Scattering

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CPC
G01N21/47

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/47Scattering

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Slope, p-component and s-component measurement
- Patent number 12,146,830
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 12,146,890
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Particle size distribution measurement device, particle analysis un...
- Patent number 12,140,519
- Issue date Nov 12, 2024
- Horiba, Ltd.
- Tetsuya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining rinse properties
- Patent number 12,140,539
- Issue date Nov 12, 2024
- Conopco, Inc.
- Sinead Elizabeth Bond
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring spatially resolved velocity and den...
- Patent number 12,136,498
- Issue date Nov 5, 2024
- MetroLaser, Inc.
- Thomas P. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alarm method, system and storage medium for abnormalities of sample...
- Patent number 12,135,287
- Issue date Nov 5, 2024
- Huan Qi
- G08 - SIGNALLING
Information Patent Grant
Monitoring copper corrosion in an integrated circuit device
- Patent number 12,130,241
- Issue date Oct 29, 2024
- Microchip Technology Incorporated
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical device
- Patent number 12,123,829
- Issue date Oct 22, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Akira Kurozuka
- G08 - SIGNALLING
Information Patent Grant
Method and device for label-free all-optical neural regulation and...
- Patent number 12,121,320
- Issue date Oct 22, 2024
- Zhejiang University
- Peng Li
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Biochip device
- Patent number 12,117,397
- Issue date Oct 15, 2024
- Gen-Probe Incorporated
- Claude Weisbuch
- G01 - MEASURING TESTING
Information Patent Grant
Method for calculating 19 biological parameters associated with lig...
- Patent number 12,114,992
- Issue date Oct 15, 2024
- Chen Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for biodetection applications
- Patent number 12,117,441
- Issue date Oct 15, 2024
- Consejo Superior de Investigaciones Cientificas
- Francisco Javier Tamayo de Miguel
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and device for determining a complex-valued field
- Patent number 12,117,734
- Issue date Oct 15, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 12,105,029
- Issue date Oct 1, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Colorimeter and reflectivity measuring method based on multichannel...
- Patent number 12,098,957
- Issue date Sep 24, 2024
- CaiPu Technology (Zhejiang) Co., Ltd.
- Kun Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring light scattering of a sample
- Patent number D1042183
- Issue date Sep 17, 2024
- Wyatt Technology, LLC
- Sigrid C. Kuebler
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Optical inspection device
- Patent number 12,092,582
- Issue date Sep 17, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Reference switch architectures for noncontact sensing of substances
- Patent number 12,085,500
- Issue date Sep 10, 2024
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography system for subsurface inspection
- Patent number 12,085,387
- Issue date Sep 10, 2024
- Hamamatsu Photonics K.K.
- Qingsong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus for simultaneous acquisition of multiple divers...
- Patent number 12,086,973
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Teunis Willem Tukker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vessel location assistance device
- Patent number D1040344
- Issue date Aug 27, 2024
- NOVOTEC LLC
- James B. Satovsky
- D24 - Medical and laboratory equipment
Information Patent Grant
Floor cleaning appliance and method for cleaning a floor surface
- Patent number 12,070,181
- Issue date Aug 27, 2024
- Alfred Kärcher SE & Co. KG
- Karl Engelbert Wenzel
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
Multiple light paths architecture and obscuration methods for signa...
- Patent number 12,072,288
- Issue date Aug 27, 2024
- Apple Inc.
- Chin San Han
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System, method, computer-accessible and apparatus for providing nea...
- Patent number 12,072,283
- Issue date Aug 27, 2024
- The Trustees of Columbia University In the City of New York
- Christine Hendon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scattering microscopy
- Patent number 12,072,287
- Issue date Aug 27, 2024
- Oxford University Innovation Limited
- Philipp Kukura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for obtaining wellbore pressure measurements
- Patent number 12,066,342
- Issue date Aug 20, 2024
- Ziebel AS
- Neil Gardner
- E21 - EARTH DRILLING MINING
Information Patent Grant
Methods of measuring extracellular vesicles and nanoparticles in co...
- Patent number 12,066,382
- Issue date Aug 20, 2024
- LONZA SALES AG
- Young Jun Choi
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency fluorometer
- Patent number 12,061,149
- Issue date Aug 13, 2024
- YSI, Inc.
- Kevin Flanagan
- G01 - MEASURING TESTING
Information Patent Grant
Cholesterol measurement device
- Patent number 12,061,192
- Issue date Aug 13, 2024
- GREEN CROSS MEDICAL SCIENCE
- Hyu Jeong Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNA...
- Publication number 20240418644
- Publication date Dec 19, 2024
- Apple Inc.
- Chin San Han
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLUMN FLOW DAMPENER FOR MALS NOISE REDUCTION DURING SEC-MALS ANALYSIS
- Publication number 20240416259
- Publication date Dec 19, 2024
- WATERS TECHNOLOGIES CORPORATION
- Lavelay Kizekai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
VESSEL LOCATION ASSISTANCE DEVICE
- Publication number 20240415454
- Publication date Dec 19, 2024
- NOVOTEC LLC
- James B. Satovsky
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...
- Publication number 20240418632
- Publication date Dec 19, 2024
- The Regents of the University of Michigan
- Nicholas A. KOTOV
- G01 - MEASURING TESTING
Information Patent Application
EVANESCENT SCATTERING IMAGING OF SINGLE MOLECULES
- Publication number 20240410826
- Publication date Dec 12, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Shaopeng WANG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
- Publication number 20240410827
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Diederik Jan MAAS
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES
- Publication number 20240410822
- Publication date Dec 12, 2024
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240410685
- Publication date Dec 12, 2024
- ChromoLogic LLC
- Matthew BREHOVE
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...
- Publication number 20240404036
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Teunis Willem TUKKER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSTRUMENT AND METHOD FOR MEASURING THE CURVATURE OF A SURFACE OF A...
- Publication number 20240401939
- Publication date Dec 5, 2024
- RIBER
- Youri ROUSSEAU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARAC...
- Publication number 20240393221
- Publication date Nov 28, 2024
- Malvern Panalytical Limited
- David SPRIGGS
- G01 - MEASURING TESTING
Information Patent Application
TRICORDER REFLECTOMETER FOR LATERAL FLOW IMMUNOLOGICAL TESTS
- Publication number 20240393233
- Publication date Nov 28, 2024
- JACK L. ARONOWITZ
- G01 - MEASURING TESTING
Information Patent Application
Spatiotemporal Multiplexing Module
- Publication number 20240393247
- Publication date Nov 28, 2024
- THE ROCKEFELLER UNIVERSITY
- Alipasha VAZIRI
- G02 - OPTICS
Information Patent Application
COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL...
- Publication number 20240393181
- Publication date Nov 28, 2024
- CaiPu Technology (Zhejiang) Co., Ltd.
- Kun YUAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ILLUMINATION APPARATUS OF ADAPTIVE OPTICS IN REFLECTION...
- Publication number 20240369487
- Publication date Nov 7, 2024
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- JOHANNES DOMINIK SEELIG
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SWITCH DEVICES
- Publication number 20240371226
- Publication date Nov 7, 2024
- WAVEFRONT TECHNOLOGY, INC.
- Christopher Chapman Rich
- G07 - CHECKING-DEVICES
Information Patent Application
SCATTERING MICROSCOPY
- Publication number 20240353325
- Publication date Oct 24, 2024
- Oxford University Innovation Limited
- Philipp KUKURA
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
INTERFEROMETRIC SCATTERING MICROSCOPY
- Publication number 20240344979
- Publication date Oct 17, 2024
- REFEYN LTD
- Matthias Karl Franz LANGHORST
- G01 - MEASURING TESTING
Information Patent Application
NANOSECOND-SCALE PHOTOTHERMAL DYNAMIC IMAGING
- Publication number 20240337589
- Publication date Oct 10, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING SPECIMEN
- Publication number 20240329049
- Publication date Oct 3, 2024
- SYSMEX CORPORATION
- Yuji TOYA
- G01 - MEASURING TESTING
Information Patent Application
SOLID CALIBRATION STANDARDS FOR TURBIDITY MEASURING DEVICES
- Publication number 20240328942
- Publication date Oct 3, 2024
- ABB Schweiz AG
- Sylvio R. Laplante
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...
- Publication number 20240319620
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240288375
- Publication date Aug 29, 2024
- NISSAN MOTOR CO., LTD.
- Takahiro KAITO
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY MEASUREMENT SYSTEM, RAMAN SCATTERED LIGHT SPECTROSC...
- Publication number 20240288373
- Publication date Aug 29, 2024
- Seed Co., Ltd.
- Taku Kinoshita
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED PHOTONICS AIR DATA SYSTEM
- Publication number 20240272283
- Publication date Aug 15, 2024
- Honeywell International Inc.
- Matthew Wade Puckett
- G01 - MEASURING TESTING
Information Patent Application
SPECKLE-BASED IMAGE DISTORTION CORRECTION FOR LASER SCANNING MICROS...
- Publication number 20240268672
- Publication date Aug 15, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH-SPEED AUTOMATIC FILM-FOREIGN SUBSTANCE DETECTION APPARATUS
- Publication number 20240273707
- Publication date Aug 15, 2024
- Jin Ho KIM
- G06 - COMPUTING CALCULATING COUNTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Slope, p-component and s-component measurement

Defect inspection device

Automated analyzer and automated analysis method

Particle size distribution measurement device, particle analysis un...

Method for determining rinse properties

System and method for measuring spatially resolved velocity and den...

Alarm method, system and storage medium for abnormalities of sample...

Monitoring copper corrosion in an integrated circuit device

Optical device

Method and device for label-free all-optical neural regulation and...

Biochip device

Method for calculating 19 biological parameters associated with lig...

System for biodetection applications

Metrology method and device for determining a complex-valued field

Focus-less inspection apparatus and method

Colorimeter and reflectivity measuring method based on multichannel...

Apparatus for measuring light scattering of a sample

Optical inspection device

Reference switch architectures for noncontact sensing of substances

Optical coherence tomography system for subsurface inspection

Detection apparatus for simultaneous acquisition of multiple divers...

Vessel location assistance device

Floor cleaning appliance and method for cleaning a floor surface

Multiple light paths architecture and obscuration methods for signa...

System, method, computer-accessible and apparatus for providing nea...

Scattering microscopy

Apparatus for obtaining wellbore pressure measurements

Methods of measuring extracellular vesicles and nanoparticles in co...

Swept frequency fluorometer

Cholesterol measurement device

Patents Applicationslast 30 patents

MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNA...

SEMICONDUCTOR MEASUREMENT APPARATUS

COLUMN FLOW DAMPENER FOR MALS NOISE REDUCTION DURING SEC-MALS ANALYSIS

VESSEL LOCATION ASSISTANCE DEVICE

DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...

EVANESCENT SCATTERING IMAGING OF SINGLE MOLECULES

METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...

REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES

MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY

DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...

INSTRUMENT AND METHOD FOR MEASURING THE CURVATURE OF A SURFACE OF A...

APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARAC...

TRICORDER REFLECTOMETER FOR LATERAL FLOW IMMUNOLOGICAL TESTS

Spatiotemporal Multiplexing Module

COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL...

METHOD AND ILLUMINATION APPARATUS OF ADAPTIVE OPTICS IN REFLECTION...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

OPTICAL SWITCH DEVICES

SCATTERING MICROSCOPY

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

INTERFEROMETRIC SCATTERING MICROSCOPY

NANOSECOND-SCALE PHOTOTHERMAL DYNAMIC IMAGING

METHOD FOR ANALYZING SPECIMEN

SOLID CALIBRATION STANDARDS FOR TURBIDITY MEASURING DEVICES

METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

LIGHT INTENSITY MEASUREMENT SYSTEM, RAMAN SCATTERED LIGHT SPECTROSC...

INTEGRATED PHOTONICS AIR DATA SYSTEM

SPECKLE-BASED IMAGE DISTORTION CORRECTION FOR LASER SCANNING MICROS...

HIGH-SPEED AUTOMATIC FILM-FOREIGN SUBSTANCE DETECTION APPARATUS