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ELECTRICITY
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Electric elements
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
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H01J2237/28
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Patents Grants
last 30 patents
Information
Patent Grant
Transmission electron microscope and inspection method using transm...
Patent number
12,170,184
Issue date
Dec 17, 2024
HITACHI HIGH-TECH CORPORATION
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for scanning a sample using multi-beam inspection...
Patent number
12,165,837
Issue date
Dec 10, 2024
ASML Netherlands B.V.
Martinus Gerardus Maria Johannes Maassen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
Patent number
12,165,830
Issue date
Dec 10, 2024
ASML Netherlands B.V.
Shichen Gu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for Schottky TFE inspection
Patent number
12,165,834
Issue date
Dec 10, 2024
NUFLARE TECHNOLOGY, INC.
Victor Katsap
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated ion-beam alignment for dual-beam instrument
Patent number
12,154,757
Issue date
Nov 26, 2024
FEI Company
Jeremy Graham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Observation method by means of scanning transmission electron micro...
Patent number
12,154,758
Issue date
Nov 26, 2024
The University of Tokyo
Naoya Shibata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and image acquiring method
Patent number
12,148,594
Issue date
Nov 19, 2024
Jeol Ltd.
Takeshi Otsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
12,142,457
Issue date
Nov 12, 2024
HITACHI HIGH-TECH CORPORATION
Takahiro Nishihata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection of probabilistic process windows
Patent number
12,142,454
Issue date
Nov 12, 2024
Fractilla, LLC
Chris Mack
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Testing assembly including a multiple degree of freedom stage
Patent number
12,140,571
Issue date
Nov 12, 2024
Bruker Nano, Inc.
Edward Cyrankowski
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Electron microscope and specimen contamination prevention method
Patent number
12,131,881
Issue date
Oct 29, 2024
Jeol Ltd.
Takeshi Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-source charged particle illumination apparatus
Patent number
12,125,671
Issue date
Oct 22, 2024
ASML Netherlands B.V.
Stijn Wilem Herman Karel Steenbrink
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
12,125,667
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Yasuhiro Shirasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
Patent number
12,125,669
Issue date
Oct 22, 2024
ASML Netherlands B.V.
Ning Ye
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron detector
Patent number
12,106,932
Issue date
Oct 1, 2024
DECTRIS AG
Radosav Pantelic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, apparatus and computer program for analyzing and/or process...
Patent number
12,105,415
Issue date
Oct 1, 2024
Carl Zeiss SMT GmbH
Oliver Jäckel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analysis method
Patent number
12,094,682
Issue date
Sep 17, 2024
Kioxia Corporation
Takeshi Owaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
Patent number
12,094,684
Issue date
Sep 17, 2024
Mochii, Inc.
Christopher Su-Yan Own
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
12,087,541
Issue date
Sep 10, 2024
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image contrast enhancement in sample inspection
Patent number
12,087,542
Issue date
Sep 10, 2024
ASML Netherlands B.V.
Yixiang Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for tilting characterization by microscopy
Patent number
12,078,791
Issue date
Sep 3, 2024
Yangtze Memory Technologies Co., Ltd.
Jun Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle microscope for examining a specimen, and method of...
Patent number
12,080,512
Issue date
Sep 3, 2024
FEI Company
Lubomir Tuma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
Patent number
12,080,513
Issue date
Sep 3, 2024
ASML Netherlands B.V.
Wei Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for multiple charged-particle beams
Patent number
12,080,515
Issue date
Sep 3, 2024
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection apparatus and method
Patent number
12,072,181
Issue date
Aug 27, 2024
ASML Netherlands B.V.
Yan Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for high-performance electron microscopy
Patent number
12,073,541
Issue date
Aug 27, 2024
The Board of Regents of the University of Texas System
Zbyszek Otwinowski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method, inspection system, and semiconductor fabrication...
Patent number
12,055,861
Issue date
Aug 6, 2024
Samsung Electronics Co., Ltd.
Kihyun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods of clamp compensation
Patent number
12,057,286
Issue date
Aug 6, 2024
FEI Company
Edwin Verschueren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and inspection method
Patent number
12,057,288
Issue date
Aug 6, 2024
HITACHI HIGH-TECH CORPORATION
Momoyo Enyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
12,046,446
Issue date
Jul 23, 2024
HITACHI HIGH-TECH CORPORATION
Hiroyuki Chiba
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20240420915
Publication date
Dec 19, 2024
HITACHI HIGH-TECH CORPORATION
Mihiro TAKASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DISCHARGING A REGION OF A SAMPLE
Publication number
20240420917
Publication date
Dec 19, 2024
APPLIED MATERIALS ISRAEL LTD.
Roey Levy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE INSPECTION METHOD
Publication number
20240412943
Publication date
Dec 12, 2024
Samsung Electronics Co., LTD
Jinwoo Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPY-BASED TOMOGRAPHY OF SPECIMENS
Publication number
20240404784
Publication date
Dec 5, 2024
APPLIED MATERIALS ISRAEL LTD.
Itamar Shani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
Publication number
20240395499
Publication date
Nov 28, 2024
RINKEN
Takahiro SHIMOJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE MICROSCOPE FOR EXAMINING A SPECIMEN, AND METHOD OF...
Publication number
20240395496
Publication date
Nov 28, 2024
FEI Company
Lubomir Tuma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE...
Publication number
20240379327
Publication date
Nov 14, 2024
APPLIED MATERIALS ISRAEL LTD.
Yuval Tsedek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
Publication number
20240379325
Publication date
Nov 14, 2024
ASML NETHERLANDS B.V.
Frank Nan ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...
Publication number
20240371600
Publication date
Nov 7, 2024
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
John Breuer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND METHOD
Publication number
20240369356
Publication date
Nov 7, 2024
ASML NETHERLANDS B.V.
Yan WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY
Publication number
20240355581
Publication date
Oct 24, 2024
Integrated Dynamic Electron Solutions, Inc.
Bryan Walter REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
Publication number
20240355685
Publication date
Oct 24, 2024
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Application
TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY
Publication number
20240347314
Publication date
Oct 17, 2024
FEI Company
Peter Christiaan Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS METHOD, COMPUTER-READABLE MEDIUM, AND MANUFACTURING METHOD...
Publication number
20240347315
Publication date
Oct 17, 2024
Fuji Electric Co., Ltd.
Yusuke SHIMIZU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS OF CLAMP COMPENSATION
Publication number
20240339286
Publication date
Oct 10, 2024
FEI Company
Edwin Verschueren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS
Publication number
20240339289
Publication date
Oct 10, 2024
APPLIED MATERIALS ISRAEL LTD.
Adar Sonn-Segev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMPROVED NAVIGATION FOR ELECTRON MICROSCOPY
Publication number
20240339293
Publication date
Oct 10, 2024
Oxford Instruments Nanotechnology Tools Limited
Peter Statham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF GENERATING A SAMPLE MAP, COMPUTER PROGRAM PRODUCT, CHARGE...
Publication number
20240339295
Publication date
Oct 10, 2024
ASML NETHERLANDS B.V.
Tzu-Chao CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
Publication number
20240312757
Publication date
Sep 19, 2024
FRACTILIA, LLC
Chris MACK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR STRUCTURE, INSPECTION METHOD AND INSPECTION SYSTEM
Publication number
20240304411
Publication date
Sep 12, 2024
WINBOND ELECTRONICS CORP.
Yen-Chiao CHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (...
Publication number
20240297015
Publication date
Sep 5, 2024
FEI Company
Ludek Cervinka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHO...
Publication number
20240290571
Publication date
Aug 29, 2024
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS AND MULTI-ELECTRON...
Publication number
20240282547
Publication date
Aug 22, 2024
NuFlare Technology, Inc.
Koichi ISHII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
Publication number
20240272097
Publication date
Aug 15, 2024
Virginia Commonwealth University
Carl R. Mayer
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
Publication number
20240272099
Publication date
Aug 15, 2024
Carl Zeiss SMT GMBH
Daniel Schwarz
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GLOBAL AND LOCAL OPTIMIZATION OF IMAGING RESOLUTION IN A...
Publication number
20240274398
Publication date
Aug 15, 2024
Carl Zeiss MultiSEM GmbH
Christof Riedesel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIZATION DEVICE FOR AN ELECTRON MICROSCOPE AND METHOD
Publication number
20240258064
Publication date
Aug 1, 2024
FORSCHUNGSZENTRUM JULICH GmbH
Amir Hossein TAVABI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...
Publication number
20240258067
Publication date
Aug 1, 2024
FEI Company
Peter Christiaan TIEMEIJER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
Publication number
20240258066
Publication date
Aug 1, 2024
FRACTILIA, LLC
Chris Mack
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
Publication number
20240249912
Publication date
Jul 25, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS