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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
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G01N21/47
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Patents Grants
last 30 patents
Information
Patent Grant
Biosensor
Patent number
12,228,569
Issue date
Feb 18, 2025
Electronics and Telecommunications Research Institute
Jin Tae Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microorganism information providing device and method
Patent number
12,228,509
Issue date
Feb 18, 2025
THE WAVE TALK, INC.
YongKeun Park
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Vessel location assistance device
Patent number
12,220,255
Issue date
Feb 11, 2025
NOVOTEC LLC
James B. Satovsky
G01 - MEASURING TESTING
Information
Patent Grant
Optical switch devices
Patent number
12,223,794
Issue date
Feb 11, 2025
Wavefront Technology, Inc.
Christopher Chapman Rich
B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information
Patent Grant
Turbidity calibration-correction apparatus and method for an automa...
Patent number
12,216,052
Issue date
Feb 4, 2025
ABB Schweiz AG
Benjamin Carr
G01 - MEASURING TESTING
Information
Patent Grant
Decay detection system
Patent number
12,217,410
Issue date
Feb 4, 2025
SUNKIST GROWERS, INC.
Aaron Gorsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Devices and methods for determining chiral optical properties from...
Patent number
12,216,043
Issue date
Feb 4, 2025
The Regents of the University of Michigan
Nicholas A. Kotov
G01 - MEASURING TESTING
Information
Patent Grant
Non-invasive tension measuring system
Patent number
12,209,960
Issue date
Jan 28, 2025
The United States of America as represented by the Secretary of the Navy
Anthony A Ruffa
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
Patent number
12,209,952
Issue date
Jan 28, 2025
Singapore Health Services Pte Ltd.
Leopold Schmetterer
G01 - MEASURING TESTING
Information
Patent Grant
Shape measurement system and shape measurement method
Patent number
12,203,847
Issue date
Jan 21, 2025
Nippon Telegraph and Telephone Corporation
Nobutomo Hanzawa
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging system and method based on random light field spati...
Patent number
12,203,845
Issue date
Jan 21, 2025
Soochow University
Yahong Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for obtaining chemical and/or material specifi...
Patent number
12,196,615
Issue date
Jan 14, 2025
University of Southampton
Sumeet Mahajan
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
12,196,673
Issue date
Jan 14, 2025
HITACHI HIGH-TECH CORPORATION
Takeru Utsugi
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for monitoring the drying/curing process of coatings
Patent number
12,196,685
Issue date
Jan 14, 2025
BASF Coatings GmbH
Harry Libutzki
G01 - MEASURING TESTING
Information
Patent Grant
Transmission apparatus for laser radar, laser radar apparatus and e...
Patent number
12,196,862
Issue date
Jan 14, 2025
Shenzhen Goodix Technology Co., Ltd.
Hua Chen
G01 - MEASURING TESTING
Information
Patent Grant
Methods for determining the thermodynamics and kinetics of colloida...
Patent number
12,196,668
Issue date
Jan 14, 2025
The Penn State Research Foundation
Tinglu Yang
G01 - MEASURING TESTING
Information
Patent Grant
Light source generation apparatus, light source generating method,...
Patent number
12,191,621
Issue date
Jan 7, 2025
National Tsing Hua University
Andrew Hing Cheong Kung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Foreign object debris detection
Patent number
12,188,878
Issue date
Jan 7, 2025
The Government of the United States of America, as represented by the Secreta...
Andrew Nicholas
G01 - MEASURING TESTING
Information
Patent Grant
Optical machine of smoke detector
Patent number
12,188,865
Issue date
Jan 7, 2025
PixArt Imaging Inc.
Cheng-Nan Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Devices for biological analysis
Patent number
12,188,866
Issue date
Jan 7, 2025
CELLSBIN, INC.
Ali Kabiri
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for identification of effect pigments in a target...
Patent number
12,174,073
Issue date
Dec 24, 2024
BASF Coatings GmbH
Guido Bischoff
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Slope, p-component and s-component measurement
Patent number
12,146,830
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device
Patent number
12,146,840
Issue date
Nov 19, 2024
HITACHI HIGH-TECH CORPORATION
Eiji Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated analyzer and automated analysis method
Patent number
12,146,890
Issue date
Nov 19, 2024
HITACHI HIGH-TECH CORPORATION
Yuto Kazama
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measurement device, particle analysis un...
Patent number
12,140,519
Issue date
Nov 12, 2024
Horiba, Ltd.
Tetsuya Mori
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining rinse properties
Patent number
12,140,539
Issue date
Nov 12, 2024
Conopco, Inc.
Sinead Elizabeth Bond
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring spatially resolved velocity and den...
Patent number
12,136,498
Issue date
Nov 5, 2024
MetroLaser, Inc.
Thomas P. Jenkins
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alarm method, system and storage medium for abnormalities of sample...
Patent number
12,135,287
Issue date
Nov 5, 2024
Huan Qi
G08 - SIGNALLING
Information
Patent Grant
Monitoring copper corrosion in an integrated circuit device
Patent number
12,130,241
Issue date
Oct 29, 2024
Microchip Technology Incorporated
Yaojian Leng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical device
Patent number
12,123,829
Issue date
Oct 22, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Akira Kurozuka
G08 - SIGNALLING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR LOCALIZING AND TRACKING EMITTERS IN A SAMPLE
Publication number
20250052682
Publication date
Feb 13, 2025
Abberior Instruments GmbH
Matthias REUSS
G01 - MEASURING TESTING
Information
Patent Application
A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...
Publication number
20250052692
Publication date
Feb 13, 2025
Unity Semiconductor
Alexey Butkevich
G01 - MEASURING TESTING
Information
Patent Application
Surface Inspection Device
Publication number
20250044240
Publication date
Feb 6, 2025
Hitachi High-Tech Corporation
Ayumi TOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING DEGASSING EFFECT OF CROSS-LINKED POLYETHYLENE...
Publication number
20250035550
Publication date
Jan 30, 2025
ELECTRIC PWR RESEARCH INST., CHINA SOUTH. PWR GRID
Mingli FU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING BLOOD CELLS AND REAGENT FOR BLOOD CELL ANALYSIS
Publication number
20250027933
Publication date
Jan 23, 2025
SYSMEX CORPORATION
Hiroaki Matsuba
G01 - MEASURING TESTING
Information
Patent Application
SMOKE DETECTOR AND OPTICAL SENSING SYSTEM
Publication number
20250022357
Publication date
Jan 16, 2025
PixArt Imaging Inc.
Ching-Kun Chen
G01 - MEASURING TESTING
Information
Patent Application
MODIFICATION OF CELLULOSE-BASED MATERIAL PARTS
Publication number
20250020586
Publication date
Jan 16, 2025
Teknologian Tutkimuskeskus VTT Oy
Tapio MÄKELÄ
G01 - MEASURING TESTING
Information
Patent Application
RECORDING DEVICE AND WASHING MECHANISM
Publication number
20250010646
Publication date
Jan 9, 2025
SEIKO EPSON CORPORATION
Yasunori ONISHI
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
Publication number
20240426766
Publication date
Dec 26, 2024
KOH YOUNG TECHNOLOGY INC.
Chan Kwon LEE
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNA...
Publication number
20240418644
Publication date
Dec 19, 2024
Apple Inc.
Chin San Han
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20240418645
Publication date
Dec 19, 2024
Samsung Electronics Co., Ltd.
Hojun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COLUMN FLOW DAMPENER FOR MALS NOISE REDUCTION DURING SEC-MALS ANALYSIS
Publication number
20240416259
Publication date
Dec 19, 2024
WATERS TECHNOLOGIES CORPORATION
Lavelay Kizekai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
VESSEL LOCATION ASSISTANCE DEVICE
Publication number
20240415454
Publication date
Dec 19, 2024
NOVOTEC LLC
James B. Satovsky
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...
Publication number
20240418632
Publication date
Dec 19, 2024
The Regents of the University of Michigan
Nicholas A. KOTOV
G01 - MEASURING TESTING
Information
Patent Application
EVANESCENT SCATTERING IMAGING OF SINGLE MOLECULES
Publication number
20240410826
Publication date
Dec 12, 2024
Arizona Board of Regents on behalf of Arizona State University
Shaopeng WANG
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
Publication number
20240410827
Publication date
Dec 12, 2024
ASML NETHERLANDS B.V.
Diederik Jan MAAS
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES
Publication number
20240410822
Publication date
Dec 12, 2024
Apple Inc.
Miikka M. Kangas
G01 - MEASURING TESTING
Information
Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
Publication number
20240410685
Publication date
Dec 12, 2024
ChromoLogic LLC
Matthew BREHOVE
G01 - MEASURING TESTING
Information
Patent Application
INSTRUMENT AND METHOD FOR MEASURING THE CURVATURE OF A SURFACE OF A...
Publication number
20240401939
Publication date
Dec 5, 2024
RIBER
Youri ROUSSEAU
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...
Publication number
20240404036
Publication date
Dec 5, 2024
ASML NETHERLANDS B.V.
Teunis Willem TUKKER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARAC...
Publication number
20240393221
Publication date
Nov 28, 2024
Malvern Panalytical Limited
David SPRIGGS
G01 - MEASURING TESTING
Information
Patent Application
TRICORDER REFLECTOMETER FOR LATERAL FLOW IMMUNOLOGICAL TESTS
Publication number
20240393233
Publication date
Nov 28, 2024
JACK L. ARONOWITZ
G01 - MEASURING TESTING
Information
Patent Application
Spatiotemporal Multiplexing Module
Publication number
20240393247
Publication date
Nov 28, 2024
THE ROCKEFELLER UNIVERSITY
Alipasha VAZIRI
G02 - OPTICS
Information
Patent Application
COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL...
Publication number
20240393181
Publication date
Nov 28, 2024
CaiPu Technology (Zhejiang) Co., Ltd.
Kun YUAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ILLUMINATION APPARATUS OF ADAPTIVE OPTICS IN REFLECTION...
Publication number
20240369487
Publication date
Nov 7, 2024
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
JOHANNES DOMINIK SEELIG
G01 - MEASURING TESTING
Information
Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
Publication number
20240369494
Publication date
Nov 7, 2024
NISSAN MOTOR CO., LTD.
Shota YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SWITCH DEVICES
Publication number
20240371226
Publication date
Nov 7, 2024
WAVEFRONT TECHNOLOGY, INC.
Christopher Chapman Rich
G07 - CHECKING-DEVICES
Information
Patent Application
SCATTERING MICROSCOPY
Publication number
20240353325
Publication date
Oct 24, 2024
Oxford University Innovation Limited
Philipp KUKURA
G01 - MEASURING TESTING
Information
Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
Publication number
20240342804
Publication date
Oct 17, 2024
Araz Yacoubian
B22 - CASTING POWDER METALLURGY
Information
Patent Application
INTERFEROMETRIC SCATTERING MICROSCOPY
Publication number
20240344979
Publication date
Oct 17, 2024
REFEYN LTD
Matthias Karl Franz LANGHORST
G01 - MEASURING TESTING