Scanning potential microscopy

Industry

CPC
G01Q60/30

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/30Scanning potential microscopy

Industries

Patents Grantslast 30 patents

Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,808,783
- Issue date Nov 7, 2023
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,703,523
- Issue date Jul 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 11,668,730
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,573,247
- Issue date Feb 7, 2023
- Xallent INC.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with use of composite materials
- Patent number 11,467,182
- Issue date Oct 11, 2022
- Vladimir Zhizhimontov
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Energy beam input to atom probe specimens from multiple angles
- Patent number 11,340,256
- Issue date May 24, 2022
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of performing scanning probe microscopy on a subs...
- Patent number 11,320,457
- Issue date May 3, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Automated detection of artifacts in scan image
- Patent number 11,288,809
- Issue date Mar 29, 2022
- Seagate Technology LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,175,306
- Issue date Nov 16, 2021
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
AFM with suppressed parasitic signals
- Patent number 11,156,633
- Issue date Oct 26, 2021
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Method for SEM-guided AFM scan with dynamically varied scan speed
- Patent number 11,158,486
- Issue date Oct 26, 2021
- JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
- Yu Sun
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,125,774
- Issue date Sep 21, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
High range and resolution scanning probe and methods
- Patent number 11,099,209
- Issue date Aug 24, 2021
- Advanced Measurement Technology Inc.
- Charles R. Sides
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,079,405
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of and system for detecting structures on or below the surfa...
- Patent number 11,029,329
- Issue date Jun 8, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope based instrumentation for probing nanoscale...
- Patent number 11,016,118
- Issue date May 25, 2021
- SOUTH DAKOTA UNIVERSITY
- Qiquan Qiao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy tips for interconnection
- Patent number 10,989,735
- Issue date Apr 27, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy device, method and lithographic system
- Patent number 10,976,345
- Issue date Apr 13, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 10,969,406
- Issue date Apr 6, 2021
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling a probe using constant command signals
- Patent number 10,895,584
- Issue date Jan 19, 2021
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
AFM with suppressed parasitic signals
- Patent number 10,794,930
- Issue date Oct 6, 2020
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting electrical characteristics of individual soot...
- Patent number 10,788,511
- Issue date Sep 29, 2020
- Tianjin University
- Chonglin Song
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting process solution, and sample pr...
- Patent number 10,746,635
- Issue date Aug 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating insulated-gate semiconductor device
- Patent number 10,749,001
- Issue date Aug 18, 2020
- Fuji Electric Co., Ltd.
- Takayuki Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for high throughput SEM and AFM for character...
- Patent number 10,714,310
- Issue date Jul 14, 2020
- Nanowear Inc.
- Vijay Varadan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automated detection of artifacts in scan image
- Patent number 10,679,353
- Issue date Jun 9, 2020
- Seagate Technology LLC
- Zhiyu Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY
- Publication number 20240219420
- Publication date Jul 4, 2024
- Brown University
- Daniel MITTLEMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...
- Publication number 20240094241
- Publication date Mar 21, 2024
- TOHOKU UNIVERSITY
- Yoshiomi HIRANAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...
- Publication number 20230110754
- Publication date Apr 13, 2023
- OSAKA UNIVERSITY
- Yasuhiro SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
- Publication number 20220163559
- Publication date May 26, 2022
- attocube systems AG
- Alexander A. GOVYADINOV
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20220043024
- Publication date Feb 10, 2022
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20210389346
- Publication date Dec 16, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FERROELECTRIC SIGNAL
- Publication number 20210349126
- Publication date Nov 11, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
High Speed Atomic Force Profilometry of Large Areas
- Publication number 20210341513
- Publication date Nov 4, 2021
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Application
ENERGY BEAM INPUT TO ATOM PROBE SPECIMENS FROM MULTIPLE ANGLES
- Publication number 20210333306
- Publication date Oct 28, 2021
- CAMECA INSTRUMENTS INC.
- Joseph Hale Bunton
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...
- Publication number 20210318353
- Publication date Oct 14, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR SEM-GUIDED AFM SCAN WITH DYNAMICALLY VARIED SCAN SPEED
- Publication number 20210125809
- Publication date Apr 29, 2021
- JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
- Yu SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION
- Publication number 20210055327
- Publication date Feb 25, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Application
AFM with Suppressed Parasitic Signals
- Publication number 20200371134
- Publication date Nov 26, 2020
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE BASED INSTRUMENTATION FOR PROBING NANOSCALE...
- Publication number 20200371135
- Publication date Nov 26, 2020
- SOUTH DAKOTA STATE UNIVERSITY
- Qiquan QIAO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
- Publication number 20200265583
- Publication date Aug 20, 2020
- SEAGATE TECHNOLOGY LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...
- Publication number 20200241039
- Publication date Jul 30, 2020
- TIANJIN UNIVERSITY
- Chonglin SONG
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20200204112
- Publication date Jun 25, 2020
- Cornell University
- John Marohn
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20200191827
- Publication date Jun 18, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
High Speed Atomic Force Profilometry of Large Areas
- Publication number 20200049734
- Publication date Feb 13, 2020
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR DETECTING STRUCTURES ON OR BELOW THE SURFA...
- Publication number 20190369140
- Publication date Dec 5, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC SYSTEM
- Publication number 20190369139
- Publication date Dec 5, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...
- Publication number 20190250186
- Publication date Aug 15, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
Optical source in microwave impedance microscopy
- Publication number 20190234993
- Publication date Aug 1, 2019
- PrimeNano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...
- Publication number 20190170789
- Publication date Jun 6, 2019
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
- Publication number 20190139224
- Publication date May 9, 2019
- SEAGATE TECHNOLOGY LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20190128919
- Publication date May 2, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
HIGH RANGE AND RESOLUTION SCANNING PROBE AND METHODS
- Publication number 20190094268
- Publication date Mar 28, 2019
- Charles R. Sides
- G01 - MEASURING TESTING

Scanning potential microscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vibration component measurement device, Kelvin probe force microsco...

Atomic force microscopy apparatus, methods, and applications

Method and apparatus for detecting ferroelectric signal

High speed atomic force profilometry of large areas

Systems and methods for manufacturing nano-electro-mechanical-syste...

Scanning probe microscope with use of composite materials

Energy beam input to atom probe specimens from multiple angles

System and method of performing scanning probe microscopy on a subs...

Automated detection of artifacts in scan image

Atomic force microscopy apparatus, methods, and applications

AFM with suppressed parasitic signals

Method for SEM-guided AFM scan with dynamically varied scan speed

Systems and methods for manufacturing nano-electro-mechanical-syste...

Method and tip substrate for scanning probe microscopy

High range and resolution scanning probe and methods

Method and apparatus for detecting ferroelectric signal

Method of and system for detecting structures on or below the surfa...

Atomic force microscope based instrumentation for probing nanoscale...

Method and apparatus of operating a scanning probe microscope

Atomic force microscopy tips for interconnection

Atomic force microscopy device, method and lithographic system

High speed atomic force profilometry of large areas

Multiple integrated tips scanning probe microscope

Method of controlling a probe using constant command signals

AFM with suppressed parasitic signals

Method for detecting electrical characteristics of individual soot...

Method and apparatus for inspecting process solution, and sample pr...

Method of evaluating insulated-gate semiconductor device

Methods and apparatus for high throughput SEM and AFM for character...

Automated detection of artifacts in scan image

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY

HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...

ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION

ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

METHOD AND APPARATUS FOR DETECTING FERROELECTRIC SIGNAL

High Speed Atomic Force Profilometry of Large Areas

ENERGY BEAM INPUT TO ATOM PROBE SPECIMENS FROM MULTIPLE ANGLES

SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...

A METHOD FOR SEM-GUIDED AFM SCAN WITH DYNAMICALLY VARIED SCAN SPEED

METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY

ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION

AFM with Suppressed Parasitic Signals

ATOMIC FORCE MICROSCOPE BASED INSTRUMENTATION FOR PROBING NANOSCALE...

AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE

METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...

ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

Method and Apparatus of Operating a Scanning Probe Microscope

High Speed Atomic Force Profilometry of Large Areas

METHOD OF AND SYSTEM FOR DETECTING STRUCTURES ON OR BELOW THE SURFA...

ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC SYSTEM

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...

Optical source in microwave impedance microscopy

Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...

AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

HIGH RANGE AND RESOLUTION SCANNING PROBE AND METHODS