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G01R31/2898

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2898Sample preparation

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Patents Grantslast 30 patents

Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and structures for semiconductor device testing
- Patent number 11,982,709
- Issue date May 14, 2024
- Yangtze Memory Technologies Co., Ltd.
- Lin Qi
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing a semiconductor specimen for failure analysis
- Patent number 11,828,800
- Issue date Nov 28, 2023
- MSSCORPS CO., LTD.
- Chi-Lun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die extraction method
- Patent number 11,686,765
- Issue date Jun 27, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Thermal interface formed by condensate
- Patent number 11,508,643
- Issue date Nov 22, 2022
- International Business Machines Corporation
- Mark D. Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for performing timing driven hardware emulation
- Patent number 10,970,445
- Issue date Apr 6, 2021
- Intel Corporation
- Mohamed Farag
- G01 - MEASURING TESTING
Information Patent Grant
Wafer surface test preprocessing device and wafer surface test appa...
- Patent number 10,962,591
- Issue date Mar 30, 2021
- Te-Ming Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated self-coining probe
- Patent number 10,585,119
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Yang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device testing in an inert gas
- Patent number 10,473,712
- Issue date Nov 12, 2019
- Infineon Technologies AG
- Nam Teck Shannon Teo
- G01 - MEASURING TESTING
Information Patent Grant
Reverse decoration for defect detection amplification
- Patent number 10,249,546
- Issue date Apr 2, 2019
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Grant
Testing method
- Patent number 10,031,179
- Issue date Jul 24, 2018
- INGENII TECHNOLOGIES CORPORATION
- Cheng-Ta Yu
- G01 - MEASURING TESTING
Information Patent Grant
Configurable vertical integration
- Patent number 9,804,221
- Issue date Oct 31, 2017
- Glenn J Leedy
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable vertical integration
- Patent number 9,726,716
- Issue date Aug 8, 2017
- Glenn J Leedy
- G11 - INFORMATION STORAGE
Information Patent Grant
Multidimensional structural access
- Patent number 9,696,372
- Issue date Jul 4, 2017
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for stressing an integrated circuit
- Patent number 9,618,567
- Issue date Apr 11, 2017
- EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY EADS FRANCE
- Florian Moliere
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for electronic sample preparation
- Patent number 9,465,049
- Issue date Oct 11, 2016
- James B. Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Interconnect solder bumps for die testing
- Patent number 9,207,275
- Issue date Dec 8, 2015
- International Business Machines Corporation
- Gerald K. Bartley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for endpoint detection during electronic sampl...
- Patent number 9,157,935
- Issue date Oct 13, 2015
- James Barry Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for endpoint detection during electronic sampl...
- Patent number 9,034,667
- Issue date May 19, 2015
- James Barry Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus and test method
- Patent number 8,980,655
- Issue date Mar 17, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Method for cleaning a contact pad of a microstructure and correspon...
- Patent number 8,981,803
- Issue date Mar 17, 2015
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Method for integrated circuit diagnosis
- Patent number 8,809,074
- Issue date Aug 19, 2014
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Determination of whether a line is open or shorted in an integrated...
- Patent number 8,519,731
- Issue date Aug 27, 2013
- Xilinx, Inc.
- Cathal N. McAuley
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing of integrated circuits
- Patent number 8,269,519
- Issue date Sep 18, 2012
- Xilinx, Inc.
- Mohsen Hossein Mardi
- G01 - MEASURING TESTING
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,993,504
- Issue date Aug 9, 2011
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Electron induced chemical etching for device level diagnosis
- Patent number 7,892,978
- Issue date Feb 22, 2011
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and methods of measurement and preparation of me...
- Patent number 7,812,347
- Issue date Oct 12, 2010
- International Business Machines Corporation
- George W. Banke, Jr.
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multipurpose decapsulation holder and method for a ball grid array...
- Patent number 7,772,030
- Issue date Aug 10, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Chun Kui Ji
- G01 - MEASURING TESTING
Information Patent Grant
Probe method, prober, and electrode reducing/plasma-etching process...
- Patent number 7,750,654
- Issue date Jul 6, 2010
- Octec Inc.
- Katsuya Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Methods of measurement and preparation of measurement structure of...
- Patent number 7,507,591
- Issue date Mar 24, 2009
- International Business Machines Corporation
- George W. Banke, Jr.
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING
- Publication number 20230375616
- Publication date Nov 23, 2023
- Yangtze Memory Technologies Co., Ltd.
- Lin QI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...
- Publication number 20230273256
- Publication date Aug 31, 2023
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Identifying Vulnerable Regions in an Integrated Circuit
- Publication number 20230138247
- Publication date May 4, 2023
- Battelle Memorial Institute
- Adam Gakuto KIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREPARING A SEMICONDUCTOR SPECIMEN FOR FAILURE ANALYSIS
- Publication number 20220155367
- Publication date May 19, 2022
- MSSCORPS CO., LTD.
- CHI-LUN LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIE EXTRACTION METHOD
- Publication number 20220128627
- Publication date Apr 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Kun WANG
- G01 - MEASURING TESTING
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...
- Publication number 20220005669
- Publication date Jan 6, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
WAFER SURFACE TEST PREPROCESSING DEVICE AND WAFER SURFACE TEST APPA...
- Publication number 20200057105
- Publication date Feb 20, 2020
- TE-MING CHIANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR PERFORMING TIMING DRIVEN HARDWARE EMULATION
- Publication number 20190005174
- Publication date Jan 3, 2019
- Intel Corporation
- Mohamed Farag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Configurable Vertical Integration
- Publication number 20180231605
- Publication date Aug 16, 2018
- Glenn J Leedy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE TESTING IN AN INERT GAS
- Publication number 20180180666
- Publication date Jun 28, 2018
- INFINEON TECHNOLOGIES AG
- Nam Teck Shannon Teo
- G01 - MEASURING TESTING
Information Patent Application
Reverse Decoration for Defect Detection Amplification
- Publication number 20180025952
- Publication date Jan 25, 2018
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Application
Configurable Vertical Integration
- Publication number 20180017614
- Publication date Jan 18, 2018
- Glenn J Leedy
- G01 - MEASURING TESTING
Information Patent Application
ROLLING APPARATUS AND ROLLING METHOD
- Publication number 20160282643
- Publication date Sep 29, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Yu Ai
- G02 - OPTICS
Information Patent Application
TESTING METHOD
- Publication number 20160187417
- Publication date Jun 30, 2016
- INGENII TECHNOLOGIES CORPORATION
- Cheng-Ta Yu
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER
- Publication number 20160003869
- Publication date Jan 7, 2016
- Advantest Corporation
- Hidenobu MATSUMURA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20150044788
- Publication date Feb 12, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
Configurable Vertical Integration
- Publication number 20140361806
- Publication date Dec 11, 2014
- Glenn J Leedy
- G01 - MEASURING TESTING
Information Patent Application
INTERCONNECT SOLDER BUMPS FOR DIE TESTING
- Publication number 20140167808
- Publication date Jun 19, 2014
- International Business Machines Corporation
- Gerald K. Bartley
- G01 - MEASURING TESTING
Information Patent Application
TEST VEHICLES FOR ENCAPSULATED SEMICONDUCTOR DEVICE PACKAGES
- Publication number 20130330846
- Publication date Dec 12, 2013
- Jinbang Tang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INTEGRATED CIRCUIT DIAGNOSIS
- Publication number 20130295700
- Publication date Nov 7, 2013
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Electronic Sample Preparation
- Publication number 20130271169
- Publication date Oct 17, 2013
- James B. Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus and Method for Endpoint Detection During Electronic Sampl...
- Publication number 20130273671
- Publication date Oct 17, 2013
- James Barry Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus and Method for Endpoint Detection During Electronic Sampl...
- Publication number 20130273674
- Publication date Oct 17, 2013
- James Barry Colvin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Three dimensional memory structure
- Publication number 20130265067
- Publication date Oct 10, 2013
- Glenn J Leedy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR STRESSING AN INTEGRATED CIRCUIT
- Publication number 20130193995
- Publication date Aug 1, 2013
- Florian Moliere
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CLEANING A CONTACT PAD OF A MICROSTRUCTURE AND CORRESPON...
- Publication number 20130049782
- Publication date Feb 28, 2013
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS
- Publication number 20110139368
- Publication date Jun 16, 2011
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Electronic device and method for manufacturing the same
- Publication number 20100140616
- Publication date Jun 10, 2010
- NEC Electronics Corporation
- Daiki Kaya
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES
- Publication number 20080231303
- Publication date Sep 25, 2008
- QIMONDA AG
- Jochen Kallscheuer
- G01 - MEASURING TESTING
Information Patent Application
REWORKABLE CHIP STACK
- Publication number 20080206960
- Publication date Aug 28, 2008
- International Business Machines Corporation
- Bing Dang
- G01 - MEASURING TESTING

Sample preparation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion beam delayering system and method, topographically enhanced del...

Methods and structures for semiconductor device testing

Method of preparing a semiconductor specimen for failure analysis

Die extraction method

Thermal interface formed by condensate

Methods and apparatus for performing timing driven hardware emulation

Wafer surface test preprocessing device and wafer surface test appa...

Integrated self-coining probe

Integrated circuit device testing in an inert gas

Reverse decoration for defect detection amplification

Testing method

Configurable vertical integration

Configurable vertical integration

Multidimensional structural access

Methods and devices for stressing an integrated circuit

Apparatus and method for electronic sample preparation

Interconnect solder bumps for die testing

Apparatus and method for endpoint detection during electronic sampl...

Apparatus and method for endpoint detection during electronic sampl...

Test apparatus and test method

Method for cleaning a contact pad of a microstructure and correspon...

Method for integrated circuit diagnosis

Determination of whether a line is open or shorted in an integrated...

Methods and apparatus for testing of integrated circuits

Backside unlayering of MOSFET devices for electrical and physical c...

Electron induced chemical etching for device level diagnosis

Integrated circuit and methods of measurement and preparation of me...

Multipurpose decapsulation holder and method for a ball grid array...

Probe method, prober, and electrode reducing/plasma-etching process...

Methods of measurement and preparation of measurement structure of...

Patents Applicationslast 30 patents

METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING

CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...

Method of Identifying Vulnerable Regions in an Integrated Circuit

METHOD OF PREPARING A SEMICONDUCTOR SPECIMEN FOR FAILURE ANALYSIS

DIE EXTRACTION METHOD

ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...

WAFER SURFACE TEST PREPROCESSING DEVICE AND WAFER SURFACE TEST APPA...

METHODS AND APPARATUS FOR PERFORMING TIMING DRIVEN HARDWARE EMULATION

Configurable Vertical Integration

INTEGRATED CIRCUIT DEVICE TESTING IN AN INERT GAS

Reverse Decoration for Defect Detection Amplification

Configurable Vertical Integration

ROLLING APPARATUS AND ROLLING METHOD

TESTING METHOD

TEST CARRIER

TEST APPARATUS AND TEST METHOD

Configurable Vertical Integration

INTERCONNECT SOLDER BUMPS FOR DIE TESTING

TEST VEHICLES FOR ENCAPSULATED SEMICONDUCTOR DEVICE PACKAGES

METHOD FOR INTEGRATED CIRCUIT DIAGNOSIS

Apparatus and Method for Electronic Sample Preparation

Apparatus and Method for Endpoint Detection During Electronic Sampl...

Apparatus and Method for Endpoint Detection During Electronic Sampl...

Three dimensional memory structure

METHODS AND DEVICES FOR STRESSING AN INTEGRATED CIRCUIT

METHOD FOR CLEANING A CONTACT PAD OF A MICROSTRUCTURE AND CORRESPON...

APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS

Electronic device and method for manufacturing the same

SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES

REWORKABLE CHIP STACK