Scattering

Industry

CPC
G01N21/47

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/47Scattering

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring distance
- Patent number 12,320,639
- Issue date Jun 3, 2025
- Loughborough University
- Jonathan Huntley
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing crystallinity in amorphous pharmaceutical composi...
- Patent number 12,313,613
- Issue date May 27, 2025
- COLVISTEC AG
- Andreas Berghaus
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing blood coagulation characteristics of blood spe...
- Patent number 12,313,638
- Issue date May 27, 2025
- Sekisui Medical Co., Ltd.
- Toshiki Kawabe
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus including sub-terahertz wave reflective member
- Patent number 12,306,292
- Issue date May 20, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuhiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Structure including grating coupler with optofluidic grating channels
- Patent number 12,306,442
- Issue date May 20, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Yusheng Bian
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for measuring optical characteristics and device for...
- Patent number 12,298,240
- Issue date May 13, 2025
- Konica Minolta, Inc.
- Takashi Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Device for water examination
- Patent number 12,298,214
- Issue date May 13, 2025
- THE WAVE TALK, INC.
- Young Dug Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating semiconductor wafer, method for selecting sem...
- Patent number 12,300,553
- Issue date May 13, 2025
- Shin-Etsu Handotai Co., Ltd.
- Junya Suzuki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
- Patent number 12,298,255
- Issue date May 13, 2025
- Industrial Intelligence Inc.
- George T. Armbruster
- B08 - CLEANING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,292,389
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Split refracting or split reflecting light received by cellulose-ba...
- Patent number 12,292,379
- Issue date May 6, 2025
- Teknologian tutkimuskeskus VTT Oy
- Tapio Mäkelä
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,292,386
- Issue date May 6, 2025
- VIENEX CORPORATION
- Yukihiro Kagawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the composition of a multi-layer system show...
- Patent number 12,292,378
- Issue date May 6, 2025
- HUBERGROUP DEUTSCHLAND GmbH
- Sylvia Klausnitzer
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
System and method for monitoring ultraviolet radiation bioremediation
- Patent number 12,276,607
- Issue date Apr 15, 2025
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Yaw Samuel Obeng
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Optical microscopy
- Patent number 12,276,782
- Issue date Apr 15, 2025
- Cambridge Enterprise Limited
- Tuomas Pertti Jonathan Knowles
- G01 - MEASURING TESTING
Information Patent Grant
Comparing gemstone signatures using angular spectrum information
- Patent number 12,259,333
- Issue date Mar 25, 2025
- The RealReal, Inc.
- Loretta Catherine Castoro
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method, and storage medium for acquiring a reflection ch...
- Patent number 12,254,656
- Issue date Mar 18, 2025
- Canon Kabushiki Kaisha
- Akira Shibasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scattered light signal measuring apparatus and information processi...
- Patent number 12,245,846
- Issue date Mar 11, 2025
- Sony Corporation
- Yoshihiro Wakita
- G01 - MEASURING TESTING
Information Patent Grant
Method and system comprising entrance optics, interferometer, and t...
- Patent number 12,247,882
- Issue date Mar 11, 2025
- Lyseonics BV
- Philippe Arthur Jean Ghislain Chevalier
- G01 - MEASURING TESTING
Information Patent Grant
Method for defect inspection, system, and computer-readable medium
- Patent number 12,235,223
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Biosensor
- Patent number 12,228,569
- Issue date Feb 18, 2025
- Electronics and Telecommunications Research Institute
- Jin Tae Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microorganism information providing device and method
- Patent number 12,228,509
- Issue date Feb 18, 2025
- THE WAVE TALK, INC.
- YongKeun Park
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Vessel location assistance device
- Patent number 12,220,255
- Issue date Feb 11, 2025
- NOVOTEC LLC
- James B. Satovsky
- G01 - MEASURING TESTING
Information Patent Grant
Optical switch devices
- Patent number 12,223,794
- Issue date Feb 11, 2025
- Wavefront Technology, Inc.
- Christopher Chapman Rich
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Turbidity calibration-correction apparatus and method for an automa...
- Patent number 12,216,052
- Issue date Feb 4, 2025
- ABB Schweiz AG
- Benjamin Carr
- G01 - MEASURING TESTING
Information Patent Grant
Decay detection system
- Patent number 12,217,410
- Issue date Feb 4, 2025
- SUNKIST GROWERS, INC.
- Aaron Gorsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices and methods for determining chiral optical properties from...
- Patent number 12,216,043
- Issue date Feb 4, 2025
- The Regents of the University of Michigan
- Nicholas A. Kotov
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive tension measuring system
- Patent number 12,209,960
- Issue date Jan 28, 2025
- The United States of America as represented by the Secretary of the Navy
- Anthony A Ruffa
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
- Patent number 12,209,952
- Issue date Jan 28, 2025
- Singapore Health Services Pte Ltd.
- Leopold Schmetterer
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement system and shape measurement method
- Patent number 12,203,847
- Issue date Jan 21, 2025
- Nippon Telegraph and Telephone Corporation
- Nobutomo Hanzawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...
- Publication number 20250180475
- Publication date Jun 5, 2025
- OPSOLUTION GMBH
- BJOERN MAGNUSSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING DEFECTS IN SEPARATOR COATINGS
- Publication number 20250183476
- Publication date Jun 5, 2025
- Millibatt, Inc.
- Kyung Rak Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
- Publication number 20250172493
- Publication date May 29, 2025
- JEDEX INC.
- Jin Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A SCATTERED LIGHT PARAMETER AND MEASURING AR...
- Publication number 20250172494
- Publication date May 29, 2025
- Endress + Hauser Conducta GmbH + Co. KG
- Matthias Großmann
- G01 - MEASURING TESTING
Information Patent Application
Devices, Systems, and Methods for Digital Microscopy
- Publication number 20250164774
- Publication date May 22, 2025
- IDEXX Laboratories, Inc.
- Jeremy Hammond
- G01 - MEASURING TESTING
Information Patent Application
UNDERWATER OPTICAL COMMUNICATION SYSTEM AND UNDERWATER OPTICAL COMM...
- Publication number 20250141565
- Publication date May 1, 2025
- Shimadzu Corporation
- Naoki NISHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
- Publication number 20250137927
- Publication date May 1, 2025
- Meta Platforms Technologies, LLC
- Jian XU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING EMBRITTLEMENT OF AN INTERFACE BETWEEN A SUBST...
- Publication number 20250137928
- Publication date May 1, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Frédéric MAZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INK JET PRINTER
- Publication number 20250128511
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Shota Nakano
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE END OF A CIP PHASE
- Publication number 20250128302
- Publication date Apr 24, 2025
- ECOLAB USA INC.
- Matt Porter
- B08 - CLEANING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
- Publication number 20250130175
- Publication date Apr 24, 2025
- Kabushiki Kaisha Toshiba
- Hideaki OKANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DIFFUSE REFLECTANCE SPECTROSCOPY COMPRISING I...
- Publication number 20250123202
- Publication date Apr 17, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Luc ANDRE
- G01 - MEASURING TESTING
Information Patent Application
COLOR DIFFRACTION TEST DEVICE AND TEST METHOD THEREOF, AND COLOR DI...
- Publication number 20250123203
- Publication date Apr 17, 2025
- BOE TECHNOLOGY GROUP CO., LTD.
- Bo WANG
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography System for Subsurface Inspection
- Publication number 20250102290
- Publication date Mar 27, 2025
- Hamamatsu Photonics K. K.
- Qingsong Wang
- G01 - MEASURING TESTING
Information Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
- Publication number 20250093261
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE FOR CORRECTING AND RECONSTRUCTING TARGET IMAGE IN SC...
- Publication number 20250093262
- Publication date Mar 20, 2025
- Korea University Research and Business Foundation
- Won Shik CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS OF DETERMINING A STRESS-RELATED CHARACTERISTI...
- Publication number 20250085177
- Publication date Mar 13, 2025
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE
- Publication number 20250076216
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM SMOKE DETECTOR
- Publication number 20250076196
- Publication date Mar 6, 2025
- Johnson Controls Tyco IP Holdings LLP
- Siddhesh NAGALE
- G08 - SIGNALLING
Information Patent Application
SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR...
- Publication number 20250076183
- Publication date Mar 6, 2025
- ORBOTECH LTD.
- Haim Chayet
- G01 - MEASURING TESTING
Information Patent Application
Method for Monitoring Ghost Image of Illumination Unit of Lithograp...
- Publication number 20250076195
- Publication date Mar 6, 2025
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Kaifeng Xu
- G01 - MEASURING TESTING
Information Patent Application
SMOKE DETECTOR REDUCING FALSE ALARM RATE
- Publication number 20250067667
- Publication date Feb 27, 2025
- PIXART IMAGING INC.
- Cheng-Nan TSAI
- G08 - SIGNALLING
Information Patent Application
METHOD FOR LOCALIZING AND TRACKING EMITTERS IN A SAMPLE
- Publication number 20250052682
- Publication date Feb 13, 2025
- Abberior Instruments GmbH
- Matthias REUSS
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...
- Publication number 20250052692
- Publication date Feb 13, 2025
- Unity Semiconductor
- Alexey Butkevich
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Device
- Publication number 20250044240
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Ayumi TOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING DEGASSING EFFECT OF CROSS-LINKED POLYETHYLENE...
- Publication number 20250035550
- Publication date Jan 30, 2025
- ELECTRIC PWR RESEARCH INST., CHINA SOUTH. PWR GRID
- Mingli FU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING BLOOD CELLS AND REAGENT FOR BLOOD CELL ANALYSIS
- Publication number 20250027933
- Publication date Jan 23, 2025
- SYSMEX CORPORATION
- Hiroaki Matsuba
- G01 - MEASURING TESTING
Information Patent Application
SMOKE DETECTOR AND OPTICAL SENSING SYSTEM
- Publication number 20250022357
- Publication date Jan 16, 2025
- PixArt Imaging Inc.
- Ching-Kun Chen
- G01 - MEASURING TESTING
Information Patent Application
MODIFICATION OF CELLULOSE-BASED MATERIAL PARTS
- Publication number 20250020586
- Publication date Jan 16, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Tapio MÄKELÄ
- G01 - MEASURING TESTING
Information Patent Application
RECORDING DEVICE AND WASHING MECHANISM
- Publication number 20250010646
- Publication date Jan 9, 2025
- SEIKO EPSON CORPORATION
- Yasunori ONISHI
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for measuring distance

Method of testing crystallinity in amorphous pharmaceutical composi...

Method for analyzing blood coagulation characteristics of blood spe...

Imaging apparatus including sub-terahertz wave reflective member

Structure including grating coupler with optofluidic grating channels

Optical system for measuring optical characteristics and device for...

Device for water examination

Method for evaluating semiconductor wafer, method for selecting sem...

Continuous dust accumulation monitoring system with impaired optics...

Defect inspection apparatus

Split refracting or split reflecting light received by cellulose-ba...

Foreign substance/defect inspection device, image generation device...

Method for determining the composition of a multi-layer system show...

System and method for monitoring ultraviolet radiation bioremediation

Optical microscopy

Comparing gemstone signatures using angular spectrum information

Apparatus, method, and storage medium for acquiring a reflection ch...

Scattered light signal measuring apparatus and information processi...

Method and system comprising entrance optics, interferometer, and t...

Method for defect inspection, system, and computer-readable medium

Biosensor

Microorganism information providing device and method

Vessel location assistance device

Optical switch devices

Turbidity calibration-correction apparatus and method for an automa...

Decay detection system

Devices and methods for determining chiral optical properties from...

Non-invasive tension measuring system

Methods and systems for polarization-sensitive optical coherence to...

Shape measurement system and shape measurement method

Patents Applicationslast 30 patents

NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...

SYSTEM AND METHOD FOR PREDICTING DEFECTS IN SEPARATOR COATINGS

OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...

METHOD FOR DETERMINING A SCATTERED LIGHT PARAMETER AND MEASURING AR...

Devices, Systems, and Methods for Digital Microscopy

UNDERWATER OPTICAL COMMUNICATION SYSTEM AND UNDERWATER OPTICAL COMM...

IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD

METHOD FOR MONITORING EMBRITTLEMENT OF AN INTERFACE BETWEEN A SUBST...

INK JET PRINTER

METHOD AND SYSTEM FOR DETERMINING THE END OF A CIP PHASE

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...

METHOD AND DEVICE FOR DIFFUSE REFLECTANCE SPECTROSCOPY COMPRISING I...

COLOR DIFFRACTION TEST DEVICE AND TEST METHOD THEREOF, AND COLOR DI...

Optical Coherence Tomography System for Subsurface Inspection

LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...

IMAGING DEVICE FOR CORRECTING AND RECONSTRUCTING TARGET IMAGE IN SC...

METHODS AND APPARATUS OF DETERMINING A STRESS-RELATED CHARACTERISTI...

METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE

MULTI-BEAM SMOKE DETECTOR

SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR...

Method for Monitoring Ghost Image of Illumination Unit of Lithograp...

SMOKE DETECTOR REDUCING FALSE ALARM RATE

METHOD FOR LOCALIZING AND TRACKING EMITTERS IN A SAMPLE

A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...

Surface Inspection Device

METHOD FOR EVALUATING DEGASSING EFFECT OF CROSS-LINKED POLYETHYLENE...

METHOD FOR ANALYZING BLOOD CELLS AND REAGENT FOR BLOOD CELL ANALYSIS

SMOKE DETECTOR AND OPTICAL SENSING SYSTEM

MODIFICATION OF CELLULOSE-BASED MATERIAL PARTS

RECORDING DEVICE AND WASHING MECHANISM