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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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Patents Grantslast 30 patents

Information Patent Grant
Spark spectrometry for inclusions content distribution on the surfa...
- Patent number 12,203,864
- Issue date Jan 21, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods using multi-wavelength single-pulse Raman spect...
- Patent number 12,181,340
- Issue date Dec 31, 2024
- University of Maryland Baltimore County
- Bradley Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 12,124,053
- Issue date Oct 22, 2024
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical filter, spectrometric module, and spectral measurement method
- Patent number 12,038,325
- Issue date Jul 16, 2024
- Seiko Epson Corporation
- Kei Kudo
- G01 - MEASURING TESTING
Information Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
- Patent number 11,971,303
- Issue date Apr 30, 2024
- WUHAN UNIVERSITY
- Ruyi Wei
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-invasive measurement of analytes in vivo
- Patent number 11,965,781
- Issue date Apr 23, 2024
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for material characterization
- Patent number 11,927,481
- Issue date Mar 12, 2024
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 11,885,681
- Issue date Jan 30, 2024
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer
- Patent number 11,874,167
- Issue date Jan 16, 2024
- METROHM SPECTRO, INC.
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high gain Raman spectroscopy
- Patent number 11,860,106
- Issue date Jan 2, 2024
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic system and method therefor
- Patent number 11,800,981
- Issue date Oct 31, 2023
- Colgate Palmolive Company
- Deborah Ann Peru
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multiplexing and encoding for reference switching
- Patent number 11,740,126
- Issue date Aug 29, 2023
- Trent D. Ridder
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-invasive measurement of analytes in vivo
- Patent number 11,740,128
- Issue date Aug 29, 2023
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
Optical assembly for optical emission spectroscopy
- Patent number 11,725,988
- Issue date Aug 15, 2023
- Hitachi High-Tech Analytical Science Finland Oy
- Esa Räikkönen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microspectroscope having position correction function
- Patent number 11,635,605
- Issue date Apr 25, 2023
- Jasco Corporation
- Kento Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 11,561,407
- Issue date Jan 24, 2023
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image guided micro-Raman spectroscopy
- Patent number 11,555,742
- Issue date Jan 17, 2023
- Provincial Health Services Authority
- Zhenguo Wu
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for material characterization
- Patent number 11,543,294
- Issue date Jan 3, 2023
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Low-cost, compact chromatic confocal module
- Patent number 11,473,975
- Issue date Oct 18, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Light pipe for spectroscopy
- Patent number 11,442,004
- Issue date Sep 13, 2022
- VIAVI Solutions Inc.
- Curtis R. Hruska
- G02 - OPTICS
Information Patent Grant
Optical microscope and spectroscopic measurement method
- Patent number 11,442,259
- Issue date Sep 13, 2022
- Nanophoton Corporation
- Minoru Kobayashi
- G02 - OPTICS
Information Patent Grant
Method and apparatus for processing terahertz spectral imaging data
- Patent number 11,422,031
- Issue date Aug 23, 2022
- Tsinghua University
- Xiao-Ping Zheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
- Patent number 11,378,453
- Issue date Jul 5, 2022
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Grant
Accessories for handheld spectrometer
- Patent number 11,333,552
- Issue date May 17, 2022
- VERIFOOD, LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Optical endoluminal far-field microscopic imaging catheter
- Patent number 11,330,969
- Issue date May 17, 2022
- Jaywant Philip Parmar
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Compact spectrometer
- Patent number 11,313,721
- Issue date Apr 26, 2022
- Oak Analytics
- Ruibo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 11,307,090
- Issue date Apr 19, 2022
- MKS TECHNOLOGY
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating spectral apparatus and method of producing ca...
- Patent number 11,307,093
- Issue date Apr 19, 2022
- Konica Minolta, Inc.
- Yoshiroh Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 11,300,448
- Issue date Apr 12, 2022
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filter controlling expression derivation method, light measurement...
- Patent number 11,287,320
- Issue date Mar 29, 2022
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20250013066
- Publication date Jan 9, 2025
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical Module, Electronic Device, And Driving Method
- Publication number 20240418981
- Publication date Dec 19, 2024
- SEIKO EPSON CORPORATION
- Tomonori MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer
- Publication number 20240410751
- Publication date Dec 12, 2024
- Metrohm Spectro, Inc. (d/b/a Metrohm Raman)
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
- Publication number 20240393178
- Publication date Nov 28, 2024
- trinamiX GmbH
- Robert LOVRINCIC
- G01 - MEASURING TESTING
Information Patent Application
COLORIMETRY DEVICE
- Publication number 20240385038
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Katsumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE, SENSOR ARRANGEMENT AND METHOD FOR MEASURING RADIATION
- Publication number 20240374477
- Publication date Nov 14, 2024
- VETTER PHARMA-FERTIGUNG GMBH & CO. KG
- Jan NOWAK
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REFERENCE METHOD FOR SPECTROMETER
- Publication number 20240319010
- Publication date Sep 26, 2024
- Thermo Electron Scientific Instruments LLC
- John Iverson
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS AND CONTROL METHOD
- Publication number 20240302209
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Masahide MORIYAMA
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20240302211
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Masaki ITO
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20240302208
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Katsumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20240295436
- Publication date Sep 5, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
WIDE-FIELD SPECTRAL IMAGING SYSTEM
- Publication number 20240230406
- Publication date Jul 11, 2024
- National Central University
- Fan-Ching Chien
- G01 - MEASURING TESTING
Information Patent Application
System and method for illumination source identification
- Publication number 20240219232
- Publication date Jul 4, 2024
- Jacov Tutavac
- G01 - MEASURING TESTING
Information Patent Application
SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...
- Publication number 20240159680
- Publication date May 16, 2024
- NCS Testing Technology CO.,LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
- Publication number 20240159588
- Publication date May 16, 2024
- Pendar Technologies, LLC
- Daryoosh VAKHSHOORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND LIGHT DETECTION MODULE
- Publication number 20240110829
- Publication date Apr 4, 2024
- CHAMP VISION DISPLAY INC.
- Chin-Ku Liu
- G01 - MEASURING TESTING
Information Patent Application
LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE
- Publication number 20240044709
- Publication date Feb 8, 2024
- NANCHANG HANGKONG UNIVERSITY
- Jiulin SHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
- Publication number 20240011833
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Akihiro Nojima
- G01 - MEASURING TESTING
Information Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
- Publication number 20230408337
- Publication date Dec 21, 2023
- WUHAN UNIVERSITY
- Ruyi WEI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO
- Publication number 20230314220
- Publication date Oct 5, 2023
- Sanguis Corporation
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE DEVICE, RANGE-FINDING APPARATUS, IMAGE DISPLAY APPARATUS, H...
- Publication number 20230305292
- Publication date Sep 28, 2023
- Masayuki FUJISHIMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20230296434
- Publication date Sep 21, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20230124587
- Publication date Apr 20, 2023
- CYMER, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS USING MULTI-WAVELENGTH SINGLE-PULSE RAMAN SPECT...
- Publication number 20230104561
- Publication date Apr 6, 2023
- University of Maryland Baltimore County
- Bradley ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer
- Publication number 20230075544
- Publication date Mar 9, 2023
- MKS TECHNOLOGY (D/B/A SNOWY RANGE INSTRUMENTS)
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
- Publication number 20230076993
- Publication date Mar 9, 2023
- SI-WARE SYSTEMS
- Botros George Iskander Shenouda
- G01 - MEASURING TESTING
Information Patent Application
LIGHT PIPE FOR SPECTROSCOPY
- Publication number 20220412880
- Publication date Dec 29, 2022
- VIAVI SOLUTIONS INC.
- Curtis R. HRUSKA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY
- Publication number 20220373393
- Publication date Nov 24, 2022
- Hitachi High-Tech Analytical Science Finland Oy
- Esa RÄIKKÖNEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL SENSOR
- Publication number 20220357200
- Publication date Nov 10, 2022
- ams International AG
- Francesco Paolo D'Aleo
- G01 - MEASURING TESTING
Information Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
- Publication number 20220333985
- Publication date Oct 20, 2022
- Pendar Technologies, LLC
- Daryoosh VAKHSHOORI
- H01 - BASIC ELECTRIC ELEMENTS

Scanning arrangements arrangements for order-selection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spark spectrometry for inclusions content distribution on the surfa...

Systems and methods using multi-wavelength single-pulse Raman spect...

Spectral feature control apparatus

Optical filter, spectrometric module, and spectral measurement method

Quadrilateral common-path time-modulated interferometric spectral i...

System and method for non-invasive measurement of analytes in vivo

Optical technique for material characterization

Methods and devices for standoff differential Raman spectroscopy wi...

Spectrometer

System and method for high gain Raman spectroscopy

Spectroscopic system and method therefor

Multiplexing and encoding for reference switching

System and method for non-invasive measurement of analytes in vivo

Optical assembly for optical emission spectroscopy

Microspectroscope having position correction function

Spectral feature control apparatus

Image guided micro-Raman spectroscopy

Optical technique for material characterization

Low-cost, compact chromatic confocal module

Light pipe for spectroscopy

Optical microscope and spectroscopic measurement method

Method and apparatus for processing terahertz spectral imaging data

Cubesat infrared atmospheric sounder (CIRAS)

Accessories for handheld spectrometer

Optical endoluminal far-field microscopic imaging catheter

Compact spectrometer

Spectrometer

Method of calibrating spectral apparatus and method of producing ca...

Methods and devices for standoff differential Raman spectroscopy wi...

Filter controlling expression derivation method, light measurement...

Patents Applicationslast 30 patents

SPECTRAL FEATURE CONTROL APPARATUS

Optical Module, Electronic Device, And Driving Method

Spectrometer

METHOD FOR CALIBRATING A SPECTROMETER DEVICE

COLORIMETRY DEVICE

SENSOR DEVICE, SENSOR ARRANGEMENT AND METHOD FOR MEASURING RADIATION

REFERENCE METHOD FOR SPECTROMETER

COLOR MEASUREMENT APPARATUS AND CONTROL METHOD

COLOR MEASUREMENT APPARATUS

COLOR MEASUREMENT APPARATUS

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

WIDE-FIELD SPECTRAL IMAGING SYSTEM

System and method for illumination source identification

SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...

Methods and Devices for Standoff Differential Raman Spectroscopy wi...

DISPLAY DEVICE AND LIGHT DETECTION MODULE

LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE

SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD

QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...

SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO

MOVABLE DEVICE, RANGE-FINDING APPARATUS, IMAGE DISPLAY APPARATUS, H...

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

SPECTRAL FEATURE CONTROL APPARATUS

SYSTEMS AND METHODS USING MULTI-WAVELENGTH SINGLE-PULSE RAMAN SPECT...

Spectrometer

HANDHELD OPTICAL SPECTROSCOPY SCANNER

LIGHT PIPE FOR SPECTROSCOPY

OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY

SPECTRAL SENSOR

Methods and Devices for Standoff Differential Raman Spectroscopy wi...