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Scanning-probe techniques or apparatus not otherwise provided for
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G01Q90/00
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PHYSICS
G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
Current Industry
G01Q90/00
Scanning-probe techniques or apparatus not otherwise provided for
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Patents Grants
last 30 patents
Information
Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
Patent number
10,041,114
Issue date
Aug 7, 2018
International Business Machines Corporation
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
Patent number
9,689,034
Issue date
Jun 27, 2017
International Business Machines Corporation
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Multiscale spectral nanoscopy
Patent number
9,494,518
Issue date
Nov 15, 2016
The Trustees of Princeton University
Haw Yang
G02 - OPTICS
Information
Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
Patent number
8,978,161
Issue date
Mar 10, 2015
International Business Machines Corporation
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
Patent number
8,950,011
Issue date
Feb 3, 2015
International Business Machines Corporation
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Mode-synthesizing atomic force microscopy and mode-synthesizing sen...
Patent number
8,789,211
Issue date
Jul 22, 2014
UT-Battelle, LLC
Ali Passian
G01 - MEASURING TESTING
Information
Patent Grant
Cleaning station for atomic force microscope
Patent number
8,782,811
Issue date
Jul 15, 2014
Bruker Nano, Inc.
Johannes H. Kindt
G01 - MEASURING TESTING
Information
Patent Grant
Characterization structure for an atomic force microscope tip
Patent number
8,739,310
Issue date
May 27, 2014
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Johann Foucher
G01 - MEASURING TESTING
Information
Patent Grant
Mode synthesizing atomic force microscopy and mode-synthesizing sen...
Patent number
8,448,261
Issue date
May 21, 2013
University of Tennessee Research Foundation
Ali Passian
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
REAL-TIME DIRECT MEASUREMENT OF MECHANICAL PROPERTIES IN-SITU OF SC...
Publication number
20200090901
Publication date
Mar 19, 2020
University of Connecticut
Joseph Favata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20190064211
Publication date
Feb 28, 2019
Oxford Instruments Asylum Research, Inc.
David A. Grigg
G01 - MEASURING TESTING
Information
Patent Application
MULTISCALE SPECTRAL NANOSCOPY
Publication number
20150177149
Publication date
Jun 25, 2015
THE TRUSTEES OF PRINCETON UNIVERSITY
Haw Yang
G01 - MEASURING TESTING
Information
Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
Publication number
20140352006
Publication date
Nov 27, 2014
International Business Machines Corporation
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
Publication number
20140352005
Publication date
Nov 27, 2014
Venkat K. Balagurusamy
B82 - NANO-TECHNOLOGY
Information
Patent Application
MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
Publication number
20140020141
Publication date
Jan 16, 2014
University of Tennessee Research Foundation
Ali Passian
B82 - NANO-TECHNOLOGY
Information
Patent Application
CHARACTERIZATION STRUCTURE FOR AN ATOMIC FORCE MICROSCOPE TIP
Publication number
20130291236
Publication date
Oct 31, 2013
Johann Foucher
B82 - NANO-TECHNOLOGY
Information
Patent Application
Cleaning Station for Atomic Force Microscope
Publication number
20120297510
Publication date
Nov 22, 2012
BRUKER NANO INC
Johannes H. Kindt
G01 - MEASURING TESTING
Information
Patent Application
MODE SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
Publication number
20110231965
Publication date
Sep 22, 2011
Ali Passian
G01 - MEASURING TESTING