrell
- G01 - MEASURING TESTING
Information Patent Grant
Black body background for imaging
- Patent number 6,830,349
- Issue date Dec 14, 2004
- Institute for Technology Development
- Gavin H. Poole
- G01 - MEASURING TESTING
Information Patent Grant
Optical path improvement, focus length change compensation, and str...
- Patent number 6,695,886
- Issue date Feb 24, 2004
- Axcelis Technologies, Inc.
- Douglas Brown
- G01 - MEASURING TESTING
Information Patent Grant
Process and apparatus for contactless measurement of sample tempera...
- Patent number 4,988,211
- Issue date Jan 29, 1991
- The Dow Chemical Company
- Sharon J. Barnes
- G01 - MEASURING TESTING
Information Patent Grant
Measuring the surface temperature of a body
- Patent number 4,136,952
- Issue date Jan 30, 1979
- Centre de Recherches Metallurgiques-Centrum voor Research in de Metallurgie
- Bernard Mairy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring product surface temperature in a...
- Patent number 4,024,764
- Issue date May 24, 1977
- Bethlehem Steel Corporation
- Johnson Shipman
- B22 - CASTING POWDER METALLURGY

Patents Applicationslast 30 patents

Information Patent Application
Device For The Determination Of Temperature Parameters With Adjusta...
- Publication number 20230100308
- Publication date Mar 30, 2023
- Netzsch-Gerätebau GmbH
- Stefan Lauterbach
- G01 - MEASURING TESTING
Information Patent Application
LONG-WAVE INFRARED DETECTING ELEMENT, LONG-WAVE INFRARED DETECTING...
- Publication number 20220178754
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Dongkyun KIM
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SUBSTRATE TEMPERATURE MEASUREMENT ON HIGH TEMPERATURE CE...
- Publication number 20200118850
- Publication date Apr 16, 2020
- Applied Materials, Inc.
- Yizhen ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder and Lock-In Thermography System With Such
- Publication number 20190154602
- Publication date May 23, 2019
- ADOLPHE MERKLE INSTITUTE, UNIVERSITY OF FRIBOURG
- Christophe A. MONNIER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SEMICONDUCTOR CHIP INSPECTION DEVICE
- Publication number 20190114755
- Publication date Apr 18, 2019
- Samsung Electronics Co., Ltd.
- Seong Sil LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMOGRAPHIC ANALYSIS OF POLYMERIC MATERIALS
- Publication number 20170261451
- Publication date Sep 14, 2017
- Colormatrix Holdings, Inc.
- Phillip Brannon
- G01 - MEASURING TESTING
Information Patent Application
Method And Device For The Thermal Analysis Of A Sample And/Or For T...
- Publication number 20170176257
- Publication date Jun 22, 2017
- Netzsch-Gerätebau GmbH
- Martin Brunner
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT OF A TEMPERATURE OF AN OBJECT, AND ASSOCIATED M...
- Publication number 20160216157
- Publication date Jul 28, 2016
- Centre National de la Recherche Scientifique-CNRS
- Christophe PRADERE
- G01 - MEASURING TESTING
Information Patent Application
THERMAL TEST BENCH FOR THE RUB STRIP OF A PANTOGRAPH AND PROCESS FO...
- Publication number 20160131531
- Publication date May 12, 2016
- Societe Nationale Des Chemins De Fer Francais SNCF
- Gerard Blanvillain
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASUREMENT OF THE THERMAL PERFORMANCE OF...
- Publication number 20150226611
- Publication date Aug 13, 2015
- Matthew J. Busche
- G01 - MEASURING TESTING
Information Patent Application
Optical Method for Detecting Displacements and Strains at Ultra-Hig...
- Publication number 20140319355
- Publication date Oct 30, 2014
- Russell W. Smith
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ARRANGEMENT FOR THE MEASURING OF PARAMETERS IN MELTED MATERIAL
- Publication number 20130322489
- Publication date Dec 5, 2013
- Heraeus Electro-Nite International N.V.
- Jan Cuypers
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR INFRARED (IR) BASED QUANTITATION OF BIOMOLE...
- Publication number 20130062523
- Publication date Mar 14, 2013
- Millipore Corporation
- Elena Chernokalskaya
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT APPARATUS, METHOD OF MEASURING TEMPERATURE...
- Publication number 20120303313
- Publication date Nov 29, 2012
- TOKYO ELECTRON LIMITED
- Masayuki MOROI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SUBSTRATE COOL DOWN CONTROL
- Publication number 20100265988
- Publication date Oct 21, 2010
- Applied Materials, Inc.
- JACOB NEWMAN
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Non-Intrusive Thermal Monitor
- Publication number 20080225925
- Publication date Sep 18, 2008
- Entegris, Inc.
- Marc Laverdiere
- G01 - MEASURING TESTING
Information Patent Application
IMMERSION LANCE FOR ANALYSIS OF MELTS AND LIQUIDS
- Publication number 20080083269
- Publication date Apr 10, 2008
- Heraeus Electro-Nite International N.V.
- Ralph SATTMANN
- G01 - MEASURING TESTING
Information Patent Application
System and method for enabling temperature measurement using a pyro...
- Publication number 20080002756
- Publication date Jan 3, 2008
- Michael J. Worrell
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PATH IMPROVEMENT, FOCUS LENGTH CHANGE COMPENSATION, AND STR...
- Publication number 20040037347
- Publication date Feb 26, 2004
- Douglas Brown
- G01 - MEASURING TESTING
Information Patent Application
Black body background for imaging
- Publication number 20030214721
- Publication date Nov 20, 2003
- Institute for Technology Development
- Gavin H. Poole
- G01 - MEASURING TESTING

Sample holders for pyrometry; Cleaning of sample

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Long-wave infrared detecting element, long-wave infrared detecting...

Sample holder and lock-in thermography system with such

Integrated substrate temperature measurement on high temperature ce...

Method of examining a substrate and corresponding device

Method and device for the thermal analysis of a sample and/or for t...

Thermographic analysis of polymeric materials

Optical method for detecting displacements and strains at ultra-hig...

Sensor arrangement for the measuring of parameters in melted material

Devices and methods for infrared (IR) based quantitation of biomole...

Temperature measurement apparatus, method of measuring temperature...

Immersion lance for analysis of melts and liquids

System and method for non-intrusive thermal monitor

System and method for enabling temperature measurement using a pyro...

Black body background for imaging

Optical path improvement, focus length change compensation, and str...

Process and apparatus for contactless measurement of sample tempera...

Measuring the surface temperature of a body

Method and apparatus for measuring product surface temperature in a...

Patents Applicationslast 30 patents

Device For The Determination Of Temperature Parameters With Adjusta...

LONG-WAVE INFRARED DETECTING ELEMENT, LONG-WAVE INFRARED DETECTING...

INTEGRATED SUBSTRATE TEMPERATURE MEASUREMENT ON HIGH TEMPERATURE CE...

Sample Holder and Lock-In Thermography System With Such

SEMICONDUCTOR CHIP INSPECTION DEVICE

THERMOGRAPHIC ANALYSIS OF POLYMERIC MATERIALS

Method And Device For The Thermal Analysis Of A Sample And/Or For T...

OPTICAL MEASUREMENT OF A TEMPERATURE OF AN OBJECT, AND ASSOCIATED M...

THERMAL TEST BENCH FOR THE RUB STRIP OF A PANTOGRAPH AND PROCESS FO...

APPARATUS AND METHOD FOR MEASUREMENT OF THE THERMAL PERFORMANCE OF...

Optical Method for Detecting Displacements and Strains at Ultra-Hig...

SENSOR ARRANGEMENT FOR THE MEASURING OF PARAMETERS IN MELTED MATERIAL

DEVICES AND METHODS FOR INFRARED (IR) BASED QUANTITATION OF BIOMOLE...

TEMPERATURE MEASUREMENT APPARATUS, METHOD OF MEASURING TEMPERATURE...

SUBSTRATE COOL DOWN CONTROL

System and Method for Non-Intrusive Thermal Monitor

IMMERSION LANCE FOR ANALYSIS OF MELTS AND LIQUIDS

System and method for enabling temperature measurement using a pyro...

OPTICAL PATH IMPROVEMENT, FOCUS LENGTH CHANGE COMPENSATION, AND STR...

Black body background for imaging