Scanning-probe techniques or apparatus not otherwise provided for

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Current Industry

G01Q90/00Scanning-probe techniques or apparatus not otherwise provided for

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 10,041,114
- Issue date Aug 7, 2018
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 9,689,034
- Issue date Jun 27, 2017
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiscale spectral nanoscopy
- Patent number 9,494,518
- Issue date Nov 15, 2016
- The Trustees of Princeton University
- Haw Yang
- G02 - OPTICS
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 8,978,161
- Issue date Mar 10, 2015
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 8,950,011
- Issue date Feb 3, 2015
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mode-synthesizing atomic force microscopy and mode-synthesizing sen...
- Patent number 8,789,211
- Issue date Jul 22, 2014
- UT-Battelle, LLC
- Ali Passian
- G01 - MEASURING TESTING
Information Patent Grant
Cleaning station for atomic force microscope
- Patent number 8,782,811
- Issue date Jul 15, 2014
- Bruker Nano, Inc.
- Johannes H. Kindt
- G01 - MEASURING TESTING
Information Patent Grant
Characterization structure for an atomic force microscope tip
- Patent number 8,739,310
- Issue date May 27, 2014
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Johann Foucher
- G01 - MEASURING TESTING
Information Patent Grant
Mode synthesizing atomic force microscopy and mode-synthesizing sen...
- Patent number 8,448,261
- Issue date May 21, 2013
- University of Tennessee Research Foundation
- Ali Passian
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
REAL-TIME DIRECT MEASUREMENT OF MECHANICAL PROPERTIES IN-SITU OF SC...
- Publication number 20200090901
- Publication date Mar 19, 2020
- University of Connecticut
- Joseph Favata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
MULTISCALE SPECTRAL NANOSCOPY
- Publication number 20150177149
- Publication date Jun 25, 2015
- THE TRUSTEES OF PRINCETON UNIVERSITY
- Haw Yang
- G01 - MEASURING TESTING
Information Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
- Publication number 20140352006
- Publication date Nov 27, 2014
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
- Publication number 20140352005
- Publication date Nov 27, 2014
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
- Publication number 20140020141
- Publication date Jan 16, 2014
- University of Tennessee Research Foundation
- Ali Passian
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARACTERIZATION STRUCTURE FOR AN ATOMIC FORCE MICROSCOPE TIP
- Publication number 20130291236
- Publication date Oct 31, 2013
- Johann Foucher
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cleaning Station for Atomic Force Microscope
- Publication number 20120297510
- Publication date Nov 22, 2012
- BRUKER NANO INC
- Johannes H. Kindt
- G01 - MEASURING TESTING
Information Patent Application
MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
- Publication number 20110231965
- Publication date Sep 22, 2011
- Ali Passian
- G01 - MEASURING TESTING

Scanning-probe techniques or apparatus not otherwise provided for

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Multiscale spectral nanoscopy

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Mode-synthesizing atomic force microscopy and mode-synthesizing sen...

Cleaning station for atomic force microscope

Characterization structure for an atomic force microscope tip

Mode synthesizing atomic force microscopy and mode-synthesizing sen...

Patents Applicationslast 30 patents

REAL-TIME DIRECT MEASUREMENT OF MECHANICAL PROPERTIES IN-SITU OF SC...

SCANNING PROBE MICROSCOPE

MULTISCALE SPECTRAL NANOSCOPY

TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...

TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...

MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...

CHARACTERIZATION STRUCTURE FOR AN ATOMIC FORCE MICROSCOPE TIP

Cleaning Station for Atomic Force Microscope

MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...